JPH0286156A - Lead frame - Google Patents

Lead frame

Info

Publication number
JPH0286156A
JPH0286156A JP23853988A JP23853988A JPH0286156A JP H0286156 A JPH0286156 A JP H0286156A JP 23853988 A JP23853988 A JP 23853988A JP 23853988 A JP23853988 A JP 23853988A JP H0286156 A JPH0286156 A JP H0286156A
Authority
JP
Japan
Prior art keywords
lead frame
processing
treatment
notches
notch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23853988A
Other languages
Japanese (ja)
Inventor
Masami Saito
斉藤 政美
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Original Assignee
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Semiconductor Manufacturing Co Ltd, Kansai Nippon Electric Co Ltd filed Critical Renesas Semiconductor Manufacturing Co Ltd
Priority to JP23853988A priority Critical patent/JPH0286156A/en
Publication of JPH0286156A publication Critical patent/JPH0286156A/en
Pending legal-status Critical Current

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  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To enable treatment so as to evade a region unnecessary to be treated, and remarkably improve yield and workability by providing a lead frame with recognition codes indicating the treatment information concerning assembling and working. CONSTITUTION:Treatment information such as notches (a), (a') for treatment start use, a notch (b) for treatment stop use, and notches (a''), (b') for frame end use are arranged on both sides 10a, 10b of a lead frame 10, so as to face each other. Information processing equipment 14 is installed on the conveying route of the lead frame 10. Two photo sensors 15a, 15b for detecting the notches are arranged in the above equipment. The lead frame 10 is carried through the conveying route, and the photo sensors 15a, 15b for detecting the notches detect the treatment notches. Thereby, the information processing equipment 14 performs the treatment of the lead frame 10.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、半導体装置に用いられるリードフレームに
関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a lead frame used in a semiconductor device.

〔従来の技術〕[Conventional technology]

例えば、トランジスタやIC等の樹脂封止型半導体装置
は、Cu系金属やFe−Ni合金系金属の平板を打抜き
加工したリードフレームが半導体ペレットマウント工程
、ワイヤボンディング工程、樹脂モールド工程等に順次
搬送されて製造される。
For example, in resin-sealed semiconductor devices such as transistors and ICs, lead frames are punched from flat plates of Cu-based metals or Fe-Ni alloy-based metals, and are sequentially transported to a semiconductor pellet mounting process, a wire bonding process, a resin molding process, etc. and manufactured.

上記リードフレームの具体例を第2図を参照して説明す
る。同図に示すリードフレーム(1)において、(2)
(2)・・・は長手方向に沿って所定ピッチで配設され
たペレットマウント部(3)(3)・・・は各ベレット
マウント部(2)(2)・・・の周辺部近傍までその遊
端部が延設された複数のリード、(4)(4)・・・は
ベレットマウント部(2)と複数のリード(3)(3)
・・・とを複数組一連に一体化するタイバーである。
A specific example of the above lead frame will be explained with reference to FIG. 2. In the lead frame (1) shown in the figure, (2)
(2) ... is a pellet mount section (3) arranged at a predetermined pitch along the longitudinal direction (3) ... is up to the vicinity of the periphery of each pellet mount section (2) (2) ... A plurality of leads whose free ends are extended, (4) (4)... are a bullet mount part (2) and a plurality of leads (3) (3)
This is a tie bar that integrates multiple sets of...

上記リードフレーム(1)を用いた半導体装置の製造で
は、まず、リードフレーム(1)をヒータブロック等で
加熱しながら一方向に搬送し、ベレットマウント部(2
)(2)・・・上に定量の半田を供給して熔融させ、熔
融半田上に半導体ペレットを供給してマウントする。そ
して、半導体ペレットをマウントしたリードフレーム(
1)をワイヤボンディング工程に送り、半導体ペレット
上の電極とリード(3)(3)・・・とを金線等の金属
細線(ワイヤ)で電気的接続する、次にワイヤボンディ
ングが完了したリードフレーム(1)は樹脂モールド工
程に送られ要所に樹脂材を被覆してモールド成形する。
In manufacturing a semiconductor device using the lead frame (1), first, the lead frame (1) is heated with a heater block or the like and transported in one direction, and the bullet mount part (2
)(2)... A fixed amount of solder is supplied on top and melted, and a semiconductor pellet is supplied and mounted on the molten solder. Then, a lead frame (
1) is sent to the wire bonding process, and the electrodes on the semiconductor pellet and the leads (3) (3)... are electrically connected with thin metal wires (wires) such as gold wires, and then the leads after wire bonding are completed. The frame (1) is sent to a resin molding process, where key points are coated with a resin material and molded.

