JP3017979B1 - High frequency cleaning equipment - Google Patents

High frequency cleaning equipment

Info

Publication number
JP3017979B1
JP3017979B1 JP10289371A JP28937198A JP3017979B1 JP 3017979 B1 JP3017979 B1 JP 3017979B1 JP 10289371 A JP10289371 A JP 10289371A JP 28937198 A JP28937198 A JP 28937198A JP 3017979 B1 JP3017979 B1 JP 3017979B1
Authority
JP
Japan
Prior art keywords
pure water
cleaning
chemical
frequency
main body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP10289371A
Other languages
Japanese (ja)
Other versions
JP2000117210A (en
Inventor
一文 平野
浩司 貞金
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pre Tech Co Ltd
Original Assignee
Pre Tech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pre Tech Co Ltd filed Critical Pre Tech Co Ltd
Priority to JP10289371A priority Critical patent/JP3017979B1/en
Application granted granted Critical
Publication of JP3017979B1 publication Critical patent/JP3017979B1/en
Publication of JP2000117210A publication Critical patent/JP2000117210A/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Nozzles (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Special Spraying Apparatus (AREA)

Abstract

【要約】 【課題】 純水洗浄と薬液洗浄を兼ね、かつその切替え
を迅速に行なうことが可能な高周波洗浄装置を提供する
ものである。 【解決手段】 洗浄液吐出口が開口されたテーパ状ノズ
ル部を有する本体と、前記本体に純水を供給するための
純水供給手段と、前記本体に内蔵され、前記供給手段か
ら前記本体内に供給された純水に高周波音波を付与する
ため高周波付与手段と、前記ノズル部の前記吐出口近傍
に設けられた薬液を供給するための薬液供給手段とを具
備したことを特徴としている。
An object of the present invention is to provide a high-frequency cleaning apparatus which can perform both pure water cleaning and chemical cleaning and can quickly switch between the two. SOLUTION: A main body having a tapered nozzle portion having an opening of a cleaning liquid discharge port, pure water supply means for supplying pure water to the main body, and built in the main body, are provided from the supply means into the main body. The apparatus is characterized by comprising a high-frequency applying means for applying high-frequency sound waves to the supplied pure water, and a chemical liquid supplying means for supplying a chemical liquid provided near the discharge port of the nozzle portion.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、液晶ガラス基板、
半導体ウェハや磁気ディスク等の被洗浄基板を高周波洗
浄するための装置に関する。
[0001] The present invention relates to a liquid crystal glass substrate,
The present invention relates to an apparatus for high-frequency cleaning a substrate to be cleaned such as a semiconductor wafer or a magnetic disk.

【0002】[0002]

【従来の技術】従来、液晶ガラス基板、半導体ウェハ、
磁気ディスク等の被処理物を洗浄するには、処理槽内に
前記被洗浄基板を複数枚垂直に立てて配置し、前記処理
槽内に洗浄液を収容した後、前記処理槽底部に振動子を
振動させて高周波音波を前記洗浄液に放射して前記処理
槽内の複数枚の被洗浄基板を一度に洗浄することが行わ
れている。
2. Description of the Related Art Conventionally, liquid crystal glass substrates, semiconductor wafers,
To clean an object to be processed such as a magnetic disk, a plurality of the substrates to be cleaned are vertically arranged in a processing tank, and a cleaning liquid is stored in the processing tank. It has been practiced to vibrate and emit high-frequency sound waves to the cleaning liquid to wash a plurality of substrates to be cleaned in the processing bath at a time.

【0003】しかしながら、前記方法では液晶ガラス基
板の大面積化、半導体ウェハの大口径化に伴ってそれら
被処理物全体を均一に洗浄することが困難になり、洗浄
むらを生じる問題があった。
However, in the above-described method, it is difficult to uniformly clean the entirety of the objects to be processed with an increase in the area of the liquid crystal glass substrate and an increase in the diameter of the semiconductor wafer.

【0004】このようなことから、被洗浄基板(例えば
半導体ウェハ)を枚葉式で搬送し、前記搬送経路でリン
スシャワー、薬液スクラブ、純水スクラブ、高周波洗浄
装置による洗浄、純水シャワー、スピンドライを行って
洗浄することが行われている。
For this reason, a substrate to be cleaned (for example, a semiconductor wafer) is transported in a single-wafer manner, and a rinse shower, a chemical solution scrub, a pure water scrub, a cleaning by a high-frequency cleaning device, a pure water shower, a spinner, etc. Drying and cleaning are performed.

【0005】ところで、高周波洗浄装置を用いて純水洗
浄と薬液洗浄とを行なう場合にはそれぞれ別個の専用機
により行なっていた。しかしながら、使用する洗浄液の
種類分、高周波洗浄装置を設置することは設置スペース
が増大し、半導体装置の製造システムの構築上、大きな
課題になっていた。
In the meantime, pure water cleaning and chemical liquid cleaning using a high-frequency cleaning device are performed by separate dedicated machines. However, installing a high-frequency cleaning device for the type of cleaning liquid to be used increases the installation space, and has been a major problem in constructing a semiconductor device manufacturing system.

