JPH03101159A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPH03101159A
JPH03101159A JP1237849A JP23784989A JPH03101159A JP H03101159 A JPH03101159 A JP H03101159A JP 1237849 A JP1237849 A JP 1237849A JP 23784989 A JP23784989 A JP 23784989A JP H03101159 A JPH03101159 A JP H03101159A
Authority
JP
Japan
Prior art keywords
power supply
blocks
delay time
circuit
block
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1237849A
Other languages
Japanese (ja)
Inventor
Tooru Osajima
亨 筬島
Mitsugi Naito
内藤 貢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP1237849A priority Critical patent/JPH03101159A/en
Publication of JPH03101159A publication Critical patent/JPH03101159A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To operate all circuits inside a semiconductor chip at the same speed and to suppress the irregularity in the speed by a method wherein the semiconductor chip is divided into a plurality of blocks, source voltage is adjusted at each block and the delay time is made constant. CONSTITUTION:A semiconductor chip 10 of which integrated circuits are constituted is divided into a plurality of blocks; a common power supply line 15 is arranged and installed for individual blocks B1 to B4. An electric current is applied simultaneously from the power supply line 15; a source voltage which is applied to the individual blocks is adjusted by a source voltage correction circuits 11 to 14 in such a way that it is controlled by delay time evaluation circuits inside the blocks and that the delay time inside the blocks becomes constant. Thereby, the source voltage can be set independently at the individual blocks; all circuits inside the chip can be operated at the same speed; irregularity in the speed is suppressed; the characteristic can be enhanced.

Description

【発明の詳細な説明】 〔発明の概要〕 半導体集積回路、特に遅延時間の補正を図ったその電源
回路に関し、 電源電圧補正を行なってチップ内各部の遅延時間が所定
値より大きくずれないようにすることを目的とし、 集積回路が構成される半導体チップを複数ブロックに区
分し、各ブロックに共通の電源線を配設すると共に、該
共通電源線より給電され、ブロック内遅延時間評価回路
により制御されて、ブロック内遅延時間が一定になるよ
うに調整した電源電圧をブロック内に供給する電源電圧
補正回路を各ブロックに設けた構成とする。
[Detailed Description of the Invention] [Summary of the Invention] Regarding a semiconductor integrated circuit, particularly a power supply circuit thereof in which delay time is corrected, the power supply voltage is corrected so that the delay time of each part within the chip does not deviate much from a predetermined value. For the purpose of Each block is provided with a power supply voltage correction circuit that supplies within the block a power supply voltage adjusted so that the intra-block delay time becomes constant.

〔産業上の利用分野〕[Industrial application field]

本発明は半導体集積回路、特に遅延時間の補正を図った
その電源回路に関する。
The present invention relates to a semiconductor integrated circuit, and more particularly to a power supply circuit thereof with delay time correction.

近年の半導体集積回路は、高集積化および高速化に伴な
い、半導体チップ内回路の遅延時間を保証することが不
可欠になっている。
In recent years, as semiconductor integrated circuits have become more highly integrated and faster, it has become essential to guarantee the delay time of circuits within semiconductor chips.

〔従来の技術〕[Conventional technology]

半導体集積回路では、外部電源が加えられる端子ピンに
連なる電源配線を半導体チップ上にはわせ、チップ上の
各回路素子は該電源配線より給電するのが普通である。
In a semiconductor integrated circuit, a power supply wiring connected to a terminal pin to which an external power supply is applied is usually arranged on a semiconductor chip, and each circuit element on the chip is supplied with power from the power supply wiring.

例えばチップ周辺部に環状に電源配線を設け、1個また
は複数個の電源端子ビンに該配線を接続し、チップ内回
路素子の電源回路を該配線へ接続する、はその−例であ
る。
For example, a power supply wiring is provided in a circular shape around the chip, the wiring is connected to one or more power supply terminal bins, and a power supply circuit of a circuit element within the chip is connected to the wiring.

