DE102004033526A1 - Analysis of at least partly reflecting surfaces involves varying relative orientation/position of object, pattern generation device and/or image receiver(s) for image reflected at surface, to obtain surface, especially geometry, information - Google Patents

Abstract

The method involves varying the relative orientation and/or the relative position of the object (200), at least one pattern generation device/source in the visible and/or invisible region, especially at least one pattern generator (10) and/or at least one image receiver (20) for an image reflected at the surface (202), especially at least one optical sensor in order to obtain information about the surface, especially its geometry. An independent claim is also included for a device for analysis of at least partly reflecting surfaces.

Description

technical area

The The present invention relates to the technical field of analysis and / or surveying, especially inspecting and / or of testing, of at least partially reflective, in particular shiny and / or reflective surfaces.

As a general rule that applies to the investigation of surfaces that are a partially or completely specular Have behavior, a common one Task of automated visual inspection systems. Examples include molds, Body parts, lenses, painted surfaces, perfume bottles, pressing tools, metal cutting machined parts and mirrors.

One Known method for the examination of at least partially reflective Surfaces is here the deflectometry. Here, a local pattern becomes electromagnetic Radiation reflected at the object to be measured. That reflected Image is evaluated with an optical sensor.

In the publication DE 196 43 018 A1 a method is described in which a pattern consisting of at least two different light intensities is reflected on a surface to be examined. At least one camera observes the area where the pattern is reflected. The evaluation is carried out by determining the deviation between the direct and the reflected image of the pattern.

From the publication DE 199 44 354 A1 For example, an apparatus and method is known in which a sinusoidal pattern is imaged onto a specular or transparent object. The pattern deformed by the object is examined for its local phase.

In the publication DE 101 10 994 A1 a device for the examination of objects is described in which fluorescent tubes are arranged above the object to be examined in parallel, which generate a light-dark pattern in the surface of the object to be examined. Cameras arranged parallel to the fluorescent tubes detect the light-dark pattern deformed by the surface.

From the publication DE 101 27 304 A1 For example, an apparatus and a method are known in which a raster reflected on the surface to be examined is examined for its deformation by the reflection in order to conclude the three-dimensional shape of the surface.

at all listed above Prior art devices and methods become the Pictures, even when taken from different angles be, one for each single determined viewing direction evaluated separately; it will be so no link The pictures are taken from different perspectives.

at of deflectometry only gradients of the surface be determined. To calculate the three-dimensional topography the surface have to the gradient data are integrated, which is a big source of error represents. Although triangular methods can be three-dimensional Determine data directly, but in principle have a greater inaccuracy as deflektometric methods.

Presentation of the invention: Task, solution, advantages

outgoing from the disadvantages and shortcomings set out above as well as in appreciation of the prior art is the present invention the object of a method and an arrangement or device for Analyzing and / or measuring, in particular for inspection and / or for testing, of at least partially reflective, in particular shiny and / or reflective surfaces To further develop that using the method of deflectometry the problems outlined above are overcome.

These Task will be according to the teaching of the present invention by a method as in claim 1 mentioned features and by an arrangement or device solved with the features mentioned in claim 12. Advantageous embodiments and appropriate developments of present invention are characterized in the respective subclaims.

therefore the core of the present invention lies in a novel deflektometric Surfaces- and shape examination taking advantage of the movement of components the device, that is, it is reflected from the surface Image sequence of the pattern on change the position and / or the orientation of at least one optical Sensor relative to the object to be examined using at least used an evaluation / control unit.

This can be done by changing the position and / or the rotational position of the individual components the arrangement information, in particular geometric information, are obtained on the surface to be examined, using the method of deflectometry is used.

• – um eine glatte Oberfläche mindestens eines Gegenstands, insbesondere mindestens eines Prüflings, oder
• – um eine strukturierte Oberfläche zum Beispiel mindestens eines Gegenstands, insbesondere mindestens eines Prüflings.

In this context, a "surface" in the context of the present invention as a rule

• A smooth surface of at least one object, in particular at least one test object, or
• - To a structured surface, for example, at least one item, in particular at least one DUT.

