JPH02192487A - Method for liquid-phase epitaxial growth - Google Patents

Method for liquid-phase epitaxial growth

Info

Publication number
JPH02192487A
JPH02192487A JP1208189A JP1208189A JPH02192487A JP H02192487 A JPH02192487 A JP H02192487A JP 1208189 A JP1208189 A JP 1208189A JP 1208189 A JP1208189 A JP 1208189A JP H02192487 A JPH02192487 A JP H02192487A
Authority
JP
Japan
Prior art keywords
substrate
epitaxial growth
ring
cassette
crucible
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1208189A
Other languages
Japanese (ja)
Other versions
JPH0571558B2 (en
Inventor
Masaya Konishi
昌也 小西
Yoshiaki Haneki
良明 羽木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP1208189A priority Critical patent/JPH02192487A/en
Publication of JPH02192487A publication Critical patent/JPH02192487A/en
Publication of JPH0571558B2 publication Critical patent/JPH0571558B2/ja
Granted legal-status Critical Current

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Abstract

PURPOSE:To obtain homogeneous epitaxial growth over the whole surface of a disklike substrate by providing a conical surface having a slope extending upward in the upper part of each ring for holding the substrate and holding the disklike substrate on the conical surface in linear contact therewith. CONSTITUTION:A material for carrying out epitaxial growth is charged into a crucible 5 and heated to provide a melt 4 for growth and many chambers are provided with partition plates 8 having a slit 6 in part of the periphery thereof to assemble a cassette 3 containing many sets of a ring 1 made of carbon and a substrate 2. In this case, the substrate 2 is brought into linear contact with the conical surface of the ring 1. If the cassette 3 is lowered into the crucible 5, the solution in the bottom of the crucible 5 is pushed, passed through a clearance between the crucible 5 and the cassette 3 and raised. The raised solution is passed from the slit 6 through openings 7 of the ring 1 made of the carbon and admitted into the respective chambers of the cassette 3 to fill the interiors of the chambers. The substrate is then pushed up to provide a floated state separated from the rings 1. The flow of the melt is completely distributed to the whole surface without interference by the rings 1 and brought into contact with the surfaces of the substrates 2.

Description

【発明の詳細な説明】 「産業上の利用分野」 この発明は半導体基板(ウェハ)、特に化合物半導体基
板の表面に液相エピタキシャル成長をさせる方法に関す
るものである。
DETAILED DESCRIPTION OF THE INVENTION "Industrial Application Field" The present invention relates to a method for performing liquid phase epitaxial growth on the surface of a semiconductor substrate (wafer), particularly a compound semiconductor substrate.

「従来の技術」 成長させる材料を加熱して溶融させその溶融液に半導体
基板の表面を接触させておいて冷却し半導体基板の表面
に材料をエピタキシャル成長させて種々の半導体デバイ
スを製造することは良く知られている。このエピタキシ
ャル成長方法には多数の基板上に同時にエピタキシャル
成長をさせる技術として竪型ディップ法が用いられてい
る。
``Prior art'' It is common practice to manufacture various semiconductor devices by heating and melting a material to be grown, bringing the surface of a semiconductor substrate into contact with the melt, cooling it, and epitaxially growing the material on the surface of the semiconductor substrate. Are known. This epitaxial growth method uses a vertical dip method as a technique for simultaneously performing epitaxial growth on a large number of substrates.

竪型ディップ法は、第4図(a)に示すように、ルツボ
5の中にエピタキシャル成長させる材料を投入して加熱
して溶融して成長用溶液4とする。周囲の一部にスリッ
ト6を有し仕切板8によって多数の室をもうけて各室の
中にカーボン製リング10と基板20組を多数収納した
カセット3を組ミ立てる。ウェハ保持用リングとしてカ
ーボン製が多く用いられるが溶液を汚染せず、Wr#熱
性の材料であればよい。カセット3をルツボ5内に降下
させると、第4図Φ)に示すように、ルツボ5の底にあ
った溶液が押されてルツボ5とカセット3の間の隙間を
通って上昇し、スリット6からカーボン製リング10の
開ロアを通してカセット3の各室内に流入し室内を充満
して基板2の表面と接触する。ルツボ5の温度を徐々に
降下すると溶液が基板の表面に結晶成長してエピタキシ
ャル成長が行われるようになっている。
In the vertical dipping method, as shown in FIG. 4(a), a material to be epitaxially grown is put into a crucible 5 and heated and melted to form a growth solution 4. A cassette 3 having a slit 6 in a part of its periphery and a large number of chambers formed by a partition plate 8 and storing a large number of carbon rings 10 and 20 sets of substrates in each chamber is assembled. Carbon is often used as the wafer holding ring, but any material that does not contaminate the solution and is Wr# thermal may be used. When the cassette 3 is lowered into the crucible 5, as shown in FIG. From there, it flows into each chamber of the cassette 3 through the open lower part of the carbon ring 10, fills the chamber, and comes into contact with the surface of the substrate 2. When the temperature of the crucible 5 is gradually lowered, the solution grows crystals on the surface of the substrate, and epitaxial growth is performed.