【0006】このようなことから図4に示すように純水
洗浄と薬液洗浄を兼用する高周波洗浄装置が考えられて
いる。
For this reason, as shown in FIG. 4, there has been proposed a high-frequency cleaning apparatus which performs both pure water cleaning and chemical liquid cleaning.

【0007】図4において、本体1は円筒部2と、この
円筒部2の下面に一体的に連結され、下端に吐出口3を
有するテーパ状ノズル部4と、前記円筒部2を上下に区
画する振動板5とを備える。
In FIG. 4, a main body 1 has a cylindrical portion 2, a tapered nozzle portion 4 integrally connected to the lower surface of the cylindrical portion 2 and having a discharge port 3 at a lower end, and a vertical partitioning of the cylindrical portion 2. And a vibrating plate 5 to be provided.

【0008】振動子6は、前記振動板5上に配置されて
いる。高周波供給ケーブル7は、前記本体1の円筒部2
上部にケーブルフィッティグ部材8により固定され、そ
の先端(図示せず)は前記振動子6に接続されている。
The vibrator 6 is arranged on the vibrating plate 5. The high-frequency supply cable 7 is connected to the cylindrical portion 2 of the main body 1.
It is fixed to the upper part by a cable fitting member 8, and its tip (not shown) is connected to the vibrator 6.

【0009】洗浄液供給配管9は、前記振動板5で区画
された下部側の前記筒部2の側壁に連結されている。こ
の配管9の他端は、純水供給源10に連結されている。
第1電磁弁11は、前記洗浄液供給配管9に介装されて
いる。この電磁弁11と前記の本体2の間に位置する前
記配管9には、薬液供給配管12が連結されている。こ
の薬液供給配管12の他端は、所望の濃度に希釈された
薬液を収容した薬液貯留タンク13に連結されている。
第2電磁弁14およびポンプ15は、前記薬液供給管1
2に前記洗浄液供給配管9の連結部側から順次介装され
ている。
The cleaning liquid supply pipe 9 is connected to a lower side wall of the cylindrical portion 2 defined by the diaphragm 5. The other end of the pipe 9 is connected to a pure water supply source 10.
The first solenoid valve 11 is interposed in the cleaning liquid supply pipe 9. A chemical supply pipe 12 is connected to the pipe 9 located between the solenoid valve 11 and the main body 2. The other end of the chemical supply pipe 12 is connected to a chemical storage tank 13 containing a chemical diluted to a desired concentration.
The second solenoid valve 14 and the pump 15 are connected to the chemical supply pipe 1.
2 are interposed sequentially from the connection side of the cleaning liquid supply pipe 9.

【0010】ハンドラ16は、前記前記振動板5で区画
された上部側の前記筒部2の側壁に連結されている。
The handler 16 is connected to the upper side wall of the cylindrical portion 2 partitioned by the diaphragm 5.

【0011】このような図4に示す構造の高周波洗浄装
置による(1)純水洗浄および(2)薬液洗浄を説明す
る。
A description will now be given of (1) pure water cleaning and (2) chemical cleaning by the high frequency cleaning apparatus having the structure shown in FIG.

【0012】(1)純水洗浄 第2電磁弁14を閉じ、第1電磁弁11を開いた後、純
水供給源10から純水を洗浄液供給配管9を通して本体
1の振動板5で区画された下部側の円筒部2およびテー
パ状ノズル部4内に供給する。同時に、図示しない高周
波発振器から高周波電力を高周波ケーブル7を通して振
動子6に印加すると、前記振動子6が所望の周波数で振
動し、この振動子6が取付けられた振動板5も振動する
ため、前記円筒部2および前記テーパ状ノズル部4の内
部に供給された純水に振動が付与される。このため、前
記ノズル部4の吐出口3から高周波音波に乗った純水が
図示しない被洗浄物表面に噴射される。
(1) Cleaning with Pure Water After the second solenoid valve 14 is closed and the first solenoid valve 11 is opened, pure water from the pure water supply source 10 is divided by the diaphragm 5 of the main body 1 through the cleaning liquid supply pipe 9. The liquid is supplied into the lower cylindrical portion 2 and the tapered nozzle portion 4. At the same time, when high-frequency power is applied to the vibrator 6 through a high-frequency cable 7 from a high-frequency oscillator (not shown), the vibrator 6 vibrates at a desired frequency, and the vibrating plate 5 to which the vibrator 6 is attached also vibrates. Vibration is applied to the pure water supplied into the cylindrical portion 2 and the inside of the tapered nozzle portion 4. For this reason, pure water riding on high-frequency sound waves is sprayed from the discharge port 3 of the nozzle unit 4 onto the surface of the cleaning object (not shown).