Regardless of whether these surfaces have a completely specular reflectance or only a partially specular reflectance, the present invention provides a suitable method for testing both types of surfaces, that is, for the inspection of structured surfaces and for the inspection of smooth surfaces :
According to the invention, the position and / or the orientation of at least one component of the arrangement or device is selectively changed, so that a change in the image data can be actively used; Accordingly, the present invention can also be referred to by the term "active deflectometry" (English: "active deflectometry").

For this become different and / or temporal in the context of deflectometry changeable patterns on an at least partially reflective, in particular shiny and / or reflective, surface reflected. about one or more images of at least one pattern reflected in the surface can Statements in particular about the geometry of the surface be made at which the pattern or patterns were reflected (s).

• – mindestens eine Mustererzeugungseinheit zum Erzeugen des Musters, zum Beispiel mittels mindestens einer L[ight]E[mitting]D[iode],
• – das zu untersuchende Objekt, das heißt das Objekt mit der zu untersuchenden Oberfläche sowie
• – mindestens einen optischen Sensor

auf.The arrangement or device according to the present invention has as components

• At least one pattern generation unit for generating the pattern, for example by means of at least one L [ight] E [mitting] D [iode],
• The object to be examined, that is the object with the surface to be examined as well as
• - At least one optical sensor

on.

On this way, the influence of changing the position and / or the rotational position of at least one of these components of the arrangement or device on the detected image in the optical sensor of the reflected surface Pattern in the measurement procedure.

• – bei Kenntnis der relativen Positionen und/oder der relativen Drehlagen der Komponenten der Anordnung oder Vorrichtung sowie
• – bei Kenntnis der ausgeführten Änderung(en) der Positionen und/oder der Drehlagen mindestens einer der Komponenten der Anordnung oder Vorrichtung

kann aus der Veränderung mindestens eines der reflektierten Muster auf die geometrische Eigenschaften der Oberfläche, insbesondere auf deren dreidimensionale Koordinaten, geschlossen werden.Especially

• - With knowledge of the relative positions and / or the relative rotational positions of the components of the arrangement or device as well
• - with knowledge of the executed change (s) of the positions and / or the rotational positions of at least one of the components of the arrangement or device

can be concluded from the change of at least one of the reflected patterns on the geometric properties of the surface, in particular on their three-dimensional coordinates.

According to one Particularly inventive development can be achieved by mathematically linking the Image information of different, especially from different angles and / or images taken from different positions, containing the Pixels are assigned as a scalar or as a vector, additional information about the surface, especially about their three-dimensional spatial Course, be won.

By the evaluation of image information, especially from previous ones Measurements on the same object, can previously uninvestigated areas are identified and targeted more Measurements are initiated to investigate these areas.

alternative or in addition this can by the evaluation of image information advantageously statements about the Goodness of Measurement in at least one specific area of the examined surface be made and targeted further measurements are initiated to to increase the measuring accuracy at least in this area.

For this may be provided in a preferred manner, at least one evaluation / control unit be, by means of which at least one actuator so controllable and / or It can be regulated that the relative orientation and / or the relative Position of the object, the pattern generating / providing device and / or the Recording device can be changed to each other.

through Further measurement method, the evaluation / control unit in an appropriate embodiment information about the relative orientation and / or relative position of the object, the pattern generating / providing device and / or the receiving device to each other.

• – aus den von der Aufnahmeeinrichtung mittels der erfassten Bilder gewonnenen Bildinformationen und/oder
• – aus den weiteren Informationen

geeignete Stellsignale für den Aktor ermitteln.As a result, then the evaluation / control unit

• From the image information obtained by the recording device by means of the captured images and / or
• - from the further information

determine suitable actuating signals for the actuator.

According to one appropriate embodiment of present invention, the measurement has the possibility that through the surface to change reflective patterns in time. This can be done in an appropriate manner an association or assignment between a pixel of the optical sensor and a coordinate reflected in the undistorted pattern of the considered one Pattern by means of local Coding and / or be determined by means of temporal coding.

Especially can the object and / or the optical sensor will be in motion while this Assignment or assignment takes place. At known speed and if the direction of motion is known, this information may be in determine the assignment or assignment.

The procedure or methodology according to the present invention can be described as follows:
First, at least one pattern is generated in the vicinity of the surface to be analyzed, for example on at least one screen, by means of at least one pattern generation / provision device, in particular by means of at least one pattern generator; alternatively or in addition thereto, at least one already existing pattern can be used.