ところが半導体集積回路の高集積化、高速化のために、
チップ内回路の一部で電源電圧降下が起り、このため信
号伝播遅延時間にハラつきが生じる。これは、例えば高
速論理ゲートでは誤出力を招く等の問題がある。チップ
内各部の電源電圧にハラつきが生じる原因としては、回
路素子の動作による電源線の負荷増大、温度による特性
変化、製造プロセスによる特性バラつき等がある。
However, due to the increased integration and speed of semiconductor integrated circuits,
A power supply voltage drop occurs in a part of the circuit within the chip, which causes fluctuations in signal propagation delay time. This poses a problem, such as erroneous output in high-speed logic gates, for example. Causes of variations in the power supply voltage of various parts within the chip include increased load on the power supply line due to the operation of circuit elements, changes in characteristics due to temperature, and variations in characteristics due to the manufacturing process.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

チップ上にはわせた電源配線を共通電源配線とし、チッ
プ内各回路素子がこれより給電を受ける方式では、半導
体集積回路の動作中に局部的に電源電圧降下が生じ、速
度バラつきが生じる恐れがある。
In a system where the power supply wiring on the chip is used as a common power supply wiring and each circuit element within the chip receives power from this wiring, there is a risk that a local power supply voltage drop occurs during the operation of the semiconductor integrated circuit, resulting in speed variations. be.

本発明はこの点を改善し、電源電圧補正を行なってチッ
プ内各部の遅延時間が所定値より大きくすれないように
することを目的とするものである。
An object of the present invention is to improve this point and correct the power supply voltage so that the delay time of each part within the chip does not exceed a predetermined value.

〔課題を解決するための手段] 第1図に示すように本発明では半導体チップ10を複数
ブロック本例では4ブロツク81〜B4に区分し、各ブ
ロックに共通の電源線15を配設すると共に、各ブロッ
クに電源電圧補正回路11〜14を設ける。
[Means for Solving the Problems] As shown in FIG. 1, in the present invention, the semiconductor chip 10 is divided into a plurality of blocks, in this example, four blocks 81 to B4, and a common power supply line 15 is provided to each block. , power supply voltage correction circuits 11 to 14 are provided in each block.

電源線15は図示しないが1個または複数個の外部電源
端子ビンに接続され、外部電源より給電される。
Although not shown, the power line 15 is connected to one or more external power terminal bins and is supplied with power from the external power source.

電源電圧補正回路11〜14は電源線15より給電され
、ブロック内遅延時間評価回路により制御されて、ブロ
ック内遅延時間が一定になるように調整した電圧をブロ
ック内各回路素子へ供給する。16〜19がその調整し
た電圧をブロック内へ供給する電源線である。
The power supply voltage correction circuits 11 to 14 are supplied with power from the power supply line 15, and are controlled by the intra-block delay time evaluation circuit to supply voltages adjusted so that the intra-block delay time becomes constant to each circuit element within the block. Power lines 16 to 19 supply the adjusted voltage into the block.

第2図は電源電圧補正回路11〜14の構成を示し、可
変電圧レギュレータ21.F/Vコンバータ22、遅延
補正回路(遅延時間評価回路)23を備える。
FIG. 2 shows the configuration of the power supply voltage correction circuits 11 to 14, and includes variable voltage regulators 21. It includes an F/V converter 22 and a delay correction circuit (delay time evaluation circuit) 23.

のバラつきが生しないようにすることができる。It is possible to prevent variations in the

〔作用〕[Effect]

この回路では、ブロックB1〜B4内回路素子は電源線
16〜19により電源電圧を供給される。
In this circuit, circuit elements in blocks B1 to B4 are supplied with power supply voltage through power supply lines 16 to 19.

この供給経路は共通電源線15、ブロックB、の電源電
圧補正回路11の可変電圧レギュレータ21、ブロック
別電源線16であり(他のブロックもこれに準する)、
供給される電源電圧は共通電源線15の電圧を、遅延補
正回路23およびF/■コンバータ22で制御される可
変電圧レギュレータ21により調整した電圧である。
This supply path is the common power supply line 15, the variable voltage regulator 21 of the power supply voltage correction circuit 11 of block B, and the block-specific power supply line 16 (other blocks also follow this).
The supplied power supply voltage is a voltage obtained by adjusting the voltage of the common power supply line 15 by a variable voltage regulator 21 controlled by a delay correction circuit 23 and an F/■ converter 22.

