JPH0239556A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPH0239556A
JPH0239556A JP19136888A JP19136888A JPH0239556A JP H0239556 A JPH0239556 A JP H0239556A JP 19136888 A JP19136888 A JP 19136888A JP 19136888 A JP19136888 A JP 19136888A JP H0239556 A JPH0239556 A JP H0239556A
Authority
JP
Japan
Prior art keywords
semiconductor element
electrode
planar semiconductor
flat semiconductor
housing part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19136888A
Other languages
Japanese (ja)
Inventor
Yoshihiro Yamauchi
山内 義博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP19136888A priority Critical patent/JPH0239556A/en
Publication of JPH0239556A publication Critical patent/JPH0239556A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To radiate heat from both surfaces of a planar semiconductor element and to improve heat radiating efficiency by bonding a first electrode connecting plate and one electrode of the planar semiconductor element to a radiating fin in a housing part of the planar semiconductor element, bringing a second electrode connecting plate that is bonded to another electrode to the radiating fin, and welding the plates with pressure by using a compressing device. CONSTITUTION:A recess part 1A is formed as a housing part of a planar semiconductor element at the central part of a radiating fin 1. The planar semiconductor element 2 which is housed in the housing part is bonded to the bottom surface of the housing part through one end 3A of a first electrode connecting plate 3 and an insulating material 4 having excellent heat conductivity. The depth of the housing part 1A is set so that another electrode 2B of the planar semiconductor element is slightly protruding from the housing to when the planar semiconductor element 2 is housed. A central part 5C at the horizontal part of an L shaped second electrode connecting plate 5 is bonded to the other electrode of the planar semiconductor element. both ends 5D and 5E of the horizontal part are bonded to radiating fins 1B and 1C at the periphery of the housing part through insulating materials 14 and 15 having excellent heat conductivity. In this constitution, heat generated in the planar semiconductor element can be transferred to the radiating fins through both ends. Thus the heat radiating efficiency can be enhanced.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は半導体装置、特に平形半導体素子を使用した
半導体装置の放熱構造の改良に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to improvements in the heat dissipation structure of semiconductor devices, particularly semiconductor devices using flat semiconductor elements.

〔従来の技術〕[Conventional technology]

平形半導体素子を使用した従来の半導体装置の構成を第
2図に示す。
FIG. 2 shows the configuration of a conventional semiconductor device using a flat semiconductor element.

この図において(1)は放熱フィン、(21は平形半導
体素子、(31は第1の電極接続板で、その一端(3八
)が上記平形半導体素子(2)の一方の電極に接合され
、他端(3B)は外方に延在している。(4)は第1の
電極接続板と放熱フィン(1)との間に介装された絶縁
材で、第1の電極接続板(3)と放熱フィン(1)とを
電気的に絶縁すると共に、平形半導体素子(21の発生
する熱を放熱フィン(1)に伝達し、外気中へ放熱する
ことによって平形半導体素子(21の温度上昇を抑える
ため熱伝導性のよいセラミック等で構成されている。又
、口は第2の電(至)接続板で、その一端(5Δ)は平
形半導体素子(■の他方の電極に接合され、他端(5B
)は外方に延在している。(6)は第2の電極接続板の
一端(5A)の上面に配設された絶縁材、(7)(8)
は上記放熱フィン(1)に植設されたボルト、(9)は
上記両ボルトに嵌合された押さえ板、α0)は押さえ板
(9)と上記絶縁材(6)との間に介装された板ばねで
、両端部が夫々上記ボルト(7)ts+に摺動可能に係
合され湾曲した状態で保持されている。
In this figure, (1) is a radiation fin, (21 is a flat semiconductor element, (31 is a first electrode connection plate, one end (38) of which is joined to one electrode of the flat semiconductor element (2), The other end (3B) extends outward. (4) is an insulating material interposed between the first electrode connection plate and the radiation fin (1), and the first electrode connection plate ( 3) and the heat radiation fin (1), and the temperature of the flat semiconductor element (21) is reduced by transmitting the heat generated by the flat semiconductor element (21) to the heat radiation fin (1) and dissipating the heat to the outside air. It is made of ceramic, etc. with good thermal conductivity in order to suppress the increase in heat.The opening is a second electrical connection plate, and one end (5Δ) of the plate is connected to the other electrode of the flat semiconductor element (■). , the other end (5B
) extend outward. (6) is an insulating material disposed on the top surface of one end (5A) of the second electrode connection plate; (7) and (8)
is a bolt installed in the heat dissipation fin (1), (9) is a holding plate fitted to both bolts, and α0) is a bolt inserted between the holding plate (9) and the insulating material (6). Both ends of the plate spring are slidably engaged with the bolts (7) ts+ and held in a curved state.

