JPH0244271A - Desk-top type box for electronic part heating test - Google Patents

Abstract

PURPOSE:To obtain a portable box for an electronic part heating test by mounting a substrate support means, a substrate heating means, a signal connector and a power supply connector in a box having a lid, a standoff and a handle. CONSTITUTION:A standoff 25 and a handle 5 are provided to a box 1 and a substrate 30 to be tested is horizontally supported in the hermetically closed space closed by a lid 2 in a detachable manner through a guide track 6. The substrate to be tested loaded with electronic parts is heated from the under surface thereof by a heater plate 49. Power is supplied from a power supply through a connector 8 and a switch 14 to heat the substrate 30 to be tested and a signal is inputted/outputted to said substrate 30 through a connector 11. After the hermetically closed space is rapidly raised in temp., the lid is opened to measure the electronic parts in an opening part 50. By this constitution, a portable box for an electronic part heating test handy to carry is obtained.

Description

DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a small and convenient tabletop electronic component heating test box used for heating tests of electronic components such as RC.

As one of the performance tests of conventional ICs before they are shipped from the factory, a burn-in test is carried out in which the RC is placed in a sealed heat atmosphere for a predetermined period of time, and then signals are input and output to measure the performance and determine whether the product is good or bad. It is being done.

As a general rule, this burn-in test is a complete check, and for this reason, IC manufacturers are equipped with large and heavy constant temperature chambers that can perform burn-in tests on thousands of ICs at once.

This thermostatic chamber is a very expensive device that requires a large amount of equipment, including the power supply, control device, and other attached equipment, and due to its large capacity, it takes time to start up when the operation is stopped, so it is necessary to leave the chamber in constant operation. It keeps the internal temperature constant.

On the other hand, looking at IC supply trends, the mainstream trend has traditionally been to produce a large number of rated ICs and to have users use them in combination. There is a trend toward high-mix, low-volume ICs with functions for specific users, such as ASICs called gate array ICs, custom ICs, and the like.

The problem that the invention seeks to solve is that the temperature controlled ovens in the IC manufacturer's equipment handle thousands of ICs at once.
It was suitable for burn-in testing of ICs, but due to the changes in ARC supply trends as mentioned above, the quantity of one type is limited, for example, for burn-in testing of several to several tens of ICs. It would be necessary to occupy a large-capacity thermostatic chamber that can test thousands of ICs, and if it were to be kept in constant operation, there would be large losses and it would be uneconomical, and it would be difficult to control the temperature inside the chamber due to the quantity. There are also technical problems that make it difficult to perform stable measurements.

Furthermore, when developing an ASIC for a specific user, the IC development department also requires testing at the laboratory stage before putting it on the production line. Furthermore, in order to ensure the reliability of RCs, most OA equipment manufacturers recently conduct burn-in tests again after purchase.

From the above background, there is a desire to efficiently and easily heat test a small amount of RC, and the present invention provides a small, convenient, and highly mobile tabletop electronic component heating test box that meets these demands. Currently, only the constant temperature 4N is available for IC burn-in testing, and there is no portable PA testing device that meets the above requirements.

Means for Solving the Problems As mentioned above, the present invention relates to a table-top electronic component heating test box that is used for heating tests on a limited number of electronic components such as ICs, which are inappropriate for conventional constant temperature ovens. The main body is a rectangular portable sealed box. The portable sealed box includes board support means for removably horizontally suspending an electronic component testing board in the sealed space of the box, and heating means such as a heating plate for heating the testing board in the sealed space. In addition to a connector means arranged so that the electronic components mounted on the electronic component testing board can be measured from the outside, a connector arranged so as to connect the heating means from the outside to a commercial power source. The i! ! l- Forming a lid that opens the electronic component mounting surface of the electronic component test board installed in a closed space, and testing the electronic components through the opening for measurement work formed by opening the lid. The panel facing the lid is provided with standoffs protruding from its outer surface, and the standoffs support the portable sealed box at floor level during heating and measurement operations. The board for electronic component testing is placed horizontally and stably, and the lid can be opened and closed on the top side of the board, and a handle is provided at an appropriate location on the portable sealed box to carry it to the test work site at any time and heat it. It is configured to allow testing.