At least an optical recording or sensor device, in particular at least a camera, is now used to take pictures of the pattern, where the optical recording or sensor device to be analyzed or to be checked, especially to be inspected or examined, surface aligned is and the mirror image of the pattern is recorded on the surface becomes.

According to the invention the pattern and / or the object and / or the optical recording or sensor device is now moved in a rotational and / or translatory manner, this means in their spatial Changed position, and at different times are mirrored at the surface Images of the pattern taken in a reflectometry; in this context can be a set of images of different patterns with the Recording or sensor device are recorded, be referred to as "image series".

The in the context of the present proceedings and in the present case Invention used sensors may be virtual in the sense that the use of a single receiving device, in particular a single camera can to all To record images with different lighting patterns.

The taken different pictures are taken directly or after a Image preprocessing in particular mathematical, for example using at least one digital computer, to at least one new image connected, so that in the resulting result image defective and defect-free areas can be distinguished visually or computationally.

at mathematical link the images are made this linking at least pointwise, that is the intensity values of the result image result from a combination of the intensity values the different images of the image series at least for the same Point of the surface.

at Demand is a further processing of the result image, about a classification of the detected defects, such as the determined Bumps, blisters, dents, inclusions, Scratches, orange peel, rework areas, ripples or the like.

case studies prove that a reliable and nevertheless inexpensive, hence the needs industry-appropriate analysis and / or surveying, in particular Inspection and / or testing, of at least partially reflective, in particular shiny and / or reflective surfaces is achieved.

Thus, both the method according to the present invention and the arrangement or device according to the present invention have a number of advantages, which are set forth below:
The change of the rotational position and / or the orientation and / or the position of at least one component of the device or device and the resulting linkage of the images from different viewing directions allow for the acquisition of helpful additional information (or "observations" in the metrological sense) about the surface of the object to be examined.

These additional Information remained conventional in deflectometry, that is at a procedure according to the state the technology unused, so that the deflektometric surface and shape investigation taking advantage of the movement of components of the arrangement or Device one opposite represents the state of the art much more effective solution.

If now the object to be examined is moved past the arrangement or device or through the arrangement or device, the examination of the object can take place. without a change in the position and / or the rotational position of at least one pattern generator and / or the pattern to be reflected and / or at least one optical sensor is required.

Without can interrupt the workflow in a production line, on this way an investigation is made, with the exception of the object to be examined all the components of the arrangement or device can remain unmoved.

at Objects that have a single configuration of at least one Pattern generator and at least one optical sensor not in sufficient extent can be examined may be a movement of at least one pattern generator and / or the object and / or at least one optical sensor sufficient expandable area of the object such that the entire surface or the area of interest of the surface is covered.

simultaneously with the covering of the entire or interesting surface of the Object can in the movement in an advantageous manner, the angle of view Targeted at least one optical sensor on the surface be varied to obtain information about the surface to be examined; In particular, this makes it possible to completely cover large surfaces with a single measuring arrangement measured, which misses only a part of the surface at any time.

at Use of known patterns and known objects as well in a known arrangement of at least one pattern generator and at least An optical sensor is a calibration of the present arrangement or device and the present method possible.

The Calibration can also be done without an object to be measured by: at least one optical sensor directly or via at least one mirror, its geometry at least approximately is known to be directed to at least one pattern generator and observed this pattern generator.

Especially by the movement of at least one pattern generator and / or a known measuring object and / or at least one optical sensor and / or at least one mirror whose geometry is known can information for the calibration can be won. The calibration data can be from the totality of all observations with known methods, such as For example, with the method of bundle adjustment, determine.

The The present invention finally relates to the use of a Method according to the above set forth and / or at least one arrangement or device according to the above Type for detecting and / or detecting defects, such as of bumps, blisters, dents, inclusions, scratches, orange peel, reworked areas, ripples or the like, for example on the surface a motor vehicle under construction.

Short description the drawings

As already discussed above, there are various possibilities for embodying and developing the teaching of the present invention in an advantageous manner. Reference is made on the one hand to the claims subordinate to claims 1 and 12, on the other hand, further embodiments, features and advantages of the present invention will be described below with reference to the three 1A to 3B illustrated embodiments explained in more detail.