最後にタイバー(4)(4)・・・を切断除去して複数
の樹脂封止型半導体装置を一括して得る。
Finally, the tie bars (4), (4), etc. are cut and removed to obtain a plurality of resin-sealed semiconductor devices at once.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

ところで、上記リードフレーム(1)は長尺のフープ材
に連続的に打抜き、メツキ処理がなされ、定尺に切断さ
れるが、製造過程で部分的にメツキネ良や打抜き不良が
発生する場合がある。
By the way, the above lead frame (1) is made by continuously punching out a long hoop material, plating it, and cutting it into regular lengths, but there are times when some parts of the lead frame are not well-plated or have poor punching during the manufacturing process. .

従来、このような場合ベレットマウント部(2)と複数
のリード(3)(3)・・・とが複数組毎に所定の長さ
単位で切断されたものでは、不良部分が検出された時点
でその一枚を不良品として廃棄処分するので、歩留りや
作業性が非常に恋かった。
Conventionally, in such cases, when the bullet mount part (2) and the plurality of leads (3) (3)... were cut in predetermined length units for each set, the time when the defective part was detected was Then, that one piece was discarded as a defective product, so I was very disappointed in the yield and workability.

〔課題を解決するための手段〕[Means to solve the problem]

この発明は上記の課題に鑑みてなされたもので、この課
題を解決するため、送り方向に沿って処理ブロック毎の
処理情報を示す識別符号を設けたリードフレームを堤供
する。
The present invention has been made in view of the above problem, and in order to solve this problem, a lead frame is provided that is provided with an identification code indicating processing information for each processing block along the feeding direction.

〔作用〕 この発明では、リードフレームの処理情報により処理不
要領域を避けて処理を行うことができる。
[Operation] According to the present invention, processing can be performed while avoiding areas that do not require processing, using the processing information of the lead frame.

〔実施例〕〔Example〕

この発明に係るリードフレームの一実施例を第1図を参
照しながら説明する。この発明の特徴はリードフレーム
にそのリードフレーム内の加工、組立などに関する処理
情報を設けることである。即ち、第1図において、(1
0)はCu系金属やFe−N1合金系金属の平板を打抜
きして形成したリードフレームで、長手方向に沿って所
定ピッチで配列されたベレットマウント!1ts (1
1)(11)・・・と各ベレットマウント部(11) 
 (11)・・・周辺部近傍までその遊端部が延設され
た複数のリード(12)  (12)・・・とをタイバ
ー(13)(13)・・・で複数組一連に一体化してい
る。(A)はリードフレーム(10) !造時に発生し
たメツキネ良や打抜き不良等があって、半導体装置組立
て処理不要領域、(a)及 び(ao)はリードフレー
ム(10)の側辺(10a )に形成された処理2ター
ト用ノツチで、ノツチ(a)はリードフレーム(10)
の始端部に配置され、ノツチ(ao)は処理不要領域(
A)の直後に配置される。(b)はリードフレーム(1
0)の側辺(10b )に形成された処理ストップ用ノ
ツチで、処理不要領域(A)の直前に配置される。(a
o)及び(b゛)はリードフレーム(10)の両側辺(
10a)及び(10b )に対向して形成されたフレー
ム終了用ノツチで、リードフレーム(lO)の終端部に
配置される。(14)は処理情報を示す識別符号(a)
(a’)(a” )(b)(b″)を設けたリードフレ
ーム(10)の搬送路に配設された情報処理装置で、上
記ノツチ(a)(a’)(a” )及び(b )  (
b’)を検出する2個のノツチ検出用光センサ(15a
)(15b)を設けている。
An embodiment of a lead frame according to the present invention will be described with reference to FIG. A feature of the present invention is that the lead frame is provided with processing information regarding processing, assembly, etc. within the lead frame. That is, in FIG. 1, (1
0) is a lead frame formed by punching a flat plate of Cu metal or Fe-N1 alloy metal, and is a bullet mount arranged at a predetermined pitch along the longitudinal direction! 1ts (1
1) (11)... and each bullet mount part (11)
(11)...Multiple leads (12) whose free ends extend to the vicinity of the periphery are integrated into a series using tie bars (13) (13)... ing. (A) is a lead frame (10)! Areas (a) and (ao) are notches for processing 2 formed on the side (10a) of the lead frame (10). So, the notch (a) is the lead frame (10)
The notch (ao) is placed at the starting end of the area (
It is placed immediately after A). (b) is a lead frame (1
This is a processing stop notch formed on the side (10b) of 0) and placed immediately before the non-processing area (A). (a
o) and (b) are both sides (
Frame termination notches 10a) and (10b) are formed opposite to each other and are located at the end of the lead frame (lO). (14) is an identification code (a) indicating processing information
(a') (a") (b) (b") An information processing device disposed on a conveyance path of a lead frame (10) provided with notches (a) (a') (a") and (b) (
two notch detection optical sensors (15a) that detect
) (15b) is provided.

