JPH0225121Y2 - - Google Patents

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Publication number
JPH0225121Y2
JPH0225121Y2 JP1981198308U JP19830881U JPH0225121Y2 JP H0225121 Y2 JPH0225121 Y2 JP H0225121Y2 JP 1981198308 U JP1981198308 U JP 1981198308U JP 19830881 U JP19830881 U JP 19830881U JP H0225121 Y2 JPH0225121 Y2 JP H0225121Y2
Authority
JP
Japan
Prior art keywords
model
measurement
microscope
accuracy
marks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981198308U
Other languages
Japanese (ja)
Other versions
JPS5954805U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19830881U priority Critical patent/JPS5954805U/en
Publication of JPS5954805U publication Critical patent/JPS5954805U/en
Application granted granted Critical
Publication of JPH0225121Y2 publication Critical patent/JPH0225121Y2/ja
Granted legal-status Critical Current

Links

Description

【考案の詳細な説明】 本考案は、例えば医薬の製剤に用いるエマルジ
ヨン、サスペンシヨン、又は異物等の微粒子の基
本的な大きさ(面積・幅または最大径)・形状・
数などを、顕微鏡で拡大して、肉眼または電子式
測定機で測定するに当り、顕微鏡又は電子式測定
機などの機械側の測定精度やオペレータの操作精
度を正確に知ることができ、しかも、その機械の
画像のピントやコントラストを簡単に高精度に調
節することもできるようにする、いわば標準モデ
ルともいうべき微粒子測定用マーカープレートを
提供するものである。
[Detailed description of the invention] The present invention is based on the basic size (area, width or maximum diameter), shape and
When enlarging numbers with a microscope and measuring them with the naked eye or with an electronic measuring device, it is possible to accurately know the measurement accuracy of the machine such as the microscope or electronic measuring device and the accuracy of the operator's operation. The present invention provides a marker plate for particle measurement, which can be called a standard model, and which allows the focus and contrast of the image of the machine to be easily adjusted with high precision.

従来では、本考案の微粒子測定用マーカープレ
ートに類するものは無く、測定サンプルとスケー
ルを顕微鏡に同時にセツトして、顕微鏡又は電子
式測定機のテレビ画面に写つた画像のピントやコ
ントラストを画像調節装置で調節してから、測定
していた。
Conventionally, there is no marker plate similar to the particle measurement marker plate of the present invention, and the measurement sample and scale are set on the microscope at the same time, and the focus and contrast of the image reflected on the television screen of the microscope or electronic measuring device is adjusted using an image adjustment device. I adjusted it and then measured it.

ところがこの場合、顕微鏡や電子式測定機など
の機械側の測定精度を知ることができないうえ、
オペレータの操作精度をも知ることができない。
However, in this case, it is not possible to know the measurement accuracy of machines such as microscopes and electronic measuring machines, and
It is also impossible to know the accuracy of the operator's operation.

このため、測定結果の誤差範囲がどの程度のも
のであるのかが不明で、測定結果の信頼度を確認
できない致命的な欠点がある。
For this reason, it is unclear what the error range of the measurement results is, and there is a fatal drawback that the reliability of the measurement results cannot be confirmed.

しかも、画像のピントやコントラストを調整す
る場合、サンプルの微粒子は周囲の色と似通う場
合が多く、この場合にその微粒子の画像が見えに
くく、作業者は目を凝らして慎重に画像の調節を
繰返しても、この画像が正確に調整されたかどう
かを見定めることが困難なため、作業者が疲労す
るうえ、手間がかかつて非能率である。しかも、
画像調節の誤差が大きく、これが測定ミスとなつ
て表われるため、測定精度が低下する。
Moreover, when adjusting the focus and contrast of an image, the fine particles in the sample often have a similar color to the surroundings, and in this case, it is difficult to see the image of the fine particles, and the operator must carefully adjust the image. Repeatedly, it is difficult to determine whether the image has been accurately adjusted, which is tiring for the operator, time consuming, and inefficient. Moreover,
The error in image adjustment is large, and this appears as a measurement error, resulting in a decrease in measurement accuracy.

