JPH02300613A - Measuring instrument - Google Patents

Measuring instrument

Info

Publication number
JPH02300613A
JPH02300613A JP12115689A JP12115689A JPH02300613A JP H02300613 A JPH02300613 A JP H02300613A JP 12115689 A JP12115689 A JP 12115689A JP 12115689 A JP12115689 A JP 12115689A JP H02300613 A JPH02300613 A JP H02300613A
Authority
JP
Japan
Prior art keywords
light
slit
axis direction
elliptical
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12115689A
Other languages
Japanese (ja)
Other versions
JPH0769160B2 (en
Inventor
Sadakazu Sugiyama
杉山 貞和
Teruo Asae
浅枝 暉雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissan Motor Co Ltd
Original Assignee
Nissan Motor Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissan Motor Co Ltd filed Critical Nissan Motor Co Ltd
Priority to JP1121156A priority Critical patent/JPH0769160B2/en
Publication of JPH02300613A publication Critical patent/JPH02300613A/en
Publication of JPH0769160B2 publication Critical patent/JPH0769160B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To constitute an irradiation means compactly and to increase the width of a measurement range without increasing the diameter nor focal length of a convex lens by cutting off elliptic light only in the minor-axis direction by a slit formation member without cutting off the light in the major-axis direction. CONSTITUTION:An irradiation means 3 shape the light from a light source into slit light L3, which is projected on the measured surface of an object 1 to be measured. An image pickup means 4 picks up the projection image drawn on the measured surface of the object 1 with the slit light L3, converts the image into the quantity of electricity, and outputs it. Further, a measurement unit 2 moves at right angles to the lengthwise direction of the slit light L3 while holding the constant distance to the object 1 by driving the arm 5 of an industrial robot to measure the whole shape of the object 1. Thus, the elliptic light emitted by a laser light source 10 is cut off by the slit formation member 30 only in the minor-axis direction without being cut off in the major-axis direction, so that the slit light is formed.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は測定装置、とりわけ照射手段の構造に関する。[Detailed description of the invention] Industrial applications The present invention relates to a measuring device, in particular to the structure of an irradiation means.

従来の技術 プレス成形したパネルのような測定対象の形状を三角測
量の原理で測定する場合において、産業用ロボットのア
ームに計測ユニットを取り付け、産業用ロボットのアー
ムを駆動することにより計測ユニットを測定対象に相対
的に移動しながら、計測ユニットから測定対象の測定部
にスリット光−を照射、投影し、この投影像を計測ユニ
ットの撮像手段で捕らえて測定対象の立体的な全体形状
を計測する所謂光切断法による測定装置が知られている
(特開昭62−299708号公報参照)。
Conventional technology When measuring the shape of a measurement target such as a press-formed panel using the principle of triangulation, a measurement unit is attached to the arm of an industrial robot, and the measurement unit is measured by driving the arm of the industrial robot. While moving relative to the object, a slit light is irradiated and projected from the measurement unit onto the measurement part of the measurement object, and this projected image is captured by the imaging means of the measurement unit to measure the overall three-dimensional shape of the measurement object. A measuring device using a so-called optical cutting method is known (see Japanese Patent Laid-Open No. 62-299708).