It shows:

1A a schematic plan view of a first embodiment of a basic arrangement or device according to the present invention, which operates according to the method according to the present invention and in which the measurement object is moved by a structure of pattern generators and optical sensors;

1B in a schematic side view of the arrangement or device 1A ;

2 a schematic side view of a second embodiment of a basic arrangement or device according to the present invention, which operates according to the method according to the present invention;

3A in schematic plan view, a third embodiment of a basic arrangement or device according to the present invention, which operates according to the method according to the present invention; and

3B in a schematic side view of the arrangement or device 3A ,

The same or similar embodiments, elements or features are in the 1A to 3B provided with identical reference numerals.

best way for execution the invention

Basically, the present invention is based on a deflektometric examination of the surface 202 and thus the shape of one or more objects 200 taking advantage of the movement of components of the assembly or device 100 (= first embodiment according to the 1A and 1B ) respectively. 100 ' (= second embodiment according to 2 ) respectively. 100 '' (= third embodiment according to the 3A and 3B ). Thus, the arrangement or device 100 respectively. 100 ' respectively. 100 '' for imaging smooth surfaces 202 designed.

For one of the preferred fields of application of the present invention, namely for the examination of workpieces 200 In a production line, for example, the inspection of body parts, such as painted car doors, in the manufacture of motor vehicles, it makes sense to the object to be examined 200 by means of a translatory movement T ₂₀₀ on the measuring arrangement 100 to pass (cf. 1A and 1B ); As a result, the production process is not interrupted if possible.

The object 200 is in particular known speed through the arrangement or device 100 moved through, this arrangement or device 100 four symmetrically arranged to generate and provide a pattern in the vicinity of the surface 202 certain pattern generators 10 and four symmetrically arranged optical sensors 20 having.

Taking advantage, in particular, of the change of the reflected pattern by the movement of the object 200 Be information about the object 200 gained, in particular on its three-dimensional shape. For this purpose, the images taken from different directions of view are not evaluated separately; rather, a linkage of the images from different directions is performed.

• – mit den jeweils vorhandenen Mustergeneratoren 10,
• – mit den jeweils vorhandenen optischen Sensoren 20 sowie
• – mit einem jeweils zum Anzeigen der verarbeiteten Bilder vorhandenen Bildschirm oder Display 50

in Verbindung steht.For this purpose, the image sequence of the reflection of the pattern on the object 200 in an evaluation / control unit 40 analyzed that

• - with the existing pattern generators 10 .
• - with the existing optical sensors 20 such as
• - with a screen or display for displaying the processed images 50

communicates.

If the beam path of a single point of the pattern is considered, then the angle of incidence in the camera can be 20 (and thus the image coordinate) at a known position and with known orientation of both the pattern generator 10 as well as the camera 20 with known from the literature method as a function of the distance and the orientation of the surface 202 of the object 200 to the camera 20 formulate.

Conversely, knowledge of the image coordinates allows imaging of a particular point of the pattern even with a known measurement arrangement 100 not the clear reconstruction of the distance as well as the orientation of the surface 202 of the object 200 , This is explained - graphically speaking - by the fact that more unknowns than equations arise from these observations.

• – durch Rotationsbewegung R₂₀ der Kamera 20 und/oder durch Translationsbewegung T₂₀ der Kamera 20 (vgl. zweites Ausführungsbeispiel gemäß 2, in der die Anordnung 100' von Mustergenerator 10 und Messobjekt 200 vor und nach Änderung R₂₀ und/oder T₂₀ der Position des optischen Sensors 20 illustriert ist) und/oder
• – durch Rotationsbewegung R₂₀ sowie durch Translationsbewegung T₂₀ (vgl. drittes Ausführungsbeispiel gemäß 3A und 3B, in der die Messanordnung 100'' mit dem Mustergenerator 10 und mehreren optischen Sensoren 20 an einer Roboterhand 30 befestigt ist)

erhöht, so werden für jeden Punkt der Oberfläche 202 weitere Informationen gewonnen. Die Zuordnung zwischen Bildpunkten mehrerer Bilder und einem bestimmten Punkt auf der Oberfläche 202 kann insbesondere durch eine gegenseitige Ausrichtung der gewonnenen Daten entlang der Epipolarlinien bezüglich der erfassten Bilder erreicht werden.Will now be the number of shots about

