JPH0250691U - - Google Patents

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Publication number
JPH0250691U
JPH0250691U JP13036488U JP13036488U JPH0250691U JP H0250691 U JPH0250691 U JP H0250691U JP 13036488 U JP13036488 U JP 13036488U JP 13036488 U JP13036488 U JP 13036488U JP H0250691 U JPH0250691 U JP H0250691U
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JP
Japan
Prior art keywords
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Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13036488U
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English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13036488U priority Critical patent/JPH0250691U/ja
Publication of JPH0250691U publication Critical patent/JPH0250691U/ja
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP13036488U 1988-10-03 1988-10-03 Pending JPH0250691U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13036488U JPH0250691U (enrdf_load_stackoverflow) 1988-10-03 1988-10-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13036488U JPH0250691U (enrdf_load_stackoverflow) 1988-10-03 1988-10-03

Publications (1)

Publication Number Publication Date
JPH0250691U true JPH0250691U (enrdf_load_stackoverflow) 1990-04-09

Family

ID=31385466

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13036488U Pending JPH0250691U (enrdf_load_stackoverflow) 1988-10-03 1988-10-03

Country Status (1)

Country Link
JP (1) JPH0250691U (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08327693A (ja) * 1995-05-31 1996-12-13 Nec Corp Icテストヘッド
JP2008307428A (ja) * 2008-09-30 2008-12-25 Samii Kk 遊技機の電源装置
JP2022138610A (ja) * 2021-03-10 2022-09-26 エスペック株式会社 加熱槽に対するデバイスボードの接続構造、電子デバイス試験装置及び加熱槽
TWI853213B (zh) * 2021-03-10 2024-08-21 日商愛斯佩克股份有限公司 燒入裝置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS613450B2 (enrdf_load_stackoverflow) * 1978-12-28 1986-02-01 Iseki Agricult Mach

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS613450B2 (enrdf_load_stackoverflow) * 1978-12-28 1986-02-01 Iseki Agricult Mach

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08327693A (ja) * 1995-05-31 1996-12-13 Nec Corp Icテストヘッド
JP2008307428A (ja) * 2008-09-30 2008-12-25 Samii Kk 遊技機の電源装置
JP2022138610A (ja) * 2021-03-10 2022-09-26 エスペック株式会社 加熱槽に対するデバイスボードの接続構造、電子デバイス試験装置及び加熱槽
TWI853213B (zh) * 2021-03-10 2024-08-21 日商愛斯佩克股份有限公司 燒入裝置

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