JPH0269606A - Instrument for measuring height position of linear object - Google Patents

Instrument for measuring height position of linear object

Info

Publication number
JPH0269606A
JPH0269606A JP22130888A JP22130888A JPH0269606A JP H0269606 A JPH0269606 A JP H0269606A JP 22130888 A JP22130888 A JP 22130888A JP 22130888 A JP22130888 A JP 22130888A JP H0269606 A JPH0269606 A JP H0269606A
Authority
JP
Japan
Prior art keywords
light
mirror
height position
beam expander
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22130888A
Other languages
Japanese (ja)
Inventor
Hiroyuki Tsukahara
博之 塚原
Masahito Nakajima
雅人 中島
Tetsuo Hizuka
哲男 肥塚
Noriyuki Hiraoka
平岡 規之
Giichi Kakigi
柿木 義一
Yoshinori Sudo
嘉規 須藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP22130888A priority Critical patent/JPH0269606A/en
Publication of JPH0269606A publication Critical patent/JPH0269606A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/859Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector involving monitoring, e.g. feedback loop

Landscapes

  • Measurement Of Optical Distance (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To automatically inspect the accurate height position of an irregular linear object under noncontact state by applying an optical cutting method for measuring the height of the object represented by a bonding wire. CONSTITUTION:Optical cut light is projected on an IC 3 to be inspected by a lighting system 9 and its image is picked up by an image pickup device 10. The video signal output of this device 10 is converted into a digital signal by an A/D converter 11 and stored in an image memory 12. The IC chip position is detected by a chip position detection circuit 13 from information of the above- mentioned memory 12. The position of the optical cut light (reflected light) is then detected by a cut light detection circuit 15 based on the data of the chip position and a bonding position data memory 14. The position data are calculated by a height arithmetic circuit 16 and compared with an inspecting standard stored in an inspecting standard data memory 17 by a quality decision circuit 18 and the quality is decided. By this memory, the accurate inspection of the height position can be automatically carried out under noncontact state.

Description

【発明の詳細な説明】 〔概 要〕 半導体集積回路等の製造におけるボンディングワイヤ等
の接続に際し、外観検査に用いられる線状物体の高さ位
置検査装置に関し、 不定形線状物体の高さ計測に光切断法を適用できるよう
にし、それにより非接触で正確な高さ位置の検査の自動
化を実現することを目的とし、被検査物体に該被検査物
体の検査点を結ぶ形状に対応した底面形状を有する中空
の錐状の収束性照明光を照射する照明装置、該被検査物
体を撮像する撮像装置、該中空の錐状の照明光を該被検
査物体が受けて反射する反射光を、該撮像装置を介して
検出する切断光検出回路、および、該切断光検出回路で
検出された反射光の位置から該被検査物体の該錐状照明
光との交点の高さ位置を算出し、検査基準と比較し良否
の判定を行う画像処理部を具備するよう構成する。
[Detailed Description of the Invention] [Summary] This invention relates to a height position inspection device for a linear object used for visual inspection when connecting bonding wires, etc. in the manufacture of semiconductor integrated circuits, etc., and for measuring the height of an irregularly shaped linear object. The purpose of this is to enable the application of the optical cutting method to the object, thereby realizing automation of non-contact and accurate height position inspection. An illumination device that emits convergent illumination light in the shape of a hollow cone, an imaging device that images the object to be inspected, reflected light that the object to be inspected receives and reflects the hollow cone-shaped illumination light, calculating the height position of the intersection of the object to be inspected with the conical illumination light from the position of the cutting light detection circuit detected through the imaging device and the reflected light detected by the cutting light detection circuit; It is configured to include an image processing unit that compares with inspection standards and determines pass/fail.

