JPH029124A - Washing device for semiconductor substrate with water - Google Patents
Washing device for semiconductor substrate with waterInfo
- Publication number
- JPH029124A JPH029124A JP15964088A JP15964088A JPH029124A JP H029124 A JPH029124 A JP H029124A JP 15964088 A JP15964088 A JP 15964088A JP 15964088 A JP15964088 A JP 15964088A JP H029124 A JPH029124 A JP H029124A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- liquid
- semiconductor substrate
- substrate
- tank
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 22
- 239000004065 semiconductor Substances 0.000 title claims abstract description 18
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 title abstract description 10
- 238000005406 washing Methods 0.000 title description 8
- 239000007788 liquid Substances 0.000 claims abstract description 18
- 238000007664 blowing Methods 0.000 claims description 5
- 238000004140 cleaning Methods 0.000 claims description 2
- 239000000203 mixture Substances 0.000 abstract description 5
- 238000002347 injection Methods 0.000 abstract 2
- 239000007924 injection Substances 0.000 abstract 2
- 230000000694 effects Effects 0.000 description 3
- 230000009172 bursting Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Landscapes
- Nozzles (AREA)
- Coating Apparatus (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は集積回路の製造装置に関し、特に半導体基板の
水洗袋;jに関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an integrated circuit manufacturing apparatus, and more particularly to a washing bag for semiconductor substrates.
従来、この種の水洗装置は超音波振動子を槽底部に設け
、超音波の振動力により気泡を発生させたり、或いは気
体の配管に小さな孔をあけ、そこから気体の泡を発生さ
せ、その気泡を半導体基板の表面に付着させ、その気泡
のはじける力を利用して水洗していた。Conventionally, this type of water washing equipment installed an ultrasonic vibrator at the bottom of the tank and used the vibrating force of the ultrasonic waves to generate bubbles, or made a small hole in the gas pipe and generated gas bubbles from there. Air bubbles were attached to the surface of a semiconductor substrate, and the force of the bubbles being popped was used to wash the semiconductor substrate with water.
上述した従来の水洗装置は超音波を用いた場合、半導体
基板に#1.出(タメージ)を11える欠点か有り、ま
た後者の場合では気体の泡の大きさか一定せず、また与
える力も弱いことから、水洗の効果が小さかった。When the above-mentioned conventional water washing device uses ultrasonic waves, #1. It has the disadvantage of increasing the output (damage) by 11, and in the latter case, the size of the gas bubbles is not constant and the force applied is weak, so the effect of washing with water is small.
本発明の目的は前記課題を解決した半導体基板の水洗装
置を提供することにある。An object of the present invention is to provide a water washing apparatus for semiconductor substrates that solves the above problems.
上述した従来の水洗装置に対し、本発明は気体の噴出と
ともにまわりの液体を吸引し、これを−緒に吹き出す噴
出口を装備したという相違点を有する。The present invention differs from the above-mentioned conventional water washing device in that it is equipped with a spout that sucks the surrounding liquid together with the jet of gas and blows out the liquid at the same time.
前記目的を達成するため、本発明は半導体基板の洗浄を
行なう装置において、半導体基板を収容する槽に、該槽
内に気体の吹出しによる液体の吸込み、吹出しを行なう
噴出口を有するものである。In order to achieve the above object, the present invention provides an apparatus for cleaning semiconductor substrates, in which a tank housing the semiconductor substrate has a jet port for sucking in and blowing out liquid by blowing out gas into the tank.
以下、本発明の一実施例を図により説明する。 Hereinafter, one embodiment of the present invention will be described with reference to the drawings.
第1図は本発明の一実施例を示す断面図、第2図は第1
図の噴出口の拡大断面図である。FIG. 1 is a sectional view showing one embodiment of the present invention, and FIG.
FIG. 3 is an enlarged sectional view of the jet nozzle shown in the figure.
図において、2は半導体基板1を保持するキャリアであ
り、3は半導体基板1を保持したキャリア2を収容する
槽であり、該WI3の底部の支持板6には気体配管5を
設置し、該気体配管5に噴出口4を接続する。In the figure, 2 is a carrier that holds the semiconductor substrate 1, 3 is a tank that accommodates the carrier 2 that holds the semiconductor substrate 1, and a gas pipe 5 is installed on the support plate 6 at the bottom of the WI 3. The spout 4 is connected to the gas pipe 5.
該噴出口4は第2図に示すように、気体配管5に連通し
た気体吹出孔7と、槽3内の液体を吸込む液体吸入孔8
とを有する。As shown in FIG. 2, the spout 4 includes a gas blow-off hole 7 communicating with the gas pipe 5 and a liquid suction hole 8 that sucks the liquid in the tank 3.
and has.
