JPH0237383U - - Google Patents

Info

Publication number
JPH0237383U
JPH0237383U JP11590188U JP11590188U JPH0237383U JP H0237383 U JPH0237383 U JP H0237383U JP 11590188 U JP11590188 U JP 11590188U JP 11590188 U JP11590188 U JP 11590188U JP H0237383 U JPH0237383 U JP H0237383U
Authority
JP
Japan
Prior art keywords
probes
shaped
probe
sandwiched
leg
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11590188U
Other languages
Japanese (ja)
Other versions
JPH076531Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988115901U priority Critical patent/JPH076531Y2/en
Publication of JPH0237383U publication Critical patent/JPH0237383U/ja
Application granted granted Critical
Publication of JPH076531Y2 publication Critical patent/JPH076531Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案の実施例を示す図、第２図は本
考案の実施例の１使用例を示す図、第３図は従来
のスプリングコンタクトプローブを示す断面図で
ある。 図において、１０，１１はプローブ、１２は絶
縁板、１３，１４はプローブガイド、１５はガイ
ドホルダ、を示す。 FIG. 1 is a diagram showing an embodiment of the present invention, FIG. 2 is a diagram showing an example of use of the embodiment of the present invention, and FIG. 3 is a sectional view showing a conventional spring contact probe. In the figure, 10 and 11 are probes, 12 is an insulating plate, 13 and 14 are probe guides, and 15 is a guide holder.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] Ｕ字状をなし、その一方の脚部先端に取付部Ｂ
を有し、他方の脚部先端にナイフ状の接触部Ｃを
有する薄板状の１対のプローブ１０，１１を設け
、該プローブで該プローブとほぼ同形状の絶縁薄
板１２を挾み、さらに接触部Ｃがそれぞれ独立し
て動けるようにした案内溝を構成する１対のプロ
ーブガイド１３，１４でプローブ１０，１１の取
付部Ｂを挾み、さらに該プローブガイド１３，１
４をガイドホルダ１５に固定したことを特徴とす
る４端子抵抗測定用プローブ。 U-shaped, with mounting part B at the tip of one leg.
A pair of thin plate-shaped probes 10 and 11 having a knife-shaped contact portion C at the tip of the other leg are provided, and an insulating thin plate 12 having approximately the same shape as the probe is sandwiched between the probes, and further contact is made. The attachment parts B of the probes 10 and 11 are sandwiched between a pair of probe guides 13 and 14 forming guide grooves in which the parts C can move independently, and the probe guides 13 and 1
4 fixed to a guide holder 15.
JP1988115901U 1988-09-05 1988-09-05 Measuring probe Expired - Lifetime JPH076531Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988115901U JPH076531Y2 (en) 1988-09-05 1988-09-05 Measuring probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988115901U JPH076531Y2 (en) 1988-09-05 1988-09-05 Measuring probe

Publications (2)

Publication Number Publication Date
JPH0237383U true JPH0237383U (en) 1990-03-12
JPH076531Y2 JPH076531Y2 (en) 1995-02-15

Family

ID=31357966

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988115901U Expired - Lifetime JPH076531Y2 (en) 1988-09-05 1988-09-05 Measuring probe

Country Status (1)

Country Link
JP (1) JPH076531Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014020819A (en) * 2012-07-13 2014-02-03 Hioki Ee Corp Electrode holding unit and measurement fixture

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6189558A (en) * 1984-10-08 1986-05-07 Dai Ichi Seiko Co Ltd Head for tester of liquid crystal panel and printed circuit board

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6189558A (en) * 1984-10-08 1986-05-07 Dai Ichi Seiko Co Ltd Head for tester of liquid crystal panel and printed circuit board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014020819A (en) * 2012-07-13 2014-02-03 Hioki Ee Corp Electrode holding unit and measurement fixture

Also Published As

Publication number Publication date
JPH076531Y2 (en) 1995-02-15

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