〔産業上の利用分野〕[Industrial application field]

本発明は、例えば、半導体集積回路(IC)の製造にお
けるボンディングワイヤ等の接続における外観検査に用
いられる線状物体の高さ位置検査装置に関する。IC部
品の製造では、電気試験だけでなく各工程の外観検査も
重要である。しかし外観検査の大部分は、作業者の目視
により行われている。目視検査では作業者ごとの検査基
準のばらつき、疲労による欠陥の見逃し等の問題があり
外観検査の自動化が強く望まれている。
The present invention relates to an apparatus for inspecting the height position of a linear object, which is used, for example, to inspect the appearance of connections such as bonding wires in the manufacture of semiconductor integrated circuits (ICs). In the manufacture of IC parts, not only electrical tests but also visual inspections of each process are important. However, most of the visual inspections are performed visually by the operator. Visual inspection has problems such as variations in inspection standards among workers and failures due to fatigue, so automation of visual inspection is strongly desired.

〔従来の技術] 物体の高さ情報を検出するためによく用いられている方
法に光切断法がある。この光切断法の原理を第16図お
よび第17図を用いて説明する。
[Prior Art] A method that is often used to detect height information of an object is an optical cutting method. The principle of this optical cutting method will be explained using FIGS. 16 and 17.

まず、スリット光63(幅の狭い一直線上の光)を対象
物体62に斜め方向から投射する。その画像を真上から
撮像すると高さが異なる部分で反射部分65.66に段
差dが生じる。この段差dと投射光の斜め角度θにより
、物体62の高さhが得られる。第17図はTVカメラ
61で第16図の物体62の反射光65.66を真上か
ら見た図である。
First, the slit light 63 (light on a narrow straight line) is projected onto the target object 62 from an oblique direction. When the image is captured from directly above, a step d appears in the reflective portions 65 and 66 at different heights. The height h of the object 62 is obtained from this step d and the oblique angle θ of the projected light. FIG. 17 is a view of the reflected light 65 and 66 of the object 62 in FIG. 16 viewed from directly above with the TV camera 61.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述の光切断法は、光切断法が直線スリット光の場合、
対象物体が直方体などの直線物体に有効である。しかし
検査対象が第18図に示すようなIC3またはLSI等
のボンディングワイヤのような放射状に配線された線状
物体42の高さ計測には適用が困難である。
In the above-mentioned light cutting method, when the light cutting method uses a straight slit light,
This method is effective when the target object is a rectilinear object such as a rectangular parallelepiped. However, it is difficult to apply this method to measuring the height of a linear object 42 wired radially, such as a bonding wire of an IC3 or LSI as shown in FIG. 18, to be inspected.

本発明の目的は、光切断光の作成に特別な工夫をして、
ボンディングワイヤに代表される不定形線状物体の高さ
計測に光切断法を通用できるようにし、それにより、非
接触で正確な高さ位置の検査の自動化を実現することに
ある。
The purpose of the present invention is to create a light-cutting light with a special device,
The objective is to enable the use of optical cutting methods to measure the height of irregularly shaped linear objects, such as bonding wires, and thereby realize automated, non-contact, accurate height position inspection.

〔課題を解決するための手段〕[Means to solve the problem]

上述の課題を解決するため、本発明においては、第1図
に示すように、中空の錐状の収束性照明光を照射する照
明装置9と、被検査物体3を撮像する撮像装置10と、
切断光検出回路15と、画像処理部20を具備する線状
物体の高さ位置検出装置が提供される。
In order to solve the above problems, in the present invention, as shown in FIG. 1, an illumination device 9 that emits convergent illumination light in the shape of a hollow cone, an imaging device 10 that images the object to be inspected 3,
A linear object height position detection device including a cutting light detection circuit 15 and an image processing section 20 is provided.

照明装置9は被検査物体3に、該被検査物体3の検査点
を結ぶ形状に対応した底面形状を有する中空の錐状の収
束性照明光を作成する。切断光検出回路15は該中空の
錐状の照明光を該被検査物体3が受けて反射する反射光
を、該撮像装置IOを介して検出する。画像処理部20
は、該切断光検出回路15で検出された反射光の位置か
ら該被検査物体3の錐状照明光との交点の高さ位置を算
出し、検査基準と比較し良否の判定を行う。
The illumination device 9 produces convergent illumination light on the object 3 to be inspected in the shape of a hollow cone having a bottom surface shape corresponding to the shape connecting the inspection points of the object 3 to be inspected. The cutting light detection circuit 15 detects the reflected light that is reflected by the object to be inspected 3 when the hollow cone-shaped illumination light is received, via the imaging device IO. Image processing section 20
calculates the height position of the intersection of the object to be inspected 3 with the conical illumination light from the position of the reflected light detected by the cutting light detection circuit 15, and compares it with the inspection standard to determine pass/fail.

