JPH02254617A - Method and device for measuring friction degree - Google Patents

Method and device for measuring friction degree

Info

Publication number
JPH02254617A
JPH02254617A JP7551789A JP7551789A JPH02254617A JP H02254617 A JPH02254617 A JP H02254617A JP 7551789 A JP7551789 A JP 7551789A JP 7551789 A JP7551789 A JP 7551789A JP H02254617 A JPH02254617 A JP H02254617A
Authority
JP
Japan
Prior art keywords
magnetic
magnetic head
friction
degree
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7551789A
Other languages
Japanese (ja)
Inventor
Takahiro Yamaki
八巻 隆博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP7551789A priority Critical patent/JPH02254617A/en
Publication of JPH02254617A publication Critical patent/JPH02254617A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To easily and correctly measure a friction degree between a magnetic head and a magnetic disk by measuring a heat quantity change transmitted to the magnetic head with a contact as the temperature change, and deciding the friction degree based on the secular change of a measured temperature. CONSTITUTION:Thin film temperature sensors 7 and 7a having a Hall element 11 in which an output voltage is changed according to a circumferential temperature in a fixed magnetic field, extension lines 12, 13 and 19 to impress a current to the Hall element 11, a coil 14 to generate a magnetic field with the extension lines 12, 13 and 19 to measure the output voltage of the Hall element 11, a magnetic substance 15 to conduct the magnetic field 14 to the Hall element 11, and a substrate 16 are provided to a slider edge surface 2 of the magnetic head. In such a case, the friction heat of the magnetic head and magnetic disk is transmitted to the slider 2 of the magnetic head, the change quantity of the heat quantity is measured as the temperature change by using the thin film temperature sensors 7 and 7a, and the friction degree of the magnetic head is decided. Thus, the friction degree between the magnetic head and magnetic disk can be correctly measured.

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明は、コンタクト・スタート・ストップ方式磁気記
録装置の磁気ディスク回転起動時および停止時の磁気ヘ
ッドが磁気ディスクとの接触により生じる磁気ヘッドの
摩擦度を測定する方法および装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (a) Industrial Application Field The present invention is directed to a contact start/stop type magnetic recording device, in which a magnetic head is generated by contact with a magnetic disk at the time of starting and stopping rotation of a magnetic disk. The present invention relates to a method and apparatus for measuring the degree of friction of.

(ロ)従来技術 磁気ヘッドの製造にあたっては、磁気ヘッドと磁気ディ
スクとの摩擦の度合、または摩擦特性(摩擦係数を含め
た広い概念である。以下、FZ擦度という6)。
(B) Prior art When manufacturing a magnetic head, the degree of friction between the magnetic head and the magnetic disk, or friction characteristics (a broad concept that includes the coefficient of friction, hereinafter referred to as FZ friction 6) is important.

磁気へ・ノドと磁気ディスクとの摩擦度を測定する従来
の方法として、ピエゾ圧電素子を利用して出力電圧と摩
擦度との関係からF?!擦度を測定する方法がある。(
C,E、Yeack−3cranton、 IEEE 
Transon Magn、Vol、MAG−22,N
o、5.PP、1011.1986) 、ピエゾ圧電素
子は、イオン結晶が外力による応力に対応して電気分権
を生じるという圧電効果(ピエゾ効果)を利用して歪み
を電圧に変換する素子である。
The conventional method of measuring the degree of friction between the magnetic throat and the magnetic disk uses a piezoelectric element to calculate F? from the relationship between the output voltage and the degree of friction. ! There is a method to measure the degree of friction. (
C, E, Yeack-3cranton, IEEE
Transon Magn, Vol, MAG-22, N
o, 5. PP, 1011.1986), a piezoelectric element is an element that converts strain into voltage using a piezoelectric effect (piezo effect) in which an ionic crystal generates electrical decentralization in response to stress caused by an external force.