発明が解決しようとする課題 照射手段においては、一般的には第6図(Y3)に示す
ように、図外の光源から発射した光を図外のコリメータ
レンズと図外の凸レンズとに透過して円形に形成し、こ
の円形光り、を図外のシリンドリカル凹レンズと図外の
凸レンズとに透過して楕円形に形成し、この楕円形光L
2をスリット形成部材Aのスリット&に通してスリット
光L1に形成している。しかし、スリット光I−3の長
手幅、を大きくして測定範囲の幅を広げようとするには
、シリンドリカル凹レンズの後に通ず凸レンズの直径と
焦点距離とを大きくする必要がある。このため測定範囲
の幅を広げると、凸レンズの直径と焦点距離とを大きく
した分、照射手段が大型となるばかりでなく、第6図(
A)にハツチングで示したようにスリット形成部材で遮
られる光量が多くパワーロスが大きいうえ、スリット形
成部材を透過する際に回折ににるハレーションを生じ、
スリット光■21.にボケを生じるので、にはかに採用
しがたいものである。
Problems to be Solved by the Invention In the irradiation means, generally, as shown in FIG. 6 (Y3), light emitted from a light source (not shown) is transmitted through a collimator lens (not shown) and a convex lens (not shown). This circular light is transmitted through a cylindrical concave lens (not shown) and a convex lens (not shown) to form an elliptical shape, and this elliptical light L
2 is passed through the slit & of the slit forming member A to form the slit light L1. However, in order to widen the measurement range by increasing the longitudinal width of the slit beam I-3, it is necessary to increase the diameter and focal length of the convex lens that passes behind the cylindrical concave lens. For this reason, if the width of the measurement range is widened, the diameter and focal length of the convex lens are increased, and the irradiation means will not only become larger, but also
As shown by the hatching in A), the amount of light that is blocked by the slit forming member is large, resulting in a large power loss, and when it passes through the slit forming member, it causes halation due to diffraction.
Slit light■21. It is difficult to use this method in general because it causes blurring.

課題を解決するだめの手段 光切断法により測定対象の形状を測定する測定装置にお
いて、測定対象−ヒにスリット光を照射。
Means to Solve the Problem In a measuring device that measures the shape of an object using an optical cutting method, the object to be measured is irradiated with slit light.

投影する照射手段に、楕円形のレーザ光を発射するレー
ザ光源と、このレーザ光源から発射した楕円形光を長軸
方向に拡大しつつ透過するレンズ系と、このレンズ系内
に配置され、前記楕円形光の長軸方向に延びるスリット
を有するスリット形成部材を備えている。
A laser light source that emits an elliptical laser beam onto the projection irradiation means, a lens system that transmits the elliptical light emitted from the laser light source while expanding it in the long axis direction; A slit forming member having a slit extending in the long axis direction of the elliptical light is provided.

作用 レーザ光源から発射された楕円形光の長軸方向をスリッ
ト形成部材で遮ることなく、楕円形光の短軸方向のみを
スリット形成部材で遮ることによリ、スリット光を形成
する。
A slit light is formed by blocking only the short axis direction of the elliptical light emitted from the working laser light source with the slit forming member without blocking the long axis direction of the elliptical light with the slit forming member.

実施例 第1〜3図に示すように、1は測定対象であって、例え
ば所要の形状にプレス成形されたパイルである。2は計
測ユニットであって、照射手段3と撮像手段4とを備え
ている。照射手段3は光源からの光をスリット光L3に
形成し、このスリット光■53を測定対象Iの測定面に
照射、投影する構造になっている。撮像手段4は測定対
象Iの測定面にスリット光1−3により描かれた投影像
を撮像して電気量に変換して出力する構造になっている
。また計測ユニソl−2は産業用ロボットのアーム5が
駆動することにより、測定対象1と一定の離間距離を保
ちながらスリット光■、9の長手方向と直交する方向に
移動して、測定対象lの全体形状を測定するようになっ
ている。
EMBODIMENTS As shown in FIGS. 1 to 3, reference numeral 1 indicates an object to be measured, for example, a pile press-formed into a desired shape. Reference numeral 2 denotes a measurement unit, which includes an irradiation means 3 and an imaging means 4. The irradiation means 3 forms the light from the light source into a slit light L3, and irradiates and projects this slit light 53 onto the measurement surface of the measurement object I. The imaging means 4 is structured to capture a projected image drawn by the slit light 1-3 on the measurement surface of the measurement object I, convert it into an electrical quantity, and output it. In addition, the measurement unit 1-2 is driven by the arm 5 of the industrial robot, and moves in a direction perpendicular to the longitudinal direction of the slit beams 1 and 9 while maintaining a constant distance from the measurement object 1. It is designed to measure the entire shape of.