〔作 用〕[For production]

前述の装置を用いれば、被検査物体3の所望の検査点の
配置された形状に対応した光ビームを被検査物体3に照
射することができ、光切断法を最適な条件で適用でき、
非接触で正確な高さ位置を検査できる。特にボンディン
グワイヤのような被検査対象の場合、放射状に配線され
た線状物体に斜め上方かつ周囲側から適切な光切断光を
照射でき、ループ形状も検査できる。
By using the above-mentioned device, the object to be inspected 3 can be irradiated with a light beam corresponding to the shape of the desired inspection points of the object to be inspected 3, and the light cutting method can be applied under optimal conditions.
Accurate height position can be inspected without contact. In particular, in the case of an object to be inspected such as a bonding wire, the linear object wired radially can be irradiated with appropriate light cutting light from diagonally above and from the periphery, and loop shapes can also be inspected.

[実施例] 本発明の一実施例としての線状物体の高さ位置検査装置
のブロック回路図が第2図に、該装置の各工程の流れ図
が第3図に示される。
[Embodiment] FIG. 2 shows a block circuit diagram of an apparatus for inspecting the height position of a linear object as an embodiment of the present invention, and FIG. 3 shows a flowchart of each process of the apparatus.

この装置は被検査対象物体(本例ではIC)3を照射す
る照明装置9、撮像装置10、A/D(アナログ/ディ
ジタル)変換回路11、画像メモリ12、チップ位置検
出回路13、ボンディング位置データメモリ14、切断
光検出回路15、高さ演算回路16、検査基準データメ
モリ17、良否判定回路18、および警報装置19を具
備する。
This device includes an illumination device 9 that illuminates an object to be inspected (IC in this example) 3, an imaging device 10, an A/D (analog/digital) conversion circuit 11, an image memory 12, a chip position detection circuit 13, and bonding position data. It includes a memory 14, a cutting light detection circuit 15, a height calculation circuit 16, an inspection standard data memory 17, a quality determination circuit 18, and an alarm device 19.

被検査IC3は照明装置9によって、光切断光を照射さ
れ、撮像装置10でその画像をI最像される。撮像装置
lOの映像信号出力はA/D変換器11でディジタル信
号に変換され、画像メモリ12に格納される(第3図工
程Sl)。画像メモリ12の情報からチップ位置検出回
路13(例えば、バクーンマッチング回路)により、I
Cチップ位置を検出する(工程S2)。チップ位置とボ
ンディング位置データメモリ14のデータとにより、切
断光検出回路15で光切断光(反射光)の位置を検出す
る(工程S5.S6)。前記位置データは高さ演算回路
16で演算され(工程S7)、良否判定回路18で検査
基準データメモリ17に格納されている検査基準と比較
され良否の判定が行われる(工程S8)。
The IC 3 to be inspected is irradiated with light cutting light by the illumination device 9, and its image is captured by the imaging device 10. The video signal output from the imaging device IO is converted into a digital signal by the A/D converter 11 and stored in the image memory 12 (step Sl in FIG. 3). From the information in the image memory 12, the chip position detection circuit 13 (e.g. Bakun matching circuit) determines the I
The C chip position is detected (step S2). Based on the chip position and the data in the bonding position data memory 14, the cutting light detection circuit 15 detects the position of the optical cutting light (reflected light) (steps S5 and S6). The position data is calculated by the height calculation circuit 16 (step S7), and is compared with the inspection standard stored in the inspection standard data memory 17 by the quality judgment circuit 18 to judge whether it is good or bad (step S8).

第8図に本実施例の照明装置の構成が示される。FIG. 8 shows the configuration of the lighting device of this embodiment.