(II)(121は夫々上記ポルドロ(8)に螺合され
るナツトで、これらを締めつけることにより、板ばね0
〔を介して第2の電極接続板(9,平形半導体素子(2
J及び第1の電極接続板(3)を放熱フィン(1)に圧
接するものである。(13)は上記各構成部品を収容す
るケースである。
(II) (121 is a nut screwed into each of the above-mentioned Poldro (8), and by tightening these, the leaf spring 0
[through the second electrode connection plate (9, flat semiconductor element (2)
J and the first electrode connection plate (3) are pressed against the heat radiation fin (1). (13) is a case that accommodates each of the above components.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来の半導体装置は以上のように構成され、第1及び第
2の電極接続板(31(51を経て平形半導体素子(■
への通電時に発生する熱は絶縁材(4)を介して放熱フ
ィン(1)から放熱されるが、放熱フィン(1)が平形
半導体素子(aの片面にしか接合していないため放熱効
率が著しく低く、従って平形半導体素子(2)に十分な
通電を行うことが出来ないという問題点があった。
The conventional semiconductor device is constructed as described above, and the flat semiconductor element (■
The heat generated when electricity is applied is radiated from the heat dissipation fin (1) via the insulating material (4), but because the heat dissipation fin (1) is bonded to only one side of the flat semiconductor element (a), the heat dissipation efficiency is low. Therefore, there was a problem in that the flat semiconductor element (2) could not be sufficiently energized.

この発明は、このような問題点を解消するためになされ
たもので、平形半導体素子の両面からの放熱を可能にし
、放熱効率を向上することができる半導体装置を提供し
ようとするものである。
The present invention was made to solve these problems, and aims to provide a semiconductor device that enables heat radiation from both sides of a flat semiconductor element and improves heat radiation efficiency.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係る半導体装置は、放熱フィンに平形半導体
素子の収容部を形成し、この収容部内において、第1の
電極接続板と、熱伝導性のよい絶縁材とを介して平形半
導体素子の一方の電極を放熱フィンに接合すると共に、
平形半導体素子の他方の電極に接合する第2の電極接続
板を熱伝導性のよい絶縁材を介して放熱フィンに当接し
、上記第2の電極接続板を押圧装置によって平形半導体
素子と放熱フィンとに圧接するようにしたものである。
In the semiconductor device according to the present invention, a accommodating portion for the flat semiconductor element is formed in the radiation fin, and in the accommodating portion, one side of the flat semiconductor element is inserted through the first electrode connection plate and an insulating material with good thermal conductivity. In addition to joining the electrode to the heat dissipation fin,
A second electrode connection plate to be bonded to the other electrode of the flat semiconductor element is brought into contact with the heat radiation fin through an insulating material with good thermal conductivity, and the second electrode connection plate is pressed between the flat semiconductor element and the radiation fin by a pressing device. It is designed to press into contact with the

〔(ヤ  用〕[(for ya)]

この発明によれば、平形半導体素子への通電時に発生ず
る熱は、平形半導体素子の一方の電陽面から第1の電極
接続板と、これに接合されている絶縁材とを介して放熱
フィンに伝達され、又、平形半導体素子の他方のTL電
極面ら第2の電極接続板と、これに接合されている絶縁
材とを介して放熱フィンに伝達されるため平形半導体素
子の両面から夫々放熱フィンに対して熱伝達が行われる
ことになり、放熱効率が著しく向上するものである。
According to this invention, the heat generated when the flat semiconductor element is energized is transferred from one positive surface of the flat semiconductor element to the first electrode connection plate and the insulating material bonded to the heat radiation fin. The radiation is also transmitted from the other TL electrode surface of the flat semiconductor element to the radiation fins via the second electrode connecting plate and the insulating material bonded thereto, so that the radiation is transmitted from both sides of the flat semiconductor element to Heat is transferred to the heat radiation fins, and the heat radiation efficiency is significantly improved.

