JPH0289059A - Baking method - Google Patents

Baking method

Info

Publication number
JPH0289059A
JPH0289059A JP23906088A JP23906088A JPH0289059A JP H0289059 A JPH0289059 A JP H0289059A JP 23906088 A JP23906088 A JP 23906088A JP 23906088 A JP23906088 A JP 23906088A JP H0289059 A JPH0289059 A JP H0289059A
Authority
JP
Japan
Prior art keywords
liquid
solvent
baking
photosensitive
baking furnace
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23906088A
Other languages
Japanese (ja)
Inventor
Hisato Nakamura
寿人 中村
Kenji Jingu
神宮 健次
Kimio Muramatsu
村松 公夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Hitachi High Tech Corp
Original Assignee
Hitachi Ltd
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Ltd
Priority to JP23906088A priority Critical patent/JPH0289059A/en
Publication of JPH0289059A publication Critical patent/JPH0289059A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To form insulating films having stable film quality by sucking the air in a baking furnace into which material to be treated are put to increase the degree of vacuum and to evaporate the solvent of a photosensitive polyimide-based coating liquid and then heating up the circumference of the baking furnace by heaters upon lapse of the prescribed time thereafter. CONSTITUTION:The baking device is constituted of the baking furnace 3' which is constituted to generate a vacuum by sucking the air therein through a rotary pump 5 and a valve 6 and the heaters 4 provided around this baking furnace 3'. The air in the baking furnace 3 into which the materials 1 to be treated are put is sucked by the rotary pump 5 to increase the degree of vacuum and to evaporate the solvent of the photosensitive polyimide-based coating liquid (PiQ liquid); thereafter, the circumference of the baking furnace 3' is heated up by the heaters 4. The greater part of the solvent of the photosensitive PiQ liquid is, therefore, removed by evaporation and is then solidified by a thermal crosslinking reaction. The insulating films having the stable film quality is formed in this way.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、例えばウェハ等の被処理物の表面に塗られた
感光性ポリイミド系塗布液(感光性有機物が混入された
ポリイミド・イソ・インドロ・キナ・シリジオンの液、
以下「感光性PiQ液」と略称する)を乾燥して被処理
物の表面に絶縁膜を生成するベーク方法に関し、特に感
光性PiQ液の溶媒及び溶媒中の気泡を追い出し安定な
膜質の絶縁膜を生成することができるベーク方法に関す
る。
Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a photosensitive polyimide coating solution (polyimide iso-indole mixed with a photosensitive organic substance) applied to the surface of a workpiece such as a wafer.・Cinchona silidione liquid,
Regarding the baking method of drying a photosensitive PiQ liquid (hereinafter abbreviated as "photosensitive PiQ liquid") to form an insulating film on the surface of a processed object, it is particularly concerned with the baking method of drying a photosensitive PiQ liquid (hereinafter abbreviated as "photosensitive PiQ liquid") and forming an insulating film with stable film quality by expelling the solvent of the photosensitive PiQ liquid and air bubbles in the solvent. Concerning a baking method that can produce .

〔従来の技術〕[Conventional technology]