レーザ光源85から照射された光は、ビームエキスパン
ダ86により光の径を平行にされ、かつ引き伸ばされる
。次に、光束を円形スリット板87により、円筒状の光
に整形する。円筒状のレーザ光はハーフミラ−88で垂
直下方に進路を変え、凸レンズの中心部分に穴をあけた
ような集光用円環レンズ74で被検査対象線に対し斜め
上方からの逆円錐状の光切断光を提供する。第6図、第
7図、および第9図に、それぞれ逆円錐状の照明光(光
切断光)の側断面図、平面図、および斜視図が示される
。円筒状の光75は図に示されるように集光用円環レン
ズ74により逆円錐状の照明光76に収束される。これ
により放射状に配線されたボンディングワイヤの所要部
分に切断光を照射できる。前記集光用円環レンズ74の
中心部分の穴はTVカメラ61で被検査対象3をI最像
するために必要なものである。
The light emitted from the laser light source 85 is made parallel in diameter and expanded by the beam expander 86. Next, the light beam is shaped into a cylindrical light beam by a circular slit plate 87. The cylindrical laser beam changes its course vertically downward with a half mirror 88, and a condensing annular lens 74, which is like a hole in the center of a convex lens, directs the cylindrical laser beam into an inverted conical direction from diagonally above the line to be inspected. Provides optical cutting light. 6, 7, and 9 show a side sectional view, a top view, and a perspective view of the inverted conical illumination light (light cutting light), respectively. As shown in the figure, the cylindrical light 75 is converged into an inverted conical illumination light 76 by a condensing annular lens 74. This allows the cutting light to be irradiated onto the required portions of the radially wired bonding wires. The hole in the center of the condensing annular lens 74 is necessary for the TV camera 61 to image the object 3 to be inspected.

切断光検出回路15による光切断光の検出を第3図、第
4図、および第5図を用いて説明する。
Detection of optical cutting light by the cutting light detection circuit 15 will be explained with reference to FIGS. 3, 4, and 5.

第3図の工程S3から36に示すように、ボンディング
ワイヤ42を含む矩形領域41を画像メモリ12から切
り出す(S3)。該領域をボンディングワイヤに対して
垂直方向に画像を投影する(S4)。投影像には、光切
断光の画像が投影されている。ここで、ボンディングワ
イヤ42に当たった光52とパッケージに当たった部分
51では、その光画像位置が異なる。それらの位置Pお
よびpt  (第5図参照)を検出しくS5)、その間
隔りを測長する(S6)。
As shown in steps S3 to 36 in FIG. 3, a rectangular area 41 including the bonding wire 42 is cut out from the image memory 12 (S3). An image of the area is projected in a direction perpendicular to the bonding wire (S4). An image of the light cutting light is projected onto the projection image. Here, the light image position is different between the light 52 hitting the bonding wire 42 and the portion 51 hitting the package. The positions P and pt (see FIG. 5) are detected (S5), and the distance between them is measured (S6).

次に高さ演算回路16により、高さを演算する(工程S
7)。切断光の設定角度θと間隔りにより次式でボンデ
ィングワイヤ高さHが算出される。
Next, the height calculation circuit 16 calculates the height (step S
7). The bonding wire height H is calculated using the following equation based on the set angle θ of the cutting light and the interval.

H−D X tanθ ボンディングワイヤの高さHは、検査基f−9データメ
モリ17に格納されている検査基準と、良否判定回路1
8において比較され、良否の判定が行われる。すなわち
、最大高基準よりHが小で、最小高基準よりHが大であ
れば良であるとし、それ以外の時は否として、警報装置
19により警報を発する。
H-D
8, and a determination of pass/fail is made. That is, if H is smaller than the maximum height reference and H is larger than the minimum height reference, it is determined to be OK; otherwise, it is determined to be NO, and the alarm device 19 issues an alarm.

本発明の照明装置における他の実施例について第10図
および第11図を用いて説明する。この実施例の照明装
置は第8図の実施例と比較して、円形スリント板87を
省略し、ハーフミラ−88の代りにミラー98を用いる
点が異なる。ミラー9日は透明な板に楕円形の線状反射
膜99を設けて、レーザ光源85からの平行光線を反射
させ第8図の実施例と同様な円筒状の光を作成する。ま
た、このミラーの変形として反射膜59を二重以上にし
たミラー5日を用いることもできる。これにより、複数
本の光ビームを被検査物体に照射可能となる。
Another embodiment of the lighting device of the present invention will be described with reference to FIGS. 10 and 11. The lighting device of this embodiment differs from the embodiment of FIG. 8 in that the circular slint plate 87 is omitted and a mirror 98 is used instead of the half mirror 88. The mirror 9 is provided with an elliptical linear reflective film 99 on a transparent plate to reflect parallel light from the laser light source 85 to create cylindrical light similar to the embodiment shown in FIG. Further, as a modification of this mirror, a mirror in which the reflective film 59 is made double or more can also be used. This makes it possible to irradiate the object to be inspected with a plurality of light beams.