• - By rotation R _{20 of} the camera 20 and / or by translational movement T _{20 of} the camera 20 (see second embodiment according to 2 in which the arrangement 100 ' from pattern generator 10 and measuring object 200 before and after change R ₂₀ and / or T _{20 of} the position of the optical sensor 20 illustrated) and / or
• - By rotational movement R ₂₀ and by translational movement T ₂₀ (see third embodiment according to 3A and 3B in which the measuring arrangement 100 '' with the pattern generator 10 and a plurality of optical sensors 20 on a robot hand 30 attached)

increases, so for every point of the surface 202 gained further information. The mapping between pixels of multiple images and a specific point on the surface 202 can be achieved in particular by a mutual alignment of the acquired data along the epipolar lines with respect to the captured images.

Now only six additional unknowns per shot, namely three translation parameters and three rotation parameters, but per point on the surface 202 obtained an additional equation, given a sufficient amount and taken by suitable movements recordings even an overdetermined system of equations, by standard methods, such as the bundle adjustment, the calculation of the desired sizes, namely the distance and orientation of each surface point, and the other unknowns, such as position and / or orientation allowed.

Another advantage is the determination of the position and orientation of the measuring components relative to the object 200 the piecewise Ver measuring even large objects 200 and the inherent composition of the individual surveyed areas for a holistic description of the overall object.

In the third embodiment of the present invention is an at least uniaxial robot arm 30 provided at the two optical sensors 20 symmetrical to the robot arm 30 are attached. The pattern generator 10 can either be permanently installed and / or also be attached to at least one at least uniaxial robot arm. This robot arm is in particular with the at least uniaxial robot arm 30 identical to which the optical sensors 20 are attached, as in the 3A and 3B is shown.

By means of this arrangement or device 100 '' is the investigation of the object 200 possible from several sides. By using the information provided by the robotic arm 30 is determined by its spatial position, in particular an accurate determination of the position and / or the angle of view of the pattern generator 10 and / or the optical sensors 20 possible.

Basically, the orientations as well as the positions of the patterns and the camera (s) 20 be determined from the image sequence. By using an approximation of these variables from external sensors of the robot, however, the aforementioned calculation can be considerably simplified and stabilized.

• – die rotatorischen Bewegungen R₁₀ des Mustergenerators 10 und
• – die rotatorischen Bewegungen R₂₀ sowie die translatorischen Bewegungen T₂₀ der Kameras 20.

In the third embodiment according to the 3A and 3B controls the evaluation / control unit 40 additionally

• - The rotatory movements R _{10 of} the pattern generator 10 and
• - The rotational movements R ₂₀ and the translatory movements T _{20 of} the cameras 20 ,

Finally, the evaluation / control unit 40 Target data including tolerances of the object to be measured 200 made available. The evaluation / control unit 40 then the measured shape and the reflection properties of the surface 202 of the object 200 compare with the setpoint data and signal tolerance violations.

The first embodiment according to the 1A and 1B , the second embodiment according to 2 and the third embodiment according to the 3A and 3B If required, they can also be combined so that both the movement of the object to be examined 200 (cf., first embodiment according to FIGS 1A and 1B ) as well as the movement of at least one optical sensor 20 (see second embodiment according to 2 ) and / or the movement of at least one pattern generator 10 (see third embodiment according to the 3A and 3B ) is possible.

In summary, with regard to the above three embodiments, it can be stated that with the above-described method, not only bubbles, inclusions or scratches are detected reliably, but with the same arrangement 100 respectively. 100 ' respectively. 100 '' Bumps or dents can also be detected simply by selecting the focal plane of the camera (s) used. 20 is moved.

In Essential to the invention, the scope of the above Method readily on diffusely reflecting surfaces, such as for example, on unpainted auto body parts, to be expanded, by using light of a larger wavelength and the resulting images are recorded with an infrared camera.

Overall, it should be noted that explained with reference to three embodiments, the device 100 (= first embodiment) or 100 ' (= second embodiment) or 100 '' (= third embodiment) proves to be extremely reliable.

Accordingly For example, the present invention may be applied to automated systems Visual inspection, for example, molds, body parts, lenses, of painted surfaces, from Perfume bottles, of pressing tools, of machined parts and of course of Mirrors are used.

