JPH0255900B2 - - Google Patents
Info
- Publication number
- JPH0255900B2 JPH0255900B2 JP57165369A JP16536982A JPH0255900B2 JP H0255900 B2 JPH0255900 B2 JP H0255900B2 JP 57165369 A JP57165369 A JP 57165369A JP 16536982 A JP16536982 A JP 16536982A JP H0255900 B2 JPH0255900 B2 JP H0255900B2
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- electron beam
- sample
- signal
- automatic focusing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010894 electron beam technology Methods 0.000 claims description 22
- 230000005284 excitation Effects 0.000 claims description 12
- 238000001514 detection method Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 201000009310 astigmatism Diseases 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 238000012937 correction Methods 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/21—Means for adjusting the focus
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57165369A JPS5954159A (ja) | 1982-09-22 | 1982-09-22 | 走査電子顕微鏡における自動焦点合わせ装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57165369A JPS5954159A (ja) | 1982-09-22 | 1982-09-22 | 走査電子顕微鏡における自動焦点合わせ装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5954159A JPS5954159A (ja) | 1984-03-28 |
JPH0255900B2 true JPH0255900B2 (enrdf_load_html_response) | 1990-11-28 |
Family
ID=15811058
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57165369A Granted JPS5954159A (ja) | 1982-09-22 | 1982-09-22 | 走査電子顕微鏡における自動焦点合わせ装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5954159A (enrdf_load_html_response) |
-
1982
- 1982-09-22 JP JP57165369A patent/JPS5954159A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5954159A (ja) | 1984-03-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1632980B1 (en) | Scanning particle beam instrument | |
US4199681A (en) | Method and apparatus for automatically focusing an electron beam in a scanning beam device | |
JP2001357811A (ja) | 走査形荷電粒子顕微鏡、並びに走査形荷電粒子顕微鏡の焦点合わせ方法及び非点収差補正方法 | |
JP2002150987A (ja) | 電子顕微鏡および電子顕微鏡における透過電子像撮影方法 | |
JP2003151484A (ja) | 走査型荷電粒子ビーム装置 | |
JPH0255900B2 (enrdf_load_html_response) | ||
US5258617A (en) | Method and apparatus for correcting axial coma in electron microscopy | |
JP3571561B2 (ja) | 走査顕微鏡 | |
JPH0255899B2 (enrdf_load_html_response) | ||
EP0989583A1 (en) | Method and device for focusing a charged particle beam | |
JPH08167396A (ja) | 電界放射型電子銃を備えた電子ビーム装置 | |
JP3037006B2 (ja) | 走査電子顕微鏡における自動画像調整方法 | |
JPH03138841A (ja) | 走査形電子顕微鏡 | |
JPH07302574A (ja) | 集束イオンビーム加工観察装置 | |
JPH10172489A (ja) | 走査電子顕微鏡における電子ビームの調整方法 | |
JP3414602B2 (ja) | 走査電子顕微鏡およびその制御方法 | |
JP3114416B2 (ja) | 荷電粒子ビーム装置における焦点合わせ方法 | |
JP2002319361A (ja) | 走査電子顕微鏡の異種倍率設定方法 | |
JP2000048749A (ja) | 走査電子顕微鏡および電子ビームの軸合わせ方法 | |
JPS6364255A (ja) | 粒子線照射装置 | |
JPH05290780A (ja) | 荷電粒子ビーム装置における焦点合わせおよび非点補正方法 | |
JPS5914222B2 (ja) | 走査電子顕微鏡等用倍率制御装置 | |
JPS5946746A (ja) | 荷電粒子線装置における自動焦点合わせ装置 | |
JP3112541B2 (ja) | 電子ビーム装置における非点補正方法 | |
JP2004327118A (ja) | 走査型電子顕微鏡のヒステリシス補正方法、及び走査型電子顕微鏡 |