Function The above-mentioned tabletop type electronic component heating test box can be moved freely to the test work place using the handle. The board is placed in a horizontal position with standoffs and placed through a heating test.
By connecting a commercial power supply to the commercial power supply connector means, the heating means is energized and the temperature within the limited volume of the closed space is rapidly raised. The above test board is the box'I
When the box is placed horizontally in the ErA space and subjected to a heating test, the lid, which is provided so as to face the test board, is placed on the top side of the box, and in the heating state, the lid is immediately opened to perform the test. The electronic component mounting surface of the board is opened and the electronic components are measured and checked. That is, by opening the lid, an opening for measurement is formed on the top side of the box installed by the standoff, and the opening allows the space above the electronic component mounting surface to be opened, allowing measurement of electronic components from above. Let's do it.

Also, the measured electronic components are mounted and removed from above through the measurement operation opening, and electronic components to be measured from now on are similarly mounted on the test board through the measurement operation opening. An electronic component socket is installed on the test board and connected to a test circuit formed on the surface of the board, and the electronic component is connected to the test circuit via the socket.

The test box can be moved freely to the work place by the handle, and the above test work can be performed immediately by connecting a nearby commercial power source to the connector provided on the box. The above tests can be conducted without being restricted by location, such as in a laboratory, development room, or office.

This test box is designed to measure and test a limited number of electronic components in a closed space with a limited volume.
By connecting a commercial power source through the connector, the inside of the sealed space can be efficiently raised to the required temperature in a short time, and when not in use, the power can be turned off to prevent 1iIO loss.

As mentioned above, the wooden μ test box is suitably used for heating tests of limited quantities of electronic components such as the ASrC mentioned above.
It is possible to provide a test box that is convenient and highly maneuverable because it can be placed nearby and the heating test can be performed immediately using a commercial power supply whenever necessary.

EXAMPLES Hereinafter, examples of the present invention will be described in detail based on the examples shown in FIGS. 1 to 13.

This tabletop electronic component heating test box is designed for the purpose of heating tests on small, movable, small quantities of electronic components.
The main body is a rectangular portable sealed box 1 as shown in FIGS.

The portable sealed box 1 includes a test board 30 that is removably supported horizontally within the sealed space of the box 1, and has a wide panel (
It has a lid body 2 for forming a measurement work opening 50 formed in the front panel (hereinafter referred to as a front panel), and a portable sealed box 1 is mounted at floor height on a wide back panel facing the lid body 2. A supporting standoff 25 is provided. this standoff 2
5 is preferably made of an electrically insulating material and a heat insulating material.

The lid body 2 is provided with gripping means 27 such as a knob or handle for convenient opening and closing operations.

As described above, the test board 30 is installed so as to face the lid 2, and the box 1 is placed on a desk or the like using the standoffs 25 and subjected to a heating test. The body 2 is placed in a horizontal state, and the lid 2 is placed opposite the upper surface of the test board 30, that is, the electronic component mounting surface, and when the lid 2 is opened, the space above the electronic component mounting surface is opened. is opened and an opening 50 for measurement work is formed.

A handle 5 such as a handle or a belt is provided at a suitable location on the box 1, preferably on a narrow side panel adjacent to the front panel, so that the box 1 can be carried to the test site at any time by holding the handle 5; Another standoff 26 is provided on the narrow side panel facing the panel provided with the handle 5.
The box 1 is carried by the handle 5 and installed using the standoff 26 at times other than testing.

The portable sealed box 1 has a size approximately concave to the outer shape of the test board 30 on which the electronic component 45 is mounted on the front panel side forming the lid body 2, and is relatively thin on the side panel side.

In the sealed space in the box 1 closed by the above-mentioned benefit body 2, there are provided a substrate support means for removably horizontally suspending the test substrate 30, and a heating means for heating the test substrate 30.

