JPH023939B2 - - Google Patents

Info

Publication number
JPH023939B2
JPH023939B2 JP56066386A JP6638681A JPH023939B2 JP H023939 B2 JPH023939 B2 JP H023939B2 JP 56066386 A JP56066386 A JP 56066386A JP 6638681 A JP6638681 A JP 6638681A JP H023939 B2 JPH023939 B2 JP H023939B2
Authority
JP
Japan
Prior art keywords
electrode
detector
particles
detection
fine hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56066386A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57179729A (en
Inventor
Norihiro Okada
Masayoshi Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to JP56066386A priority Critical patent/JPS57179729A/ja
Publication of JPS57179729A publication Critical patent/JPS57179729A/ja
Publication of JPH023939B2 publication Critical patent/JPH023939B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10Investigating individual particles
    • G01N15/1031Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/13Details pertaining to apertures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
JP56066386A 1981-04-30 1981-04-30 Detector for particle counter Granted JPS57179729A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56066386A JPS57179729A (en) 1981-04-30 1981-04-30 Detector for particle counter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56066386A JPS57179729A (en) 1981-04-30 1981-04-30 Detector for particle counter

Publications (2)

Publication Number Publication Date
JPS57179729A JPS57179729A (en) 1982-11-05
JPH023939B2 true JPH023939B2 (enrdf_load_stackoverflow) 1990-01-25

Family

ID=13314329

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56066386A Granted JPS57179729A (en) 1981-04-30 1981-04-30 Detector for particle counter

Country Status (1)

Country Link
JP (1) JPS57179729A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04118601A (ja) * 1990-09-10 1992-04-20 Stanley Electric Co Ltd ホログラム反射板

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5376878A (en) * 1991-12-12 1994-12-27 Fisher; Timothy C. Multiple-aperture particle counting sizing and deformability-measuring apparatus
US6624621B2 (en) * 2000-04-03 2003-09-23 Howard L. North, Jr. Particle counter volume sensor
JP6925040B2 (ja) * 2018-08-27 2021-08-25 アイポア株式会社 分析装置、及び、分析方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04118601A (ja) * 1990-09-10 1992-04-20 Stanley Electric Co Ltd ホログラム反射板

Also Published As

Publication number Publication date
JPS57179729A (en) 1982-11-05

Similar Documents

Publication Publication Date Title
US4262203A (en) Alpha particle monitor
CA2050164A1 (en) Particle detector and particle detecting apparatus having the detector
TWI588784B (zh) 用於偵測於一離子室中煙霧之方法及設備
US20160098909A1 (en) Differential Current Measurements To Determine Ion Current In The Presence Of Leakage Current
EP2803056B1 (en) Method and apparatus for detecting smoke in an ion chamber
US3361965A (en) Electronic particle study apparatus with improved aperture tube
JPH023939B2 (enrdf_load_stackoverflow)
US4829833A (en) Liquid impedance flow monitors
JP2007504454A (ja) 粒子検出装置及び方法
US3515884A (en) Detecting and counting apparatus for particles suspended in a liquid
CN87106641A (zh) 碎屑探测器
US20210231553A1 (en) Method for processing a substrate by using fluid flowing through a particle detector
JPH09318574A (ja) 金属粒子検出センサ及びその粒径測定方法
JP3772027B2 (ja) 静電容量型検出装置
JPS56154069A (en) Detecting device for amount of electrification of ink particle in ink-jet printer
JPH0668398U (ja) 除電装置における放電監視装置
JP6482687B2 (ja) 溶液槽デバイス
WO2018163704A1 (ja) 微粒子数検出器
JPH0120676Y2 (enrdf_load_stackoverflow)
JPH0120675Y2 (enrdf_load_stackoverflow)
JPS58144734A (ja) オイル劣化検知装置
JPH0130099B2 (enrdf_load_stackoverflow)
JPH11297145A (ja) 碍子汚損検知装置
JPH0610292Y2 (ja) 粒子検出器
JP2004117011A (ja) 容量式電磁流量計