JPH0291200U - - Google Patents
Info
- Publication number
- JPH0291200U JPH0291200U JP17040688U JP17040688U JPH0291200U JP H0291200 U JPH0291200 U JP H0291200U JP 17040688 U JP17040688 U JP 17040688U JP 17040688 U JP17040688 U JP 17040688U JP H0291200 U JPH0291200 U JP H0291200U
- Authority
- JP
- Japan
- Prior art keywords
- ray tube
- displacement
- view
- showing
- amount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000006073 displacement reaction Methods 0.000 claims 4
- 238000001514 detection method Methods 0.000 claims 3
- 230000007423 decrease Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 5
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Landscapes
- X-Ray Techniques (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Description
第１図ないし第３図は、この考案の一実施例に
係り、第１図は装置全体の概略構成を示した側面
図、第２図は位置補正手段の部分拡大斜視図、第
３図は装置の動作順序を示した側面図である。第
４図ないし第９図はこの考案のその他の実施例に
係り、第４図は第２実施例の概略構成を示したブ
ロツク図、第５図は第３実施例の概略構成を示し
たブロツク図、第６図は第４実施例の概略構成を
示したブロツク図、第７図は第５実施例の概略構
成を示した側面図、第８図は第６実施例の概略構
成を示した側面図、第９図は第６実施例の変形例
の概略構成を示した平面図である。第１０図およ
び第１１図は従来例に係り、第１０図は従来装置
全体の概略構成を示した側面図、第１１図ａは装
置の要部を示した断面図、第１１図ｂは従来例の
問題点を説明するための図である。
１……Ｘ線管、２……Ｘ線検出器、５……スラ
イド台、６……ガイドレール、７……ねじ棒、８
……モーター、９……モータドライブ回路、１０
……補正用Ｘ線検出器、１１……差動増幅器、１
２……赤外線検出器、１３……マイクロコンピユ
ータ、１８……温度検出器、１９……データ入力
部、２０……電源装置、２１……支持壁、２２…
…熱膨張部材、２３……台、２４……ヒーター、
２５……電圧発生器、２６……圧電素子、２７…
…固定板、２８……てこ棒、２９……支点。
1 to 3 relate to one embodiment of this invention, in which FIG. 1 is a side view showing a schematic configuration of the entire device, FIG. 2 is a partially enlarged perspective view of the position correction means, and FIG. FIG. 3 is a side view showing the operating order of the device. 4 to 9 relate to other embodiments of this invention, FIG. 4 is a block diagram showing the schematic structure of the second embodiment, and FIG. 5 is a block diagram showing the schematic structure of the third embodiment. 6 is a block diagram showing the schematic structure of the fourth embodiment, FIG. 7 is a side view showing the schematic structure of the fifth embodiment, and FIG. 8 is a block diagram showing the schematic structure of the sixth embodiment. The side view and FIG. 9 are plan views showing a schematic configuration of a modification of the sixth embodiment. 10 and 11 relate to a conventional example. FIG. 10 is a side view showing a schematic configuration of the entire conventional device, FIG. 11a is a sectional view showing the main parts of the device, and FIG. 11b is a conventional example. FIG. 3 is a diagram for explaining problems in the example. 1... X-ray tube, 2... X-ray detector, 5... Slide stand, 6... Guide rail, 7... Threaded rod, 8
... Motor, 9 ... Motor drive circuit, 10
...Correction X-ray detector, 11...Differential amplifier, 1
2...Infrared detector, 13...Microcomputer, 18...Temperature detector, 19...Data input section, 20...Power supply device, 21...Support wall, 22...
...Thermal expansion member, 23...stand, 24...heater,
25... Voltage generator, 26... Piezoelectric element, 27...
...fixing plate, 28...pry bar, 29...fulcrum.
Claims (1)
を照射するＸ線管を備えたＸ線管装置において、
Ｘ線管の温度変動に伴うＸ線管焦点の変位量を検
出する変位量検出手段と、前記変位量検出手段の
検出信号に基づき、前記変位量が少なくなる方向
にＸ線管の位置を補正する位置補正手段とを備え
たことを特徴とするＸ線管装置。 In an X-ray tube device including an X-ray tube that is placed opposite to an X-ray detector and irradiates a subject with X-rays,
displacement amount detection means for detecting the amount of displacement of the X-ray tube focal point due to temperature fluctuations of the X-ray tube; and based on the detection signal of the displacement amount detection means, correcting the position of the X-ray tube in a direction in which the amount of displacement decreases. An X-ray tube device characterized by comprising: a position correction means.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17040688U JPH0291200U (en) | 1988-12-28 | 1988-12-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17040688U JPH0291200U (en) | 1988-12-28 | 1988-12-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0291200U true JPH0291200U (en) | 1990-07-19 |
Family
ID=31461319
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17040688U Pending JPH0291200U (en) | 1988-12-28 | 1988-12-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0291200U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005512288A (en) * | 2001-12-04 | 2005-04-28 | エックス−レイ オプティカル システムズ インコーポレーテッド | X-ray source assembly with improved output stability and application of its fluid stream analysis |
| JP2005345184A (en) * | 2004-06-01 | 2005-12-15 | Shimadzu Corp | X-ray photographing device |
| JP2018146554A (en) * | 2017-03-09 | 2018-09-20 | アンリツインフィビス株式会社 | X-ray inspection device |
-
1988
- 1988-12-28 JP JP17040688U patent/JPH0291200U/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005512288A (en) * | 2001-12-04 | 2005-04-28 | エックス−レイ オプティカル システムズ インコーポレーテッド | X-ray source assembly with improved output stability and application of its fluid stream analysis |
| JP2011071120A (en) * | 2001-12-04 | 2011-04-07 | X-Ray Optical Systems Inc | X-ray source assembly having enhanced output stability, and application of fluid stream analysis |
| JP2005345184A (en) * | 2004-06-01 | 2005-12-15 | Shimadzu Corp | X-ray photographing device |
| JP2018146554A (en) * | 2017-03-09 | 2018-09-20 | アンリツインフィビス株式会社 | X-ray inspection device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0291200U (en) | ||
| JPS6359608U (en) | ||
| JPH0431339B2 (en) | ||
| JPH0561573B2 (en) | ||
| JPS6129710U (en) | X-ray CT device | |
| JPS629405U (en) | ||
| JPH0726705Y2 (en) | Flow velocity measuring device | |
| JPH02196933A (en) | Infrared-ray detection device | |
| JPH03123234U (en) | ||
| JPS6344152U (en) | ||
| JPS61112254U (en) | ||
| JPS62276798A (en) | Device for x-ray tomography | |
| Blankenburg et al. | A Transistorized 125 kHz Crystal Controlled Oscillator for ESR Field Modulation | |
| JPH01118398U (en) | ||
| JPS58198162A (en) | Linear motor | |
| JP2000275261A (en) | Scanning microscope with temperature correcting mechanism | |
| JPH062210U (en) | Thermomechanical analyzer | |
| JPH02113108U (en) | ||
| JPS5946515A (en) | Sensor for detecting surface of low temperature liquified gas | |
| JPH0433378B2 (en) | ||
| JPS6119704U (en) | Angle detection device for periscope | |
| JPH03291502A (en) | Alignment mechanism and inter-atomic force microscope using same | |
| JPS6246351U (en) | ||
| JPS6166377U (en) | ||
| JPH0188964U (en) |