【0013】(2)薬液洗浄 第1電磁弁11を閉じ、第2電磁弁14を開いた後、ポ
ンプ15を作動して焼く貯留タンク13内の薬液を薬液
供給配管12および洗浄液供給配管9を通して本体1の
振動板5で区画された下部側の円筒部2およびテーパ状
ノズル部4内に供給する。同時に、図示しない高周波発
振器から高周波電力を高周波ケーブル7を通して振動子
6に印加すると、前記振動子6が所望の周波数で振動
し、この振動子6が取付けられた振動板5も振動するた
め、前記円筒部2および前記テーパ状ノズル部4の内部
に供給された薬液に振動が付与される。このため、前記
ノズル部4の吐出口3から高周波音波に乗った薬液が図
示しない被洗浄物表面に噴射される。
(2) Cleaning of Chemical Solution After closing the first electromagnetic valve 11 and opening the second electromagnetic valve 14, the pump 15 is operated to bake the chemical solution in the storage tank 13 through the chemical solution supply pipe 12 and the cleaning liquid supply pipe 9. The liquid is supplied into the lower cylindrical portion 2 and the tapered nozzle portion 4 defined by the diaphragm 5 of the main body 1. At the same time, when high-frequency power is applied to the vibrator 6 through a high-frequency cable 7 from a high-frequency oscillator (not shown), the vibrator 6 vibrates at a desired frequency, and the vibrating plate 5 to which the vibrator 6 is attached also vibrates. Vibration is applied to the chemical solution supplied into the cylindrical portion 2 and the inside of the tapered nozzle portion 4. For this reason, a chemical solution riding on high-frequency sound waves is ejected from the discharge port 3 of the nozzle unit 4 onto the surface of the cleaning object (not shown).

【0014】このような図4に示す構造の高周波洗浄装
置によれば、1つの高周波洗浄装置で純水洗浄と薬液洗
浄を兼用することが可能になる。
According to the high-frequency cleaning device having the structure shown in FIG. 4, it is possible to use a single high-frequency cleaning device for both pure water cleaning and chemical cleaning.

【0015】しかしながら、図4に示す構造の高周波洗
浄装置において薬液洗浄から純水洗浄に切り替える場合
には前記薬液供給配管12の連結部から本体1側の純水
供給配管9部分および前記本体1の円筒部2およびノズ
ル部4に薬液が残留するため、純水洗浄を行なうには前
記各部材に残留する薬液をすべて完全に純水と置換する
必要がある。その結果、切替え時間が長くかかり、効率
的な洗浄を行なうことが困難になる。
However, in the high-frequency cleaning apparatus having the structure shown in FIG. 4, when the cleaning is switched from the chemical cleaning to the pure water cleaning, the connection between the chemical liquid supply pipe 12 and the pure water supply pipe 9 on the main body 1 side and the cleaning of the main body 1 are performed. Since the chemical solution remains in the cylindrical portion 2 and the nozzle portion 4, it is necessary to completely replace the chemical solution remaining in each member with pure water in order to perform pure water cleaning. As a result, a long switching time is required, and it is difficult to perform efficient cleaning.

【0016】[0016]

【発明が解決しようとする課題】本発明は、純水洗浄と
薬液洗浄を兼ね、かつその切替えを迅速に行なうことが
可能な高周波洗浄装置を提供しようとするものである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a high-frequency cleaning apparatus which can perform both pure water cleaning and chemical cleaning and can quickly switch between the two.

【0017】[0017]

【課題を解決するための手段】本発明に係わる高周波洗
浄装置は、洗浄液吐出口が開口されたテーパ状ノズル部
を有する本体と、前記本体に純水を供給するための純水
供給手段と、前記本体に内蔵され、前記供給手段から前
記本体内に供給された純水に高周波音波を付与するため
高周波付与手段と、前記ノズル部の前記吐出口近傍に設
けられた薬液を供給するための薬液供給手段とを具備
前記薬液供給手段は薬液の供給停止時に薬液を供給
方向と反対方向に吸引するためのこぼれ落ち(零れ落
ち)防止機構を有する。
According to the present invention, there is provided a high frequency cleaning apparatus comprising: a main body having a tapered nozzle portion having an opening of a cleaning liquid discharge port; pure water supply means for supplying pure water to the main body; A high-frequency applying means for applying high-frequency sound waves to the pure water supplied from the supply means into the main body, and a chemical liquid for supplying a chemical liquid provided in the vicinity of the discharge port of the nozzle portion; Supply means , wherein the chemical liquid supply means supplies the chemical liquid when the supply of the chemical liquid is stopped.
Spillage for suction in the opposite direction
C) It has a prevention mechanism.

【0018】[0018]

【0019】[0019]

【発明の実施形態】以下、本発明に係わる高周波洗浄装
置を図1および図2を参照して詳細に説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a high frequency cleaning apparatus according to the present invention will be described in detail with reference to FIGS.