ここで照射手段3は第1.2図に示すように、レーザ光
源10とレンズ系20とスリット形成部材30とで構成
されている。
Here, the irradiation means 3 is composed of a laser light source 10, a lens system 20, and a slit forming member 30, as shown in FIG. 1.2.

レーザ光源IOは第3図に示すように半導体レ−ザで構
成されており、楕円形光L2を発射するものである。
As shown in FIG. 3, the laser light source IO is composed of a semiconductor laser and emits an elliptical light L2.

レンズ系20はレーザ光源10側から順に配置したコリ
メータレンズ2■とシリンドリカル凹レンズ22と凸レ
ンズ23とで構成されている。シリンドリカル凹レンズ
22の凹面軸は楕円形光172の長軸に沿って配置され
ている。
The lens system 20 is composed of a collimator lens 2, a cylindrical concave lens 22, and a convex lens 23, which are arranged in order from the laser light source 10 side. The concave axis of the cylindrical concave lens 22 is arranged along the long axis of the elliptical light 172.

スリット形成部材30はレンズ系20内に配置されてお
り、そのスリット31の長手幅が楕円形光L 2の長軸
に沿って配置され、スリット30aの短手幅が楕円形光
り、の短軸に沿って配置されている。
The slit forming member 30 is arranged within the lens system 20, and the longitudinal width of the slit 31 is arranged along the long axis of the elliptical light L2, and the short width of the slit 30a is arranged along the short axis of the elliptical light. is located along.

以」二の実施例構造によれば、照射手段3から発射する
スリット光L3の長手幅を産業用ロボットのY軸方向と
平行にセットし、スリット光■73が産業用ロボットの
X軸方向と平行に移動するように、産業用ロボットのア
ーム5を駆動しながら、スリット光L3を測定対象Iに
照射、投影し、この投影像を撮像手段4で捕らえて測定
対象1の全体形状を測定する。
According to the structure of the second embodiment, the longitudinal width of the slit light L3 emitted from the irradiation means 3 is set parallel to the Y-axis direction of the industrial robot, and the slit light L3 is set parallel to the X-axis direction of the industrial robot. While driving the arm 5 of the industrial robot so as to move in parallel, the slit light L3 is irradiated and projected onto the measurement object I, and this projected image is captured by the imaging means 4 to measure the overall shape of the measurement object 1. .

ここで、レーザ光源10から発射された楕円形光り、 
2はコリメータレンズ21て平行光1−4に形成され、
この平行光174がシリンドリカル凹レンズ22とスリ
ン)・形成部材30のスリット3Iを経由して凸レンズ
23を透過する際に、シリンドリカル凹レンズ22の凹
面軸とスリシト形成部材30のスリット3Iの長手幅と
が楕円形光T、2の長軸に沿って配置されているので、
第1図に示すように楕円形光り、の短軸方向から見ると
、スリット31で遮光されることなく、シリンドリカル
凹レンズ22で発散作用を受けながら凸レンズ23に到
達し、凸レンズ23で集束作用を受けて平行光り、とな
って測定対象1」−に照射、投影する。
Here, the elliptical light emitted from the laser light source 10,
2 is formed into parallel beams 1-4 by a collimator lens 21,
When this parallel light 174 passes through the convex lens 23 via the cylindrical concave lens 22 and the slit 3I of the slit forming member 30, the concave axis of the cylindrical concave lens 22 and the longitudinal width of the slit 3I of the slit forming member 30 form an ellipse. Since it is arranged along the long axis of the shaped light T,2,
As shown in FIG. 1, when viewed from the short axis direction of the elliptical light, it is not blocked by the slit 31, and reaches the convex lens 23 while undergoing a diverging effect by the cylindrical concave lens 22, and is then converged by the convex lens 23. It becomes parallel light and is irradiated and projected onto the measurement object 1.