第14図はピエゾ圧電素子lを利用して摩擦度を測定す
る従来装置例を示す、この装置ではピエゾ圧電素子1を
磁気ヘッドのスライダ2に取り付はスライダ2をサスペ
ンション3で支持している。
FIG. 14 shows an example of a conventional device for measuring the degree of friction using a piezoelectric element 1. In this device, the piezoelectric element 1 is attached to a slider 2 of a magnetic head, and the slider 2 is supported by a suspension 3. .

磁気ヘッドと磁気ディスクとが接触するとき、サスペン
ション3の歪みをピエゾ圧電素子1′?:電圧に変換し
て、摩擦度を測定する。
When the magnetic head and magnetic disk come into contact, the distortion of the suspension 3 is caused by the piezoelectric element 1'? :Convert to voltage and measure the degree of friction.

第15図は、ピエゾ圧電素子1を利用して摩擦度を測定
する従来の別の装置例を示す。この装置では、ピエゾ圧
電素子1を磁気ヘッドのスライダ2を支持する1スペン
シヨン3に取り付けている。
FIG. 15 shows another example of a conventional device for measuring the degree of friction using the piezoelectric element 1. As shown in FIG. In this device, a piezoelectric element 1 is attached to a suspension 3 that supports a slider 2 of a magnetic head.

磁気ヘッドと磁気ディスクとが接触するとき、サスペン
ション3の歪みをピエゾ圧電素子1で電圧に変換して、
摩擦度を測定する。
When the magnetic head and the magnetic disk come into contact, the distortion of the suspension 3 is converted into voltage by the piezoelectric element 1,
Measure the degree of friction.

第16図は歪みゲージ4.5を利用して摩擦度を測定す
る従来の別の装置例を示す。この装置では歪みゲージ4
.5は、磁気ヘットのスライダ2を取り付けたサスペン
ション3の基部を支持する力検出ブロック6に取り付け
られる。磁気ヘッドと6m磁気ィスクとの接触時のZ方
向にかかる力を歪みゲージ4で測定し、また、X方向に
かかる力を歪みゲージ5で測定する。
FIG. 16 shows another example of a conventional device for measuring the degree of friction using a strain gauge 4.5. In this device, strain gauge 4
.. 5 is attached to a force detection block 6 that supports the base of the suspension 3 to which the slider 2 of the magnetic head is attached. A strain gauge 4 measures the force applied in the Z direction when the magnetic head contacts the 6 m magnetic disk, and a strain gauge 5 measures the force applied in the X direction.

従来方法のさらに別の例として、歪ゲージを利用して、
抵抗値の変化量と摩擦度の関係から、摩擦度を測定する
方法がある(地材、長屋、宮崎第11回日本応用磁気学
会学術講演概要集、PP、151987年)。
As yet another example of the conventional method, using strain gauges,
There is a method of measuring the degree of friction based on the relationship between the amount of change in resistance value and the degree of friction (Jiki, Nagaya, Miyazaki, Abstracts of the 11th Academic Conference of the Japanese Society of Applied Magnetics, PP, 151987).

一方、従来の温度センサの代表的な例としては、熱電対
がある。熱電対は、2種類の金属導体の両端を電気的に
接続して閉回路をつくり、一端のみを加熱するなどして
、両端に温度差を与えると電流が流れるというゼーベッ
ク効果を利用している。
On the other hand, a typical example of a conventional temperature sensor is a thermocouple. Thermocouples make use of the Seebeck effect, in which current flows when a temperature difference is created between the two ends by electrically connecting the ends of two types of metal conductors to create a closed circuit and heating only one end. .

実際には、起電力を測定し、温度と起電力との関係から
温度を求めるものである。
In reality, the electromotive force is measured and the temperature is determined from the relationship between the temperature and the electromotive force.

従来のF@擦度測定方法には、磁気ディスクを回転させ
るスピンドル・モータからの振動や、測定機が設置され
ている周囲からの振動が雑音になり、正確な測定ができ
ない。また磁気ヘッドと磁気ディスクとの摩擦熱により
過渡的な温度変化による零点が変動する。
In the conventional F@friction measurement method, vibrations from the spindle motor that rotates the magnetic disk and vibrations from the surroundings where the measuring device is installed create noise, making it impossible to measure accurately. Furthermore, the zero point fluctuates due to transient temperature changes due to frictional heat between the magnetic head and the magnetic disk.