従来のこの種のベーク方法は、第4図に示すように、感
光性PiQ液が表面に塗られたウェハ等の被処理物1を
カートリッジ2の中に複数枚積層してベーク炉3の中に
入れ、そのベーク炉3の周囲をヒータ4,4.・・・で
加熱して昇温することにより、上記感光性PiQ液を乾
燥して被処理物1の表面に絶縁膜を生成するものであっ
た。このときの上記ヒータ4,4.・・・による加熱昇
温のカーブは、第5図に曲線aで示すように、処理時間
の当初から徐々に加熱を始め、所定時間後に一定の温度
、例えば約400℃に到達するようにしていた。このと
き、ある温度まで昇温すると、被処理物1の表面に塗ら
れた感光性PiQ液が熱架橋反応(加熱するとアミドが
イミド化して硬化すること)により固化し始め、絶縁膜
が生成されるものであった・ 〔発明が解決しようとする課題〕 しかし、このような従来のベーク方法においては、第4
図に示すようにベーク炉3の中に被処理物1を入れて単
に加熱昇温するだけであったので、第5図に示すように
処理時間の当初は徐々に加熱昇温させたとしても、例え
ば約145℃で感光性PiQ液の溶媒が揮発し始め、約
165℃でアミドがイミド化して硬化し始めて、第6図
において曲線すで示す溶媒揮発と曲線Cで示す固化とが
ほぼ同時進行する形となるものであった。従って、被処
理物1の表面に塗られた感光性PiQ液の内部から溶媒
が揮発するときは、既に上記感光性PiQ液の表面では
熱架橋反応により膜が固化し始め、その固化し始めた膜
の下に残っている溶媒は気泡状態で内部に残ってしまう
ものであった。これでは、感光性PiQ液が完全に乾燥
せず、安定した膜質の絶縁膜は生成されないものであっ
た。
In the conventional baking method of this type, as shown in FIG. , and the area around the baking oven 3 is heated by heaters 4, 4 . The photosensitive PiQ liquid was dried by heating to raise the temperature to form an insulating film on the surface of the object 1 to be processed. At this time, the heaters 4, 4. As shown by curve a in Figure 5, the heating temperature increase curve for ... is such that heating is started gradually from the beginning of the treatment time and reaches a constant temperature, for example, about 400°C, after a predetermined time. Ta. At this time, when the temperature is raised to a certain temperature, the photosensitive PiQ liquid applied to the surface of the object to be processed 1 begins to solidify due to a thermal crosslinking reaction (amide is imidized and hardened when heated), and an insulating film is formed. [Problem to be solved by the invention] However, in such conventional baking methods, the fourth
As shown in the figure, the object to be processed 1 was placed in the baking furnace 3 and the temperature was simply heated, so even if the heating temperature was gradually increased at the beginning of the processing time as shown in For example, at about 145°C, the solvent of the photosensitive PiQ liquid starts to volatilize, and at about 165°C, the amide starts to imidize and harden, and the solvent volatilization shown by the curve in FIG. 6 and the solidification shown by curve C occur almost simultaneously. It was an ongoing process. Therefore, when the solvent evaporates from inside the photosensitive PiQ liquid applied to the surface of the object to be treated 1, the film has already begun to solidify on the surface of the photosensitive PiQ liquid due to the thermal crosslinking reaction. The solvent remaining under the membrane remained inside in the form of bubbles. In this case, the photosensitive PiQ liquid was not completely dried, and an insulating film with stable film quality was not produced.

このように膜質が安定していないと、被処理物1の下地
と絶縁膜との接着性が悪くなって剥がれ易くなったり、
気泡の部分で耐熱性が悪くなったり。
If the film quality is not stable in this way, the adhesion between the substrate of the object to be processed 1 and the insulating film may deteriorate, making it easy to peel off.
Heat resistance may deteriorate due to air bubbles.

或いは眉間の配線の絶縁が悪くなったりして、製品(I
C等の電子部品)として不良品となると共に、歩留まり
も低下するものであった。
Or, the insulation of the wiring between the eyebrows may deteriorate, causing the product (I
In addition to resulting in defective products (electronic components such as C), the yield rate also decreased.

そこで1本発明は、このような問題点を解決することが
できるベーク方法を提供することを目的とする。
Therefore, one object of the present invention is to provide a baking method that can solve these problems.

〔課題を解決するための手段〕[Means to solve the problem]

上記目的を達成するために1本発明によるベーク方法は
、感光性ポリイミド系塗布液が表面に塗られた被処理物
をベーク炉の中に入れ、そのベーク炉の周囲をヒータで
加熱して昇温することにより、上記感光性ポリイミド系
塗布液を乾燥して被処理物の表面に絶縁膜を生成するベ
ーク方法において、上記被処理物が入れられたベーク炉
内の空気を吸引し真空度を上げて感光性ポリイミド系塗
布液の溶媒を揮発させ、その後所定時間経過後に上記ベ
ーク炉の周囲をヒータで加熱昇温するものである。
In order to achieve the above object, the baking method according to the present invention involves placing a workpiece whose surface is coated with a photosensitive polyimide coating liquid into a baking oven, heating the area around the baking oven with a heater, and raising the temperature. In the baking method, which dries the photosensitive polyimide coating solution by heating to form an insulating film on the surface of the object to be treated, the air in the baking oven containing the object to be treated is sucked to maintain the degree of vacuum. The solvent of the photosensitive polyimide coating liquid is evaporated, and after a predetermined period of time, the temperature around the baking oven is heated with a heater.