そのうえ、機械側が故障して測定精度が異常低
下している場合、またはオペレータの体調が悪く
て操作精度が異常低下している場合に、そのこと
に気付かないまま、測定結果を間違える重大な欠
点もあつた。
Furthermore, there is the serious drawback that if the measurement accuracy is abnormally reduced due to a malfunction on the machine side, or if the operator is unwell and the operational accuracy is abnormally reduced, the measurement result may be incorrect without being aware of it. It was hot.

そこで、本考案者は、測定サンプル中の微粒子
に似せたモデルマークを所定の大きさと形と数だ
け印した物を、測定サンプルの代りにセツトし
て、機械側に表われたモデルマークの画像の大き
さ・形・数の測定値を、モデルマークの既知の実
際の大きさ・形・数と比較することにより、その
機械側の測定精度またはオペレータの操作精度を
知ることができるようにし、しかも、そのモデル
マークを明確に印して、サンプルの微粒子よりも
画像がはつきり写るようにすることにより、画像
のピントやコントラストを簡単に高精度に調節で
きる方法を考え出した。
Therefore, the inventor of the present invention set an object with a predetermined size, shape, and number of model marks imitating the particles in the measurement sample in place of the measurement sample, and created an image of the model mark that appeared on the machine side. By comparing the measured values of the size, shape, and number of the model mark with the known actual size, shape, and number of the model mark, it is possible to know the measurement accuracy of the machine or the operation accuracy of the operator, Moreover, by clearly marking the model mark so that the image stands out more than the sample particles, they devised a method to easily adjust the focus and contrast of the image with high precision.

本考案は、この方法に使用する前記「モデルマ
ークを印した物」を提供することにより、機械側
の測定精度もオペレータの操作精度も正確に知る
ことができ、しかも、簡単に高精度に画像のピン
トやコントラストの調節ができるようにすること
を主要な目的とするものである。
By providing the above-mentioned "model mark-marked object" used in this method, the present invention makes it possible to accurately determine both the measurement accuracy of the machine and the operation accuracy of the operator. Its main purpose is to enable adjustment of focus and contrast.

以下、本考案の実施例を図面に基き説明する。 Embodiments of the present invention will be described below with reference to the drawings.

第1図及び第2図において、符号1はガラスま
たは硬質合成樹脂製の透明プレートであり、2は
モデルマークである。
In FIGS. 1 and 2, reference numeral 1 is a transparent plate made of glass or hard synthetic resin, and 2 is a model mark.

モデルマーク2は、顕微鏡で測定しようとする
サンプルの微粒子の基本的な大きさと形状を模し
たものであり、複数種の形状のものが多数ある。
これらのモデルマーク2は、透明プレート1の上
面の映像領域3の全域に亘つて一面に散らばつ
て、明確に印されている。この透明プレート1の
上面は必要に応じて第4図に示すように、透明の
保護カバー4で覆つてもよい。
The model mark 2 imitates the basic size and shape of the particles of the sample to be measured with a microscope, and there are many types of shapes.
These model marks 2 are clearly marked and scattered over the entire image area 3 on the upper surface of the transparent plate 1. The upper surface of the transparent plate 1 may be covered with a transparent protective cover 4 as shown in FIG. 4, if necessary.

モデルマーク2には、第3図に示すように、丸
形・正方形及び棒形の3種の形状のものがあり、
さらにこの3種の形状のそれぞれに大・中・小・
微の4種の大きさのものがある。
As shown in Figure 3, model mark 2 has three shapes: round, square, and rod.
Furthermore, each of these three shapes has large, medium, small, and
There are four sizes: micro.

これらの多数種のモデルマーク2は、第1図に
示すように、各種類ごとに合同形のものが数個づ
つあり、合同形のもの同士は互いに分離してい
る。そして、4角形のモデルマークには水平に座
るものと斜めに立つものとがある。棒状のものに
は、縦に立つもの、横に倒れるもの、及び斜めに
傾くものがある。
As shown in FIG. 1, these many types of model marks 2 have several congruent shapes for each type, and the congruent shapes are separated from each other. There are two types of rectangular model marks: those that sit horizontally and those that stand diagonally. Stick-shaped objects include those that stand vertically, those that fall horizontally, and those that tilt diagonally.

