JPH0224321B2 - - Google Patents

Info

Publication number
JPH0224321B2
JPH0224321B2 JP6364281A JP6364281A JPH0224321B2 JP H0224321 B2 JPH0224321 B2 JP H0224321B2 JP 6364281 A JP6364281 A JP 6364281A JP 6364281 A JP6364281 A JP 6364281A JP H0224321 B2 JPH0224321 B2 JP H0224321B2
Authority
JP
Japan
Prior art keywords
crack
signal
length
circuit
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6364281A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57178133A (en
Inventor
Mitsuhisa Myazawa
Hideaki Yanai
Seiichiro Satomura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Akashi Seisakusho KK
Original Assignee
Akashi Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akashi Seisakusho KK filed Critical Akashi Seisakusho KK
Priority to JP6364281A priority Critical patent/JPS57178133A/ja
Publication of JPS57178133A publication Critical patent/JPS57178133A/ja
Publication of JPH0224321B2 publication Critical patent/JPH0224321B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP6364281A 1981-04-27 1981-04-27 Automatic measuring device of crack length Granted JPS57178133A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6364281A JPS57178133A (en) 1981-04-27 1981-04-27 Automatic measuring device of crack length

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6364281A JPS57178133A (en) 1981-04-27 1981-04-27 Automatic measuring device of crack length

Publications (2)

Publication Number Publication Date
JPS57178133A JPS57178133A (en) 1982-11-02
JPH0224321B2 true JPH0224321B2 (enrdf_load_stackoverflow) 1990-05-29

Family

ID=13235205

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6364281A Granted JPS57178133A (en) 1981-04-27 1981-04-27 Automatic measuring device of crack length

Country Status (1)

Country Link
JP (1) JPS57178133A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS57178133A (en) 1982-11-02

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