JPH0282033U - - Google Patents

Info

Publication number
JPH0282033U
JPH0282033U JP16129388U JP16129388U JPH0282033U JP H0282033 U JPH0282033 U JP H0282033U JP 16129388 U JP16129388 U JP 16129388U JP 16129388 U JP16129388 U JP 16129388U JP H0282033 U JPH0282033 U JP H0282033U
Authority
JP
Japan
Prior art keywords
wafer
wafer holding
plate
holding part
polishing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16129388U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16129388U priority Critical patent/JPH0282033U/ja
Publication of JPH0282033U publication Critical patent/JPH0282033U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は考案の実施例に係る研磨装置を示す概
略断面図、第2図は従来技術に係る研磨装置を示
す概略断面図である。 1:研磨布、2:定盤、2a:回転軸、3:ウ
エーハ、40:プレート。
FIG. 1 is a schematic sectional view showing a polishing apparatus according to an embodiment of the invention, and FIG. 2 is a schematic sectional view showing a polishing apparatus according to the prior art. 1: Polishing cloth, 2: Surface plate, 2a: Rotating shaft, 3: Wafer, 40: Plate.

Claims (1)

【実用新案登録請求の範囲】 1 プレートの下面に固定保持されている半導体
ウエーハと、定盤上に貼設されている研磨布とを
、研磨剤を流下させつつ加圧下に摺擦運動させな
がら前記ウエーハ表面を研磨可能にしたウエーハ
研磨装置において、プレートのウエーハ保持面を
僅かに凸曲面状に設定したことを特徴とするウエ
ーハ研磨装置。 2 前記プレートのウエーハ保持面が、ウエーハ
保持部中心域と、ウエーハ保持部周縁域との差が
1〜10μmの範囲に設定されている請求項1記
載のウエーハ研磨装置。 3 前記プレートのウエーハ保持面が、ウエーハ
保持部中心域よりウエーハ保持部周縁域に移行す
るに連れ徐々に曲率半径を小に設定し、その断面
形状を略楕円形状に近似した曲線からなるよう設
定された請求項1記載のウエーハ研磨装置。
[Scope of Claim for Utility Model Registration] 1. A semiconductor wafer fixedly held on the lower surface of a plate and an abrasive cloth attached to a surface plate are subjected to a sliding movement under pressure while an abrasive is flowing down. A wafer polishing apparatus capable of polishing the wafer surface, wherein the wafer holding surface of the plate is set to have a slightly convex curved surface. 2. The wafer polishing apparatus according to claim 1, wherein the wafer holding surface of the plate has a difference between a central area of the wafer holding part and a peripheral area of the wafer holding part in a range of 1 to 10 μm. 3. The radius of curvature of the wafer holding surface of the plate is gradually made smaller as it moves from the central area of the wafer holding part to the peripheral area of the wafer holding part, and the cross-sectional shape is set to consist of a curved line approximating an approximately elliptical shape. The wafer polishing apparatus according to claim 1.
JP16129388U 1988-12-14 1988-12-14 Pending JPH0282033U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16129388U JPH0282033U (en) 1988-12-14 1988-12-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16129388U JPH0282033U (en) 1988-12-14 1988-12-14

Publications (1)

Publication Number Publication Date
JPH0282033U true JPH0282033U (en) 1990-06-25

Family

ID=31444095

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16129388U Pending JPH0282033U (en) 1988-12-14 1988-12-14

Country Status (1)

Country Link
JP (1) JPH0282033U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS632655A (en) * 1986-06-23 1988-01-07 Furukawa Electric Co Ltd:The Wafer polishing plate

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS632655A (en) * 1986-06-23 1988-01-07 Furukawa Electric Co Ltd:The Wafer polishing plate

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