本考案の微粒子測定用マーカープレートは、以
上のように構成されており、次のように用いる。
The marker plate for particle measurement of the present invention is constructed as described above, and is used as follows.

即ち、顕微鏡で測定しようとするサンプルの代
りに、本考案の微粒子測定用マーカープレートを
顕微鏡の載物台にセツトする。すると、顕微鏡の
接眼レンズまたはこれに付設した電子式測定機の
テレビ受像器に、前記映像領域3の全域に亘つて
モデルマーク2の画像が拡大して写る。(第1図
は実物の72.5倍の大きさ。) 次いで、顕微鏡または電子式測定機の画像焦点
調節装置を操作して、その画像のピントとコント
ラストを映像領域3の全部分に亘つて明確に合せ
る。このとき、モデルマーク2が明確に印されて
いてその周囲とはつきり見分けられるため、その
画像はピントとコントラストが合つたときにピタ
リと明確になり、簡単に明確にコントラストを合
せることができる。
That is, instead of the sample to be measured with the microscope, the marker plate for particle measurement according to the present invention is set on the stage of the microscope. Then, an enlarged image of the model mark 2 covering the entire image area 3 appears on the eyepiece of the microscope or the television receiver of the electronic measuring device attached thereto. (Figure 1 is 72.5 times the actual size.) Next, operate the image focus adjustment device of the microscope or electronic measuring device to clearly adjust the focus and contrast of the image over the entire image area 3. Match. At this time, the model mark 2 is clearly marked and can be easily distinguished from its surroundings, so the image becomes sharply clear when the focus and contrast is adjusted, making it easy to clearly match the contrast. .

これ以後は、本考案の微粒子測定用マーカープ
レートを顕微鏡の載物台から取外し、そこに測定
サンプルを置けば、測定サンプルの微粒子をピン
トとコントラストが正確に合つた状態で、その基
本的な形・大きさ及び数の全てを、作業者または
電子式測定機が高精度に測定する。
After this, by removing the particle measurement marker plate of this invention from the stage of the microscope and placing the measurement sample there, the particles in the measurement sample can be accurately focused and contrasted, and their basic shape・All sizes and numbers are measured with high precision by a worker or an electronic measuring device.

なお、上記実施例の変形例として、モデルマー
ク2の大きさの種類を、2種類、3種類、又は5
種類以上のどの複数種類にでも、またどのような
大きさにでも任意に決定してもよい。また、モデ
ルマーク2の形を正方形のものの代りに長方形の
ものにすること、三角形その他の形のモデルマー
クを加えることなど、必要に応じて決めればよ
い。
In addition, as a modification of the above embodiment, the size of the model mark 2 may be 2 types, 3 types, or 5 types.
It may be arbitrarily determined to be of any plurality of types or to any size. Further, the shape of the model mark 2 may be made rectangular instead of square, or a model mark of a triangular or other shape may be added, as necessary.

本考案は、上記のように構成され、使用される
ものであるから、次の作用効果を奏する。
Since the present invention is configured and used as described above, it has the following effects.

イ 本考案の微粒子測定用マーカープレートを顕
微鏡にセツトして、顕微鏡又はこれに付設した
電子式測定機などの機械側の画面に表われたモ
デルマークの画像の大きさ・形・数の測定値
を、モデルマークの既知の実際の大きさ・形・
数と比較することにより、その機械側の測定精
度もオペレータの操作精度も知ることができ
る。
(a) Measured values of the size, shape, and number of the image of the model mark displayed on the screen of the microscope or an electronic measuring device attached to it by setting the particle measurement marker plate of the present invention in a microscope. , the known actual size, shape and shape of the model mark.
By comparing the numbers, it is possible to know both the measurement accuracy of the machine and the accuracy of the operator's operation.

即ち、一定水準の操作精度を有するオペレー
タが検査すれば、機械側の測定精度を正確に知
ることができる。また、一定水準の測定精度を
もつ機械でテストすれば、オペレータの操作精
度のレベルを知ることができる。
That is, if an operator with a certain level of operational accuracy performs the inspection, the measurement accuracy of the machine can be accurately known. Furthermore, by testing with a machine that has a certain level of measurement accuracy, it is possible to determine the level of operator accuracy.

