JPH0310903B2 - - Google Patents

Info

Publication number
JPH0310903B2
JPH0310903B2 JP55114070A JP11407080A JPH0310903B2 JP H0310903 B2 JPH0310903 B2 JP H0310903B2 JP 55114070 A JP55114070 A JP 55114070A JP 11407080 A JP11407080 A JP 11407080A JP H0310903 B2 JPH0310903 B2 JP H0310903B2
Authority
JP
Japan
Prior art keywords
sample
plate
ray diffraction
casing
filling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55114070A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5739338A (en
Inventor
Nobuyasu Hisamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsui Petrochemical Industries Ltd
Original Assignee
Mitsui Petrochemical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui Petrochemical Industries Ltd filed Critical Mitsui Petrochemical Industries Ltd
Priority to JP55114070A priority Critical patent/JPS5739338A/ja
Publication of JPS5739338A publication Critical patent/JPS5739338A/ja
Publication of JPH0310903B2 publication Critical patent/JPH0310903B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP55114070A 1980-08-21 1980-08-21 Sealing apparatus of sample for x-ray diffraction Granted JPS5739338A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55114070A JPS5739338A (en) 1980-08-21 1980-08-21 Sealing apparatus of sample for x-ray diffraction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55114070A JPS5739338A (en) 1980-08-21 1980-08-21 Sealing apparatus of sample for x-ray diffraction

Publications (2)

Publication Number Publication Date
JPS5739338A JPS5739338A (en) 1982-03-04
JPH0310903B2 true JPH0310903B2 (OSRAM) 1991-02-14

Family

ID=14628280

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55114070A Granted JPS5739338A (en) 1980-08-21 1980-08-21 Sealing apparatus of sample for x-ray diffraction

Country Status (1)

Country Link
JP (1) JPS5739338A (OSRAM)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11969212B2 (en) 2019-12-27 2024-04-30 Ohio State Innovation Foundation Methods and apparatus for detecting a presence and severity of a cataract in ambient lighting
US11969210B2 (en) 2019-12-27 2024-04-30 Ohio State Innovation Foundation Methods and apparatus for making a determination about an eye using color temperature adjusted lighting

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5045123A (en) * 1988-05-17 1991-09-03 Kabushiki Kaisha Toshiba Thermopile
JPH01180646U (OSRAM) * 1988-05-31 1989-12-26
FR2770908B1 (fr) * 1997-11-12 1999-12-10 Commissariat Energie Atomique Porte-echantillon pour analyse de caracteristiques cristallographiques

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS537746Y2 (OSRAM) * 1974-02-26 1978-02-27
JPS5928351Y2 (ja) * 1976-02-16 1984-08-16 工業技術院長 粉末ｘ線回折用密封容器

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11969212B2 (en) 2019-12-27 2024-04-30 Ohio State Innovation Foundation Methods and apparatus for detecting a presence and severity of a cataract in ambient lighting
US11969210B2 (en) 2019-12-27 2024-04-30 Ohio State Innovation Foundation Methods and apparatus for making a determination about an eye using color temperature adjusted lighting

Also Published As

Publication number Publication date
JPS5739338A (en) 1982-03-04

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