The substrate supporting means is formed, for example, by a pair of guide tracks 6 as shown in FIG. The guide track 6 extends in parallel along the inner surfaces of the pair of side panels facing the thickness of the test board 30 of the sealed box 1, and the test board 30 is guided by the track 6 to the track i! Box 1 from one end of 6
As shown in FIG. 4, the edge of the test board 30 is engaged with the track 6, and is supported horizontally within the box i.

As a means of inserting the test board 30 into the box 1, a gate plate 3 is formed from a side panel on one end side of the guide track 6. The gate plate 3 can be inserted into and removed from the front panel side forming the lid body 2, and in order to perform the insertion and removal, a hole is provided at one end of each side panel on which the guide track 6 is provided in the direction in which the guide track 6 extends. Guide grooves 43 extending in a right angle direction are arranged to face each other. The entrance of the guide groove 43 is closed by the lid 2, and opened by opening the lid 2, allowing the test board 30 to be inserted and removed. An insertion opening 4 for the test board 30 is formed at one end of the guide track 6 in an area in which the guide groove 43 extends, and as shown in FIG. By removing it from the guide groove 43, the board insertion opening 4 and one side of the box 1 are opened, and the guide track 6 of the test board 30 is opened.
In addition, by inserting the gate plate 3 into the guide groove 43 as shown in FIG. 1, the board insertion opening 4 is closed, thereby preventing gas from flowing in and out of the box.

Further, as shown in FIGS. 2 and 3, a board insertion opening 4 for the guide track 1Ji6 is provided on the side panel facing the gate plate 3.
Connector means 11 is provided at the opposite end of the test board 30, and signals are input and output through the connector means 11 to the signal circuit pattern 34 formed in close contact with the surface of the test board 30. The connector means 11 has an insertion slot 12 for the test board 30 that opens on the inner surface of the box 1, and contacts 13 that are exposed on the outer surface of the box 1 and output signals.
has. The test board 30 is placed on the guide track 11 as described above.
i6, the connection plate portion 42 extending from the end of the board is inserted into the board insertion slot 12 at the insertion end, and the circuit terminals 41 arranged in close contact with the surface of the connection plate portion 42 are connected to the contacts. 13 in the slot 12.

40 is a socket mounted on the upper surface of the test board 30, the socket 40 is connected to the circuit pattern 34 through solder or the like, and an electronic component 45 such as an IC is connected to the socket 40; It is connected to the circuit pattern 34 and the signal input/output connector 11 through the socket 40. The electronic component mounting surface of the test board 30 suspended horizontally on the support means faces the mounted body 2, and by opening the lid 2, the entire surface of the mounting surface is opened upward and opened for measurement work. form 50.

Further, the heating means is applied to the sealed space inside the box 1 closed by the lid 2 and the test substrate 30 within the sealed space.
An electronic component 45 such as an RC mounted on the board 30 via a socket 40 is heated.

FIGS. 3, 4, and 6 show an example of the heating means in which the test substrate 30 itself also functions as a heating plate.

As shown in FIG. 11, the test substrate 30 which also serves as the heating plate is a metal plate 3 made of aluminum or the like having good thermal conductivity.
A wiring board 32 having a signal circuit pattern 34 on both sides is layered on the front surface of the metal plate 31 via an insulating layer 37, and a heater circuit pattern 35 is provided on the back surface of the metal plate 31 via an insulating layer F133. covering the heater circuit pattern 35 with a protective layer 38, removing the protective layer 38 at the connection plate portion 42, and arranging the terminals 36 of the heater circuit pattern 35 in an exposed state;
The terminal 36 is configured to be connected to a commercial power source.

FIG. 12 shows a test board 30 that also serves as the heater plate.
shows the other side. The test board 30 has a signal circuit pattern 34 layered on the front surface of an insulating plate 39 having good thermal conductivity, typically made of ceramic or the like, and a heater circuit pattern 35 layered on the back surface thereof.