一方策2図に示ずにうに楕円形光り、の長軸方向から見
ると、シリンドリカル凹レンズ22で発散作用を受ける
ことなく、平行光L4のままスリシト形成部材30に到
達して遮光され、スリット3Iによる所要の幅で凸レン
ズ23に到達し、凸レンズ23で集束作用を受1ノでス
リット光1−3として測定対象1」−に照射、投影する
。つまり、ンリンドリカル凹レンズ22の凹面軸が楕円
形光[7゜の長軸に沿って配置されているので、ソリン
トリカル凹レンズ22による発散作用でスリット光■7
3の長手幅が大きくなり、もって測定範囲の幅が広がる
。しかもスリット31の長手幅が楕円形光L2の長軸に
沿って配置されているので、第5図(B)に示すように
スリット形成部材30で遮られる光量が少なくなってパ
ワーロスが小さいうえ、第5図(A、 )に示すように
スリット形成部材30を透過する際に回折によるハレー
ションを生じることもないので、ボケのないシャープな
像を結ぶことができる。
On the other hand, the light is emitted in an elliptical shape (not shown in Figure 2), and when viewed from the long axis direction, the parallel light L4 reaches the slit forming member 30 as the parallel light L4 and is blocked by the slit 3I, without being diverging by the cylindrical concave lens 22. The light reaches the convex lens 23 with the required width, receives a focusing action by the convex lens 23, and is then irradiated and projected onto the measurement object 1'' as slit light 1-3. In other words, since the concave axis of the lindrical concave lens 22 is arranged along the long axis of the elliptical light [7°, the slit light 7
3 becomes larger in length, thereby widening the measurement range. Moreover, since the longitudinal width of the slit 31 is arranged along the long axis of the elliptical light L2, the amount of light blocked by the slit forming member 30 is reduced, as shown in FIG. 5(B), and power loss is small. As shown in FIG. 5(A, ), since no halation occurs due to diffraction when the light passes through the slit forming member 30, a sharp image without blur can be formed.

発明の効果 以上のように本発明によれば、レーザ光源から発射され
た楕円形光の長軸方向をスリット形成部材で遮ることな
く、楕円形光の短軸方向のみをスリット形成部材で遮る
ことにより、スリット光を形成することができるので、
凸レンズの直径と焦点距離とを大きくする必要もなく、
照射手段をコンパクトに構成でき、しかも測定範囲の幅
を太きくでき、ボケのない投影像を形成できる。。
Effects of the Invention As described above, according to the present invention, only the short axis direction of the elliptical light emitted from the laser light source is blocked by the slit forming member without blocking the long axis direction of the elliptical light emitted by the slit forming member. As a result, a slit light can be formed.
There is no need to increase the diameter and focal length of the convex lens,
The irradiation means can be configured compactly, the measurement range can be widened, and a projected image without blur can be formed. .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の要部を楕円形光の短軸方向
より見た構成図、第2図は同実施例の要部を楕円形光の
長軸方向より見た構成図、第3図は同実施例のレーザ光
源の斜視図、第4図は同実施例の全体を示す構成図、第
5図は同実施例の作用説明図、第6図は従来の作用説明
図である。 I・・・測定対象、2・照射手段、IO・レーザ光源、
20 レンズ系、30 ・スリット形成部材。 −8= @l Δ Δ 区 mへの
Fig. 1 is a block diagram of the main part of an embodiment of the present invention viewed from the short axis direction of the elliptical light, and Fig. 2 is a block diagram of the main part of the same embodiment seen from the long axis direction of the elliptical light. , FIG. 3 is a perspective view of the laser light source of the same embodiment, FIG. 4 is a block diagram showing the entire structure of the same embodiment, FIG. 5 is an explanatory diagram of the operation of the same embodiment, and FIG. 6 is an explanatory diagram of the conventional operation. It is. I...Measurement target, 2. Irradiation means, IO/laser light source,
20 Lens system, 30 - Slit forming member. −8= @l Δ Δ to section m