〔実施例〕〔Example〕

以下、本発明の実施例を添付図面を参照して説明する。 Embodiments of the present invention will be described below with reference to the accompanying drawings.

第1図は本発明によるベーク方法を説明するための処理
時間と真空度及び加熱温度との関係を示すグラフである
。このベーク方法が適用されるベーク装置は、第2図に
示すように、ロータリポンプ5及びバルブ6を介して内
部の空気を吸引し真空を作り出すようにしたベーク炉3
′と、このベーク炉3′の周囲に設けられたヒータ4,
4.・・・とから成る。そして、感光性PiQ液が表面
に塗られたウェハ等の被処理物1をカートリッジ2の中
に複数枚積層してベーク炉3′の中に入れ、そのベーク
炉3′の周囲をヒータ4,4.・・・で加熱して昇温す
ることにより、上記感光性PiQ液を乾燥して被処理物
10表面に絶縁膜を生成するようになっている。
FIG. 1 is a graph showing the relationship between processing time, degree of vacuum, and heating temperature for explaining the baking method according to the present invention. As shown in FIG. 2, the baking apparatus to which this baking method is applied is a baking oven 3 which sucks internal air through a rotary pump 5 and a valve 6 to create a vacuum.
', a heater 4 provided around this baking oven 3',
4. It consists of... Then, a plurality of workpieces 1 such as wafers whose surfaces are coated with the photosensitive PiQ liquid are stacked in a cartridge 2 and put into a baking oven 3', and the area around the baking oven 3' is heated by a heater 4, 4. By heating and increasing the temperature, the photosensitive PiQ liquid is dried and an insulating film is formed on the surface of the object to be processed 10.

そして、このようなベーク装置におけるベーク方法は、
まず、第1図に曲線dで示すように上記被処理物1が入
れられたベーク炉3′内の空気をロータリポンプ5で吸
引し真空度を上げて感光性PiQ液の溶媒を揮発させ、
その後所定時間tが経過後に第1図に曲線eで示すよう
に上記ベーク炉3′の周囲をヒータ4,4.・・・で加
熱昇温する。
The baking method in such a baking device is as follows:
First, as shown by curve d in FIG. 1, air in the baking oven 3' containing the object 1 to be processed is sucked by the rotary pump 5 to increase the degree of vacuum and evaporate the solvent of the photosensitive PiQ liquid.
Thereafter, after a predetermined time t has elapsed, heaters 4, 4. Heating to raise the temperature.

このとき、第1図に曲線dで示すように処理時間の当初
は真空度だけを上げることにより、第3図に曲線b′で
示すように処理時間の当初は溶媒の揮発だけが先行して
始まり、かつ第6図に示す従来の溶媒揮発の曲線すより
も強いカーブで立ち上がる。このときは、上記感光性P
iQ液の表面ではまだ熱架橋反応は始まっていない。こ
れにより、常圧時よりも感光性PiQ液の溶媒が揮発し
易くなると共に、その溶媒中の気泡も抜は出し易くなる
。その後、所定時間tが経過して上記感光性PiQ液の
溶媒が大部分揮発したところで、第1図に曲線eで示す
ようにベーク炉3′をヒータ4゜4、・・・で加熱して
約400℃まで昇温する。すると、被処理物1の表面に
塗られた感光性PiQ液が熱架橋反応により、第3図に
曲線Cで示すように主として時間を以後に固化し始める
At this time, by increasing only the degree of vacuum at the beginning of the processing time, as shown by curve d in Figure 1, only the volatilization of the solvent takes precedence at the beginning of the processing time, as shown by curve b' in Figure 3. 6, and rises with a stronger curve than the conventional solvent volatilization curve shown in FIG. At this time, the photosensitive P
Thermal crosslinking reaction has not yet started on the surface of the iQ liquid. As a result, the solvent of the photosensitive PiQ liquid evaporates more easily than under normal pressure, and air bubbles in the solvent also become easier to remove. Thereafter, when a predetermined time t has elapsed and most of the solvent of the photosensitive PiQ liquid has evaporated, the baking oven 3' is heated with heaters 4°4, . . . as shown by curve e in FIG. Raise the temperature to approximately 400°C. Then, the photosensitive PiQ liquid applied to the surface of the object to be treated 1 starts to solidify mainly after a certain period of time due to a thermal crosslinking reaction, as shown by curve C in FIG.