照明装置のさらに他の実施例について第12図および第
13図を用いて説明する。この実施例では、第8図の実
施例の集光用円環レンズ74の代りにパラボラリフレク
タ89が用いられる。これにより集光用円環レンズ74
と同等の機能を与えることができる。このパラボラリフ
レクタ89の代りに二重以上のパラボラリフレクタ54
を用い、複数本の光ビームを被検査物体へ収束して、照
射することが可能になる。
Still another embodiment of the lighting device will be described with reference to FIGS. 12 and 13. In this embodiment, a parabolic reflector 89 is used in place of the condensing annular lens 74 of the embodiment shown in FIG. As a result, the condensing annular lens 74
It is possible to provide the same functionality as . Instead of this parabolic reflector 89, a double or more parabolic reflector 54
Using this method, it becomes possible to converge and irradiate multiple light beams onto an object to be inspected.

前述の第10図の実施例においては、ミラーの反射膜は
楕円形として説明したが、第14図に示されるような透
明板31の上に長方形状の反射膜32を設けたミラー3
0を用いることもでき、この他にも種々の形状の反射)
模を被検査対象の形状に応じて使用することができる。
In the embodiment shown in FIG. 10, the reflective film of the mirror was explained as being elliptical, but the mirror 3 shown in FIG. 14 has a rectangular reflective film 32 on a transparent plate 31.
0 can also be used, and various other shapes of reflection)
A pattern can be used depending on the shape of the object to be inspected.

さらにミラーの変形例として中心部に開口部を有する反
射板34でミラー33を構成することもできる。この際
、円筒状の光の外縁はビームエキスパンダ86によって
規定される。
Furthermore, as a modified example of the mirror, the mirror 33 can also be configured with a reflecting plate 34 having an opening in the center. At this time, the outer edge of the cylindrical light is defined by the beam expander 86.