これにより、測定結果の誤差範囲がどの程度
のものであるのかが分り、測定結果の信頼度を
正確に知ることができる。
This makes it possible to know the extent of the error range of the measurement results and to accurately know the reliability of the measurement results.

ロ モデルマークは明確に印すことにより、測定
サンプルの微粒子の場合よりも、その周囲から
はつきり見分けられるので、顕微鏡または電子
式測定機の画像のピントやコントラストを簡単
に高精度に合せることができる。
(b) By marking the model mark clearly, it can be more easily distinguished from its surroundings than the fine particles in the measurement sample, making it easier to adjust the focus and contrast of images from a microscope or electronic measuring device with high precision. Can be done.

これにより、その画像調節を速やかに楽に能
率良く行なえるうえ、高精度に合つたピントや
コントラストで微粒子測定を高精度に行なえ、
測定精度を高めることができる。
This allows you to quickly, easily and efficiently adjust the image, and also to perform fine particle measurements with high accuracy with precisely matched focus and contrast.
Measurement accuracy can be improved.

ハ 機械側が故障して測定精度が異常低下してい
る場合、またはオペレータの体調が悪くて操作
精度が異常低下している場合、本案微粒子測定
用マーカープレートを用いれば、測定精度の異
常低下により、機械やオペレータの異常を簡単
に発見できる。これにより、その異常を見過し
測定結果を間違えることを無くせる。
C. If the measurement accuracy is abnormally reduced due to a malfunction on the machine side, or if the operator is unwell and the operational accuracy is abnormally reduced, if the marker plate for particulate measurement of this invention is used, the measurement accuracy will be abnormally reduced. Abnormalities in machines and operators can be easily detected. This eliminates the possibility of overlooking the abnormality and making a mistake in the measurement results.

ニ モデルマークは、透明プレートの映像領域の
全域に亘つて印されているので、画像のピント
やコントラストが中央部で合つているが周辺部
で合つていないことなども一目で確認でき、全
ての部分を正確に合せ直すことができるので、
この点からも機械側の測定精度やオペレータの
操作精度をさらに正確に知ることができるとと
もに、微粒子測定精度をされに高めることもで
きる。
(2) The model mark is marked over the entire image area of the transparent plate, so you can check at a glance whether the focus or contrast of the image is correct in the center but not in the periphery. The parts can be re-aligned accurately, so
From this point of view, it is possible to more accurately know the measurement accuracy of the machine and the operation accuracy of the operator, and it is also possible to further improve the accuracy of particle measurement.

ホ モデルマークは、丸形・4角形並び棒形の基
本的な形状がほぼ揃い、しかもこれらの各形状
ごとに大小複数種の大きさのものもあるので、
測定サンプルの微粒子の数だけにとどまらず、
その基本的な形も基本的な大きさも高精度に測
定できる。
E Model marks have almost the same basic shapes as round, square, and bar shapes, and each of these shapes also comes in multiple sizes.
Not only the number of particles in the measurement sample, but also
Its basic shape and basic size can be measured with high precision.

しかも、1種の本案微粒子測定用マーカープ
レートで、種々の測定サンプルの微粒子を可成
り広範に亘つても高精度に測定でき、汎用性に
富む。
Moreover, with one type of marker plate for particle measurement according to the present invention, particles of various measurement samples can be measured with high precision even over a fairly wide range, and is highly versatile.

ヘ 多数のモデルマークは、例えば写真製版など
により、簡単に高精度にしかも高速度で明確に
印すことができるので、簡単に量産でき、安価
に提供できる。
F. A large number of model marks can be easily and clearly marked with high precision and high speed using, for example, photoengraving, so they can be easily mass-produced and provided at low cost.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本考案の一実施例を示し、第1図は平面
図、第2図は第1図−線断面図、第3図はモ
デルマークの形及び大きさの種類を示す標、第4
図は別の実施例に係る第2図相当図である。 1……透明プレート、2……モデルマーク、3
……映像領域。
The drawings show one embodiment of the present invention, in which Fig. 1 is a plan view, Fig. 2 is a sectional view taken along the line shown in Fig. 1, Fig. 3 is a mark indicating the type of shape and size of the model mark, and Fig. 4 is a plan view.
The figure is a diagram corresponding to FIG. 2 according to another embodiment. 1...Transparent plate, 2...Model mark, 3
...image area.