遅延補正回路23は例えば、ブロック別電源線16より
給電されるリングオシレータであり、該電源電圧の変動
につれて発振周波数を変える。これで等測的にブロック
内遅延時間の変動が検出され、この発振周波数の変動を
コンバーク22でF/V(周波数/電圧)変換し、出力
電圧でレギュレータ21を負帰還制御する。これにより
ブロック内遅延時間の変動を防ぎ、チンプ上で遅延時間
〔実施例] 可変電圧レギュレータ21.F/Vコンバータ22、遅
延補正回路23の具体例を第3図に示ず。
The delay correction circuit 23 is, for example, a ring oscillator supplied with power from the block-specific power supply line 16, and changes its oscillation frequency as the power supply voltage fluctuates. In this way, variations in the intra-block delay time are detected isometrically, and this variation in oscillation frequency is F/V (frequency/voltage) converted by the converter 22, and the regulator 21 is controlled by negative feedback using the output voltage. This prevents variations in the delay time within the block and reduces the delay time on the chimp [Example] Variable voltage regulator 21. Specific examples of the F/V converter 22 and the delay correction circuit 23 are not shown in FIG.

第3図(a)に示すように遅延補正回路23は、奇数個
本例では5個のインバータ11〜I5を環状に接続して
なるリングオシレータである。インバータ11の入力を
Hとすると、11の出力(1□の入力)はり、Izの出
力(13の入力)はH1以下同様で15の出力はLとな
り、ごれが1.に加わると11の出力はH,I2の出力
はし、・・・・・・となり、上記とは逆になる。これら
が繰り返されて、本回路は発振する。発振の周期は各イ
ンバータの信号伝播遅延時間の和であり、回路の抵抗、
寄生容量、電源電圧などの影響を受ける。従って本回路
の電源をブロック別電源線(16等)からとれば、該発
振周期(発振周波数)で当該ブロックの回路素子の遅延
時間、その変動、を代表させることができる。
As shown in FIG. 3(a), the delay correction circuit 23 is a ring oscillator formed by connecting an odd number of inverters 11 to I5, five in this example, in a ring. When the input of inverter 11 is H, the output of 11 (input of 1□) is high, the output of Iz (input of 13) is the same as H1 and below, and the output of 15 is L, and the dirt is 1. When added to , the output of 11 becomes H, the output of I2 becomes H, etc., which is the opposite of the above. These are repeated and the circuit oscillates. The oscillation period is the sum of the signal propagation delay times of each inverter, and the circuit resistance,
Affected by parasitic capacitance, power supply voltage, etc. Therefore, if the power supply for this circuit is taken from the block-specific power supply line (16, etc.), the oscillation period (oscillation frequency) can represent the delay time and its fluctuation of the circuit elements of the block.

第3図(b)に示すようにF/Vコンバータはシュミッ
ト回路22a、積分器22b、R2,02等で構成され
、入力はリングオシレータ23の発振出力Aである。こ
れはトランジスタQをオン/オフし、該トランジスタQ
は抵抗R1を通して充電されるコンデンサC1を、オン
のとき放電させる。
As shown in FIG. 3(b), the F/V converter is composed of a Schmitt circuit 22a, an integrator 22b, R2, 02, etc., and the input is the oscillation output A of the ring oscillator 23. This turns transistor Q on and off, and the transistor Q
discharges capacitor C1, which is charged through resistor R1, when on.

コンデンサCIの電圧はシュミット回路22aで整形さ
れたのちスイッチSWを接点a側、b側に切換え、積分
回路を充/放電させる。この積分回路の出力電圧Bは入
力周波数Aに比例する。
After the voltage of the capacitor CI is shaped by the Schmitt circuit 22a, the switch SW is switched to the contact a side and the contact b side to charge/discharge the integrating circuit. The output voltage B of this integrating circuit is proportional to the input frequency A.

