JPH0225121Y2 - - Google Patents

Info

Publication number
JPH0225121Y2
JPH0225121Y2 JP1981198308U JP19830881U JPH0225121Y2 JP H0225121 Y2 JPH0225121 Y2 JP H0225121Y2 JP 1981198308 U JP1981198308 U JP 1981198308U JP 19830881 U JP19830881 U JP 19830881U JP H0225121 Y2 JPH0225121 Y2 JP H0225121Y2
Authority
JP
Japan
Prior art keywords
model
measurement
microscope
accuracy
marks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981198308U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5954805U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19830881U priority Critical patent/JPS5954805U/ja
Publication of JPS5954805U publication Critical patent/JPS5954805U/ja
Application granted granted Critical
Publication of JPH0225121Y2 publication Critical patent/JPH0225121Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Microscoopes, Condenser (AREA)
JP19830881U 1981-12-28 1981-12-28 顕微鏡による微粒子測定用マ−カ−プレ−ト Granted JPS5954805U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19830881U JPS5954805U (ja) 1981-12-28 1981-12-28 顕微鏡による微粒子測定用マ−カ−プレ−ト

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19830881U JPS5954805U (ja) 1981-12-28 1981-12-28 顕微鏡による微粒子測定用マ−カ−プレ−ト

Publications (2)

Publication Number Publication Date
JPS5954805U JPS5954805U (ja) 1984-04-10
JPH0225121Y2 true JPH0225121Y2 (online.php) 1990-07-11

Family

ID=30423868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19830881U Granted JPS5954805U (ja) 1981-12-28 1981-12-28 顕微鏡による微粒子測定用マ−カ−プレ−ト

Country Status (1)

Country Link
JP (1) JPS5954805U (online.php)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4741043B1 (en) * 1985-11-04 1994-08-09 Cell Analysis Systems Inc Method of and apparatus for image analyses of biological specimens
US20050142654A1 (en) * 2002-10-18 2005-06-30 Kazuji Matsumoto Slide glass, cover glass and pathologic diagnosis system
DE102011055294B4 (de) * 2011-11-11 2013-11-07 Leica Microsystems Cms Gmbh Mikroskopische Einrichtung und Verfahren zur dreidimensionalen Lokalisierung von punktförmigen Objekten in einer Probe
JP6187190B2 (ja) * 2013-11-26 2017-08-30 大日本印刷株式会社 顕微鏡画像校正用スライドガラス
JP6769534B2 (ja) * 2019-09-05 2020-10-14 大日本印刷株式会社 顕微鏡画像校正用スライドガラス
JP7088250B2 (ja) * 2020-09-23 2022-06-21 大日本印刷株式会社 顕微鏡画像校正用スライドガラス

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS507451U (online.php) * 1973-05-21 1975-01-25
JPS5094926U (online.php) * 1973-12-24 1975-08-08
JPS543378A (en) * 1977-06-08 1979-01-11 Matsushita Electric Ind Co Ltd Feed water changeover apparatus for hydroextraction rinse type washing machine

Also Published As

Publication number Publication date
JPS5954805U (ja) 1984-04-10

Similar Documents

Publication Publication Date Title
EP1456605B1 (de) Verfahren und anordnung zur erfassung der raumform eines objekts
EP2549227B1 (en) Method for determining the tilt of an image sensor
DE102021113391A1 (de) Koordinatenmessgerät mit sichttaster zum durchführen von messvorgängen des typs punkte-aus-fokus
DE102020101191A1 (de) Mikroskop und Verfahren zum Ermitteln eines Messortes eines Mikroskops
DE602004011681T2 (de) Verfahren und ir-kamera zur bestimmung der kondensationsgefahr
US6513257B2 (en) Method and apparatus for determining scale in photographic images
US5691812A (en) Calibration standard for calibrating a defect inspection system and a method of forming same
DE3712958C1 (en) Method and device for photographically measuring a three-dimensional object
DE102013001897A1 (de) Verfahren zur Vermessung von Gliedmaßen
DE102023136425A1 (de) Prüfverfahren, prüfvorrichtung und prüfprogramm für eine scheibenförmige massteilungsplatte
DE102016102753A1 (de) Handwerkzeug mit Lagebestimmung und Verfahren zur Lagebestimmung eines Handwerkzeuges
DE102004033526A1 (de) Verfahren und Vorrichtung zur Analyse zumindest partiell reflektierender Oberflächen
CN107356529A (zh) 一种茶树病害茶饼病病害级别鉴定装置
EP2055255A1 (de) Verifizierung des Kalibrierungszustandes eines optischen Trackingsystems
US20020131633A1 (en) System and method for machine vision inspection through platen
DE10159899A1 (de) Automatisierte Bildkettengeometriequantifizierung
EP2974865B1 (de) Verfahren zur fehlerortbestimmung und vorrichtung zur durchführung desselbigen verfahrens
DE202013007536U1 (de) Vorrichtung zur digitalen Ablesung für Schnelltests
EP1473540B1 (de) Verfahren zur Bestimmung des Niveaus mehrerer Messpunkte sowie Anordnung dafür
DE102024118318A1 (de) Graduierungsplattenhaltungsinspektionsverfahren
DE4134689C1 (en) Optically measuring contour of toroidal opaque object - registering shadows cast by light source using line or matrix camera taking into account distance from object and imaging scale
DE102023120034B3 (de) Messanordung sowie Verfahren zum mehrdimensionalen Vermessen von Füßen
Suh et al. Measurement of morphological properties of tree seedlings using machine vision and image processing
CN112985276B (zh) 电路板的厚度量测方法及厚度量测系统
US3806799A (en) Arrangement for determining optimum phase position when sorting workpieces by the eddy current test method