JPH0237383U - - Google Patents
Info
- Publication number
- JPH0237383U JPH0237383U JP11590188U JP11590188U JPH0237383U JP H0237383 U JPH0237383 U JP H0237383U JP 11590188 U JP11590188 U JP 11590188U JP 11590188 U JP11590188 U JP 11590188U JP H0237383 U JPH0237383 U JP H0237383U
- Authority
- JP
- Japan
- Prior art keywords
- probes
- shaped
- probe
- sandwiched
- leg
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 9
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988115901U JPH076531Y2 (ja) | 1988-09-05 | 1988-09-05 | 測定用プローブ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988115901U JPH076531Y2 (ja) | 1988-09-05 | 1988-09-05 | 測定用プローブ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0237383U true JPH0237383U (ru) | 1990-03-12 |
| JPH076531Y2 JPH076531Y2 (ja) | 1995-02-15 |
Family
ID=31357966
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988115901U Expired - Lifetime JPH076531Y2 (ja) | 1988-09-05 | 1988-09-05 | 測定用プローブ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH076531Y2 (ru) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014020819A (ja) * | 2012-07-13 | 2014-02-03 | Hioki Ee Corp | 電極保持ユニットおよび測定治具 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6189558A (ja) * | 1984-10-08 | 1986-05-07 | Dai Ichi Seiko Co Ltd | 液晶板，プリント基板テスタ−用ヘツド |
-
1988
- 1988-09-05 JP JP1988115901U patent/JPH076531Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6189558A (ja) * | 1984-10-08 | 1986-05-07 | Dai Ichi Seiko Co Ltd | 液晶板，プリント基板テスタ−用ヘツド |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014020819A (ja) * | 2012-07-13 | 2014-02-03 | Hioki Ee Corp | 電極保持ユニットおよび測定治具 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH076531Y2 (ja) | 1995-02-15 |