上記リードフレーム(10)が搬送路を第1図に示すよ
うに搬送されてくると、情報処理装置(14)のノツチ
検出用光センサ(15a)が処理スタート用ノツチ(a
)を検出し、リードフレーム(10)に処理をスタート
させる。このとき、リードフレーム(10)の先端のベ
レットマウント部(11)及び複数のリード(12) 
 (12)・・・が処理位置に搬送されたときに、情報
処理装置(14)のノツチ検出用光センサ(15a)が
処理スタート用ノツチ(a)を検出するように設定して
おく。
When the lead frame (10) is conveyed along the conveyance path as shown in FIG. 1, the notch detection optical sensor (15a) of the information processing device (14)
) and causes the lead frame (10) to start processing. At this time, the bullet mount part (11) at the tip of the lead frame (10) and the plurality of leads (12)
(12) The notch detection optical sensor (15a) of the information processing device (14) is set to detect the processing start notch (a) when the... is transported to the processing position.

次に、リードフレーム(10)の処理不要領域(A)が
情報処理装置(14)に搬送されてくると、情報処理装
置(14)のノツチ検出用光センサ(15b )が処理
ストップ用ノツチ(b)を検出し、リードフレーム(1
0)の処理不要領域(A)の処理をストップする。この
とき、情報処理装置(14)のノツチ検出用光センサ(
15b )が処理ストップ用ノツチ(b)を検出してか
らもリードフレーム(10)の処理不要領域(A)が処
理位置に搬送されるまで処理を継続し、処理不要領域(
A)が処理位置に搬送されると処理をストップするよう
に設定しておく。
Next, when the non-processing area (A) of the lead frame (10) is conveyed to the information processing device (14), the notch detection optical sensor (15b) of the information processing device (14) detects the processing stop notch (15b). b) and detect the lead frame (1
0) Stops the processing of the non-processing area (A). At this time, the notch detection optical sensor (
15b) detects the processing stop notch (b), the processing continues until the processing-unnecessary area (A) of the lead frame (10) is transported to the processing position, and
The processing is set to stop when A) is transported to the processing position.

そして、リードフレーム(10)の処理不要領域(A)
が判別装置(14)を通過すると、情報処理装置(14
)のノツチ検出用光センサ(15a)が処理スタート用
ノフチ(b′)を検出し、リードフレーム(10)に処
理を再開させる。このとき、情報処理装置(14)のノ
ツチ検出用光センサ(15a )が処理スタート用ノン
チ(ao)を検出しても処理不要領域(A)が処理位置
に搬送されて通過するまでの間処理をストップし、通過
してから処理をスタートするように設定しておく。
And the unprocessed area (A) of the lead frame (10)
When the information processing device (14) passes through the discriminating device (14), the information processing device (14)
) detects the process start notch (b') and causes the lead frame (10) to restart the process. At this time, even if the notch detection optical sensor (15a) of the information processing device (14) detects the non-notch (ao) for starting processing, the processing will continue until the non-processing area (A) is conveyed to the processing position and passes through. Set it to stop, pass through, and then start processing.

