JPH0310903B2 - - Google Patents
Info
- Publication number
- JPH0310903B2 JPH0310903B2 JP55114070A JP11407080A JPH0310903B2 JP H0310903 B2 JPH0310903 B2 JP H0310903B2 JP 55114070 A JP55114070 A JP 55114070A JP 11407080 A JP11407080 A JP 11407080A JP H0310903 B2 JPH0310903 B2 JP H0310903B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- plate
- ray diffraction
- casing
- filling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000002441 X-ray diffraction Methods 0.000 claims description 38
- 239000000843 powder Substances 0.000 claims description 23
- 238000007789 sealing Methods 0.000 claims description 15
- 230000002093 peripheral effect Effects 0.000 claims description 4
- 239000010408 film Substances 0.000 description 11
- 238000005259 measurement Methods 0.000 description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 239000011261 inert gas Substances 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 229910052760 oxygen Inorganic materials 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 230000006866 deterioration Effects 0.000 description 4
- 238000012856 packing Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- -1 polytetrafluoroethylene Polymers 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は粉末試料のＸ線回折を行うためのＸ線
回折試料シール装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an X-ray diffraction sample sealing device for performing X-ray diffraction of a powder sample.
一般にＸ線回折装置においては、板状容器に粉
末試料を充填し、大気中でＸ線を照射することに
よつて測定が行われている。しかしながら、粉末
試料が酸素や水分などに鋭敏で変化を起こし易い
場合には、試料充填後、Ｘ線回折装置にセツト
し、測定を行つている間に試料が変質を起こすこ
とがあり、真の測定ができない。
Generally, in an X-ray diffraction apparatus, measurements are performed by filling a plate-shaped container with a powder sample and irradiating it with X-rays in the atmosphere. However, if the powder sample is sensitive to oxygen, moisture, etc. and easily changes, the sample may change in quality while being placed in the X-ray diffraction device and being measured after filling the sample. Unable to measure.
このような試料の変質を防止するためには、測
定系全体を乾燥不活性ガスでシールすることが考
えられるが、大懸りな装置となつてコスト高にな
るとともに、実際の測定操作も煩雑とならざるを
得ない。 In order to prevent such deterioration of the sample, it may be possible to seal the entire measurement system with dry inert gas, but this would result in a large-scale equipment and high cost, and the actual measurement operation would also be complicated. I have no choice but to do so.
また側方に開口部を有する容器本体の前記開口
部に気密性でかつＸ線を透過する薄膜を設け、こ
の容器本体上方の開口部に真空活栓を有する蓋体
を気密性を保つて着脱するように構成し、前記容
器内部に固定した粉末試料支持台上に、試料板を
挿入抜出し自在に設けたＸ線回折用試料密封容器
が提案されている（実開昭52−108985号）。 Further, a thin film that is airtight and transmits X-rays is provided at the opening of the container body having an opening on the side, and a lid body having a vacuum stopcock is attached and removed while maintaining airtightness at the opening above the container body. A sealed sample container for X-ray diffraction has been proposed (Utility Model Application Publication No. 108985/1983), which is constructed as follows and has a sample plate that can be freely inserted and extracted from a powder sample support fixed inside the container.
しかしながら、上記のＸ線回折用試料密封容器
は、試料板の全体を容器内に収容し、容器の底部
に設けたＸ線回折装置への取付位置決め部をＸ線
回折装置のゴニオメータに取付けて位置決めする
ようになつているため、密封容器を使用しない場
合に使用する通常の試料板とは異なる試料板を別
に準備する必要があり、また試料板を容器内に収
容したときに、容器底部に設けられた取付位置決
め部と試料板の位置を正確に一致させることが困
難であり、分析精度が低下するという問題点があ
つた。 However, in the above sealed sample container for X-ray diffraction, the entire sample plate is housed in the container, and the mounting positioning part for the X-ray diffraction device provided at the bottom of the container is attached to the goniometer of the X-ray diffraction device to determine the position. Therefore, it is necessary to prepare a separate sample plate from the normal sample plate used when a sealed container is not used, and when the sample plate is placed in the container, There was a problem in that it was difficult to accurately match the position of the sample plate with the attached mounting positioning part, resulting in a decrease in analysis accuracy.
