JPH0311981Y2 - - Google Patents
Info
- Publication number
- JPH0311981Y2 JPH0311981Y2 JP15661686U JP15661686U JPH0311981Y2 JP H0311981 Y2 JPH0311981 Y2 JP H0311981Y2 JP 15661686 U JP15661686 U JP 15661686U JP 15661686 U JP15661686 U JP 15661686U JP H0311981 Y2 JPH0311981 Y2 JP H0311981Y2
- Authority
- JP
- Japan
- Prior art keywords
- testing device
- contact
- polarity
- display
- rod
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007689 inspection Methods 0.000 claims description 16
- 239000004020 conductor Substances 0.000 description 4
- 239000000470 constituent Substances 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Current Or Voltage (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15661686U JPH0311981Y2 (enrdf_load_html_response) | 1986-10-15 | 1986-10-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15661686U JPH0311981Y2 (enrdf_load_html_response) | 1986-10-15 | 1986-10-15 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6364147U JPS6364147U (enrdf_load_html_response) | 1988-04-27 |
| JPH0311981Y2 true JPH0311981Y2 (enrdf_load_html_response) | 1991-03-22 |
Family
ID=31078398
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15661686U Expired JPH0311981Y2 (enrdf_load_html_response) | 1986-10-15 | 1986-10-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0311981Y2 (enrdf_load_html_response) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004347326A (ja) * | 2003-05-20 | 2004-12-09 | Hitachi Ltd | 非破壊診断装置 |
-
1986
- 1986-10-15 JP JP15661686U patent/JPH0311981Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6364147U (enrdf_load_html_response) | 1988-04-27 |
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