JPH02208545A - Inspection of coating of cream-like solder - Google Patents

Inspection of coating of cream-like solder

Info

Publication number
JPH02208545A
JPH02208545A JP3059089A JP3059089A JPH02208545A JP H02208545 A JPH02208545 A JP H02208545A JP 3059089 A JP3059089 A JP 3059089A JP 3059089 A JP3059089 A JP 3059089A JP H02208545 A JPH02208545 A JP H02208545A
Authority
JP
Japan
Prior art keywords
solder
printed circuit
conductor
discharge lamp
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3059089A
Other languages
Japanese (ja)
Inventor
Hajime Kinoshita
肇 木下
Masaaki Mori
森 雅彰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CKD Corp
Original Assignee
CKD Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CKD Corp filed Critical CKD Corp
Priority to JP3059089A priority Critical patent/JPH02208545A/en
Publication of JPH02208545A publication Critical patent/JPH02208545A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE:To achieve a higher efficiency by providing a lighting means with a specified spectrum and an angle of irradiation to obtain the results of inspection distinguishing a cream-like solder completely from a conductor of a printed circuit utilizing an image data obtained with a camera device. CONSTITUTION:Among visible lights, a fluorescent discharge lamp 6 with a peak spectrum in the vicinity of a wavelength of 600nm is large in wavelength and the discharge lamp 6 is arranged to light an object to be inspected at a specified angle. Then, when a printed circuit board as object to be inspected is lighted with the discharge lamp 6, the reflected light reaches a lens. Here, a voltage outputted from a camera device 4 by the reflected light is 1,000mV at its maximum while 400mV is obtained for a conductor of a printed circuit and 800mV for cream-like solder 3 as output. Thus, the results of inspection can be obtained distinguishing the solder 3 completely from the conductor 2 by processing the output with an image processor connected to the device 4.

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明は、プリント基板へのクリーム状はんだの塗付状
態の良否検査方法に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application The present invention relates to a method for inspecting the quality of cream solder applied to a printed circuit board.

(ロ)従来技術 従来、チップ型電子部品をプリント基板へ実装する工程
において、そのチップ型電子部品の搭載に先たち、その
プリント基板上の回路導体上にクリーム状はんだを塗付
する必要がある。
(B) Prior Art Conventionally, in the process of mounting chip-type electronic components onto a printed circuit board, it is necessary to apply creamy solder onto the circuit conductor on the printed circuit board prior to mounting the chip-type electronic component. .

この場合、はんだを均一に薄く塗付するのにスクリーン
印刷方式が用いられている。
In this case, a screen printing method is used to uniformly and thinly apply the solder.

(ハ)発明が解決しようとする問題点 このような塗付工程では、プリント基板の表面の油水分
の有無、その他の状態によりクリーム状はんだが回路導
体上に転写されず、塗付ムラが生ずることがあるため、
その塗付状態の良否を検査して不完全な基板を取り除く
必要がある。そのためにはクリーム状はんだを印刷処理
されたプリント基板を全て目視検査しなければならず極
めて不能率であった。
(c) Problems to be solved by the invention In such a coating process, creamy solder may not be transferred onto the circuit conductor due to the presence of oil or moisture on the surface of the printed circuit board or other conditions, resulting in uneven coating. Because of this,
It is necessary to inspect the coating condition and remove defective substrates. To do this, all printed circuit boards printed with creamy solder had to be visually inspected, which was extremely difficult.

また、このような目視検査に代えて、撮像装置によって
得た画像データを利用してその良否を判別することも考
えられるが、レジストコーティングされたプリント基板
上の導体と印刷処理されたクリーム状はんだは互いに極
く近似した反射率と色調のために撮像装置によって光学
的に判別する手掛かりが得られていなかった。
In addition, instead of such visual inspection, it is possible to use image data obtained by an imaging device to determine the quality of the product. Since the reflectance and color tone are very similar to each other, it has not been possible to obtain a clue to optically distinguish them using an imaging device.

(ニ)問題点を解決するための手段 本発明はこのような問題を解決するために、特定のスペ
クトルと照射角度をもつ照明手段を備え、撮像装置によ
って得た画像データを利用できるようにした。
(d) Means for Solving the Problems In order to solve these problems, the present invention is equipped with an illumination means having a specific spectrum and irradiation angle, so that image data obtained by an imaging device can be used. .

以下、本発明の実施例につき図面を参照して説明する。Embodiments of the present invention will be described below with reference to the drawings.

第1図は本発明による、クリーム状はんだの塗付状態検
査方法の実施例を示す断面図である。
FIG. 1 is a sectional view showing an embodiment of the method for inspecting the application state of creamy solder according to the present invention.