本発明の目的は、上記のような問題点を解決す
るため、通常のＸ線回折装置および試料板をその
まま使用し、粉末試料の変質を防止しながら正確
に位置決めして、精度よくＸ線回折を行うことが
できるＸ線回折試料シール装置である。
The purpose of the present invention is to solve the above-mentioned problems by using an ordinary X-ray diffraction apparatus and sample plate as they are, and by accurately positioning the powder sample while preventing deterioration of the powder sample. This is an X-ray diffraction sample sealing device that can perform
本発明は、粉末試料を充填する試料充填部およ
びＸ線回折装置への取付位置決め部を有する試料
板と、この試料板の試料充填部を収容し、かつ取
付位置決め部を突出させるように試料板を取付け
るケーシングと、前記試料板の試料充填部の周辺
部に気密状に密着するように前記ケーシングの基
部に形成された試料取付板と、この試料取付板の
前記試料充填部に対応する位置に形成された窓部
と、この窓部から間隔を保つて前記ケーシングの
対向位置に設けられたＸ線透過部と、前記試料板
を前記試料取付板に押圧して固定するとともに前
記ケーシングを密閉状態にする押圧機構とを有す
るＸ線回折試料シール装置である。
The present invention provides a sample plate having a sample filling part for filling a powder sample and a mounting positioning part for an X-ray diffraction apparatus, and a sample plate that accommodates the sample filling part of the sample plate and has a mounting positioning part protruding from the sample plate. a casing to which the sample mounting plate is attached, a sample mounting plate formed at the base of the casing so as to be in close contact with the periphery of the sample filling portion of the sample plate, and a sample mounting plate located at a position corresponding to the sample filling portion of the sample mounting plate. a formed window, an X-ray transmitting part provided at a position opposite to the casing with a distance from the window, and the sample plate is pressed and fixed to the sample mounting plate, and the casing is kept in a sealed state. This is an X-ray diffraction sample sealing device that has a pressing mechanism that allows
本発明のＸ線回折試料シール装置は、不活性ガ
ス中など、空気を遮断した状態で、試料板の試料
充填部に粉末試料を充填し、この試料板の試料充
填部をケーシング内に収容し、かつ取付位置決め
部をケーシングから突出させるように、試料板を
ケーシングに取付ける。このとき試料板を試料充
填部が窓部に対向するようにケーシングの試料取
付板に取付け、押圧機構により押圧して、試料板
を固定するとともに、ケーシングを密閉状態にす
る。
The X-ray diffraction sample sealing device of the present invention fills the sample filling portion of a sample plate with a powder sample in an inert gas environment or the like with air blocked, and then houses the sample filling portion of the sample plate in a casing. , and the sample plate is attached to the casing so that the attachment positioning portion protrudes from the casing. At this time, the sample plate is attached to the sample mounting plate of the casing so that the sample filling part faces the window part, and is pressed by the pressing mechanism to fix the sample plate and bring the casing into a sealed state.
こうしてＸ線回折試料シール装置に取付けた試
料板のケーシングから突出する取付位置決め部を
Ｘ線回折装置のゴニオメータに装着して位置決め
し、Ｘ線回折試料シール装置のＸ線透過部を通し
て、試料板に充填された粉末試料にＸ線を照射
し、再度Ｘ線透過部を透過した回折線を検出して
測定を行う。この場合、試料を充填した試料板は
取付位置決め部により直接Ｘ線回折装置のゴニオ
メータに取付けて位置決めされるので、位置決め
は正確であり、またケーシング内は密閉状態に維
持されているため、酸素、水等による粉末試料の
変質は防止され、正確な測定を行うことができ
る。 In this way, the mounting positioning part protruding from the casing of the sample plate attached to the X-ray diffraction sample sealing device is attached and positioned to the goniometer of the X-ray diffraction device, and the sample plate is attached to the sample plate through the X-ray transparent part of the X-ray diffraction sample sealing device. The filled powder sample is irradiated with X-rays, and the diffraction rays transmitted through the X-ray transmitting section are detected again for measurement. In this case, the sample plate filled with the sample is directly mounted and positioned on the goniometer of the X-ray diffraction device by the mounting positioning section, so the positioning is accurate, and since the inside of the casing is maintained in a sealed state, the oxygen and Deterioration of the powder sample due to water etc. is prevented and accurate measurements can be performed.
