JPH0262949B2 - - Google Patents

Info

Publication number
JPH0262949B2
JPH0262949B2 JP15990285A JP15990285A JPH0262949B2 JP H0262949 B2 JPH0262949 B2 JP H0262949B2 JP 15990285 A JP15990285 A JP 15990285A JP 15990285 A JP15990285 A JP 15990285A JP H0262949 B2 JPH0262949 B2 JP H0262949B2
Authority
JP
Japan
Prior art keywords
test
burn
block
high temperature
under test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15990285A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6221236A (ja
Inventor
Noriaki Okazaki
Masahiro Manabe
Yoshimasa Oosaka
Akira Wada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PFU Ltd
Original Assignee
PFU Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PFU Ltd filed Critical PFU Ltd
Priority to JP15990285A priority Critical patent/JPS6221236A/ja
Publication of JPS6221236A publication Critical patent/JPS6221236A/ja
Publication of JPH0262949B2 publication Critical patent/JPH0262949B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP15990285A 1985-07-19 1985-07-19 半導体ボ−ドのダイナミツクバ−イン試験方法 Granted JPS6221236A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15990285A JPS6221236A (ja) 1985-07-19 1985-07-19 半導体ボ−ドのダイナミツクバ−イン試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15990285A JPS6221236A (ja) 1985-07-19 1985-07-19 半導体ボ−ドのダイナミツクバ−イン試験方法

Publications (2)

Publication Number Publication Date
JPS6221236A JPS6221236A (ja) 1987-01-29
JPH0262949B2 true JPH0262949B2 (cg-RX-API-DMAC7.html) 1990-12-27

Family

ID=15703666

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15990285A Granted JPS6221236A (ja) 1985-07-19 1985-07-19 半導体ボ−ドのダイナミツクバ−イン試験方法

Country Status (1)

Country Link
JP (1) JPS6221236A (cg-RX-API-DMAC7.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5077740B2 (ja) * 2007-03-29 2012-11-21 Nltテクノロジー株式会社 エージング装置

Also Published As

Publication number Publication date
JPS6221236A (ja) 1987-01-29

Similar Documents

Publication Publication Date Title
RU2075135C1 (ru) Установка для плазмоструйной обработки пластин
US6204679B1 (en) Low cost memory tester with high throughput
US5838568A (en) Heated circuit assembly tester and method
KR20030029266A (ko) 테스트 핸들러
JP2863352B2 (ja) 半導体集積回路試験装置
KR20000034619A (ko) 모듈 아이씨 핸들러의 모듈 아이씨 및 캐리어 핸들링방법
JP3450825B2 (ja) 製品のインライン試験装置及び方法
CN108562844B (zh) 一种bms电池管理系统组装测试线
JPH0262949B2 (cg-RX-API-DMAC7.html)
JP3942734B2 (ja) 電子部品試験装置
JPH0539500Y2 (cg-RX-API-DMAC7.html)
JP2000162268A (ja) 電子部品の温度印加方法および電子部品試験装置
JPS6131827B2 (cg-RX-API-DMAC7.html)
KR100283433B1 (ko) 모듈 아이씨 핸들러의 캐리어 핸들링 장치 및 그 방법
JP2657314B2 (ja) 半導体検査装置
JP2533174B2 (ja) 部品試験装置
JP2008170224A (ja) 温度試験装置及び温度試験方法
CN219964912U (zh) 一种高精度温度试验箱
CN221156717U (zh) 一种高温老化测试设备
JPH0480347B2 (cg-RX-API-DMAC7.html)
CN209488727U (zh) 一种摄像头装载治具
JPS59232430A (ja) 半導体素子の製造装置
JPH06331694A (ja) 恒温式測定装置
CN117773383A (zh) 一种汽车尾门脚踢传感控制器的装配结构及其测试方法
JP3249833B2 (ja) ハンドラー装置