例えばGaAsの化合物半導体ウェハ上にAlGaAs
をエピタキシャル成長させてLEDを製造する場合があ
る。このようにGaAsの化合物半導体ウェハ上にGa
を溶媒としてGaとAsを含む化合物半導体結晶をエピ
タキシャル成長させる場合、Gaに比しAsは比重が小
さいため成長用溶液の上部ではAs濃度が高く、下部で
は低くなり易いためカセットの内部を多数の室として各
室内で成長用溶液の上部に基板を保持することによって
短時間で厚いエピタキシャル層を成長させることができ
る。また、第6図に示すように、GaAsの化合物半導
体ウェハは成長用溶液より比重が小さいので室内では溶
液中を浮き上がって仕切板8の下面に接するまで上昇す
るので結局ウェハの下面にエピタキシャル成長が生ずる
ものである。
For example, AlGaAs is deposited on a GaAs compound semiconductor wafer.
In some cases, LEDs are manufactured by epitaxially growing. In this way, GaAs compound semiconductor wafers are
When growing a compound semiconductor crystal containing Ga and As as a solvent, the As concentration tends to be high in the upper part of the growth solution and lower in the lower part because As has a smaller specific gravity than Ga. By holding the substrate on top of the growth solution in each chamber, thick epitaxial layers can be grown in a short time. Furthermore, as shown in FIG. 6, since the GaAs compound semiconductor wafer has a lower specific gravity than the growth solution, it floats up in the solution indoors until it touches the bottom surface of the partition plate 8, so that epitaxial growth eventually occurs on the bottom surface of the wafer. It is something.

「発明が解決しようとする課題」 従来からディップ法で成長用溶液の上部に基板を保持す
るため基板保持用カーボン製リング1Gとして、第5図
に示すような、上部に角型の切り込み座11をもうけた
リング10を用いている。
``Problem to be Solved by the Invention'' Conventionally, a substrate holding carbon ring 1G for holding a substrate above a growth solution using a dip method has a rectangular cut seat 11 at the top as shown in FIG. A ring 10 with .

この切り込み座11を有するカーボン製リング10を用
いると基板2の切り込み座11に接触している部分、或
いは基板2が第6図のように浮上しても切り込み座11
との隙間部分が非常に狭いため成長用溶液4が充分に接
触することができない。従って基板20周7辺部分には
エピタキシャル成長が行われず、基板のその部分を除去
する後工程を必要とし、また使用する基板の面積より得
られるエピタキシャルウェハの面積が小さくなってしま
うと言う課題があった。
If the carbon ring 10 having this notch seat 11 is used, even if the part of the substrate 2 that is in contact with the notch seat 11 or the substrate 2 floats as shown in FIG.
Since the gap between the growth solution 4 and the growth solution 4 is very narrow, the growth solution 4 cannot make sufficient contact with the growth solution 4. Therefore, epitaxial growth is not performed on the seven sides around the substrate 20, requiring a post-process to remove that portion of the substrate, and there is also the problem that the area of the epitaxial wafer obtained is smaller than the area of the substrate used. Ta.

「課題を解決するための手段」 この発明はディップ法において、内面の上部に上方に広
がるように傾斜した円錐面をもうけたカーボン製リング
を用いることを特徴とするものである。すなわち第1図
(a) 、 (b)に示すように従来のディップ法と同
じ構造のルツボ5及びカセット3を用いるものであり、
その各部分名称は第1図(a)。
"Means for Solving the Problems" The present invention is characterized by using a carbon ring having a conical surface on the upper part of the inner surface that is inclined so as to spread upward in the dip method. That is, as shown in FIGS. 1(a) and 1(b), a crucible 5 and a cassette 3 having the same structure as the conventional dipping method are used.
The names of each part are shown in Figure 1(a).

(′b)と同じ番号で示され且つそれらの作用も同じで
あるが、カセット30室内に収納するカーボン製リング
1として、第2図(a) 、 (b)に示すように、開
ロアを有し、リングの内面の上部に上方に広がる傾斜し
た円錐面12をもうけたものを用いることを特徴とする
ものである。
Although they are indicated by the same numbers as ('b) and have the same functions, the carbon ring 1 to be stored in the cassette 30 chamber has an open lower ring as shown in FIGS. 2(a) and (b). The ring is characterized by having an upwardly sloping conical surface 12 on the upper part of the inner surface of the ring.

