JPH0283435A - System for measuring light absorption factor of low light absorption factor object - Google Patents
System for measuring light absorption factor of low light absorption factor objectInfo
- Publication number
- JPH0283435A JPH0283435A JP23708088A JP23708088A JPH0283435A JP H0283435 A JPH0283435 A JP H0283435A JP 23708088 A JP23708088 A JP 23708088A JP 23708088 A JP23708088 A JP 23708088A JP H0283435 A JPH0283435 A JP H0283435A
- Authority
- JP
- Japan
- Prior art keywords
- light
- light absorption
- absorption factor
- low
- absorption rate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000031700 light absorption Effects 0.000 title claims abstract description 41
- 238000000034 method Methods 0.000 claims abstract description 5
- 230000003287 optical effect Effects 0.000 claims description 17
- 238000010521 absorption reaction Methods 0.000 abstract description 7
- 238000005259 measurement Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は仮光吸収率物体の元服収率測定方式に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a method for measuring the Genpuku yield of a temporary light absorption rate object.
従来、１０％以下程度の低光吸収率を有する物体の元服
収率測定では、１個の被測定物の入射光に対するは反射
光を測定し、その差から光吸収率を得ていた。Conventionally, in measuring the Genpuku yield of an object having a low light absorption rate of about 10% or less, the reflected light for the incident light of one object to be measured was measured, and the light absorption rate was obtained from the difference.
上述した従来の測定方式では、吸収率が１０％以下程度
で非常に小さい低吸収率物体の場合では、測定系そのも
のの測定誤差、すなわち、通常±５〜±１０％程度に及
ぶ入射光と反射光の光パワー測定誤差が差けられず、こ
のため正確な吸収率の測定値が得られないと云う欠点が
ある。In the conventional measurement method described above, in the case of a very low absorption object with an absorption rate of about 10% or less, the measurement error of the measurement system itself, that is, the incident light and reflection, which usually ranges from ±5 to ±10%, can occur. There is a drawback that the optical power measurement error of the light cannot be compensated for, and therefore an accurate measured value of absorption rate cannot be obtained.
本発明の目的は上述した欠点を除去し、吸収率を精度良
く測定できる仮光吸収率物体の元服収率測定方式を提供
することにある。SUMMARY OF THE INVENTION An object of the present invention is to eliminate the above-mentioned drawbacks and provide a method for measuring the Genpuku yield of a temporary light absorption rate object, which can measure the absorption rate with high accuracy.
本発明の仮光吸収率物体の元服収率測定方式は、同一特
性を有するｎ個の仮光吸収率物体によって入射光を次次
に反射されつつ多重反射を形成し入射光と最終反射光の
光パワーの差から得る前記ｎ個の仮光吸収率物体による
光吸収率の１ ／ ｎを１個当りの仮光吸収率物体の光
吸収率とする手段を備えて構成される。The Genpuku yield measurement method of temporary light absorption rate objects of the present invention is such that the incident light is sequentially reflected by n temporary light absorption rate objects having the same characteristics, forming multiple reflections, and the incident light and the final reflected light are The light absorption rate of each temporary light absorption rate object is set to 1/n of the light absorption rate of the n temporary light absorption rate objects obtained from the difference in optical power of the n temporary light absorption rate objects.
次に図面を参照して本発明を説明する。 Next, the present invention will be explained with reference to the drawings.
第１図は本発明の一実施例の構成図で、平行光発生装置
１と、同一の光パワーメータ２ａ、２ｂ、平行光発生装
Ｍ１からの入射光を次次に反射させつつ多重反射を形成
するｎ個の同一特性の仮光吸収率物体３−１〜３−ｎを
備えて成る。FIG. 1 is a block diagram of an embodiment of the present invention, in which multiple reflections are achieved while sequentially reflecting incident light from a parallel light generator 1, the same optical power meters 2a and 2b, and a parallel light generator M1. It comprises n temporary light absorption objects 3-1 to 3-n having the same characteristics.
次に、第１図の実施例の動作について説明する。Next, the operation of the embodiment shown in FIG. 1 will be explained.
平行光発生装置１から出力される平行光は、光路１０１
に沿って仮光吸収率物体３−１に入射され、その後仮光
吸収率物体３−２．３−３．３−４・・・３−ｎと次次
に多重反射して最終反射光の光パワーが光パワーメータ
２ｂで計測される。The parallel light outputted from the parallel light generator 1 follows the optical path 101.
The light is incident on the temporary light absorption object 3-1 along the path, and then undergoes multiple reflections from the temporary light absorption object 3-2. Optical power is measured by an optical power meter 2b.
また、平行光発生装置１の出力する平行光、すなわち、
多重反射を形成すべく仮光吸収率物体３−１に供給され
る入射光のパワーは、点線で示す如く光路１０１に光パ
ワーメータ２ａを配置して計測される。In addition, the parallel light output from the parallel light generator 1, that is,
The power of the incident light supplied to the temporary light absorption rate object 3-1 to form multiple reflections is measured by placing the optical power meter 2a in the optical path 101 as shown by the dotted line.
