JPH03100353U - - Google Patents

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Publication number
JPH03100353U
JPH03100353U JP766990U JP766990U JPH03100353U JP H03100353 U JPH03100353 U JP H03100353U JP 766990 U JP766990 U JP 766990U JP 766990 U JP766990 U JP 766990U JP H03100353 U JPH03100353 U JP H03100353U
Authority
JP
Japan
Prior art keywords
mass filter
quadrupole mass
terminal
leaf spring
rod
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP766990U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP766990U priority Critical patent/JPH03100353U/ja
Publication of JPH03100353U publication Critical patent/JPH03100353U/ja
Pending legal-status Critical Current

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  • Electron Tubes For Measurement (AREA)
JP766990U 1990-01-30 1990-01-30 Pending JPH03100353U (ru)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP766990U JPH03100353U (ru) 1990-01-30 1990-01-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP766990U JPH03100353U (ru) 1990-01-30 1990-01-30

Publications (1)

Publication Number Publication Date
JPH03100353U true JPH03100353U (ru) 1991-10-21

Family

ID=31511324

Family Applications (1)

Application Number Title Priority Date Filing Date
JP766990U Pending JPH03100353U (ru) 1990-01-30 1990-01-30

Country Status (1)

Country Link
JP (1) JPH03100353U (ru)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07142026A (ja) * 1993-11-18 1995-06-02 Shimadzu Corp 四重極質量分析装置
JPH1097838A (ja) * 1996-07-30 1998-04-14 Yokogawa Analytical Syst Kk 誘導結合プラズマ質量分析装置
JP2001351563A (ja) * 2000-06-07 2001-12-21 Shimadzu Corp 質量分析装置
WO2019155543A1 (ja) * 2018-02-07 2019-08-15 株式会社島津製作所 質量分析装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5894745A (ja) * 1981-11-30 1983-06-06 Agency Of Ind Science & Technol 多重極レンズ
JPS63155547A (ja) * 1986-12-18 1988-06-28 Seiko Instr & Electronics Ltd 四重極質量分析計の分析管
JPS646352A (en) * 1987-06-29 1989-01-10 Yokogawa Electric Corp High-frequency inductive coupling plasma mass spectrometer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5894745A (ja) * 1981-11-30 1983-06-06 Agency Of Ind Science & Technol 多重極レンズ
JPS63155547A (ja) * 1986-12-18 1988-06-28 Seiko Instr & Electronics Ltd 四重極質量分析計の分析管
JPS646352A (en) * 1987-06-29 1989-01-10 Yokogawa Electric Corp High-frequency inductive coupling plasma mass spectrometer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07142026A (ja) * 1993-11-18 1995-06-02 Shimadzu Corp 四重極質量分析装置
JPH1097838A (ja) * 1996-07-30 1998-04-14 Yokogawa Analytical Syst Kk 誘導結合プラズマ質量分析装置
JP2001351563A (ja) * 2000-06-07 2001-12-21 Shimadzu Corp 質量分析装置
WO2019155543A1 (ja) * 2018-02-07 2019-08-15 株式会社島津製作所 質量分析装置

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