一方、従来の熱電対には、センサ部の熱容量が大きく磁
気ヘッドの温度測定に影響を与え、また、位置の分解能
が悪い。
On the other hand, in conventional thermocouples, the sensor portion has a large heat capacity, which affects the temperature measurement of the magnetic head, and the positional resolution is poor.

(ハ)発明が解決しようとする課題 本発明が解決しようとする課題は、磁気ヘッドと磁気デ
ィスクとの摩擦度を簡易かつ正確に測定できる方法およ
び装置を得ることにある。
(c) Problems to be Solved by the Invention An object to be solved by the present invention is to provide a method and apparatus that can easily and accurately measure the degree of friction between a magnetic head and a magnetic disk.

(ニ)課題を解決するための手段 本発明の摩擦度測定方法は、コンタクト・スタート・ス
トップ方式磁気記録装置の磁気ディスク回転起動時およ
び停止時の磁気ヘッドが咳ディスクとの接触により生じ
る磁気ヘッドの摩擦度を測定する方法において、前記接
触により磁気ヘッドに伝わる熱FJk変化を温度測定し
、測定温度の経時変化にもとづいて前記摩擦度を決定す
る手段によって、上記課題を解決している。
(d) Means for Solving the Problems The method for measuring the degree of friction of the present invention is based on the method of measuring the degree of friction of a contact start-stop type magnetic recording device, in which the magnetic head is generated when the magnetic head comes into contact with the cough disk when the magnetic disk rotation is started and stopped. In this method for measuring the degree of friction, the above-mentioned problem is solved by measuring the change in heat FJk transmitted to the magnetic head due to the contact, and determining the degree of friction based on the change over time in the measured temperature.

本発明の摩擦度測定装置は、一定磁場中で周囲温度によ
って出力電圧が変化するホール素子と、前記ホール素子
に電流を印加する引出し線と、前記ホール素子の出力電
圧を測定する引出し線と磁場を発生させるコイルと、前
記磁場を前記ホール素子に誘導する磁性体と、基板と、
絶縁膜とを有する薄膜温度センサを磁気ヘッドのスライ
ダ端面に設けた手段によって、上記課題を解決している
The friction measuring device of the present invention includes a Hall element whose output voltage changes depending on the ambient temperature in a constant magnetic field, a lead wire that applies a current to the Hall element, a lead wire that measures the output voltage of the Hall element, and a magnetic field. a coil that generates a magnetic field, a magnetic body that induces the magnetic field to the Hall element, and a substrate;
The above problem is solved by providing a thin film temperature sensor having an insulating film on the end face of the slider of the magnetic head.

さらに、本発明の摩擦度測定装置は、一定もn湯中で周
囲温度によって抵抗値が変化する磁場抵抗素子と、前記
磁気抵抗素子に電流を印加し、出力電圧を測定する引出
し線と、磁場を発生させるコイルと、前記磁場を前記磁
気抵抗素子に誘導する磁性体と、基板と、絶縁膜とを有
する薄膜温度センナを61気ヘツドのスライダ端面に設
けた手段によっでも、上記課題を解決している。
Furthermore, the friction measuring device of the present invention includes a magnetic field resistance element whose resistance value changes depending on the ambient temperature in hot water, a lead wire for applying a current to the magnetic resistance element and measuring an output voltage, and a magnetic field resistance element whose resistance value changes depending on the ambient temperature in hot water. The above problem can also be solved by a means in which a thin film temperature sensor having a coil that generates a magnetic field, a magnetic body that induces the magnetic field to the magnetoresistive element, a substrate, and an insulating film is provided on the end face of a slider of a 61 atmosphere head. are doing.

(ホ)作用 本発明の方法は、磁気ヘッドと磁気ディスクとのV!擦
熱が磁気ヘッドのスライダに伝達し、その熱量の変化量
を温度変化として薄膜温度センサを用いて測定し、予め
求めである温度変化と摩擦度との関係から、磁気ヘッド
の摩擦度を決定する。
(e) Effect The method of the present invention provides V! between the magnetic head and the magnetic disk! Frictional heat is transmitted to the slider of the magnetic head, and the amount of change in the amount of heat is measured as a temperature change using a thin film temperature sensor.The degree of friction of the magnetic head is determined from the relationship between the temperature change and the degree of friction, which has been determined in advance. do.