Claims (1)

【実用新案登録請求の範囲】 1 顕微鏡で測定しようとするサンプルの微粒子
の基本的な大きさと形の基本形状を模した複数
種の多数のモデルマークを、透明プレートの映
像領域の全域に一面に散らばせて印し、そのモ
デルマークには、丸形・4角形及び棒形の少な
くとも3種の形状のものがあり、さらにこの3
種の形状のそれぞれに大小異なる複数種の大き
さのものがあり、各々の合同形のモデルマーク
を複数個づつ互いに分散させてなる、顕微鏡に
よる微粒子測定用マーカープレート。 2 実用新案登録請求の範囲第1項に記載したマ
ーカープレートにおいて、前記3種の形状のモ
デルマークのそれぞれに、少なくとも大・中・
小3種の大きさのものがあるもの。 3 実用新案登録請求の範囲第1項又は第2項に
記載したマーカープレートにおいて、4角形と
棒形とのモデルマークのうちの少なくとも1種
の合同形のもの同士の向きを2種以上に異なら
せたもの。
[Claims for Utility Model Registration] 1. A large number of model marks of multiple types that imitate the basic size and shape of microparticles of a sample to be measured with a microscope are placed all over the entire imaging area of a transparent plate. The model mark has at least three shapes: round, square, and bar.
A marker plate for microparticle measurement using a microscope, which has multiple types of seed shapes with different sizes, and has a plurality of model marks of each congruent shape dispersed among each other. 2. In the marker plate described in claim 1 of the utility model registration claim, each of the three types of model marks has at least large, medium, and
There are three small sizes. 3. In the marker plate described in paragraph 1 or 2 of the claims for utility model registration, if at least one of the square and rod-shaped model marks has a congruent shape, the orientations of two or more different model marks. What I set.
JP19830881U 1981-12-28 1981-12-28 Marker plate for particle measurement using a microscope Granted JPS5954805U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19830881U JPS5954805U (en) 1981-12-28 1981-12-28 Marker plate for particle measurement using a microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19830881U JPS5954805U (en) 1981-12-28 1981-12-28 Marker plate for particle measurement using a microscope

Publications (2)

Publication Number Publication Date
JPS5954805U JPS5954805U (en) 1984-04-10
JPH0225121Y2 true JPH0225121Y2 (en) 1990-07-11

Family

ID=30423868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19830881U Granted JPS5954805U (en) 1981-12-28 1981-12-28 Marker plate for particle measurement using a microscope

Country Status (1)

Country Link
JP (1) JPS5954805U (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4741043B1 (en) * 1985-11-04 1994-08-09 Cell Analysis Systems Inc Method of and apparatus for image analyses of biological specimens
DE60321159D1 (en) * 2002-10-18 2008-07-03 Hamamatsu Photonics Kk SLIDING GAUGES, COVERED GLASS AND PATHOLOGICAL DIAGNOSTIC SYSTEM
DE102011055294B4 (en) * 2011-11-11 2013-11-07 Leica Microsystems Cms Gmbh Microscopic device and method for the three-dimensional localization of punctiform objects in a sample
JP6187190B2 (en) * 2013-11-26 2017-08-30 大日本印刷株式会社 Microscope image calibration slide glass
JP6769534B2 (en) * 2019-09-05 2020-10-14 大日本印刷株式会社 Slide glass for microscope image calibration
JP7088250B2 (en) * 2020-09-23 2022-06-21 大日本印刷株式会社 Microscope image calibration slide glass

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS543378A (en) * 1977-06-08 1979-01-11 Matsushita Electric Ind Co Ltd Feed water changeover apparatus for hydroextraction rinse type washing machine

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS507451U (en) * 1973-05-21 1975-01-25
JPS5094926U (en) * 1973-12-24 1975-08-08

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS543378A (en) * 1977-06-08 1979-01-11 Matsushita Electric Ind Co Ltd Feed water changeover apparatus for hydroextraction rinse type washing machine

Also Published As

Publication number Publication date
JPS5954805U (en) 1984-04-10

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