〔発明の実施例〕[Embodiments of the invention]

以下、この発明の一実施例を第1図について説明する。 An embodiment of the present invention will be described below with reference to FIG.

この図において(1)は放熱フィンで、中央部に平形半
導体素子を収容するための収容部として凹所(IA)を
形成している。(21はこの収容部に収容された平形半
導体素子で、第1の電極接続板(3)の一端(3A)及
び熱伝導性のよい絶縁材(4)を介して収容部の底面に
接合されている。
In this figure, (1) is a heat dissipation fin, and a recess (IA) is formed in the center thereof as a housing portion for housing a flat semiconductor element. (Denoted at 21 is a flat semiconductor element housed in this accommodation section, which is bonded to the bottom surface of the accommodation section via one end (3A) of the first electrode connection plate (3) and an insulating material (4) with good thermal conductivity. ing.

なお、収容部(1八)の深さは、上述のような!TJ様
で平形半導体素子(21が収容された時、平形半導体素
子の他方の電極面(2B)が第1図に示すように、収容
部(IA)から少し突出する程度に設定される。
In addition, the depth of the accommodating part (18) is as described above! When the flat semiconductor element (21) is housed in the TJ, the other electrode surface (2B) of the flat semiconductor element is set so as to slightly protrude from the housing part (IA), as shown in FIG.

((5)はL字状に折曲した第2の電極接続板で、水平
部の中央部(5C)が平形半導体素子の他方の電極に接
合され、水平部の両端(5D) <5E)が夫々熱伝導
性のよい絶縁材(14) (Is)を介して上記収容部
周縁の放熱フィン(IB) (Ic)に接合するように
されている。
((5) is the second electrode connection plate bent into an L shape, the center part (5C) of the horizontal part is joined to the other electrode of the flat semiconductor element, and both ends of the horizontal part (5D) <5E) are connected to the radiation fins (IB) (Ic) on the periphery of the housing portion, respectively, via insulating materials (14) (Is) having good thermal conductivity.

その他の構成は従来の装置と、同様であるため説明を省
略する。
The rest of the configuration is the same as that of the conventional device, so a description thereof will be omitted.

この実施例は以上のように構成され、平形半導体素子(
aを放熱フィン(1)の収容部(1八)に収容し、その
一方の電極を第1の電極接続板(3)及び絶縁材(4)
を介して収容部底面の放熱フィンに接合すると共に、他
方の電極を第2の電極接続板(51及び絶縁材(+4)
 (+5)を介して収容部周縁の放熱フィンに接合する
ようにしたため、平形半導体素子の発熱を、その両面か
ら夫々放熱フィンに伝達することが可能となり放熱効率
が向上するものである。
This embodiment is constructed as described above, and has a flat semiconductor element (
A is accommodated in the housing part (18) of the heat dissipation fin (1), and one electrode is connected to the first electrode connection plate (3) and the insulating material (4).
The other electrode is connected to the heat dissipation fin on the bottom of the housing part through the second electrode connection plate (51 and the insulating material (+4)
Since it is connected to the heat dissipation fins on the periphery of the housing part through the (+5), it is possible to transmit the heat generated by the flat semiconductor element to the heat dissipation fins from both sides of the element, thereby improving heat dissipation efficiency.

なお、以上の実施例では放熱フィンとして、多数のひだ
を有し、それ自身で放熱作用を有するものを示したが、
ひだを有さない単なる板状の放熱フィンを使用し、これ
を別の放熱フィンに取付けるようにしても同様の効果を
期待することができる。
Note that in the above embodiments, the heat dissipation fins have a large number of folds and have a heat dissipation effect by themselves.
A similar effect can be expected even if a simple plate-shaped heat dissipation fin without folds is used and this is attached to another heat dissipation fin.