以下、本発明の実施例を図面により説明する。 Embodiments of the present invention will be described below with reference to the drawings.
第１図は実施例のＸ線回折試料シール装置を示
す正面透視図、第２図はその−断面図、第３
図は−断面図、第４図は試料板の正面図であ
る。 Fig. 1 is a front perspective view showing the X-ray diffraction sample sealing device of the example, Fig. 2 is its cross-sectional view, and Fig. 3
The figure is a sectional view, and FIG. 4 is a front view of the sample plate.
図において、１は試料板で、ガラス等の長方形
の平板からなり、長手方向の一半部の片面に凹状
の試料充填部２が形成され、他半部は平板状のま
まＸ線回折装置への取付位置決め部１ａとなつて
いる。試料充填部２は凹部が粗面化され、粉末試
料３が充填された場合落下することなく保持され
るようになつている。 In the figure, reference numeral 1 denotes a sample plate, which is made of a rectangular flat plate made of glass or the like, with a concave sample filling part 2 formed on one side of one half in the longitudinal direction, and the other half remaining in the flat shape and placed in the X-ray diffraction apparatus. This serves as a mounting positioning portion 1a. The sample filling part 2 has a roughened recess so that when the powder sample 3 is filled, it is held without falling.
４は試料板１を取付けるケーシングで、試料板
１の試料充填部２を収容し、取付位置決め部１ａ
を突出させるように形成されている。ケーシング
４は、試料板１の試料充填部２の周辺部と気密状
に密着するように形成された平板状の試料取付板
５と、この試料取付板５の試料充填部２に対応す
る位置に形成された窓部６と、この窓部６の対向
位置に間隔を保つて半円筒状に設けられたＸ線透
過部としてのＸ線透過フイルム７と、このフイル
ム７の周辺部を保持する枠部８と、ケーシング４
の側面を形成する半円状の側面板９とからなる。
試料取付板５の窓部６周囲の試料板１と接する部
分には、シール材としてポリテトラフルオロエチ
レン等からなる薄いパツキング１０が張られてい
る。 4 is a casing for mounting the sample plate 1, which accommodates the sample filling part 2 of the sample plate 1, and the mounting positioning part 1a.
It is formed so that it protrudes. The casing 4 has a flat sample mounting plate 5 formed to be in airtight contact with the peripheral part of the sample filling section 2 of the sample plate 1, and a sample mounting plate 5 at a position corresponding to the sample filling section 2 of the sample mounting plate 5. A window portion 6 formed, an X-ray transparent film 7 as an X-ray transparent portion provided in a semi-cylindrical shape with a gap maintained at a position opposite to the window portion 6, and a frame that holds the peripheral portion of the film 7. part 8 and casing 4
It consists of a semicircular side plate 9 forming the side surface of.
A thin packing 10 made of polytetrafluoroethylene or the like is applied as a sealing material to a portion of the sample mounting plate 5 that is in contact with the sample plate 1 around the window 6 .
ケーシング４の試料取付板５側には押圧機構１
１が設けられている。押圧機構１１は、ケーシン
グ４の試料取付板５を覆うように一体化されたコ
字状の支持板１２と、この支持板１２および試料
取付板５間に形成された試料板装着空間１３に試
料板１を押圧できるように移動可能に配置された
押圧板１４と、押圧板１４に固着されかつ支持板
１２にねじ付けられたねじ１５と、試料板１を試
料取付板５側に押圧する板ばね１６と、試料板１
を両側から中央方向に押圧する板ばね１７とから
なる。１８は試料板１の先端を規制するストツパ
である。 A pressing mechanism 1 is provided on the sample mounting plate 5 side of the casing 4.
1 is provided. The pressing mechanism 11 includes a U-shaped support plate 12 that is integrated so as to cover the sample attachment plate 5 of the casing 4, and a sample plate attachment space 13 formed between the support plate 12 and the sample attachment plate 5. A press plate 14 movably arranged to press the plate 1, a screw 15 fixed to the press plate 14 and screwed to the support plate 12, and a plate that presses the sample plate 1 toward the sample mounting plate 5. Spring 16 and sample plate 1
It consists of a leaf spring 17 that presses from both sides toward the center. Reference numeral 18 denotes a stopper for regulating the tip of the sample plate 1.