したがって、機械的な歪みや振動は、本発明の測定方法
になんら影響を与えない。
Therefore, mechanical distortion and vibration have no effect on the measurement method of the present invention.

薄膜温度センサは、ホール素子の出力電圧が一定の磁場
中で一定の電流が印加されているときに、周囲の温度に
依存して変化するという現象(第4図)にもとづいてつ
くられる、また、別の薄膜温度センサは磁気抵抗素子の
出力電圧が一定の磁場中で周囲の温度に依存して変化す
るという現象(第5図)にもとづいてもつくられる。従
来の薄膜形成技術を利用して、ホール素子や磁気抵抗素
子をつくり、これらに一定の磁界を印加する構造をつく
って、薄膜温度センサを完成できる。
Thin film temperature sensors are created based on the phenomenon that the output voltage of a Hall element changes depending on the ambient temperature when a constant current is applied in a constant magnetic field (Figure 4). Another thin film temperature sensor is also constructed based on the phenomenon that the output voltage of a magnetoresistive element changes in a constant magnetic field depending on the ambient temperature (FIG. 5). A thin film temperature sensor can be completed by creating a Hall element or a magnetoresistive element using conventional thin film forming technology, and creating a structure that applies a constant magnetic field to these elements.

(へ)実施例 図面を参照して、本発明の摩擦度測定方法および装置の
実施例について説明する。
(f) Examples Examples of the friction measuring method and apparatus of the present invention will be described with reference to the drawings.

本発明の摩擦度測定方法は、コンタクト・スタート・ス
トップ方式磁気記録装置の磁気ディスク回転起動時およ
び停止時の磁気ヘッドがディスクとの接触により生じる
磁気ヘッドの摩擦度を測定する方法である0本方法は、
接触により磁気ヘッドに伝わる熱量変化を温度測定し、
測定温度の経時変化にもとづいて前記PJ擦度を決定す
る。
The method for measuring the degree of friction of the present invention is a method for measuring the degree of friction of the magnetic head caused by contact between the magnetic head and the disk when the rotation of the magnetic disk starts and stops in a contact start-stop type magnetic recording device. The method is
The temperature is measured by the change in the amount of heat transmitted to the magnetic head due to contact,
The PJ friction degree is determined based on the change in measured temperature over time.

第1図は磁気ディスクの回転停止時(時間0秒のとき、
磁気ヘッドが磁気ディスクに接触し、20秒後に磁気デ
ィスクの回転が停止した場合)における磁気ヘッドの温
度変化を示す。磁気ヘッドの磁気ディスクとの摩擦によ
る熱の発生量は、動摩擦係数、磁気ヘッドの浮上量、回
転の停止時間、ヘッドの形状や姿勢などにより異なる。
Figure 1 shows when the magnetic disk stops rotating (when time is 0 seconds,
3 shows the temperature change of the magnetic head when the magnetic head contacts the magnetic disk and the rotation of the magnetic disk stops after 20 seconds. The amount of heat generated by the friction of the magnetic head with the magnetic disk varies depending on the coefficient of dynamic friction, the flying height of the magnetic head, the rotation stop time, the shape and posture of the head, and other factors.

温度経時変化は、磁気ヘッドの材質や磁気ディスクの膜
構造とその材質によって異なる。
Temperature changes over time vary depending on the material of the magnetic head, the film structure of the magnetic disk, and its material.

摩擦度を一般的に測定する本発明の測定方法の実施例を
次に示す。第1の実施例は、第1図のΔTmaxで評価
する方法である。摩擦度目、は下記(11弐で表される
。第1図の場合は、L=11となる。
Examples of the measuring method of the present invention for generally measuring the degree of friction are shown below. The first example is a method of evaluating using ΔTmax in FIG. The degree of friction is expressed as follows (112). In the case of Fig. 1, L=11.

