JPH027582U - - Google Patents
Info
- Publication number
- JPH027582U JPH027582U JP8600188U JP8600188U JPH027582U JP H027582 U JPH027582 U JP H027582U JP 8600188 U JP8600188 U JP 8600188U JP 8600188 U JP8600188 U JP 8600188U JP H027582 U JPH027582 U JP H027582U
- Authority
- JP
- Japan
- Prior art keywords
- current
- group
- under test
- integrated circuits
- circuits under
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims description 10
- 238000001514 detection method Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8600188U JPH027582U (cs) | 1988-06-28 | 1988-06-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8600188U JPH027582U (cs) | 1988-06-28 | 1988-06-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH027582U true JPH027582U (cs) | 1990-01-18 |
Family
ID=31310655
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8600188U Pending JPH027582U (cs) | 1988-06-28 | 1988-06-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH027582U (cs) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09262316A (ja) * | 1996-10-21 | 1997-10-07 | Mitsuharu Nozawa | スイミングゴーグルのブリッジ構造 |
| WO2007029463A1 (ja) * | 2005-09-06 | 2007-03-15 | Advantest Corporation | 試験装置および試験方法 |
-
1988
- 1988-06-28 JP JP8600188U patent/JPH027582U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09262316A (ja) * | 1996-10-21 | 1997-10-07 | Mitsuharu Nozawa | スイミングゴーグルのブリッジ構造 |
| WO2007029463A1 (ja) * | 2005-09-06 | 2007-03-15 | Advantest Corporation | 試験装置および試験方法 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH027582U (cs) | ||
| AU7071594A (en) | Process and device for testing an integrated circuit soldered on a board | |
| CN108227681A (zh) | 集便器快速检测装置 | |
| CN207895312U (zh) | 集便器快速检测装置 | |
| JP3281164B2 (ja) | Icのインサーキットテスタによる足浮き検出方法 | |
| JPH025083U (cs) | ||
| JP2809278B2 (ja) | 半導体集積装置 | |
| GB2236193A (en) | Voltage indication apparatus | |
| JPS6110214Y2 (cs) | ||
| EP0012137A1 (en) | Electrical conductor and short circuit locator | |
| JPS6442470U (cs) | ||
| JPH0921846A (ja) | 検査装置 | |
| JPH052869Y2 (cs) | ||
| JPS60179976U (ja) | ラツチアツプ特性測定装置 | |
| JPH07198796A (ja) | 半導体集積回路装置 | |
| JPS6341783U (cs) | ||
| JPH0648441Y2 (ja) | ラツチアツプ特性試験装置 | |
| JPH0216075U (cs) | ||
| JPS58138047U (ja) | 熱電対の検査回路 | |
| JPS6466573A (en) | Apparatus for measuring latch-up strength of ic | |
| JPS62156868U (cs) | ||
| FR2756380B1 (fr) | Dispositif de controle de conformite de consommation d'un composant electronique dans une machine de tests | |
| JPH03122380U (cs) | ||
| JPH0755867A (ja) | 回路探査器 | |
| JPS59191676U (ja) | 素子劣化検出装置 |