更に、リードフレーム(■0)の終端部が情報処理装置
(14)に搬送されると、情報処理装置(14)のノツ
チ検出用光センサ(15a)  (15b)がフレーム
終了用ノツチ(a” )  (b’)を検出し、処理を
ストップさせる。このとき、情報処理装置(14)のノ
ツチ検出用光センサ(15a)(15b)がフレーム終
了用ノツチ(ao”>  (b”)を検出してからちり
一部フレーム(10)の最終のベレントマウント部(1
1)及び複数のリード(12)  (12)・・・が処
理位置を通過するまで処理を継続し、通過してから処理
をストップするように設定しておく。
Further, when the end portion of the lead frame (■0) is conveyed to the information processing device (14), the notch detection optical sensors (15a) (15b) of the information processing device (14) detect the frame end notch (a”). ) (b') is detected and the process is stopped. At this time, the notch detection optical sensors (15a) (15b) of the information processing device (14) detect the frame end notch (ao">(b")). Then dust some of the final berent mount part (10) of the frame (10).
1) and a plurality of leads (12) (12)... are set to continue the processing until they pass the processing position, and then stop the processing.

上記リードフレーム(10)は処理スタート用ノツチ(
a )  (a’) 、処理ストップ用ノツチ(b)及
びフレーム終了用ノツチ(a” )  (b’)等の処
理情報を設けているから、上述の如くメツキネ良や打抜
き不良といった処理不要領域(A)を避けて処理を行う
ことができる。
The lead frame (10) has a processing start notch (
Since processing information such as a) (a'), a processing stop notch (b), and a frame end notch (a'') (b') are provided, processing unnecessary areas (such as poor fitting and punching defects) are provided as described above. Processing can be performed while avoiding A).

以上の実施例は製造工程について説明したが、この発明
は実施することができる。
Although the above embodiment describes the manufacturing process, the present invention can be practiced.

〔発明の効果〕〔Effect of the invention〕

この発明によれば、リードフレームに組立、加工などに
関する処理情報を示す識別符号を設けたので、メツキネ
良や打法き不良といった処理不用領域を避けて処理を行
うことができるので、歩留まりや作業性が大幅に向上す
ることが期待できる。
According to this invention, since the lead frame is provided with an identification code that indicates processing information related to assembly, processing, etc., processing can be performed while avoiding areas that do not need processing, such as poor fitting or poor hitting method. It can be expected that the performance will be significantly improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明に係るリードフレームの平面図、第2
図は従来のリードフレームを示す平面図でろあ。 (10) −・リードフレーム、 (a)、(ao)、(b)、(a” )、(b゛)−識
別符号。 >
FIG. 1 is a plan view of a lead frame according to the present invention, and FIG.
The figure is a plan view showing a conventional lead frame. (10) - Lead frame, (a), (ao), (b), (a"), (b゛) - identification code. >

Claims (1)

【特許請求の範囲】[Claims] (1)送り方向に沿って処理ブロック毎の処理情報を示
す識別符号を設けたことを特徴とするリードフレーム。
(1) A lead frame characterized in that an identification code indicating processing information for each processing block is provided along the feeding direction.
JP23853988A 1988-09-21 1988-09-21 Lead frame Pending JPH0286156A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23853988A JPH0286156A (en) 1988-09-21 1988-09-21 Lead frame

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23853988A JPH0286156A (en) 1988-09-21 1988-09-21 Lead frame

Publications (1)

Publication Number Publication Date
JPH0286156A true JPH0286156A (en) 1990-03-27

Family

ID=17031755

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23853988A Pending JPH0286156A (en) 1988-09-21 1988-09-21 Lead frame

Country Status (1)

Country Link
JP (1) JPH0286156A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006150837A (en) * 2004-11-30 2006-06-15 Nissei Plastics Ind Co Managing device and management method of injection molding machine
WO2007079122A2 (en) * 2005-12-29 2007-07-12 Sandisk Corporation Strip for integrated circuit packages having a maximized usable area

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS642451B2 (en) * 1983-02-09 1989-01-17 Daido Steel Co Ltd

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS642451B2 (en) * 1983-02-09 1989-01-17 Daido Steel Co Ltd

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006150837A (en) * 2004-11-30 2006-06-15 Nissei Plastics Ind Co Managing device and management method of injection molding machine
WO2007079122A2 (en) * 2005-12-29 2007-07-12 Sandisk Corporation Strip for integrated circuit packages having a maximized usable area
WO2007079122A3 (en) * 2005-12-29 2007-09-07 Sandisk Corp Strip for integrated circuit packages having a maximized usable area
KR101015267B1 (en) * 2005-12-29 2011-02-18 샌디스크 코포레이션 Strip for integrated circuit packages having a maximized usable area

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