いま、光パワーメータ２ａで計測した入射光の光パワー
をＡ、光パワーメータ２ｂで計測した光パワーをＢとす
ると、Ａ−Ｂ＝に’がｎ個の仮光吸収率物体３−１〜３
−ｎの多重反射で失なわれた光パワー、すなわち吸収さ
れた光パワーである。Now, if the optical power of the incident light measured by the optical power meter 2a is A, and the optical power measured by the optical power meter 2b is B, A-B=' is n temporary light absorption objects 3-1~ 3
-n optical power lost due to multiple reflections, that is, absorbed optical power.
このに′には通常、光パワーメータ２ａ、２ｂ間の５〜
１０％程度の誤差が含まれている。いま、これをに±Δ
にの形で表現し、また仮光吸収率物体３−１〜３−ｎは
それぞれαの光吸収率であるとすると、次のり１）式が
得られる。In this case, normally 5 to 5 between the optical power meters 2a and 2b
Contains an error of about 10%. Now, change this to ±Δ
If it is expressed in the form of , and assuming that the temporary light absorption rate objects 3-1 to 3-n each have a light absorption rate of α, the following equation 1) is obtained.
Ｋ±Δに＝（１−α）″ ・・・（１）（１）式か
ら、αを求める次の（２）式が得られる。K±Δ=(1−α)″ (1) From equation (1), the following equation (2) for finding α is obtained.
α＝１−″１Ｆで三τ丁 ・・・（２）（２）式は
また次の（３）式に変換しうる。α=1−″1F and 3τ d...(2) Equation (2) can also be converted into the following equation (3).
α＝１−１１ｒＵＦＴＫ
＝１−ｆｉ ±Δ Ｋ
４１−’ｒＫ″（１±１／ｎ−Δに／Ｋ）・（３）通常
、同一生産ロットの仮光吸収率物体の光吸収率αはほぼ
同一であり、（３）式におけるαの誤差は１個の被測定
物の誤差±Δに／Ｋに比し１／ｎの１ ／ ｎ・Δに／
にとなり、多重反射を形成する。仮光吸収率物体の個数
に比例して計測精度が向上する。α=1-11rUFTK =1-fi ±Δ K 41-'rK'' (1±1/n-Δ/K)・(3) Normally, the light absorption rate α of the temporary light absorption rate object of the same production lot is They are almost the same, and the error of α in equation (3) is the error of one measured object ±Δ/K compared to 1/n of 1/n・Δ/
and forms multiple reflections. Measurement accuracy improves in proportion to the number of temporary light absorption objects.
以上説明したように本発明は、抵抗吸収率物体の光吸収
率の測定において、複数の低吸収率物体の多重反射を利
用する事により、光吸収率を著しく高精度に測定出来る
という効果がある。As explained above, the present invention has the advantage that in measuring the light absorption rate of a resistive absorption rate object, the light absorption rate can be measured with extremely high precision by utilizing multiple reflections from multiple low absorption rate objects. .
第１図は本発明の一実施例の構成図である。
１・・・平行光発生装置、２ａ、２ｂ・・・光パワーメ
ータ、３−１〜３−ｎ・・・仮光吸収率物体。FIG. 1 is a block diagram of an embodiment of the present invention. 1... Parallel light generator, 2a, 2b... Optical power meter, 3-1 to 3-n... Temporary light absorption rate object.
Claims (1)
を次次に反射されつつ多重反射を形成し入射光と最終反
射光の光パワーの差から得る前記ｎ個の仮光吸収率物体
による光吸収率の１／ｎを１個当りの低光吸収率物体の
光吸収率とする手段を備えて成ることを特徴とする低光
吸収率物体の光吸収率測定方式。The incident light is successively reflected by n low light absorption objects having the same characteristics, forming multiple reflections, and is obtained from the difference in optical power between the incident light and the final reflected light. A method for measuring the light absorption rate of a low light absorption rate object, comprising means for determining the light absorption rate of each low light absorption rate object to be 1/n of the light absorption rate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23708088A JPH0283435A (en) | 1988-09-20 | 1988-09-20 | System for measuring light absorption factor of low light absorption factor object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23708088A JPH0283435A (en) | 1988-09-20 | 1988-09-20 | System for measuring light absorption factor of low light absorption factor object |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0283435A true JPH0283435A (en) | 1990-03-23 |
Family
ID=17010118
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23708088A Pending JPH0283435A (en) | 1988-09-20 | 1988-09-20 | System for measuring light absorption factor of low light absorption factor object |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0283435A (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5342878A (en) * | 1976-09-30 | 1978-04-18 | Wako Kk | Soot concentration measuring apparatus |
| JPS5539049A (en) * | 1978-09-12 | 1980-03-18 | Matsushita Electric Ind Co Ltd | Detection and detector of optical attenuation |
| JPS5742842A (en) * | 1980-08-27 | 1982-03-10 | Nittan Co Ltd | Photoelectric smoke sensor |
-
1988
- 1988-09-20 JP JP23708088A patent/JPH0283435A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5342878A (en) * | 1976-09-30 | 1978-04-18 | Wako Kk | Soot concentration measuring apparatus |
| JPS5539049A (en) * | 1978-09-12 | 1980-03-18 | Matsushita Electric Ind Co Ltd | Detection and detector of optical attenuation |
| JPS5742842A (en) * | 1980-08-27 | 1982-03-10 | Nittan Co Ltd | Photoelectric smoke sensor |
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