【0020】図1は、円筒型高周波洗浄装置を示す部分
切欠正面図、図2は図1の薬液液供給管に設けられた零
れ落ち防止機構であるサックバックバルブを示す断面図
である。
FIG. 1 is a partially cutaway front view showing a cylindrical high-frequency cleaning device, and FIG. 2 is a cross-sectional view showing a suck-back valve which is a spill-over prevention mechanism provided in the chemical liquid supply pipe of FIG.

【0021】図1の本体21は、円筒部22と、この円
筒部22の下面に一体的に連結され、下端に吐出口23
を有するテーパ状ノズル部24と、前記円筒部22を上
下に区画する振動板25とを備えている。
The main body 21 shown in FIG. 1 is integrally connected to a cylindrical portion 22 and a lower surface of the cylindrical portion 22.
And a diaphragm 25 that partitions the cylindrical portion 22 up and down.

【0022】純水供給管26は、前記振動板25で区画
された下部側の前記円筒部22の側壁に連結されてい
る。この純水供給管26の他端は図示しない純水供給源
に連結されている。振動子27は、前記振動板25上に
配置されている。高周波供給ケーブル28は、前記本体
21の円筒部22上部にケーブルフィッティグ部材29
により固定され、その先端は前記振動子27に接続され
ている。
The pure water supply pipe 26 is connected to the lower side wall of the cylindrical portion 22 defined by the diaphragm 25. The other end of the pure water supply pipe 26 is connected to a pure water supply source (not shown). The vibrator 27 is disposed on the diaphragm 25. The high-frequency supply cable 28 is provided with a cable fitting member 29 above the cylindrical portion 22 of the main body 21.
And its tip is connected to the vibrator 27.

【0023】例えば2本の薬液供給管301,302は、
前記吐出口23近傍の前記ノズル部24部分にそれらの
供給口が互いに対称的に連通するように設けられてい
る。電磁弁311,312は、前記薬液供給管301,3
2の途中にそれぞれ介装されている。零れ落ち防止機
構であるサックバックバルブ321,322は、前記電磁
弁311,312と前記ノズル部24の間に位置する前記
薬液供給管301,302部分にそれぞれ設けられてい
る。なお、2本の薬液供給管301,302からの薬液供
給にあたっては、同種の薬液を供給しても別種の薬液を
供給してもよい。
For example, two chemical supply pipes 30 1 and 30 2
The supply ports are provided in the vicinity of the discharge port 23 so as to communicate symmetrically with each other at the nozzle portion 24. The solenoid valves 31 1 and 31 2 are connected to the chemical supply pipes 30 1 and 30 3 respectively.
They are respectively interposed in the middle of the 0 2. Suck back valve 32 is spilled drop prevention mechanism 1, 32 2 are respectively provided on the solenoid valves 31 1, 31 2 and the chemical supply pipe 30 1, 30 2 portion located between the nozzle portion 24 . In supplying the chemicals from the two chemical supply pipes 30 1 and 30 2 , the same chemical or a different chemical may be supplied.

【0024】前記サックバックバルブ321,322は、
図2の(A),(B)に示すように薬液を貯留する筐体
33と、この筐体33上部と前記薬液供給管301(3
2)とを連通するための分岐管34と、前記筐体33
を上下に区画するように配置されたダイヤフラム35
と、前記筐体33の下面からその内部に気密に挿入さ
れ、先端が前記ダイヤフラム35の下面に連結された下
端に係止板36を有する作動軸37と、前記筐体33下
面と前記係止板36の間に位置する前記作動軸37部分
に配置され、前記作動軸37を下方に向けて付勢するた
めのコイルスプリング38と、前記ダイヤフラム35で
区画された前記筐体33の下部空間と連通するように前
記筐体33に連結されたガス流通管39とを具備した構
造を有する。ガス(例えば空気)を前記ガス流通管39
を経由して前記筐体33に供給・排気するタイミング
は、前記電磁弁311,312と同期してなされる。つま
り、前記電磁弁311,312の開時にはガス(例えば空
気)が前記ガス流通管39を通して前記筐体33に供給
され、前記電磁弁311,312の閉時には前記筐体33
内のガスを前記ガス流通管39を通して排気する。
The suck back valves 32 1 and 32 2 are:
As shown in FIGS. 2A and 2B, a housing 33 for storing a chemical, an upper portion of the housing 33, and the chemical supply pipe 30 1 (3
0 2 ), and a branch pipe 34 for communicating with the housing 33.
Diaphragm 35 arranged so as to partition the upper and lower sides
An operating shaft 37 having a locking plate 36 at a lower end, which is hermetically inserted from the lower surface of the housing 33 into the lower surface of the housing 33 and has a leading end connected to the lower surface of the diaphragm 35; A coil spring 38 disposed at a portion of the operation shaft 37 located between the plates 36 to urge the operation shaft 37 downward; and a lower space of the housing 33 partitioned by the diaphragm 35. It has a structure provided with a gas flow pipe 39 connected to the housing 33 so as to communicate with each other. The gas (for example, air) is supplied to the gas flow pipe 39.
Timing to supply and exhaust to the housing 33 via is made in synchronism with the solenoid valve 31 1, 31 2. That is, when the solenoid valves 31 1 and 31 2 are opened, gas (for example, air) is supplied to the housing 33 through the gas flow pipe 39, and when the solenoid valves 31 1 and 31 2 are closed, the housing 33 is closed.
The gas inside is exhausted through the gas flow pipe 39.

