JPH0235420B2 - - Google Patents
Info
- Publication number
- JPH0235420B2 JPH0235420B2 JP61006410A JP641086A JPH0235420B2 JP H0235420 B2 JPH0235420 B2 JP H0235420B2 JP 61006410 A JP61006410 A JP 61006410A JP 641086 A JP641086 A JP 641086A JP H0235420 B2 JPH0235420 B2 JP H0235420B2
- Authority
- JP
- Japan
- Prior art keywords
- lens
- charged particle
- magnetic field
- lenses
- ion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61006410A JPS61165941A (ja) | 1986-01-17 | 1986-01-17 | 荷電粒子照射装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61006410A JPS61165941A (ja) | 1986-01-17 | 1986-01-17 | 荷電粒子照射装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61165941A JPS61165941A (ja) | 1986-07-26 |
| JPH0235420B2 true JPH0235420B2 (enExample) | 1990-08-10 |
Family
ID=11637597
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61006410A Granted JPS61165941A (ja) | 1986-01-17 | 1986-01-17 | 荷電粒子照射装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61165941A (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0636346B2 (ja) * | 1988-03-09 | 1994-05-11 | セイコー電子工業株式会社 | 荷電粒子線装置及びこれによる試料観察方法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5947424B2 (ja) * | 1976-02-27 | 1984-11-19 | 株式会社島津製作所 | 複合分析装置 |
-
1986
- 1986-01-17 JP JP61006410A patent/JPS61165941A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61165941A (ja) | 1986-07-26 |
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