Claims (1)

【特許請求の範囲】[Claims] (1)光切断法により測定対象の形状を測定する測定装
置において、測定対象上にスリット光を照射、投影する
照射手段に、楕円形のレーザ光を発射するレーザ光源と
、このレーザ光源から発射した楕円形光を長軸方向に拡
大しつつ透過するレンズ系と、このレンズ系内に配置さ
れ、前記楕円形光の長軸方向に延びるスリットを有する
スリット形成部材を備えたことを特徴とする測定装置。
(1) In a measuring device that measures the shape of a measurement target using the optical cutting method, a laser light source that emits an elliptical laser beam is provided to an irradiation means that irradiates and projects a slit light onto the measurement target, and a laser light source that emits an elliptical laser beam is emitted from the laser light source. The present invention is characterized by comprising a lens system that transmits the elliptical light while expanding it in the major axis direction, and a slit forming member disposed within the lens system and having a slit extending in the major axis direction of the elliptical light. measuring device.
JP1121156A 1989-05-15 1989-05-15 measuring device Expired - Fee Related JPH0769160B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1121156A JPH0769160B2 (en) 1989-05-15 1989-05-15 measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1121156A JPH0769160B2 (en) 1989-05-15 1989-05-15 measuring device

Publications (2)

Publication Number Publication Date
JPH02300613A true JPH02300613A (en) 1990-12-12
JPH0769160B2 JPH0769160B2 (en) 1995-07-26

Family

ID=14804240

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1121156A Expired - Fee Related JPH0769160B2 (en) 1989-05-15 1989-05-15 measuring device

Country Status (1)

Country Link
JP (1) JPH0769160B2 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05280943A (en) * 1992-04-03 1993-10-29 Tokai Rika Co Ltd Light source device for measuring shape
US5612785A (en) * 1996-01-03 1997-03-18 Servo Robot Inc. Twin sensor laser probe
WO2001098760A1 (en) * 2000-06-19 2001-12-27 Ccs Inc. Illumination device for inspection
JP2006227006A (en) * 2005-01-13 2006-08-31 Komag Inc Optical workpiece checking test head equipped with lens for extending laser spot on workpiece
JP2012122844A (en) * 2010-12-08 2012-06-28 Aisin Seiki Co Ltd Surface inspection device
JP2017079173A (en) * 2015-10-21 2017-04-27 スタンレー電気株式会社 Vehicular lighting fixture

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61149919A (en) * 1984-12-25 1986-07-08 Fujitsu Ltd Slit light source
JPS63145907A (en) * 1986-12-09 1988-06-18 Fujitsu Ltd Slit light irradiator

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61149919A (en) * 1984-12-25 1986-07-08 Fujitsu Ltd Slit light source
JPS63145907A (en) * 1986-12-09 1988-06-18 Fujitsu Ltd Slit light irradiator

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05280943A (en) * 1992-04-03 1993-10-29 Tokai Rika Co Ltd Light source device for measuring shape
US5373362A (en) * 1992-04-03 1994-12-13 Kabushiki Kaisha Tokai-Rika-Denki-Seisakusho Light source device for measuring shape
US5612785A (en) * 1996-01-03 1997-03-18 Servo Robot Inc. Twin sensor laser probe
WO2001098760A1 (en) * 2000-06-19 2001-12-27 Ccs Inc. Illumination device for inspection
JP2006227006A (en) * 2005-01-13 2006-08-31 Komag Inc Optical workpiece checking test head equipped with lens for extending laser spot on workpiece
JP2012122844A (en) * 2010-12-08 2012-06-28 Aisin Seiki Co Ltd Surface inspection device
JP2017079173A (en) * 2015-10-21 2017-04-27 スタンレー電気株式会社 Vehicular lighting fixture

Also Published As

Publication number Publication date
JPH0769160B2 (en) 1995-07-26

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