【0025】なお、前記本体21を移動させるためのハ
ンドラ40は、前記前記振動板25で区画された上部側
の前記円筒部22の側壁に連結されている。
A handler 40 for moving the main body 21 is connected to the upper side wall of the cylindrical portion 22 defined by the diaphragm 25.

【0026】このような構成の高周波洗浄装置による
(1)純水洗浄および(2)薬液洗浄を説明する。
A description will be given of (1) pure water cleaning and (2) chemical cleaning with the high-frequency cleaning apparatus having such a configuration.

【0027】(1)純水洗浄 図示しない純水供給源から純水を純水供給管26を通し
て本体21の振動板25で区画された下部側の円筒部2
2およびテーパ状ノズル部24内に供給する。同時に、
図示しない高周波発振器から高周波電力を高周波ケーブ
ル28を通して振動子27に印加すると、前記振動子2
7が所望の周波数で振動し、この振動子27が取付けら
れた振動板25も振動するため、前記円筒部22および
前記テーパ状ノズル部24の内部に供給された純水に振
動が付与される。このため、純水を前記ノズル部24の
吐出口23から高周波音波に乗って図示しない被洗浄物
表面に噴射することができる。
(1) Pure Water Cleaning A lower cylindrical portion 2 divided by a diaphragm 25 of the main body 21 through a pure water supply pipe 26 and pure water from a pure water supply source (not shown).
2 and into the tapered nozzle portion 24. at the same time,
When high-frequency power is applied to the vibrator 27 through a high-frequency cable 28 from a high-frequency oscillator (not shown), the vibrator 2
7 vibrates at a desired frequency and the vibrating plate 25 to which the vibrator 27 is attached vibrates, so that vibration is applied to the pure water supplied to the inside of the cylindrical portion 22 and the tapered nozzle portion 24. . For this reason, pure water can be jetted from the discharge port 23 of the nozzle portion 24 onto the surface of the object to be cleaned (not shown) on the high-frequency sound wave.

【0028】(2)薬液洗浄 図示しない純水供給源から純水を純水供給管26を通し
て本体21の振動板25で区画された下部側の円筒部2
2およびテーパ状ノズル部24内に供給すると共に、電
磁弁311,312を開いて2本の薬液供給管301,3
2から例えば同種の薬液を吐出口23近傍のノズル部
24内に供給する。この時、前記電磁弁311,312
開動作に同期してガス(例えば空気)がサックバックバ
ルブ321,322のガス流通管39を通して筐体33に
供給される。このような空気の前記筐体33内への供給
により図2の(A)に示すようにダイヤフラム35が作
動軸37に配置されたコイルスプリング38による下方
への付勢力に抗して上方に湾曲される。
(2) Chemical Cleaning The lower cylindrical part 2 divided by the diaphragm 25 of the main body 21 through a pure water supply pipe 26 and pure water from a pure water supply source (not shown).
2 and the inside of the tapered nozzle portion 24, and open the solenoid valves 31 1 and 3 12 to open the two chemical liquid supply tubes 30 1 and 3
0 is supplied from the 2 for example the same type of liquid medicine to the discharge port 23 near the nozzle portion 24. At this time, the solenoid valve 31 1, 31 2 of the opening operation in synchronization with a gas (e.g., air) is supplied to the housing 33 through the suck back valve 32 1, 32 2 of the gas flow pipe 39. By supplying such air into the housing 33, the diaphragm 35 is bent upward against the downward urging force of the coil spring 38 disposed on the operating shaft 37 as shown in FIG. Is done.