Each of the test boards 30 in FIGS. 11 and 12 has a signal circuit pattern 34 on one side and a heater circuit pattern 3 on the other side.
5, the high thermal conductive metal plate 31 or the high thermal conductive insulating plate 39 is heated by the heater circuit pattern 35, and the signal is uniformly diffused by the metal plate 31 or the insulating plate 39 and layered on the surface thereof. The circuit pattern 34 is uniformly heated, and the sockets 1-40 and electronic components 45 connected to the circuit pattern 34 are uniformly heated.

At the same time, the inside of the sealed space of the portable sealed box 1 occupied by the test board 30 is heated uniformly. A temperature sensor 10 is installed at a suitable location in the box 1 to detect the temperature inside the closed space.
The temperature sensor 10 is placed inside the box.

On the other side of the heating means, as shown in FIG.
Separately from the test board 30, a heater plate 49 having a heater circuit pattern 35 dedicated to heating is formed, and the heater plate 49 is placed inside the box l so as to be parallel to the board 30 on the test board 3o. Place it like this. As shown in FIG. 13, the heater circuit pattern 35 is arranged in a meandering manner so that the wiring is dense at both ends and sparse in the middle.

The portable type a!
- Connector means 8 for commercial NyA connection is provided at an appropriate location of the opening-closing box 1. For example, the connector means 8 is provided on a side panel other than the front panel forming the lid body 2, and is connected to a commercial power source by a plug from the outside. be done. The connector means 8 and the heater circuit 35 may be connected directly by conductive wires as shown in FIG. 10, or may be connected and disconnected via switch means.
When the test board 30 also serves as a heater plate, the test board 30
is connected to the connector means 8 through the switch means so that it can be removed from inside the box l, and when it is made separate from the test board 30 like the heater plate 49 shown in FIG. You can also connect directly.

The switch means is provided at a suitable location in the box, for example in the vicinity of the connector means 8. ′! FIG. J3 and FIG. 6 show an example of the above-mentioned switch means. As shown in the figure, a switch lever 14 is provided on a mounting piece 24 so that it can be rotated around @22 as a fulcrum, and a movable block 15 made of an insulating material having a contact piece 16 on its surface is disposed inside the box 1. The movable block 15 is disposed below the connection plate portion 42 of the test board 3o, and the contact piece 16 is opposed to the terminal 36 of the heater circuit pattern 35, and the contact piece 16 of the movable block 15 is connected to the terminal 17.20 of the contact piece 16 of the movable block 15. Above heater circuit pattern 35
The terminal 36 of the movable block 1 is connected with the conducting wire 21.
5 is resiliently supported by a spring 19 to bias the contact piece 16 in the direction of contacting the heater rotation Wr@ child 36, and the movable block 15 and the free end of the switch lever 14 are connected to the connecting member 1.
8, and by rotating the lever 14 in one direction as shown in FIG. Separate the terminal 36 (release contact) and conversely ¥S6
As shown in FIG. B, by rotating the switch lever 14 in the other direction according to the spring 19, the elasticity of the spring 19 pushes up the movable block 15 and the contact piece 16 and the heater circuit terminal 3.
Forms contact with 6. As means for holding the switch lever 14 at each of the operating positions, for example, means for selectively engaging a ball 23 supported by a spring in two holes is used.

By providing the switch means as described above, the plug can be inserted into the connector means 8 for connecting to the commercial power supply,
The heater circuit pattern 35 can be energized and de-energized from the commercial power supply, and the test board 30 can be removed from the box 1 and replaced with another board. When removing the test board 30, remove the lid 2 as shown in FIG.
After opening the gate plate 3 and removing it from the guide groove 43, the guide track i! 6 and pull it out from the insertion slot 4 while sliding it.

Figure 8 and Figure 'fS9 show the above test board 30 in box 1.
A case is shown in which a measuring operation opening 50 formed by opening the lid body 2 is used as a means for removably attaching the device.