1はプリント基板、2はそのプリント基板1の上に予め
形成された印刷回路の導体(銅箔)、3はその上にスク
リーン印刷されたクリーム状はんだである。印刷回路の
導体2″の表面にクリーム状はんだが塗付されていない
のは何らかの阻害要因による。
1 is a printed circuit board, 2 is a printed circuit conductor (copper foil) previously formed on the printed circuit board 1, and 3 is a creamy solder screen-printed thereon. The reason why creamy solder is not applied to the surface of the conductor 2'' of the printed circuit is due to some inhibiting factor.

4はイメージセンサを内蔵した撮像装置、5はそのレン
ズである。6は波長600nm(ナノメートル)の近傍
にピークスペクトルを有する蛍光放電灯であって、可視
光の中でも波長が大である(第2図)。また、その放電
灯6は検査目的物を所定の角度θで照明するように配置
されている。その角度θは20°以下が望ましい。その
放電灯6は環状型のものであるが、直管型の放電灯であ
ってもよい。
4 is an imaging device with a built-in image sensor, and 5 is its lens. 6 is a fluorescent discharge lamp having a peak spectrum near a wavelength of 600 nm (nanometers), which has a large wavelength among visible light (FIG. 2). Further, the discharge lamp 6 is arranged so as to illuminate the object to be inspected at a predetermined angle θ. The angle θ is preferably 20° or less. Although the discharge lamp 6 is of an annular type, it may be a straight tube type discharge lamp.

なお、プリント基板2は公知の手段で同一平面上を移動
されて、検査目的物が順次レンズ5の視野内に入るよう
になっている。
The printed circuit board 2 is moved on the same plane by known means so that the objects to be inspected are successively brought into the field of view of the lens 5.

上記構成において、蛍光放電灯6によって検査対象物で
あるプリント基板2を照明すると、その反射光がレンズ
5に達するが、その反射光によって撮像装置4が出力す
る電圧は、その最大出力が10100Oであるのに対し
、 印刷回路の導体(銅箔)2のとき、400mV、クリー
ム状はんだ3のとき、800mV、の出力が得られる。
In the above configuration, when the printed circuit board 2, which is the object to be inspected, is illuminated by the fluorescent discharge lamp 6, the reflected light reaches the lens 5, but the voltage output by the imaging device 4 due to the reflected light has a maximum output of 10100O. On the other hand, when using printed circuit conductor (copper foil) 2, an output of 400 mV is obtained, and when using cream solder 3, an output of 800 mV is obtained.

したがって前記撮像装置に接続された画像処理装置(図
示されていない)によってその出力を処理し、印刷回路
の導体2とクリーム状はんだ3とを完全に識別した検査
結果を得ることができる。
Therefore, the output can be processed by an image processing device (not shown) connected to the image pickup device, and an inspection result can be obtained in which the conductor 2 of the printed circuit and the creamy solder 3 are completely distinguished.

これに対して、放電灯のスペクトルが波長600nm(
ナノメートル)未満のものでは、印刷回路の導体(銅箔
)2とクリーム状はんだ3の出力電圧はほぼ同等であっ
て、識別できる程の差異が得られない。
In contrast, the spectrum of a discharge lamp has a wavelength of 600 nm (
If the voltage is less than nanometers, the output voltages of the printed circuit conductor (copper foil) 2 and the cream solder 3 are almost the same, and there is no discernible difference.

なお、前記画像処理装置によって得られな検査結果億シ
よんだのクリーン印刷スキージの速度等にフィードバッ
クしてその品質を自動的に制御することも可能である。
It is also possible to automatically control the quality by feeding back the speed of the clean printing squeegee, etc. of the inspection results obtained by the image processing device.

(ホ)効果 本発明のクリーム状はんだの塗付状態検査方法は、可視
光の中でも長い波長のスペクトルと小さな照射角度をも
つ照明手段を備え、撮像装置によって得た画像データを
利用するものであるので、印刷回路の導体と、クリーム
状はんだとに対応した出力が得られる。したがって撮像
装置に接続された画像処理装置によってその出力を処理
し、印刷回路の導体とクリーム状はんだとを完全に識別
した検査結果を迅速に得ることができ、能率の向上を図
れる効果がある。
(E) Effect The method for inspecting the application state of creamy solder of the present invention is equipped with an illumination means having a long wavelength spectrum among visible light and a small irradiation angle, and utilizes image data obtained by an imaging device. Therefore, an output corresponding to the printed circuit conductor and creamy solder can be obtained. Therefore, the output is processed by the image processing device connected to the imaging device, and inspection results that completely distinguish between the conductor of the printed circuit and the creamy solder can be quickly obtained, which has the effect of improving efficiency.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による、クリーム状はんだの塗付状態検
査方法の実施例を示す断面図、第2図は蛍光放電灯のス
ペクトルを示す。 1ニブリント基板 2:印刷回路の導体(銅箔)、 3:クリーム状はんだ 4:撮像装置 5:レンズ 6:蛍光放電灯 特許出願人 シーケーディ株式会社 第 1 N 手続有11正書(方式) %式% クリーム状はんだの塗付状態検査方法 3、補正をする者 事件との関係
FIG. 1 is a sectional view showing an embodiment of the method for inspecting the application state of creamy solder according to the present invention, and FIG. 2 shows a spectrum of a fluorescent discharge lamp. 1 Niblint board 2: Printed circuit conductor (copper foil), 3: Cream solder 4: Imaging device 5: Lens 6: Fluorescent discharge lamp Patent applicant: CKD Co., Ltd. No. 1 N Procedures 11 Regular Book (Method) % Formula % Creamy solder application condition inspection method 3, relationship with the case of the person making the correction