ケーシング４の試料取付板５、枠部８、側面板
９等はＸ線不透過性材料、例えば金属で構成され
ているが、フイルム７はＸ線透過性材料、例えば
ベリリウム、ポリエステル、ポリオレフイン、ニ
ツケル、アルミニウムなどで構成されており、フ
イルム７を通過したＸ線が粉末試料３に照射さ
れ、回折Ｘ線がフイルム７を透過して出ていくの
で、従来同様の測定が行えるようになつている。
フイルム７としてはできるだけ薄いものが好まし
く、また酸素透過性の小さいものが好ましい。フ
イルム７は試料測定の際、フイルム７のＸ線回折
が認められない程度に窓部６と離れている必要が
あり、Ｘ線の透過に支障がなければ如何なる形状
になつていてもよく、円筒形に限らない。 The sample mounting plate 5, frame 8, side plate 9, etc. of the casing 4 are made of an X-ray opaque material, such as metal, while the film 7 is made of an X-ray transparent material, such as beryllium, polyester, polyolefin, or nickel. , aluminum, etc., the powder sample 3 is irradiated with the X-rays that have passed through the film 7, and the diffracted X-rays pass through the film 7 and exit, making it possible to carry out measurements similar to conventional methods. .
The film 7 is preferably as thin as possible and has low oxygen permeability. The film 7 must be separated from the window 6 to such an extent that X-ray diffraction of the film 7 is not observed during sample measurement, and it may have any shape as long as it does not impede the transmission of X-rays, such as a cylinder. Not limited to shape.
上記のＸ線回折試料シール装置は、不活性ガス
中など、空気を遮断した状態で試料板１の試料充
填部２に粉末試料３を指またはガラス板等で押し
て充填し、この試料板１の試料充填部２をケーシ
ング４内に収容し、かつ取付位置決め部１ａをケ
ーシング４の下側から突出させるように、試料板
１をケーシング４に取付ける。このとき試料板１
を試料充填部２が窓部６に対向するようにケーシ
ング４の試料取付板５に取付け、押圧機構１１に
より押圧して、試料板１を固定するとともに、ケ
ーシング４を密閉状態にする。 The above-mentioned X-ray diffraction sample sealing device presses and fills a powder sample 3 into the sample filling portion 2 of a sample plate 1 with a finger or a glass plate, etc. in an inert gas or other state with air cut off. The sample plate 1 is attached to the casing 4 so that the sample filling section 2 is housed in the casing 4 and the attachment positioning section 1a protrudes from the bottom of the casing 4. At this time, sample plate 1
is attached to the sample mounting plate 5 of the casing 4 so that the sample filling part 2 faces the window part 6, and is pressed by the pressing mechanism 11 to fix the sample plate 1 and bring the casing 4 into a sealed state.
このとき試料板１をケーシング４と押圧機構１
１間の試料板装着空間１３に挿入すると、試料板
１はストツパ１８により上下方向に位置決めさ
れ、板ばね１７により横方向に位置決めされ、試
料充填部２に充填された粉末試料３が窓部６に対
向した状態で、板ばね１６によりパツキング１０
に圧着される。この状態でねじ１５により押圧板
１４を前進させると、試料板１はパツキング１０
を介してケーシング４の試料取付板５に押圧され
て、気密状に密着して固定され、ケーシング４内
は密閉状態になる。 At this time, the sample plate 1 is pressed between the casing 4 and the pressing mechanism 1.
1, the sample plate 1 is vertically positioned by the stopper 18 and laterally positioned by the plate spring 17, and the powder sample 3 filled in the sample filling part 2 is inserted into the window part 6. The packing 10 is held by the leaf spring 16 while facing the
is crimped. In this state, when the press plate 14 is moved forward with the screw 15, the sample plate 1 is moved forward by the packing 10.
The sample mounting plate 5 of the casing 4 is pressed through the sample mounting plate 5 and fixed in an airtight manner, and the inside of the casing 4 becomes airtight.