100

arrangement or device

(first embodiment; 1A and 1B )

100 '

arrangement or device

(second embodiment; 2 )

100 ''

arrangement or device

(third embodiment; 3A and 3B )

10

Pattern generation - / - ready provision means,

especially Pattern generator

in the special video projector or imaging system

20

Receiving device, in particular optical sensor,

in the special camera and / or microscope

30

robot arm or robotic hand

40

Evaluation / control unit

50

screen or display

200

Object, in particular measuring piece

202

Surface of the object 200

R ₁₀

rotatory Movement or rotation

the pattern generating / providing device 10

R ₂₀

rotatory Movement or rotation

the receiving device 20

R ₂₀₀

rotational movement or rotation of the object 200

T ₁₀

translational Movement or translation (movement) of the

Pattern generation - / - ready provision means 10

T ₂₀

translational Movement or translation (movement) of the

recording device 20

T ₂₀₀

translational Movement or translation (movement) of the

object 200

Claims (30)

Method for analyzing and / or measuring, in particular for inspecting and / or testing, at least one surface (at least partially reflecting, in particular shiny and / or reflecting) ( 202 ) at least one object ( 200 ), characterized in that the relative orientation and / or the relative position of the object ( 200 ), At least one pattern generating / providing device (for generating at least one in the visible and / or non-visible region of electromagnetic radiation, in particular local pattern provided) 10 ), in particular at least one pattern generator, and / or - at least one for receiving in each case at least one on the surface ( 202 ) reflected image of the pattern recording device ( 20 ), in particular at least one optical sensor, to one another in order to obtain information about the surface ( 202 ), in particular about the geometry of the surface ( 202 ), to obtain. Method according to claim 1, characterized in that the orientation and / or the position of the receiving device ( 20 ) against the object ( 200 ) are changed by the object ( 200 ) relative to the receiving device ( 20 ) (R ₂₀₀ , T ₂₀₀ ) is moved. Method according to claim 1 or 2, characterized in that the orientation and / or the position of the receiving device ( 20 ) against the object ( 200 ) are changed by the recording device ( 20 ) against the object ( 200 ) (R ₂₀ , T ₂₀ ) is moved. Method according to at least one of claims 1 to 3, characterized in that the relative orientation and / or the relative position of the pattern generating / providing device ( 10 ), the receiving device ( 20 ) and the object ( 200 ) to each other, in particular targeted, can be set. Method according to at least one of claims 1 to 4, characterized in that the optical imaging parameters of the recording device ( 20 ) are temporally changed for the purpose of obtaining image information. Process according to at least one of the claims 1 to 5, characterized in that the patterns in periodic Shape, in particular in the form of a sinusoidal intensity pattern or in the form of binary striped patterns, be created or exist. Method according to at least one of claims 1 to 6, characterized in that the surface ( 202 ) reflected image of the pattern by means of the surface ( 202 ) receiving device ( 20 ) is recorded. Method according to at least one of claims 1 to 7, characterized in that at least one position of the receiving device ( 20 ) is recorded and / or measured in the room from reflectometry. Process according to at least one of the claims 1 to 8, characterized in that in particular the diffusely reflected Proportion of the pattern for a particular triangulatory evaluation is used. Method according to at least one of claims 1 to 9, characterized in that the device ( 100 ; 100 '; 100 '' ), in particular the measurement setup, is calibrated by means of at least one known pattern. Method according to at least one of claims 1 to 10, characterized in that the information of the measured object ( 200 ) with predetermined setpoints, in particular - with data of at least one reference object, - with data of a computer [A] Dedicated drawing and / or - with tolerance data, in order to detect deviations of the object ( 200 ) of its desired state and to a correction of the determined deviations of the object ( 200 ) from its nominal state. Contraption ( 100 ; 100 '; 100 '' ) for analyzing and / or measuring, in particular for inspecting and / or testing, at least one surface (at least partially reflecting, in particular shining and / or reflecting, 202 ) at least one object ( 200 ), comprising - at least one pattern generating / providing device (for generating at least one in the visible and / or non - visible region of electromagnetic radiation lying, in particular local pattern provided) 10 ), in particular at least one pattern generator, and - at least one receiving device ( 20 ), in particular at least one optical sensor, for receiving in each case at least one on the surface ( 202 ) reflected image of the pattern, characterized in that the relative orientation and / or the relative position of the object ( 200 ), the