【0029】純水および薬液の供給後に図示しない高周
波発振器から高周波電力を高周波ケーブル28を通して
振動子27に印加すると、前記振動子27が所望の周波
数で振動し、この振動子27が取付けられた振動板25
も振動するため、前記円筒部22および前記テーパ状ノ
ズル部24の内部に供給された純水に振動が付与され
る。このため、純水を前記薬液供給管301,302から
前記吐出口23近傍のノズル部24に供給された薬液と
共に前記ノズル部24の吐出口23から高周波音波に乗
って被洗浄物に噴射できる。また、薬液は前記吐出部2
3近傍のノズル部24に供給される、つまり純水の噴射
直前で薬液が供給されるものの、前記純水は高周波音波
に乗って噴射されるため、この噴射過程で薬液を純水中
に均一に希釈、混合することができる。したがって、純
水で均一に希釈された薬液の噴射流により前記被洗浄物
を均一洗浄することができる。
When high-frequency power is applied from a high-frequency oscillator (not shown) to the vibrator 27 through a high-frequency cable 28 after the supply of the pure water and the chemical solution, the vibrator 27 vibrates at a desired frequency, and the vibrator to which the vibrator 27 is attached is mounted. Board 25
Therefore, the pure water supplied into the cylindrical portion 22 and the tapered nozzle portion 24 is also vibrated. For this reason, pure water is jetted onto the object to be cleaned together with the chemical supplied from the chemical liquid supply pipes 30 1 and 30 2 to the nozzle 24 near the discharge port 23 via the high frequency sound wave from the discharge port 23 of the nozzle 24. it can. In addition, the chemical solution is supplied to the discharge unit 2
3 is supplied to the nozzle portion 24 in the vicinity, that is, the chemical solution is supplied immediately before the injection of the pure water, but since the pure water is injected on the high-frequency sound wave, the chemical solution is uniformly injected into the pure water in this injection process. Can be diluted and mixed. Therefore, the object to be cleaned can be uniformly cleaned by the jet flow of the chemical solution uniformly diluted with pure water.

【0030】また、薬液洗浄から純水洗浄に切り替える
時には前記薬液供給管301,302に介装した前記電磁
弁311,312の閉じて吐出口23近傍のノズル部24
内への薬液供給を停止する。この時、前記電磁弁3
1,312の閉作動に同期して前記筐体33内のガスが
前記サックバックバルブ321,322の前記ガス流通管
39を通して排気される。このような前記筐体33内の
空気を排気することによって、図2の(B)に示すよう
に作動軸37に配置されたコイルスプリング38による
下方への付勢力ににより前記作動軸37先端に連結され
たダイヤフラム35が下方に湾曲して前記ダイヤフラム
35で区画された前記筐体33の上部側空間の体積が増
大する。その結果、前記電磁弁311,312からノズル
部24側の前記薬液供給管301,302部分に残留した
薬液が図2の(B)に示すように分岐管34を通して前
記筐体33内に流入するため、薬液の供給停止後の純水
洗浄過程において前記薬液供給管301,302の供給口
からノズル部24内に薬液が零れ出るのを防止できる。
When switching from chemical cleaning to pure water cleaning, the nozzles 24 near the discharge port 23 are closed by closing the solenoid valves 31 1 and 31 2 interposed in the chemical supply pipes 30 1 and 30 2.
Stop supplying the chemical solution to the inside. At this time, the solenoid valve 3
The gas in the housing 33 is exhausted through the gas flow pipes 39 of the suck back valves 32 1 and 32 2 in synchronization with the closing operations of 11 and 31 2 . By exhausting the air in the housing 33, the distal end of the operating shaft 37 is caused by a downward urging force of a coil spring 38 disposed on the operating shaft 37 as shown in FIG. The connected diaphragm 35 curves downward, and the volume of the upper space of the housing 33 partitioned by the diaphragm 35 increases. As a result, the through the solenoid valve 31 1, 31 2 from the nozzle portion 24 side the chemical supply pipe 30 1, 30 2 chemical liquid remaining in part the branch pipe 34 as shown in (B) of FIG. 2 casing 33 to flowing within, prevents the chemical is spilling into the nozzle portion 24 from the chemical supply pipe 30 1, 30 2 of the supply port in the pure water cleaning process after stopping supply of the chemical liquid.

【0031】なお、図2の(B)に示すように前記薬液
供給管301,302部分に残留した薬液を分岐管34を
通して前記筐体33内に流入させる際、前記薬液供給管
30 1,302の供給口と連通する前記ノズル部24内の
純水も吸引するため、薬液の拡散により徐々に前記ノズ
ル部24側に染み出す。ただし、前記筐体33の容量、
つまりサックバック量を増大させることにより実用上、
一定時間は薬液の拡散による影響を回避することができ
る。
In addition, as shown in FIG.
Supply pipe 301, 30TwoA branch pipe 34 is used to remove the chemical solution remaining in the portion.
When flowing into the housing 33 through the
30 1, 30TwoOf the nozzle portion 24 communicating with the supply port of
Since pure water is also sucked in, the nozzle gradually spreads due to the diffusion of chemicals.
Seeps out to the side of the screw 24. However, the capacity of the housing 33,
In other words, by increasing the amount of suck-back,
For a certain period of time, the effect of the diffusion of the drug solution can be avoided.
You.