As shown in the figure, a pair of board support seats 47 are provided along a pair of opposing side panels, and the test board 30 is received from the measurement work opening 50 and placed on the support seats 47 to be in a horizontally suspended state. As a means for engaging the edge of the test board 30 in place through the support seat 470, for example, an elastic locking piece 46 as shown in the figure is provided. The locking piece 46 is attached to the test board 30.
When pushed into the locking piece 46, it is elastically displaced backward, and when the substrate 30 is placed on the support seat 47, it is restored forward and engaged with the edge of the substrate. Further, by pulling up the test board 30 against the elasticity of the locking piece 46, the engagement by the locking piece 46 is released and the test board 30 can be taken out from the measurement operation opening 50.

In this case, the measurement operation opening 50 functions as an opening for measuring the electronic component 45 and for attaching and detaching the test board 30. Further, an electronic component 45 such as an IC can be attached to and removed from the socket 40 through the opening 50.

When a structure is adopted in which the test board 30 is installed from the measurement work opening 50, the connector 48 is attached to the lower surface of the connection plate part 42 of the test board 30, and the connector 48 is attached to the rear panel facing the lid 2 of the box 1. A 0-way connector 48 to which the signal person exit/exit connector 11 is attached opposite to the connector 48.
．． 11 are connected to each other when the test board 30 is inserted through the measurement operation opening 50 and supported on the support seat 4.

Further, as shown in FIG. 3, the lid 2 is made separable from the box body, and a locking means 7 such as a locking lock is provided at the opening edges of the lid 2 and the box 1 to secure the opening for the measurement operation. 50 and maintain a sealed state.

On the other side, as shown in FIGS. 7 and 8, one end of the lid 2 is attached to the box body via a hinge 44 such as a hinge.
The free end of the lid body 2 can be locked and sealed via a locking means 7 such as the above-mentioned baratin lock.

Although the above-mentioned test board 30 is exemplified as a single board installed inside the box 1, two or more boards can be placed side by side and installed inside the box 1.
Further, in the present invention, the substrate 30 is horizontally supported in the inner cavity of the lid body 2 in the same manner as described above, and when the inner lid body 2 is opened, the substrate 3
This includes an embodiment in which the cover 2 is attached to the lid 2 and opened.

For example, at the same time that the test board 30 is placed inside the box body in the above-described manner, the same board 30 is also held in the lid body 2,
When the lid body 2 is closed, the substrates are arranged in parallel in the closed space of the box 1 with an interval of 1 vertically.

Then, the portable sealed box 1 is attached to the standoff 25.
When installed at floor level on a desk or the like, the test board 30 horizontally supported in the box 1 is held in a horizontal state, and when a commercial power source is connected to the connector means 8 and the switch means is inserted, the heating means That is, the heater circuit pattern 35 is energized to heat the inside of the closed space of the box 1, the test board 3o, and the electronic components 45 mounted on the board 30. After reaching a predetermined heating temperature, various checks and measurement tests on the electronic component 45 are performed by inputting and outputting signals through the contacts 13 of the signal input/output connector means 11.

At the same time, when a predetermined heating temperature is reached, the lid 2 is opened to open the electronic component mounting surface of the test board 30, and the measurement work opening 50 formed by opening the lid 2 is opened. Test detectors are inserted and brought into contact with the terminal sides of the socket 40 to perform various checks and measurement tests on the electronic components.

When the lid 2 is opened, the heating temperature decreases, so the lid 2 is closed again after a predetermined period of time has elapsed, and after the temperature rises, the lid 2 is opened again, and the same measurement test as described above is continued.

After the measurement is completed, another electronic component is inserted into the measurement work opening 50.
Then, it is mounted on the socket 40 and the same test as above is repeated.

As described in the detailed description of the invention, the test box can be moved freely to the test work site using the handle, and the test work can be performed immediately by connecting a nearby commercial power source to the connector provided on the box. As long as there is a commercial power source, testing can be carried out in a laboratory, development room, office, etc. without being restricted by location.