〔発明の効果〕〔Effect of the invention〕

以上のようにこの発明によれば、放熱フィンに設けた収
容部に平形半導体素子を収容し、平形半導体素子の一方
の電極を、絶縁材を介して収容部内で放熱フィンに接合
すると共に、他方の電極に接合した第2のTLri1接
続板を、絶縁材を介して収容部周縁の放熱フィンに接合
するようにしたため、平形半導体素子の発熱をその両面
から放熱フィンに伝達することができ、放熱効率を著し
く向上することができるものである。
As described above, according to the present invention, a flat semiconductor element is housed in a housing part provided in a radiation fin, one electrode of the flat semiconductor element is joined to the radiation fin inside the housing part via an insulating material, and the other electrode is joined to the radiation fin in the housing part through an insulating material. The second TLri1 connection plate, which is bonded to the electrode of This can significantly improve efficiency.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例を示す概略図、第2図は従
来の半導体装置を示す概略図である。 図において(1)は放熱フィン、(21は平形半導体素
子、(3)((5)は第1及び第2の′:S、極接続板
接続板1[61(14)(15)は絶縁材、(71(8
1はポル1〜、C0)は板ばね、(9)は押さえ板、C
11)(+2)はナラ1〜、(IA)は収納部である。 なお、図中、同一符号は夫々相当部分を示す。 代理人 弁理士 大 岩 増 雄 第1図 4.6./4,1.f:ξC球持 重A : り人 帖部
FIG. 1 is a schematic diagram showing an embodiment of the present invention, and FIG. 2 is a schematic diagram showing a conventional semiconductor device. In the figure, (1) is a heat dissipation fin, (21 is a flat semiconductor element, (3) ((5) is the first and second ': Material, (71 (8
1 is Pol 1 ~, C0) is a leaf spring, (9) is a holding plate, C
11) (+2) is the oak 1~, (IA) is the storage part. In addition, in the figures, the same reference numerals indicate corresponding parts. Agent Patent Attorney Masuo Oiwa Figure 1 4.6. /4,1. f: ξC ball holding weight A: Rito Chobe

Claims (1)

【特許請求の範囲】[Claims] 平形半導体素子、この平形半導体素子を収容する収容部
を有する放熱フィン、この放熱フィンと上記半導体素子
との間に介装され両者間を絶縁する絶縁材、この絶縁材
と上記平形半導体素子の一方の電極との間に介装された
第1の電極接続板、上記平形半導体素子の他方の電極に
当接すると共に絶縁材を介して上記放熱フィンに当接す
る第2の電極接続板及び第2の電極接続板を上記平形半
導体素子と放熱フィンとに圧接する押圧装置を備えた半
導体装置。
A flat semiconductor element, a radiation fin having a housing portion for accommodating the flat semiconductor element, an insulating material interposed between the radiation fin and the semiconductor element to insulate the two, and one of the insulating material and the flat semiconductor element. a first electrode connection plate interposed between the electrode of the flat semiconductor element, a second electrode connection plate that abuts the other electrode of the flat semiconductor element and abuts the heat dissipation fin via an insulating material; A semiconductor device comprising a pressing device for pressing an electrode connection plate onto the flat semiconductor element and the heat radiation fin.
JP19136888A 1988-07-29 1988-07-29 Semiconductor device Pending JPH0239556A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19136888A JPH0239556A (en) 1988-07-29 1988-07-29 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19136888A JPH0239556A (en) 1988-07-29 1988-07-29 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH0239556A true JPH0239556A (en) 1990-02-08

Family

ID=16273422

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19136888A Pending JPH0239556A (en) 1988-07-29 1988-07-29 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH0239556A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6479882B2 (en) * 2000-06-15 2002-11-12 Mitsubishi Denki Kabushiki Kaisha Current-limiting device
JP2012195559A (en) * 2011-02-28 2012-10-11 Toyota Industries Corp Semiconductor device
WO2013121691A1 (en) * 2012-02-14 2013-08-22 パナソニック株式会社 Semiconductor device and method for manufacturing same

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6479882B2 (en) * 2000-06-15 2002-11-12 Mitsubishi Denki Kabushiki Kaisha Current-limiting device
JP2012195559A (en) * 2011-02-28 2012-10-11 Toyota Industries Corp Semiconductor device
US8885344B2 (en) 2011-02-28 2014-11-11 Kabushiki Kaisha Toyota Jidoshokki Semiconductor device
WO2013121691A1 (en) * 2012-02-14 2013-08-22 パナソニック株式会社 Semiconductor device and method for manufacturing same
CN103843132A (en) * 2012-02-14 2014-06-04 松下电器产业株式会社 Semiconductor device and method for manufacturing same
US9076752B2 (en) 2012-02-14 2015-07-07 Panasonic Intellectual Property Management Co., Ltd. Semiconductor device and method for manufacturing the same

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