M、−ΔTmax     −−−(1)第2の実施例
は、第2図の斜線部の面積で評価する方法である。摩擦
度−2は(2)弐で表される。第2図の場合は、M、 
−233となる。
M, -ΔTmax --- (1) The second example is a method of evaluation based on the area of the shaded part in FIG. The degree of friction -2 is represented by (2) 2. In the case of Figure 2, M,
-233.

g−233 第3の実施例は、第3図の斜線部の面積で評価する方法
である。摩擦度H1は(3)弐で表される。第3図の場
合はM3−207となる。ここで、tISt、はそれぞ
れ温度上昇・下降時の温度変化量ΔTがΔTmax となるときの時間である(e:自然対数の底)?!2−
207 第6図および第7図に示すように、本発明の摩擦度測定
装置は、一定磁場中で周囲温度によって出力電圧が変化
するホール素子tiと、ホール素子11に電流を印加す
る引出し綿12と、ホール素子11の出力電圧を測定す
る引出し線13と磁場を発生させるコイル14と、磁1
&をホール素子11に誘導する磁性体15と基板16と
、絶縁膜17とを有する1N5!温度センサ7を磁気ヘ
ッドのスライダ2の端面に設けた構成になっている。
g-233 The third example is a method of evaluation based on the area of the shaded area in FIG. The degree of friction H1 is expressed as (3) 2. In the case of FIG. 3, it is M3-207. Here, tISt is the time when the amount of temperature change ΔT during temperature rise and fall becomes ΔTmax (e: base of natural logarithm)? ! 2-
207 As shown in FIGS. 6 and 7, the friction measuring device of the present invention includes a Hall element ti whose output voltage changes depending on the ambient temperature in a constant magnetic field, and a drawn cotton 12 that applies a current to the Hall element 11. , a lead wire 13 for measuring the output voltage of the Hall element 11, a coil 14 for generating a magnetic field, and a magnetic 1
1N5! which has a magnetic body 15 that induces & to the Hall element 11, a substrate 16, and an insulating film 17! The temperature sensor 7 is provided on the end face of the slider 2 of the magnetic head.

第7図はホール素子11を用いた薄膜温度センサ7の原
理を示す、第8図は、その薄IlK ?A度センサ7の
実施例を示す。第9図は第8図のIX−IX線からみた
縦断面図である。
FIG. 7 shows the principle of the thin film temperature sensor 7 using the Hall element 11, and FIG. 8 shows the thin film temperature sensor 7 using the Hall element 11. An example of the A degree sensor 7 is shown. FIG. 9 is a longitudinal sectional view taken along the line IX--IX in FIG. 8.

第6図および第8図に示すように、薄膜温度センサ7の
引出し線12および13の端子121および131、コ
イル14の端子141がスライダ2の端面に現れている
As shown in FIGS. 6 and 8, terminals 121 and 131 of the lead wires 12 and 13 of the thin film temperature sensor 7 and a terminal 141 of the coil 14 appear on the end surface of the slider 2.

第10図は本発明のFJ擦度′測定装置の別の実施例を
示す、この装置は、一定磁場中で周囲温度によって抵抗
値が変化する磁気抵抗素子21と、磁気抵抗素子21に
電流を印加し、出力電圧を測定する引出し線19と、磁
場を発生させるコイル14と、磁場を磁気抵抗素子21
に誘導する磁性体15と、基板16と、絶縁li!17
とを有する薄膜温度センサ7aを磁気ヘッドのスライダ
2の端面に設けた構成になっている。
FIG. 10 shows another embodiment of the FJ friction' measurement device of the present invention. This device includes a magnetoresistive element 21 whose resistance value changes depending on the ambient temperature in a constant magnetic field, and a current applied to the magnetoresistive element 21. A lead wire 19 for applying voltage and measuring an output voltage, a coil 14 for generating a magnetic field, and a magnetoresistive element 21 for generating a magnetic field.
The magnetic material 15, the substrate 16, and the insulator li! 17
A thin film temperature sensor 7a having the following structure is provided on the end face of the slider 2 of the magnetic head.