すなわち、第1図に示すように処理時間の当初はベーク
炉3′内の真空度だけを上げ(曲線d参照)、所定時間
tの経過後に上記ベーク炉3′内を加熱昇温する(曲線
e参照)ことにより、第3図に示すように感光性PiQ
液の溶媒の揮発(曲線b′参照)と、熱架橋反応による
同化(曲線C参照)とを処理の時間軸上で分けるもので
ある。
That is, as shown in FIG. 1, only the degree of vacuum in the bake oven 3' is increased at the beginning of the processing time (see curve d), and after the elapse of a predetermined time t, the temperature inside the bake oven 3' is increased (see curve d). (see e), photosensitive PiQ is formed as shown in Figure 3.
The volatilization of the liquid solvent (see curve b') and the assimilation by thermal crosslinking reaction (see curve C) are separated on the time axis of the treatment.

これにより、第6図に示す従来例のように溶媒揮発と同
化とが同時進行する形となるのを防止し、感光性PiQ
液の溶媒が大部分揮発し除去された後に、熱架橋反応に
より固化されることとなり、上記感光性PiQ液を完全
に乾燥して被処理物lの表面に絶縁膜を生成することが
できる。
This prevents solvent volatilization and assimilation from proceeding simultaneously as in the conventional example shown in FIG.
After most of the solvent in the liquid is volatilized and removed, it is solidified by a thermal cross-linking reaction, and the photosensitive PiQ liquid can be completely dried to form an insulating film on the surface of the object to be treated.

〔発明の効果〕〔Effect of the invention〕

本発明は以上のように構成されたので、感光性PiQ液
の溶媒の揮発と、熱架橋反応による絶縁膜の固化とを処
理の時間軸上で分けることができる。従って、従来のよ
うに溶媒揮発と同化とが同時進行する形となるのを防止
し、感光性PiQ液の溶媒が大部分揮発し除去された後
に、熱架橋反応により絶縁膜を固化することができる。
Since the present invention is configured as described above, the volatilization of the solvent of the photosensitive PiQ liquid and the solidification of the insulating film due to the thermal crosslinking reaction can be separated on the processing time axis. Therefore, it is possible to prevent solvent volatilization and assimilation from proceeding simultaneously as in the past, and to solidify the insulating film by thermal crosslinking reaction after most of the solvent in the photosensitive PiQ liquid has been volatilized and removed. can.