「作用」 即ち第1図(a)に示すように、ルツボ5の中にエピタ
キシャル成長させる材料を投入して加熱して溶融して成
長用溶液4とし、周囲の一部にスリット6を有し仕切板
8によって多数の室をもうけて各室の中にカーボン製リ
ング(1)と基板(2)の組を多数収納したカセット3
を組み立てる。その場合に基板2はカーボン製リング1
0円錐面と線接触している。カセット3をルツボ5内に
降下させると第1図(b)に示すように、ルツボ5の底
1ζあった溶液が押されてルツボ5とカセット3の間の
隙間を通って上昇し、スリット6からカーボン製リング
1の開ロアを通してカセット3の各室内に流入して室内
を充満し、基板を押し上げてカーボン製リングと離れて
浮いた状態となり、溶液の流れはカーボン製リングに妨
げられることなく完全に全面にわたって基板20表面と
接触する。ウェハが浮き上がらなくても保持リングとウ
ェハは線接触であるので全面にエピタキシャル成長が起
こる。この状態で徐冷すると基板2の全面の表面にエピ
タキシャル成長をすることができる。従って基板の面積
が無駄にならず、また得られたエピタキシャルウェハを
使用する際にエピタキシャル成長層のない部分を除去す
る必要がなく基板と作業時間の節約ができる。
"Operation" That is, as shown in FIG. 1(a), a material to be epitaxially grown is put into a crucible 5, heated and melted to form a growth solution 4, and a slit 6 is provided in a part of the periphery to form a partition. A cassette 3 which has a large number of chambers formed by a plate 8 and stores a large number of pairs of carbon rings (1) and substrates (2) in each chamber.
Assemble. In that case, the substrate 2 is the carbon ring 1
It is in line contact with the 0 conical surface. When the cassette 3 is lowered into the crucible 5, as shown in FIG. From there, the solution flows into each chamber of the cassette 3 through the open lower part of the carbon ring 1, filling the chambers, pushing up the substrate, separating it from the carbon ring, and leaving it in a floating state, so that the flow of the solution is not hindered by the carbon ring. It contacts the surface of the substrate 20 completely over the entire surface. Even if the wafer does not lift up, epitaxial growth occurs on the entire surface because the holding ring and the wafer are in line contact. By slowly cooling in this state, epitaxial growth can be performed on the entire surface of the substrate 2. Therefore, the area of the substrate is not wasted, and when the obtained epitaxial wafer is used, it is not necessary to remove the portion without the epitaxial growth layer, so that the substrate and working time can be saved.

「実施例」 本発明のようなカーボン製リングを用いた第1図の方法
によってAlxGa1−xAsのエピタキシャル成長を
行った。成長用溶液としてGa100に対してGaAs
化合物を4.75 flAl 505mfを投入したも
のを用いた。また比較のため従来のようなカーボン製リ
ングを用いて第4図の方法で同じエピタキシャル成長を
行った。
"Example" AlxGa1-xAs was epitaxially grown by the method shown in FIG. 1 using a carbon ring according to the present invention. GaAs for Ga100 as growth solution
A compound containing 4.75 flAl and 505 mf was used. For comparison, the same epitaxial growth was performed using a conventional carbon ring using the method shown in FIG.

得られたエピタキシャル成長したウェハの周辺部を観察
すると、本発明の方法では第3図のように基板2の周辺
部の末端までエピタキシャル成長層9が得られたが、従
来の切り込み座11を有するカーボン製リングを用いた
場合には第7図のようにウェハ2の周辺部ではエピタキ
シャル成長層9が非常に薄くなっていた。製造したエピ
タキシャル成長ウェハでは下面にエピタキシャル成長層
があるが図面では上下逆としである。
Observing the peripheral area of the obtained epitaxially grown wafer, it was found that in the method of the present invention, an epitaxially grown layer 9 was obtained up to the end of the peripheral area of the substrate 2 as shown in FIG. When a ring was used, the epitaxial growth layer 9 was extremely thin at the periphery of the wafer 2, as shown in FIG. The manufactured epitaxial growth wafer has an epitaxial growth layer on the bottom surface, but it is shown upside down in the drawing.