(発明の効果〕 本発明によれば、ボンディングワイヤに代表される不定
形線状物体の高さ計測に光切断法を適用することができ
、それにより、非接触で正確な高さ位置の検査の自動化
を実現できる。
(Effects of the Invention) According to the present invention, the optical cutting method can be applied to the height measurement of an irregularly shaped linear object such as a bonding wire, and thereby the accurate height position can be inspected without contact. can be automated.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明を説明するブロック図、第2図は本発明
の一実施例としての線状物体の高さ位置検査装置のブロ
ック図、 第3図は第2図の装置の工程流れ図、 第4図は第3図の工程における検査領域切出しを説明す
る図、 第5図は第3図の工程における検査領域内投影を説明す
る図、 第6図および第7図は実施例の照明光のそれぞれ側断面
図および平面図、 第8図は第2図の実施例の照明装置を説明する図、 第9図は実施例の照明光の斜視図、 第10図は照明装置の他の実施例を説明する図、第11
図は第10図のミラーの変形例を示す斜視図、 第12図は照明装置の他の実施例を説明する図、第13
図は第12図のパラボラリフレクタの変形例を示す斜視
図、 第14図は第10図の実施例の照明装置のミラー反射膜
の変形例を示す図、 第15図は第10図のミラーの他の変形例を示す図、 第16図は光切断法を説明する斜視図、第17図は第1
6図の反射光を真上から見た平面図、および 第18図は本発明が一例として適用されるICのボンデ
ィングワイヤを示す斜視図である。 図において、 3・・・被検査rc、 9・・・照明装置、 10・・・撮像装置、 11・・・A/D変換回路、 12・・・画像メモリ、 13・・・チップ位置検出回路、 14・・・ボンディング位置データメモリ、15・・・
切断光検出回路、 16・・・高さ演算回路、 17・・・検査基準データメモリ、 18・・・良否判定回路、 19・・・警報装置、 20・・・画像処理部、 である。
FIG. 1 is a block diagram explaining the present invention, FIG. 2 is a block diagram of a height position inspection device for a linear object as an embodiment of the present invention, and FIG. 3 is a process flow diagram of the device shown in FIG. FIG. 4 is a diagram illustrating the inspection area extraction in the process of FIG. 3, FIG. 5 is a diagram illustrating the projection within the inspection area in the process of FIG. 3, and FIGS. 6 and 7 are illumination lights of the embodiment FIG. 8 is a diagram explaining the illumination device of the embodiment shown in FIG. 2, FIG. 9 is a perspective view of the illumination light of the embodiment, and FIG. 10 is another embodiment of the illumination device. Figure 11 explaining an example
The figures are a perspective view showing a modified example of the mirror shown in Fig. 10, Fig. 12 is a view explaining another embodiment of the illumination device, and Fig. 13 is a diagram illustrating another embodiment of the illumination device.
12 is a perspective view showing a modification of the parabolic reflector of FIG. 12, FIG. 14 is a diagram showing a modification of the mirror reflection film of the illumination device of the embodiment shown in FIG. 10, and FIG. 15 is a perspective view of the mirror of FIG. Figures showing other modifications; Figure 16 is a perspective view illustrating the light cutting method; Figure 17 is the first
FIG. 6 is a plan view of reflected light viewed from directly above, and FIG. 18 is a perspective view showing an IC bonding wire to which the present invention is applied as an example. In the figure, 3... RC to be inspected, 9... Illumination device, 10... Imaging device, 11... A/D conversion circuit, 12... Image memory, 13... Chip position detection circuit , 14... bonding position data memory, 15...
Cutting light detection circuit, 16... Height calculation circuit, 17... Inspection standard data memory, 18... Pass/fail determination circuit, 19... Alarm device, 20... Image processing unit.

Claims (1)