このことから、上記感光性PiQ液の溶媒及び溶媒中の
気泡をほぼ完全に追い出し、その感光性PiQ液を完全
に乾燥して安定した膜質の絶縁膜を生成することができ
る。従って、被処理物1の下地と絶縁膜との接着性を良
くして剥がれにくくすると共に、眉間の配線の絶縁を良
くして、製品の品質を向上できると共に歩留まりも向上
することができる。なお、本発明のベータ方法では、被
処理物1について、バッチ処理または枚葉処理のどちら
でも適用することができる。
Therefore, the solvent of the photosensitive PiQ liquid and the bubbles in the solvent can be almost completely expelled, and the photosensitive PiQ liquid can be completely dried to produce an insulating film with stable film quality. Therefore, it is possible to improve the adhesion between the base of the workpiece 1 and the insulating film, making it difficult to peel off, and to improve the insulation of the wiring between the eyebrows, thereby improving the quality of the product and the yield. In addition, in the beta method of the present invention, either batch processing or single-wafer processing can be applied to the object 1 to be processed.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明によるベーク方法を説明するための処理
時間と真空度及び加熱温度との関係を示すグラフ、第2
図は本発明のベーク方法が適用されるベーク装置の概要
を示す説明図、第3図は本発明の処理プロファイルを示
すグラフ、第4図は従来のベータ方法が適用されるベー
ク装置の概要を示す説明図、第5図は従来のベーク方法
を説明するための処理時間と加熱温度との関係を示すグ
ラフ、第6図は従来の処理プロファイルを示すグラフで
ある。 1・・・被処理物、  2・・・カートリッジ、  3
′・・・ベーク炉、  4・・・ヒータ、  5・・・
ロータリポンプ、6・・・バルブ。 出願人 日立電子エンジニアリング株式会社同 株式会
社日立製作所
FIG. 1 is a graph showing the relationship between processing time, degree of vacuum, and heating temperature for explaining the baking method according to the present invention;
The figure is an explanatory diagram showing an overview of a baking device to which the baking method of the present invention is applied, FIG. 3 is a graph showing the processing profile of the present invention, and FIG. 4 is an overview of a baking device to which the conventional beta method is applied. FIG. 5 is a graph showing the relationship between processing time and heating temperature for explaining the conventional baking method, and FIG. 6 is a graph showing the conventional processing profile. 1... Workpiece, 2... Cartridge, 3
'... Bake oven, 4... Heater, 5...
Rotary pump, 6 valves. Applicant: Hitachi Electronics Engineering Co., Ltd. Hitachi, Ltd.

Claims (1)

【特許請求の範囲】[Claims] 感光性ポリイミド系塗布液が表面に塗られた被処理物を
ベーク炉の中に入れ、そのベーク炉の周囲をヒータで加
熱して昇温することにより、上記感光性ポリイミド系塗
布液を乾燥して被処理物の表面に絶縁膜を生成するベー
ク方法において、上記被処理物が入れられたベーク炉内
の空気を吸引し真空度を上げて感光性ポリイミド系塗布
液の溶媒を揮発させ、その後所定時間経過後に上記ベー
ク炉の周囲をヒータで加熱昇温することを特徴とするベ
ーク方法。
The object to be treated whose surface is coated with the photosensitive polyimide coating liquid is placed in a baking oven, and the area around the baking oven is heated with a heater to raise the temperature, thereby drying the photosensitive polyimide coating liquid. In the baking method in which an insulating film is formed on the surface of the object to be treated, the air in the baking oven containing the object to be treated is sucked to increase the degree of vacuum to evaporate the solvent of the photosensitive polyimide coating liquid, and then A baking method characterized in that after a predetermined period of time has elapsed, the area around the baking oven is heated with a heater to raise the temperature.
JP23906088A 1988-09-26 1988-09-26 Baking method Pending JPH0289059A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23906088A JPH0289059A (en) 1988-09-26 1988-09-26 Baking method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23906088A JPH0289059A (en) 1988-09-26 1988-09-26 Baking method

Publications (1)

Publication Number Publication Date
JPH0289059A true JPH0289059A (en) 1990-03-29

Family

ID=17039269

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23906088A Pending JPH0289059A (en) 1988-09-26 1988-09-26 Baking method

Country Status (1)

Country Link
JP (1) JPH0289059A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0557846U (en) * 1992-01-09 1993-07-30 東レエンジニアリング株式会社 Curing furnace for resin encapsulation of semiconductor chips
WO2015001936A1 (en) * 2013-07-05 2015-01-08 東京エレクトロン株式会社 Method for forming coating film and computer storage medium

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0557846U (en) * 1992-01-09 1993-07-30 東レエンジニアリング株式会社 Curing furnace for resin encapsulation of semiconductor chips
WO2015001936A1 (en) * 2013-07-05 2015-01-08 東京エレクトロン株式会社 Method for forming coating film and computer storage medium
JP2015015370A (en) * 2013-07-05 2015-01-22 東京エレクトロン株式会社 Method for forming coating film, program, and computer storage medium

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