【0032】従って、本発明に係わる高周波洗浄装置に
よれば本体21における吐出口23近傍のノズル部24
に薬液供給管301,302を連通することによって、薬
液洗浄時において本体の円筒部22およびテーパ状ノズ
ル部25内が薬液で汚染されるのを防止できる。その結
果、薬液洗浄から純水洗浄に切り替える際、従来のよう
に本体の円筒部およびテーパ状ノズル部内に残留する薬
液を全て純水に置換する長時間の切替え操作を行なうこ
となく、短時間でその切替え操作を行なうことができ
る。
Therefore, according to the high frequency cleaning apparatus of the present invention, the nozzle portion 24 near the discharge port 23 in the main body 21 is provided.
The inside of the cylindrical portion 22 and the tapered nozzle portion 25 of the main body can be prevented from being contaminated with the chemical solution during the cleaning of the chemical solution by connecting the chemical solution supply pipes 30 1 and 30 2 to the nozzles. As a result, when switching from chemical solution cleaning to pure water cleaning, a long-time switching operation of replacing all the chemical solution remaining in the cylindrical portion of the main body and the tapered nozzle portion with pure water as in the related art is performed in a short time. The switching operation can be performed.

【0033】また、サックバックバルブ321,322
薬液供給管301,302部分に設けることによって、薬
液の供給停止後の純水洗浄過程において前記薬液供給管
30 1,302の供給口からノズル部24内に薬液が零れ
出るのを防止できるため、薬液の混入のない純水洗浄を
行なうことができる。
The suck back valve 321, 32TwoTo
Chemical supply pipe 301, 30TwoMedicine by providing in the part
In the pure water washing process after the supply of the liquid is stopped,
30 1, 30TwoChemical spills into the nozzle part 24 from the supply port of
Cleaning with pure water without chemical solution contamination can be prevented.
Can do it.

【0034】次に、本発明の係わる別の高周波洗浄装置
を図3を参照して説明する。なお、図3において前述し
た図1と同様な部材は同符号を付して説明を省略する。
Next, another high frequency cleaning apparatus according to the present invention will be described with reference to FIG. In FIG. 3, the same members as those in FIG. 1 described above are denoted by the same reference numerals, and description thereof will be omitted.

【0035】図3に示す高周波洗浄装置は、例えば2本
の薬液供給管411,412を吐出口23近傍のテーパー
状ノズル部24の側面に沿ってそれら供給口が下方に向
くように取付けられている。
In the high frequency cleaning apparatus shown in FIG. 3, for example, two chemical supply pipes 41 1 and 41 2 are attached along the side surface of the tapered nozzle portion 24 near the discharge port 23 so that the supply ports face downward. Have been.

【0036】このような構成によれば、本体21におけ
る吐出口23近傍のノズル部24に沿って薬液供給管4
1,412を取付けることによって、薬液洗浄時におい
て薬液が本体21の円筒部22およびテーパ状ノズル部
25内に直接流入されないため、それらの部材内部が薬
液で汚染されるのを防止できる。その結果、薬液洗浄か
ら純水洗浄に切り替える際、従来のように本体の円筒部
およびテーパ状ノズル部内に残留する薬液を全て純水に
置換する長時間の切替え操作を行なうことなく、短時間
でその切替え操作を行なうことができる。
According to such a configuration, the chemical solution supply pipe 4 extends along the nozzle portion 24 near the discharge port 23 in the main body 21.
By mounting the 1 1, 41 2, because the drug solution at the time of chemical cleaning is not flow directly into the cylindrical portion 22 and a tapered nozzle portion 25 of the body 21, it is possible to prevent the inner these members are contaminated with chemical. As a result, when switching from chemical solution cleaning to pure water cleaning, a long-time switching operation of replacing all the chemical solution remaining in the cylindrical portion of the main body and the tapered nozzle portion with pure water as in the related art is performed in a short time. The switching operation can be performed.

【0037】また、サックバックバルブ321,322
薬液供給管411,412部分に設け、かつ前記薬液供給
管411,412を前記ノズル部24に外付けにして、ノ
ズル部24内部と連通させない構造にすることによっ
て、薬液の供給停止後の純水洗浄過程においてノズル部
24の吐出口23からの純水噴射流に前記薬液供給管4
1,412の供給口の薬液が混入されるのを防止できる
ため、薬液の混入のない純水洗浄を行なうことができ
る。
Further, suck-back valves 32 1 and 32 2 are provided at the chemical solution supply pipes 41 1 and 41 2 , and the chemical solution supply pipes 41 1 and 41 2 are externally attached to the nozzle section 24. By making the structure not communicated with the inside, the chemical solution supply pipe 4 is connected to the pure water jet flow from the discharge port 23 of the nozzle part 24 in the pure water washing process after the supply of the chemical solution is stopped.
1 1, 41 for the chemical liquid 2 of the supply port can be prevented from being mixed, it is possible to perform mixing without pure water cleaning chemicals.

【0038】なお、前記実施例では薬液供給管を2本配
置したが、1本、または3本、4本の薬液供給管を本体
の吐出口近傍のノズル部に設けてもよい。
Although two chemical supply pipes are arranged in the above embodiment, one, three, or four chemical supply pipes may be provided in the nozzle portion near the discharge port of the main body.