【特許請求の範囲】 1、被検査物体(3)に該被検査物体(3)の検査点を
結ぶ形状に対応した底面形状を有する中空の錐状の収束
性照明光を照射する照明装置(9)、該被検査物体(3
)を撮像する撮像装置(10)、該中空の錐状の照明光
を該被検査物体(3)が受けて反射する反射光を、該撮
像装置(10)を介して検出する切断光検出回路(15
)、および 該切断光検出回路(15)で検出された反射光の位置か
ら該被検査物体(3)の該錐状照明光との交点の高さ位
置を算出し、検査基準と比較し良否の判定を行う画像処
理部(20)を具備する線状物体の高さ位置検査装置。 2、前記照明装置(9)は、レーザ光源(85)、該レ
ーザ光源からの光を引き伸ばしてかつ平行にするビーム
エキスパンダ(86)、該ビームエキスパンダ(86)
からの平行光線を円筒状の光に整形する円形スリット板
(87)、該円形スリット板(87)からの円筒状の光
を反射するハーフミラー(88)、該ハーフミラー(8
8)からの反射光を受け逆円錐状の照射光を作成する集
光用円環レンズ(74)を具備する請求項1記載の線状
物体の高さ位置検査装置。 3、前記照明装置(9)は、レーザ光源(85)、該レ
ーザ光源からの光を引き伸ばしてかつ平行にするビーム
エキスパンダ(86)、該ビームエキスパンダ(86)
からの平行光線を楕円状の光反射膜(99)で反射する
ミラー(98)、該ミラー(98)からの反射光を受け
逆円錐状の照射光を作成する集光用円環レンズ(74)
を具備する請求項1記載の線状物体の高さ位置検査装置
。 4、前記照明装置(9)は、レーザ光源(85)、該レ
ーザ光源からの光を引き伸ばしてかつ平行にするビーム
エキスパンダ(86)、該ビームエキスパンダ(86)
からの平行光線を円筒状の光に整形する円形スリット板
(87)、該円形スリット板(87)からの円筒状の光
を反射するハーフミラー(88)、該ハーフミラー(8
8)からの反射光を受け逆円錐状の照射光を作成するパ
ラボラリフレクタ(89)を具備する請求項1記載の線
状物体の高さ位置検査装置。 5、前記照明装置(9)は、レーザ光源(85)、該レ
ーザ光源からの光を引き伸ばし平行な円柱状にするビー
ムエキスパンダ(86)、該ビームエキスパンダ(86
)からの円柱状光線を反射する楕円状の開口を有するミ
ラー(33)、該ミラー(33)からの反射光を受け逆
円錐状の照射光を作成する集光用円環レンズ(74)を
具備する請求項1記載の線状物体の高さ位置検査装置。
[Claims] 1. An illumination device ( 9), the object to be inspected (3
), and a cutting light detection circuit that detects, via the imaging device (10), reflected light that is reflected by the object to be inspected (3) receiving the hollow cone-shaped illumination light. (15
) and the position of the reflected light detected by the cutting light detection circuit (15), calculate the height position of the intersection of the object to be inspected (3) with the conical illumination light, and compare it with the inspection standard to determine pass/fail. A height position inspection device for a linear object, comprising an image processing unit (20) that performs a determination. 2. The illumination device (9) includes a laser light source (85), a beam expander (86) that stretches and parallelizes the light from the laser light source, and the beam expander (86).
a circular slit plate (87) that shapes parallel light from the circular slit plate (87) into cylindrical light; a half mirror (88) that reflects the cylindrical light from the circular slit plate (87);
2. The height position inspection device for a linear object according to claim 1, further comprising a condensing annular lens (74) for receiving the reflected light from the condenser (74) and creating an inverted cone-shaped irradiation light. 3. The illumination device (9) includes a laser light source (85), a beam expander (86) that stretches and parallelizes the light from the laser light source, and the beam expander (86).
A mirror (98) that reflects parallel light from the mirror (99) with an elliptical light reflection film (99), a condensing annular lens (74) that receives the reflected light from the mirror (98) and creates an inverted conical irradiation light. )
The height position inspection device for a linear object according to claim 1, comprising: 4. The illumination device (9) includes a laser light source (85), a beam expander (86) that stretches and parallelizes the light from the laser light source, and the beam expander (86).
A circular slit plate (87) that shapes parallel light from the circular slit plate (87) into cylindrical light; a half mirror (88) that reflects the cylindrical light from the circular slit plate (87);
2. The height position inspection device for a linear object according to claim 1, further comprising a parabolic reflector (89) that receives the reflected light from the object and creates an inverted cone-shaped irradiation light. 5. The illumination device (9) includes a laser light source (85), a beam expander (86) that stretches the light from the laser light source into a parallel cylindrical shape, and the beam expander (86).
), a mirror (33) having an elliptical aperture that reflects the cylindrical light beam from the mirror (33), and a condensing annular lens (74) that receives the reflected light from the mirror (33) and creates an inverted cone-shaped irradiation light. A height position inspection device for a linear object according to claim 1.
JP22130888A 1988-09-06 1988-09-06 Instrument for measuring height position of linear object Pending JPH0269606A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22130888A JPH0269606A (en) 1988-09-06 1988-09-06 Instrument for measuring height position of linear object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22130888A JPH0269606A (en) 1988-09-06 1988-09-06 Instrument for measuring height position of linear object

Publications (1)

Publication Number Publication Date
JPH0269606A true JPH0269606A (en) 1990-03-08

Family

ID=16764761

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22130888A Pending JPH0269606A (en) 1988-09-06 1988-09-06 Instrument for measuring height position of linear object

Country Status (1)

Country Link
JP (1) JPH0269606A (en)

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Publication number Priority date Publication date Assignee Title
JP2008265844A (en) * 2007-04-24 2008-11-06 Furukawa Mfg Co Ltd Method and apparatus for packaging and supplying meat part to vacuum packaging machine
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US9243761B2 (en) 2013-02-28 2016-01-26 Sumitomo Electric Industries, Ltd. Optical assembly and method for assembling the same, and optical module implemented with optical assembly
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JPWO2015093470A1 (en) * 2013-12-16 2017-03-16 日本電信電話株式会社 End face observation device
US10006831B2 (en) 2013-12-16 2018-06-26 Nippon Telegraph And Telephone Corporation End face observation device
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