第11図は磁気抵抗素子21を用いたIwA温度センサ
7aの原理を示す、第12図はその′ifJ、膜温度セ
ンサ7aの実施例を示す、第13図は第12図のxm−
xm線からみた縦断面図である。
FIG. 11 shows the principle of the IwA temperature sensor 7a using the magnetoresistive element 21, FIG. 12 shows its 'ifJ, and an embodiment of the film temperature sensor 7a, and FIG. 13 shows the xm-
It is a longitudinal cross-sectional view seen from the xm line.

第10図および第12図に示すように、IM温度センサ
7aの引出し線19の端子1911コイル14の端子1
41がスライダ2の端面に現れている。
As shown in FIGS. 10 and 12, the terminal 1911 of the lead wire 19 of the IM temperature sensor 7a, the terminal 1 of the coil 14
41 appears on the end face of the slider 2.

(ト)効果 本発明によれば、簡易な方法および装置によって、磁気
ヘッドと磁気ディスクとの摩擦度を正確に測定すること
ができる。
(g) Effects According to the present invention, the degree of friction between a magnetic head and a magnetic disk can be accurately measured using a simple method and device.

【図面の簡単な説明】[Brief explanation of drawings]

第1図から第3図までは本発明の方法に基づく摩擦度の
各種表示方法を示す説明図、第4図および第5図は本発
明の方法に用いる薄膜温度センサの特性を示すグラフ。 第6図は本発明の摩擦度測定装置の斜視図。第7図はホ
ール素子を用いた薄膜温度センサの原理を示す説明図。 第8図は実際の薄膜温度センサの斜視図。第9図は第8
図の■−■線からみた縦断面図、第10図は本発明の別
のP9!擦度測定装置の斜視図、第11図は磁気抵抗素
子の原理を示す説明図、第12図は実際の別の薄膜温度
センサの斜視図。第13図は第12図のxm−xm線か
らみた縦断面図。第14図から第16図までは従来の各
種摩擦度測定装置の斜視図。 1:ビエゾ圧電素子、  2ニスライダ。 3;サスベンシラン、  4.54歪ゲージ。 7.7a:薄膜温度センサ511:ホール素子。 12、13.197引出し線、14:コイル。 15[を洗体、16:基板。 17:絶縁膜2    21:磁気抵抗素子121.1
31.141.191  !端子。 (外4名) 第1図 第3図 TpF藺(す) τQヒト−#ン リ千7g11  (m妙) 戸I!I遥友(aC)
FIGS. 1 to 3 are explanatory diagrams showing various methods of displaying the degree of friction based on the method of the present invention, and FIGS. 4 and 5 are graphs showing the characteristics of the thin film temperature sensor used in the method of the present invention. FIG. 6 is a perspective view of the friction measuring device of the present invention. FIG. 7 is an explanatory diagram showing the principle of a thin film temperature sensor using a Hall element. FIG. 8 is a perspective view of an actual thin film temperature sensor. Figure 9 is the 8th
A vertical cross-sectional view taken from the line ■-■ in the figure, FIG. 10 is another P9 of the present invention! FIG. 11 is an explanatory diagram showing the principle of a magnetoresistive element, and FIG. 12 is a perspective view of another actual thin film temperature sensor. FIG. 13 is a longitudinal sectional view taken along the line xm-xm in FIG. 12. FIG. 14 to FIG. 16 are perspective views of various conventional friction measuring devices. 1: Viezo piezoelectric element, 2 Nislider. 3; Susbensilane, 4.54 strain gauge. 7.7a: Thin film temperature sensor 511: Hall element. 12, 13.197 lead wire, 14: coil. 15: Body wash, 16: Substrate. 17: Insulating film 2 21: Magnetoresistive element 121.1
31.141.191! terminal. (4 other people) Figure 1 Figure 3 TpF 藺(su) τQ person-#Nrisen7g11 (m strange) Door I! I Harutomo (aC)

Claims (1)