【0039】[0039]

【発明の効果】以上詳述したように、本発明に係わる高
周波洗浄装置によれば、純水洗浄と薬液洗浄を兼ね、か
つその切替えを迅速に行なうことができ、微細かつ高密
度の半導体装置、液晶ガラス基板や磁気ディスクの製造
等に有効に利用できる等顕著な効果を奏する。
As described above in detail, according to the high frequency cleaning apparatus of the present invention, it is possible to perform both cleaning with pure water and cleaning with a chemical solution, and to quickly switch between them. It has a remarkable effect such as being able to be effectively used for manufacturing a liquid crystal glass substrate or a magnetic disk.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例における高周波洗浄装置を示す
部分切欠正面図。
FIG. 1 is a partially cutaway front view showing a high-frequency cleaning device according to an embodiment of the present invention.

【図2】図1の薬液液供給管に設けられた零れ落ち防止
機構であるサックバックバルブを示す断面図。
FIG. 2 is a sectional view showing a suck-back valve which is a spill-prevention mechanism provided in the chemical liquid supply pipe of FIG. 1;

【図3】本発明の他の実施例における高周波洗浄装置を
示す部分切欠正面図。
FIG. 3 is a partially cutaway front view showing a high frequency cleaning device according to another embodiment of the present invention.

【図4】従来の高周波洗浄装置を示す概略図。FIG. 4 is a schematic view showing a conventional high frequency cleaning device.

【符号の説明】[Explanation of symbols]

21…本体、 23…吐出口、 24…テーパー状ノズル部、 26…純水供給管、 27…振動子、 301,302,411,412…薬液供給管、 311,312…電磁弁、 321,322…サックバックバルブ。Reference numeral 21 denotes a main body, 23 denotes a discharge port, 24 denotes a tapered nozzle portion, 26 denotes a pure water supply pipe, 27 denotes a vibrator, 30 1 , 30 2 , 41 1 , 41 2 ... a chemical liquid supply pipe, 31 1 and 31 2 ... Solenoid valves, 32 1 , 32 2 ... Suck back valves.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平8−230622(JP,A) 特開 平10−125641(JP,A) 特開 平11−102885(JP,A) 特開 平2−257632(JP,A) 実開 平6−31879(JP,U) 実開 平7−21168(JP,U) (58)調査した分野(Int.Cl.7,DB名) B08B 3/12 B08B 3/02 ────────────────────────────────────────────────── ─── Continuation of front page (56) References JP-A-8-230622 (JP, A) JP-A-10-125641 (JP, A) JP-A-11-102885 (JP, A) JP-A-2- 257632 (JP, A) JP 6-31879 (JP, U) JP 7-21168 (JP, U) (58) Fields investigated (Int. Cl. 7 , DB name) B08B 3/12 B08B 3 / 02

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 洗浄液吐出口が開口されたテーパ状ノズ
ル部を有する本体と、 前記本体に純水を供給するための純水供給手段と、 前記本体に内蔵され、前記供給手段から前記本体内に供
給された純水に高周波音波を付与するため高周波付与手
段と、 前記ノズル部の前記吐出口近傍に設けられた薬液を供給
するための薬液供給手段とを具備し 前記薬液供給手段は、薬液の供給停止時に薬液を供給方
向と反対方向に吸引するためのこぼれ落ち防止機構を有
する ことを特徴とする高周波洗浄装置。
1. A main body having a tapered nozzle portion having an opening of a cleaning liquid discharge port, pure water supply means for supplying pure water to the main body, and a built-in main body; A high-frequency applying means for applying a high-frequency sound wave to the pure water supplied, and a chemical liquid supply means for supplying a chemical liquid provided in the vicinity of the discharge port of the nozzle portion , wherein the chemical liquid supply means comprises: How to supply chemicals when chemical supply is stopped
Has a spill prevention mechanism for suction in the opposite direction.
A high-frequency cleaning device characterized in that:
JP10289371A 1998-10-12 1998-10-12 High frequency cleaning equipment Expired - Fee Related JP3017979B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10289371A JP3017979B1 (en) 1998-10-12 1998-10-12 High frequency cleaning equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10289371A JP3017979B1 (en) 1998-10-12 1998-10-12 High frequency cleaning equipment

Publications (2)

Publication Number Publication Date
JP3017979B1 true JP3017979B1 (en) 2000-03-13
JP2000117210A JP2000117210A (en) 2000-04-25

Family

ID=17742351

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10289371A Expired - Fee Related JP3017979B1 (en) 1998-10-12 1998-10-12 High frequency cleaning equipment

Country Status (1)

Country Link
JP (1) JP3017979B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3857059B2 (en) * 2001-02-09 2006-12-13 住友ベークライト株式会社 Biological tissue adhesive applicator

Also Published As

Publication number Publication date
JP2000117210A (en) 2000-04-25

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