For example, the above box can be installed on a desk using standoffs to perform test work, and when installed on a desk, etc.
The test board can be placed in a horizontal position by standoffs, making it suitable for heating tests.

Furthermore, when the test board is placed horizontally in the sealed space of the box and subjected to the heating test as described above, the lid body provided to face the test board is placed on the top side of the box, While in the heated state, the lid is immediately opened to expose the electronic component mounting surface of the test board, and electronic components can be easily measured and checked. That is, by opening the lid, a measurement opening is formed on the top side of the box installed by the standoff, and this opening opens the space above the electronic component mounting surface, making it easy to measure the electronic components from above. can be done.

The electronic components that have already been measured are mounted and removed from above through the above-mentioned dramatic operation opening, and the electronic components to be measured are also mounted on the test board through the above-mentioned measurement operation opening.

This test box is designed to measure and test a limited number of electronic components in a closed space with a limited volume.
By connecting a commercial power source through the connector, the inside of the sealed space can be efficiently raised to a required temperature in a short time, and the power can be turned off when not in use to prevent operational loss.

As mentioned above, this test box is suitably used for heating tests of limited small quantities of electronic components such as the ASICs mentioned above.
It is possible to provide a test box that is convenient and highly maneuverable and can be placed nearby and the heating test can be performed immediately using a commercial power supply whenever necessary.

[Brief explanation of the drawing]

The drawings show an embodiment of the present invention, and FIG. 1 is a perspective view of the external structure of a tabletop electronic component heating test box viewed from the front panel, and FIG. 2 is a perspective view of the external structure of the box viewed from the back panel. Figure 3 is a perspective view of the box with the front panel lid opened to show the internal structure, Figure 4 is a perspective view of the box with the lid opened and the test board installed, and Figure 5. 6A is a sectional view showing the structure of the switch means in the closed state, FIG. 6B is a sectional view showing the switch in the open state, and FIG. 7 is a sectional view of the switch means in the open state. 8 is a cross-sectional view of the box showing the other side related to the opening/closing structure of the body, FIG. 9 is a longitudinal sectional view of the same, and FIG. 10 is the other side related to the heating means. Figure 12 is an enlarged cross-sectional view of the main part of the test board that also serves as a heater plate, with cross-sectional representation omitted, and Figure 12 is an enlarged cross-sectional view of the main part showing the other side of the heater plate. FIG. 13 is an enlarged plan view of a main part illustrating a heater circuit pattern. l...Portable airtight box, 2...Lid, 5...
Handle, 6... Board guide track, 8... Connector means for connecting commercial power supply, 11... Connector means for signal input/output,
14...Switch lever 25 forming switch means
...Standoff, 30...Test board, 34...
・Signal circuit pattern, 35... Heater circuit pattern,
40...Socket, 45...Electronic component, 47...
Substrate support seat, 49... Heater plate, 50... Opening for measurement work. Patent applicant Yama-Denki Kogyo Co., Ltd. Figure 1 Figure 11

Claims (3)

[Claims] (1) Consists of a rectangular portable sealed box and a test board placed inside the portable sealed box, and the test board is removably mounted horizontally in the sealed space of the portable box. and a heating means for heating the test board, a connector means for connecting with the installed test board for signal input/output, and connecting the heating means to a commercial power source. A lid body is formed of a panel facing the electronic component mounting surface of the test board of the portable sealed box, and when the lid body is opened, the electronic component mounting surface is connected to the electronic component mounting surface. A measuring operation opening is formed to open the box, and a panel facing the lid body is provided with a standoff for supporting the portable sealed box at floor level, so that the box can be carried to an appropriate location in the portable sealed box. A tabletop electronic component heating test box characterized by having a handle. (2) The tabletop electronic component heating test box according to claim 1, further comprising switch means for supplying commercial power to the heating means at a suitable location in the portable sealed box. (3) The tabletop electronic component heating test box according to claim 1, wherein the test substrate forms a heating plate.