pattern generating / providing device ( 10 ) and / or the recording device ( 20 ) are mutually variable to provide information about the surface ( 202 ), in particular about the geometry of the surface ( 202 ), to obtain. Device according to claim 12, characterized by two or more receiving devices ( 20 ), their orientation and / or their position relative to one another and / or to the object ( 200 ) is specifically adjustable. Device according to claim 12 or 13, characterized in that the relative orientation and / or the relative position of the pattern generating / providing device ( 10 ), the receiving device ( 20 ) and the object ( 200 ) to each other, in particular targeted, are adjustable. Device according to at least one of claims 12 to 14, characterized by at least one at least uniaxial robot arm ( 30 ), by means of which movement the controlled orientation and / or the controlled position of the pattern generating / providing device ( 10 ), the receiving device ( 20 ) and the object ( 200 ) is at least approximately definable to each other. Device according to at least one of claims 12 to 15, characterized by at least one assembly line, by means of which the object ( 200 ) is movable (T ₂₀₀ ). Device according to at least one of claims 12 to 16, characterized by at least one base on which the object ( 200 ) is mounted rotatably and / or tiltable and / or displaceable. Device according to at least one of claims 12 to 17, characterized by at least one evaluation / control unit ( 40 ), by means of which at least one actuator can be controlled and / or regulated such that the relative orientation and / or the relative position of the object ( 200 ), the pattern generating / providing device ( 10 ) and / or the recording device ( 20 ) can be changed to each other. Device according to claim 18, characterized in that the evaluation / control unit ( 40 ) by means of further measuring methods, in particular image analysis, of the recording device ( 20 ) Information about the relative orientation and / or the relative position of the object ( 200 ), the pattern generating / providing device ( 10 ) and / or the recording device ( 20 ) receives each other. Device according to claim 18 or 19, characterized in that the evaluation / control unit ( 40 ) - from the reception facility ( 20 ) determined by the captured images image information and / or - suitable for further information control signals for the actuator. Device according to at least one of claims 12 to 20, characterized in that the pattern generating / providing device ( 10 ) for generating the pattern - at least one illumination device with at least one light emitting element [iode] or at least one heating element, in particular at least one quartz emitter, or at least one cathode ray tube or at least one liquid-carrying line or at least one Polymer display or - at least one video projector, for example at least one L [iquid] C [rystal] D [isplay] -based projector or at least one D [igital] M [icromirror] D [evice] -based projector, or - at least one mechanical has moved, in particular heated, surface in particular spatially varying radiation behavior for electromagnetic radiation. Device according to at least one of claims 12 to 21, characterized in that the pattern generating / providing device ( 10 ) is designed so that the pattern emits an electromagnetic radiation whose wavelength is greater than the wavelength of visible light. Device according to at least one of claims 12 to 22, characterized in that the pattern generating / providing device ( 10 ) from the evaluation / control unit ( 40 ) is controllable. Device according to at least one of claims 12 to 23, characterized in that the receiving device ( 20 ) in the non-visible region, especially in the thermal I [nfra] R [ot] region, is sensitive to electromagnetic radiation. Device according to at least one of claims 12 to 24, characterized by at least one screen or by at least one display ( 50 ) to display the processed images. Device according to claim 25, characterized in that at least one output of the evaluation / control unit ( 40 ) with at least one input of the screen or the display ( 50 ) connected is. Device according to at least one of claims 12 to 26, characterized in that - both the at least one receiving device ( 20 ) - as well as the at least one screen or the at least one display ( 50 ) are fixed to each other. Device according to at least one of claims 12 to 27, characterized in that at least one output of the receiving device ( 20 ) with at least one input of the evaluation / control unit ( 40 ) connected is. Device according to at least one of claims 12 to 28, characterized in that the evaluation / control unit ( 40 ) - part of the reception facility ( 20 ) and / or - in the receiving device ( 20 ) is integrated. Use of a method according to at least one of claims 1 to 11 and / or at least one device ( 100 ; 100 '; 100 '' ) according to any one of claims 12 to 29 for detecting and / or detecting defects such as dents, blisters, dents, inclusions, scratches, orange peel, reworked areas, ripples or the like Example in the interface ( 202 ) of a motor vehicle under construction.