「発明の効果」 以上に詳しく説明したように、本発明の方法によれば基
板の全面にわたって均一なエピタキシャル成長層が得ら
れるので、従来の方法に比し同じ面積のエピタキシャル
ウェハを得るために必要な原基板の面積が少なくてすみ
、基板に対する収率が向上する。さらに得られたエピタ
キシャルウェハを使用して次の工程を行う場合にエピタ
キシャル成長層の無い部分を除去する必要が無く、工程
の短縮、時間とコストの節約ができる効果を有するもの
である。
"Effects of the Invention" As explained in detail above, according to the method of the present invention, a uniform epitaxial growth layer can be obtained over the entire surface of the substrate. The area of the original substrate is reduced, and the yield for the substrate is improved. Furthermore, when performing the next process using the obtained epitaxial wafer, there is no need to remove the portion where no epitaxial growth layer is present, which has the effect of shortening the process and saving time and cost.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)は本発明のエピタキシャル成長装置の準備
中の状態を示す正面断面図、第1図(b)は成長作業中
の正面断面図、第2図(a) 、 (b)は本発明に用
いる基板保持用リングの平面図及びA−A断面図である
。第5図は本発明によって製造したエピタキシャル成長
層を有するウェハの周辺部の断面図である。第4図(a
) 、 (b)は従来のエピタキシャル成長装置の準備
中及び作業中の状態を示す正面断面図である。第5図は
従来の方法に使用する基板保持用リングの断面図、第6
図は溶液に浸漬された状態の基板及び基板保持用リング
の断面図である。 第7図は従来の方法によって製造したエピタキシャル成
長層を有する基板の周辺部の断面図である。 1.10:基板保持用リング 2:基板(ウェハ) 3
:カセット 4:エピタキシャル成長用溶液 5ニルツ
ボ 6:スリット 7:開口 8:仕切板 9:エピタ
キシャル成長層 第1区
FIG. 1(a) is a front cross-sectional view showing the epitaxial growth apparatus of the present invention during preparation, FIG. 1(b) is a front cross-sectional view during the growth operation, and FIGS. 2(a) and (b) are the main FIG. 2 is a plan view and a sectional view taken along line A-A of a substrate holding ring used in the invention. FIG. 5 is a cross-sectional view of the periphery of a wafer having an epitaxially grown layer manufactured according to the present invention. Figure 4 (a
) and (b) are front sectional views showing the state of a conventional epitaxial growth apparatus during preparation and operation. Figure 5 is a cross-sectional view of a substrate holding ring used in the conventional method;
The figure is a cross-sectional view of the substrate and substrate holding ring immersed in a solution. FIG. 7 is a cross-sectional view of the peripheral portion of a substrate having an epitaxially grown layer manufactured by a conventional method. 1.10: Substrate holding ring 2: Substrate (wafer) 3
: Cassette 4: Epitaxial growth solution 5 Nylpot 6: Slit 7: Opening 8: Partition plate 9: First section of epitaxial growth layer

Claims (1)

【特許請求の範囲】[Claims] 1、エピタキシャル成長させる材料を溶融した成長用溶
液を入れたルツボ内に仕切板により多数の室を有し各室
の中に基板保持用リングと基板の組を多数収納したカセ
ットを浸漬して多数の基板に同時にエピタキシャル成長
層を形成させるディップ法液相エピタキシャル成長方法
において、リングの内面の上部に上方に広がる傾斜を有
する円錐面をもうけ、該円錐面に円板状の基板を線接触
で保持するようにした基板保持用リングを用いることを
特徴とする液相エピタキシャル成長方法2、GaAs化
合物半導体基板にGaを溶媒としてGa及びAsを含む
化合物半導体結晶を液相エピタキシャル成長させること
を特徴とする請求項1記載の液相エピタキシャル成長方
1. A crucible containing a growth solution containing melted material to be epitaxially grown has a number of chambers separated by partition plates, and a cassette containing a number of pairs of substrate holding rings and substrates is immersed in each chamber. In a dip method liquid phase epitaxial growth method in which an epitaxial growth layer is simultaneously formed on a substrate, a conical surface having an upwardly expanding slope is provided at the upper part of the inner surface of the ring, and a disk-shaped substrate is held in line contact with the conical surface. A liquid phase epitaxial growth method 2 characterized in that a ring for holding a substrate is used, and a compound semiconductor crystal containing Ga and As is grown on a GaAs compound semiconductor substrate by liquid phase epitaxial growth using Ga as a solvent. Liquid phase epitaxial growth method
JP1208189A 1989-01-21 1989-01-21 Method for liquid-phase epitaxial growth Granted JPH02192487A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1208189A JPH02192487A (en) 1989-01-21 1989-01-21 Method for liquid-phase epitaxial growth

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1208189A JPH02192487A (en) 1989-01-21 1989-01-21 Method for liquid-phase epitaxial growth

Publications (2)

Publication Number Publication Date
JPH02192487A true JPH02192487A (en) 1990-07-30
JPH0571558B2 JPH0571558B2 (en) 1993-10-07

Family

ID=11795635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1208189A Granted JPH02192487A (en) 1989-01-21 1989-01-21 Method for liquid-phase epitaxial growth

Country Status (1)

Country Link
JP (1) JPH02192487A (en)

Also Published As

Publication number Publication date
JPH0571558B2 (en) 1993-10-07

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