実施例において、半導体基板1はキャリア2に保持され
て槽3内に収容される。一方、気体配管5内を気体がA
方向に流れ気体吹出孔7で絞られて吹出すと、液体吸入
孔8は陰圧となるため、周囲の液体がC方向に流れる。In the embodiment, a semiconductor substrate 1 is held by a carrier 2 and accommodated in a tank 3. On the other hand, the gas inside the gas pipe 5 is
When the liquid flows in the direction C and is throttled and blown out by the gas blow-off hole 7, the liquid suction hole 8 becomes a negative pressure, so that the surrounding liquid flows in the C direction.
そして噴出口4内に混きされ気液混合物かC方向に噴出
し、気液混合物を半導体基板1に叩付けて水洗を行う。Then, the gas-liquid mixture mixed in the spout 4 is ejected in the direction C, and the gas-liquid mixture is struck against the semiconductor substrate 1 to perform water washing.
以上説明したように本発明は気液混合物を勢いよく吹き
出し、半導体基板にたたきつけるため、気泡のはじける
力だけよりも強くウェハーを洗うことができ、また超音
波のような高周波の振動を用いないため、半導体基板に
ダメージを与えることがないという効果を有する。As explained above, the present invention blows out a gas-liquid mixture vigorously and hits the semiconductor substrate, so the wafer can be washed more strongly than just the force of bursting bubbles, and it does not use high-frequency vibrations such as ultrasonic waves. This has the effect of not damaging the semiconductor substrate.
第1図は本発明の一実施例を示す縦断面図、第2図は第
1図のA−A線拡大断面図である。
1・・・半導体基板 2・・・キャリア3・・・
槽 4・・・噴出口5・・・気体配管
6・・・支持板7・・・気体吹出孔 8
・・・液体吸入孔I−T−導結父
第1図FIG. 1 is a longitudinal sectional view showing an embodiment of the present invention, and FIG. 2 is an enlarged sectional view taken along the line A--A in FIG. 1... Semiconductor substrate 2... Carrier 3...
Tank 4... Outlet 5... Gas piping
6... Support plate 7... Gas blowing hole 8
...Liquid suction hole I-T-conductor Figure 1
Claims (1)
基板を収容する槽に、該槽内に気体の吹出しによる液体
の吸込み、吹出しを行なう噴出口を有することを特徴と
する半導体基板の水洗装置。(1) An apparatus for cleaning semiconductor substrates, characterized in that a tank housing the semiconductor substrates has a spout for sucking in and blowing out liquid by blowing out gas into the tank.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15964088A JPH029124A (en) | 1988-06-28 | 1988-06-28 | Washing device for semiconductor substrate with water |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15964088A JPH029124A (en) | 1988-06-28 | 1988-06-28 | Washing device for semiconductor substrate with water |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH029124A true JPH029124A (en) | 1990-01-12 |
Family
ID=15698131
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15964088A Pending JPH029124A (en) | 1988-06-28 | 1988-06-28 | Washing device for semiconductor substrate with water |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH029124A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04246828A (en) * | 1991-02-01 | 1992-09-02 | Nec Kyushu Ltd | Cleaning device of semiconductor wafer |
DE4332857A1 (en) * | 1992-09-25 | 1994-04-21 | Mitsubishi Electric Corp | Semiconductor wafer cleaning appts. associated with prod. cassette - handles wafers set upright in portable rack for mechanised transport between isopropyl alcohol cleaning and drying stations |
US6637443B2 (en) | 1995-07-10 | 2003-10-28 | Lg Semicon Co., Ltd. | Semiconductor wafer cleaning apparatus and method |
JP2007521959A (en) * | 2004-02-27 | 2007-08-09 | ゴス インターナショナル アメリカス インコーポレイテッド | Spraying equipment |
WO2022176695A1 (en) * | 2021-02-19 | 2022-08-25 | 東京エレクトロン株式会社 | Substrate processing device and liquid guide member |
-
1988
- 1988-06-28 JP JP15964088A patent/JPH029124A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04246828A (en) * | 1991-02-01 | 1992-09-02 | Nec Kyushu Ltd | Cleaning device of semiconductor wafer |
DE4332857A1 (en) * | 1992-09-25 | 1994-04-21 | Mitsubishi Electric Corp | Semiconductor wafer cleaning appts. associated with prod. cassette - handles wafers set upright in portable rack for mechanised transport between isopropyl alcohol cleaning and drying stations |
DE4332857C2 (en) * | 1992-09-25 | 1999-05-06 | Mitsubishi Electric Corp | Semiconductor cleaning device |
US6637443B2 (en) | 1995-07-10 | 2003-10-28 | Lg Semicon Co., Ltd. | Semiconductor wafer cleaning apparatus and method |
JP2007521959A (en) * | 2004-02-27 | 2007-08-09 | ゴス インターナショナル アメリカス インコーポレイテッド | Spraying equipment |
WO2022176695A1 (en) * | 2021-02-19 | 2022-08-25 | 東京エレクトロン株式会社 | Substrate processing device and liquid guide member |
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