【特許請求の範囲】 1、コンタクト・スタート・ストップ方式磁気記録装置
の磁気ディスク回転起動時および停止時の磁気ヘッドが
該ディスクとの接触により生じる磁気ヘッドの摩擦度を
測定する方法において、前記接触により磁気ヘッドに伝
わる熱量変化を温度測定し、測定温度の経時変化にもと
づいて前記摩擦度を決定することを特徴とした磁気ヘッ
ドの摩擦度測定方法。 2、一定磁場中で周囲温度によって出力電圧が変化する
ホール素子と、前記ホール素子に電流を印加する引出し
線と、前記ホール素子の出力電圧を測定する引出し線と
磁場を発生させるコイルと、前記磁場を前記ホール素子
に誘導する磁性体と、基板と、絶縁膜とを有する薄膜温
度センサを磁気ヘッドのスライダ端面に設けたことを特
徴とする磁気ヘッドの摩擦度測定装置。 3、一定磁場中で周囲温度によって抵抗値が変化する磁
気抵抗素子と、前記磁気抵抗素子に電流を印加し、出力
電圧を測定する引出し線と、磁場を発生させるコイルと
、前記磁場を前記磁気抵抗素子に誘導する磁性体と、基
板と、絶縁膜とを有する薄膜温度センサを磁気ヘッドの
スライド端面に設けたことを特徴とする磁気ヘッドの摩
擦度測定装置。
[Scope of Claims] 1. A method for measuring the degree of friction of a magnetic head caused by contact between the magnetic head and the disk at the time of starting and stopping rotation of a magnetic disk of a contact start-stop type magnetic recording device, wherein said contact 1. A method for measuring the degree of friction of a magnetic head, characterized in that the change in the amount of heat transmitted to the magnetic head is measured by temperature, and the degree of friction is determined based on the change in measured temperature over time. 2. A Hall element whose output voltage changes depending on the ambient temperature in a constant magnetic field, a lead wire that applies a current to the Hall element, a lead wire that measures the output voltage of the Hall element, and a coil that generates a magnetic field; A friction measuring device for a magnetic head, characterized in that a thin film temperature sensor including a magnetic body for guiding a magnetic field to the Hall element, a substrate, and an insulating film is provided on an end face of a slider of the magnetic head. 3. A magnetoresistive element whose resistance value changes depending on the ambient temperature in a constant magnetic field, a lead wire that applies a current to the magnetoresistive element and measures the output voltage, a coil that generates a magnetic field, and a coil that generates a magnetic field. 1. A friction degree measuring device for a magnetic head, characterized in that a thin film temperature sensor having a magnetic material guided to a resistive element, a substrate, and an insulating film is provided on the sliding end surface of the magnetic head.
JP7551789A 1989-03-28 1989-03-28 Method and device for measuring friction degree Pending JPH02254617A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7551789A JPH02254617A (en) 1989-03-28 1989-03-28 Method and device for measuring friction degree

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7551789A JPH02254617A (en) 1989-03-28 1989-03-28 Method and device for measuring friction degree

Publications (1)

Publication Number Publication Date
JPH02254617A true JPH02254617A (en) 1990-10-15

Family

ID=13578507

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7551789A Pending JPH02254617A (en) 1989-03-28 1989-03-28 Method and device for measuring friction degree

Country Status (1)

Country Link
JP (1) JPH02254617A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006028295A1 (en) * 2004-09-10 2006-03-16 Okayama University Method for detecting surface state of work and device for detecting surface state

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006028295A1 (en) * 2004-09-10 2006-03-16 Okayama University Method for detecting surface state of work and device for detecting surface state
JPWO2006028295A1 (en) * 2004-09-10 2008-05-08 国立大学法人 岡山大学 Surface state detection method and surface state detection apparatus for workpiece
US7463994B2 (en) 2004-09-10 2008-12-09 Okayama University Method and device for detecting surface state of work piece
JP2012021992A (en) * 2004-09-10 2012-02-02 Okayama Univ Thermocouple contact type surface roughness measuring method and detection device of surface state of workpiece
JP4882069B2 (en) * 2004-09-10 2012-02-22 国立大学法人 岡山大学 Surface state detection method and surface state detection apparatus for workpiece

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