第3図(C)に示すように可変電圧レギュレータ21は
差動増幅器21a、抵抗R3,R4で構成される。F/
Vコンバータの出力電圧Bを受け、それに比例した出力
電圧Cを生じ、これがブロック別電源線(16等)へ与
えられる。差動増幅器21aの電源は共通電源線15よ
り得る。
As shown in FIG. 3(C), the variable voltage regulator 21 is composed of a differential amplifier 21a and resistors R3 and R4. F/
It receives the output voltage B of the V converter and generates an output voltage C proportional to it, which is applied to the block-specific power supply line (16, etc.). The power supply for the differential amplifier 21a is obtained from the common power supply line 15.

き、チップ内回路全体を同一速度で動作させ、速度のハ
ラつきを抑えて特性向上に寄与することができる。
This allows the entire circuit within the chip to operate at the same speed, suppressing variations in speed and contributing to improved characteristics.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の原理図、 第2図は電源電圧補正回路ブロック図、第3図は第2図
の各部の具体例を示す回路図である。 第1図でIOは半導体チップ、II〜14は電源電圧補
正回路、15は共通電源線、16〜19はブロック別電
源線である。
FIG. 1 is a principle diagram of the present invention, FIG. 2 is a block diagram of a power supply voltage correction circuit, and FIG. 3 is a circuit diagram showing a specific example of each part of FIG. 2. In FIG. 1, IO is a semiconductor chip, II-14 are power supply voltage correction circuits, 15 is a common power line, and 16-19 are block-specific power lines.

Claims (1)

【特許請求の範囲】[Claims] 1、集積回路が構成される半導体チップ(10)を複数
ブロックに区分し、各ブロック(B_1〜B_4)に共
通の電源線(15)を配設すると共に、該共通電源線よ
り給電され、ブロック内遅延時間評価回路(23)によ
り制御されて、ブロック内遅延時間が一定になるように
調整した電源電圧をブロック内に供給する電源電圧補正
回路(11〜14)を各ブロックに設けたことを特徴と
する半導体集積回路。
1. A semiconductor chip (10) that constitutes an integrated circuit is divided into a plurality of blocks, and a common power line (15) is provided to each block (B_1 to B_4), and power is supplied from the common power line, and the blocks Each block is provided with a power supply voltage correction circuit (11 to 14) that is controlled by an internal delay time evaluation circuit (23) and supplies a power supply voltage adjusted so that the internal delay time becomes constant within the block. Features of semiconductor integrated circuits.
JP1237849A 1989-09-13 1989-09-13 Semiconductor integrated circuit Pending JPH03101159A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1237849A JPH03101159A (en) 1989-09-13 1989-09-13 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1237849A JPH03101159A (en) 1989-09-13 1989-09-13 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPH03101159A true JPH03101159A (en) 1991-04-25

Family

ID=17021323

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1237849A Pending JPH03101159A (en) 1989-09-13 1989-09-13 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH03101159A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05121503A (en) * 1991-10-25 1993-05-18 Nec Ic Microcomput Syst Ltd Semiconductor integrated circuit
JP2000332121A (en) * 1998-12-29 2000-11-30 Stmicroelectronics Srl Vlsi circuit and variable multiple supply voltage system for low-power design performance
KR100323641B1 (en) * 1997-06-04 2002-06-20 가네꼬 히사시 Semiconductor integrated circuit and method of compensating for device performance variations of semiconductor integrated circuit

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59197165A (en) * 1983-04-22 1984-11-08 Hitachi Ltd Semiconductor integrated circuit device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59197165A (en) * 1983-04-22 1984-11-08 Hitachi Ltd Semiconductor integrated circuit device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05121503A (en) * 1991-10-25 1993-05-18 Nec Ic Microcomput Syst Ltd Semiconductor integrated circuit
KR100323641B1 (en) * 1997-06-04 2002-06-20 가네꼬 히사시 Semiconductor integrated circuit and method of compensating for device performance variations of semiconductor integrated circuit
JP2000332121A (en) * 1998-12-29 2000-11-30 Stmicroelectronics Srl Vlsi circuit and variable multiple supply voltage system for low-power design performance
JP4698787B2 (en) * 1998-12-29 2011-06-08 エスティーマイクロエレクトロニクス エス.アール.エル. Performance-driven multi-variable variable supply voltage system for low power design of VLSI circuits and systems

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