Claims (1)

【特許請求の範囲】[Claims] 1.可視光の中でも長い波長のスペクトルと小さな照射
角度をもつ照明手段を備え、撮像装置によって得た画像
データを利用するクリーム状はんだの塗付状態検査方法
1. A method for inspecting the coating condition of creamy solder that uses image data obtained by an imaging device and is equipped with an illumination device that has a long wavelength spectrum among visible light and a small irradiation angle.
JP3059089A 1989-02-09 1989-02-09 Inspection of coating of cream-like solder Pending JPH02208545A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3059089A JPH02208545A (en) 1989-02-09 1989-02-09 Inspection of coating of cream-like solder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3059089A JPH02208545A (en) 1989-02-09 1989-02-09 Inspection of coating of cream-like solder

Publications (1)

Publication Number Publication Date
JPH02208545A true JPH02208545A (en) 1990-08-20

Family

ID=12308081

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3059089A Pending JPH02208545A (en) 1989-02-09 1989-02-09 Inspection of coating of cream-like solder

Country Status (1)

Country Link
JP (1) JPH02208545A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004264025A (en) * 2003-01-09 2004-09-24 Matsushita Electric Ind Co Ltd Image recognition device and method
JP2004264026A (en) * 2003-01-09 2004-09-24 Matsushita Electric Ind Co Ltd Image recognition device and method
US7551768B2 (en) 2003-01-09 2009-06-23 Panasonic Corporation Image recognition apparatus and method for surface discrimination using reflected light

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57199945A (en) * 1981-06-03 1982-12-08 Toshiba Corp Measuring and evaluating device for solder wettability

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57199945A (en) * 1981-06-03 1982-12-08 Toshiba Corp Measuring and evaluating device for solder wettability

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004264025A (en) * 2003-01-09 2004-09-24 Matsushita Electric Ind Co Ltd Image recognition device and method
JP2004264026A (en) * 2003-01-09 2004-09-24 Matsushita Electric Ind Co Ltd Image recognition device and method
US7551768B2 (en) 2003-01-09 2009-06-23 Panasonic Corporation Image recognition apparatus and method for surface discrimination using reflected light

Similar Documents

Publication Publication Date Title
KR101118210B1 (en) Visual inspection system of printed circuit board and method of the same
WO2012124260A1 (en) Solder height detection method and solder height detection device
JPH08219716A (en) Input image contrast processor and apparatus using the same
JPH02208545A (en) Inspection of coating of cream-like solder
JP3243385B2 (en) Object shape inspection device
JPH1048837A (en) Inspecting device for resist scattering and method therefor
JPH05280946A (en) Observing apparatus of board
JP3149522B2 (en) Appearance inspection method for cream solder
KR100200213B1 (en) Test unit for component of pcb
JP4180127B2 (en) Cream solder printing inspection apparatus and cream solder printing inspection method
JPH04104044A (en) Apparatus for inspecting printed state of soldering paste
KR920005935B1 (en) Lighting method for electronics parts assembly state testing
JPH06160035A (en) Substrate inspection device
JPS63124943A (en) Inspection equipment for packaged substrate
JPH03107706A (en) Inspecting device for soldering appearance
KR100292343B1 (en) Inspection method of cream solder position appearance on the board
JPH08233749A (en) Printed surface inspection apparatus
JP2024027506A (en) Image acquisition device, substrate inspection device, image acquisition method, and substrate inspection method
JPH02278105A (en) Inspecting apparatus for soldering
JPS607311A (en) Detecting method of configuration
JPS61243304A (en) Visual inspection system for mounted substrate
JP2000205837A (en) Inspection device and method for printing machine of cream solder and printing machine with its inspection device
JPH0375045B2 (en)
JPH0269641A (en) Device for incorporating reflected light of object to be measured
JP2000088556A (en) Visual inspection system for electronic device