こうしてＸ線回折試料シール装置に取付けた試
料板１のケーシング４から突出する取付位置決め
部１ａをＸ線回折装置のゴニオメータに装着して
位置決めし、Ｘ線回折試料シール装置に設けられ
たＸ線透過部としてのフイルム７を通して、試料
板１に充填された粉末試料３にＸ線を照射し、再
度フイルム７を透過した回折線を検出して測定を
行う。この場合、粉末試料３を充填した試料板１
は取付位置決め部１ａにより直接Ｘ線回折装置の
ゴニオメータに取付けて位置決めされるので、位
置決めは正確である。またケーシング４内は密閉
状態に維持されているため、酸素、水等による粉
末試料の変質は防止され、正確な測定を行うこと
ができる。 In this way, the mounting positioning part 1a protruding from the casing 4 of the sample plate 1 attached to the X-ray diffraction sample sealing device is mounted and positioned on the goniometer of the X-ray diffraction device, and the The powder sample 3 filled in the sample plate 1 is irradiated with X-rays through the film 7 as a part, and the diffraction rays transmitted through the film 7 are detected again for measurement. In this case, sample plate 1 filled with powder sample 3
Since it is directly attached and positioned to the goniometer of the X-ray diffraction apparatus by the attachment positioning part 1a, the positioning is accurate. Furthermore, since the inside of the casing 4 is maintained in a sealed state, deterioration of the powder sample due to oxygen, water, etc. is prevented, and accurate measurements can be performed.
すなわち、空気中の成分、例えば酸素や水分等
に対して変質し易い粉末試料のＸ線回折を行うに
当つては、乾燥不活性ガス雰囲気中、例えば窒素
ボツクス中で粉末試料３を試料板１に充填すると
ともに、本発明のＸ線回折シール装置への試料板
１の取付も同様に行えば、試料板１取付後にＸ線
回折試料シール装置を窒素ボツクスより取り出
し、Ｘ線回折を行つても、粉末試料３は密室に封
じ込められた不活性ガスに触れるのみで、大気に
全く接触せずに測定できるので正確な分析を行う
ことができる。また試料板１の上記取付操作は簡
単に行うことができ、作業性が良好である。 That is, when performing X-ray diffraction on a powder sample that is easily altered by components in the air, such as oxygen and moisture, the powder sample 3 is placed on the sample plate 1 in a dry inert gas atmosphere, for example in a nitrogen box. If the sample plate 1 is also attached to the X-ray diffraction sealing device of the present invention in the same way, even if the X-ray diffraction sample sealing device is taken out from the nitrogen box after the sample plate 1 is attached and X-ray diffraction is performed. Since the powder sample 3 can be measured only by coming into contact with an inert gas sealed in a closed room and without any contact with the atmosphere, accurate analysis can be performed. Further, the above-mentioned mounting operation of the sample plate 1 can be performed easily and has good workability.
本発明によれば、Ｘ線透過部を有するケーシン
グに試料板の試料充填部の周辺部を押圧して試料
充填部を密閉状態とし、ケーシングから突出する
試料板の取付位置決め部をＸ線回折装置に直接装
着して、位置決めした状態でＸ線回折を行うよう
にしたので、通常のＸ線回折装置および試料板を
そのまま使用し、粉末試料の変質を防止しながら
正確に位置決めして、精度よくＸ線回折を行うこ
とができ、操作も簡単である。
According to the present invention, the peripheral part of the sample filling part of the sample plate is pressed against the casing having the X-ray transmitting part to seal the sample filling part, and the mounting positioning part of the sample plate protruding from the casing is placed in the X-ray diffraction apparatus. X-ray diffraction can be performed with the X-ray diffraction device mounted directly on the powder sample and positioned, allowing the normal X-ray diffraction device and sample plate to be used as they are. It can perform X-ray diffraction and is easy to operate.
第１図は実施例のＸ線回折試料シール装置を示
す正面透視図、第２図はその−断面図、第３
図は−断面図、第４図は試料板の正面図であ
る。
各図中、同一符号は同一または相当部分を示
し、１は試料板、２は試料充填部、３は粉末試
料、４はケーシング、５は試料取付板、６は窓
部、７はＸ線透過フイルム、１１は押圧機構、１
４は押圧板、１６，１７は板ばねである。
Fig. 1 is a front perspective view showing the X-ray diffraction sample sealing device of the example, Fig. 2 is its cross-sectional view, and Fig. 3
The figure is a sectional view, and FIG. 4 is a front view of the sample plate. In each figure, the same reference numerals indicate the same or equivalent parts, 1 is the sample plate, 2 is the sample filling part, 3 is the powder sample, 4 is the casing, 5 is the sample mounting plate, 6 is the window part, and 7 is the X-ray transmission part. Film, 11 is a pressing mechanism, 1
4 is a pressing plate, and 16 and 17 are leaf springs.
