JPH0252981B2 - - Google Patents

Info

Publication number
JPH0252981B2
JPH0252981B2 JP58192409A JP19240983A JPH0252981B2 JP H0252981 B2 JPH0252981 B2 JP H0252981B2 JP 58192409 A JP58192409 A JP 58192409A JP 19240983 A JP19240983 A JP 19240983A JP H0252981 B2 JPH0252981 B2 JP H0252981B2
Authority
JP
Japan
Prior art keywords
vibration
laser
lead
inspection
speckle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58192409A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6085363A (ja
Inventor
Takashi Hiroi
Takanori Ninomya
Yasuo Nakagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58192409A priority Critical patent/JPS6085363A/ja
Publication of JPS6085363A publication Critical patent/JPS6085363A/ja
Publication of JPH0252981B2 publication Critical patent/JPH0252981B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/24Probes
    • G01N29/2418Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/26Scanned objects
    • G01N2291/269Various geometry objects
    • G01N2291/2697Wafer or (micro)electronic parts

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP58192409A 1983-10-17 1983-10-17 接合状態検出方法及びその装置 Granted JPS6085363A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58192409A JPS6085363A (ja) 1983-10-17 1983-10-17 接合状態検出方法及びその装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58192409A JPS6085363A (ja) 1983-10-17 1983-10-17 接合状態検出方法及びその装置

Publications (2)

Publication Number Publication Date
JPS6085363A JPS6085363A (ja) 1985-05-14
JPH0252981B2 true JPH0252981B2 (de) 1990-11-15

Family

ID=16290833

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58192409A Granted JPS6085363A (ja) 1983-10-17 1983-10-17 接合状態検出方法及びその装置

Country Status (1)

Country Link
JP (1) JPS6085363A (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS627200A (ja) * 1985-07-03 1987-01-14 株式会社日立製作所 接合状態検出装置
JPS62126346A (ja) * 1985-11-28 1987-06-08 Nippon Kokan Kk <Nkk> 非接触超音波探傷方法
JPS62133341A (ja) * 1985-12-06 1987-06-16 Hitachi Ltd はんだ付部検査装置
JPH01203966A (ja) * 1988-02-10 1989-08-16 Hitachi Constr Mach Co Ltd 微小部材接合部の接合状態検査方法およびその装置
JP3201046B2 (ja) * 1993-02-19 2001-08-20 株式会社日立製作所 光音響信号検出方法及び装置
JP3254465B2 (ja) * 1993-04-21 2002-02-04 株式会社日立製作所 光熱変位信号検出方法とその装置
CN115769071A (zh) * 2021-01-21 2023-03-07 雅马哈智能机器控股株式会社 不良检测装置以及不良检测方法

Also Published As

Publication number Publication date
JPS6085363A (ja) 1985-05-14

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