Claims (1)
折装置への取付位置決め部を有する試料板と、こ
の試料板の試料充填部を収容し、かつ取付位置決
め部を突出させるように試料板を取付けるケーシ
ングと、前記試料板の試料充填部の周辺部に気密
状に密着するように前記ケーシングの基部に形成
された試料取付板と、この試料取付板の前記試料
充填部に対応する位置に形成された窓部と、この
窓部から間隔を保つて前記ケーシングの対向位置
に設けられたＸ線透過部と、前記試料板を前記試
料取付板に押圧して固定するとともに前記ケーシ
ングを密閉状態にする押圧機構とを有するＸ線回
折試料シール装置。 ２ 押圧機構が試料板を押圧する押圧板を有する
特許請求の範囲第１項記載のＸ線回折試料シール
装置。 ３ 押圧機構が試料板を位置決めする位置決め機
構を有する特許請求の範囲第１項または第２項記
載のＸ線回折試料シール装置。[Scope of Claims] 1. A sample plate having a sample filling part for filling a powder sample and a positioning part for attaching to the X-ray diffraction apparatus, and a sample plate that accommodates the sample filling part of the sample plate and makes the mounting positioning part protrude. a casing to which a sample plate is attached; a sample mounting plate formed at the base of the casing so as to be in close contact with the peripheral portion of the sample filling portion of the sample plate; and a sample mounting plate corresponding to the sample filling portion of the sample mounting plate. a window portion formed at a position where the sample plate is pressed against and fixed to the sample mounting plate; An X-ray diffraction sample sealing device having a pressing mechanism that brings the sample into a sealed state. 2. The X-ray diffraction sample sealing device according to claim 1, wherein the pressing mechanism includes a pressing plate that presses the sample plate. 3. The X-ray diffraction sample sealing device according to claim 1 or 2, wherein the pressing mechanism has a positioning mechanism for positioning the sample plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55114070A JPS5739338A (en) | 1980-08-21 | 1980-08-21 | Sealing apparatus of sample for x-ray diffraction |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55114070A JPS5739338A (en) | 1980-08-21 | 1980-08-21 | Sealing apparatus of sample for x-ray diffraction |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5739338A JPS5739338A (en) | 1982-03-04 |
| JPH0310903B2 true JPH0310903B2 (en) | 1991-02-14 |
Family
ID=14628280
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55114070A Granted JPS5739338A (en) | 1980-08-21 | 1980-08-21 | Sealing apparatus of sample for x-ray diffraction |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5739338A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11969210B2 (en) | 2019-12-27 | 2024-04-30 | Ohio State Innovation Foundation | Methods and apparatus for making a determination about an eye using color temperature adjusted lighting |
| US11969212B2 (en) | 2019-12-27 | 2024-04-30 | Ohio State Innovation Foundation | Methods and apparatus for detecting a presence and severity of a cataract in ambient lighting |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5045123A (en) * | 1988-05-17 | 1991-09-03 | Kabushiki Kaisha Toshiba | Thermopile |
| JPH01180646U (en) * | 1988-05-31 | 1989-12-26 | ||
| FR2770908B1 (en) * | 1997-11-12 | 1999-12-10 | Commissariat Energie Atomique | SAMPLE HOLDER FOR ANALYSIS OF CRYSTALLOGRAPHIC CHARACTERISTICS |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS537746Y2 (en) * | 1974-02-26 | 1978-02-27 | ||
| JPS5928351Y2 (en) * | 1976-02-16 | 1984-08-16 | 工業技術院長 | Sealed container for powder X-ray diffraction |
-
1980
- 1980-08-21 JP JP55114070A patent/JPS5739338A/en active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11969210B2 (en) | 2019-12-27 | 2024-04-30 | Ohio State Innovation Foundation | Methods and apparatus for making a determination about an eye using color temperature adjusted lighting |
| US11969212B2 (en) | 2019-12-27 | 2024-04-30 | Ohio State Innovation Foundation | Methods and apparatus for detecting a presence and severity of a cataract in ambient lighting |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5739338A (en) | 1982-03-04 |
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