JPH02192144A - Gate array type semiconductor device - Google Patents

Gate array type semiconductor device

Info

Publication number
JPH02192144A
JPH02192144A JP1130289A JP1130289A JPH02192144A JP H02192144 A JPH02192144 A JP H02192144A JP 1130289 A JP1130289 A JP 1130289A JP 1130289 A JP1130289 A JP 1130289A JP H02192144 A JPH02192144 A JP H02192144A
Authority
JP
Japan
Prior art keywords
peripheral circuit
chip
circuit chip
circuit
pads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1130289A
Other languages
Japanese (ja)
Inventor
Toru Kume
徹 久米
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1130289A priority Critical patent/JPH02192144A/en
Publication of JPH02192144A publication Critical patent/JPH02192144A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

PURPOSE:To make it possible to form many basic cells on one chip in the limit of manufacture of the dimension of the chip by a method wherein peripheral circuit chips, which are respectively constituted of each peripheral circuit comprising a static breakdown strength protective circuit, a latch-up protective circuit, an output transistor and the like, and an internal circuit chip comprising basic cells other than the above circuits, transistor and the like are connected to each other on a package. CONSTITUTION:A P-channel output transistor, an N-channel output transistor and a latch-up protective circuit are contained in respective peripheral circuit cells 501. Static protective circuits are respectively constituted of part of the respective output transistors and peripheral circuit chips 5 are provided arranging a necessary number of the cells 501 on each one side. An internal circuit chip 4 and the chips 5 are conformed to lead patterns 1 and peripheral internal patterns (wirings) 2 and are mounted on a package main body 3 in such a way that pads face downward to make the leads 1 and pads 502 and pads 503 and the wirings 2 correspond to each other to connect. Moreover, a power conductor 6 and pads 504 and a grounding conductor 7 and pads 505 are connected to each other to feed a power supply to the chips 5. Thereby, an internal circuit region is made wide within the limited dimension of a chip and the improvement of an integration degree can be attained.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はゲーI・アレイ型半導体装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a GaI array type semiconductor device.

〔従来の技術〕[Conventional technology]

従来のゲートアレイ型半導体装置は、第8図に示すよう
に、半導体チップ801上の中央部に設けた内部回路領
域803及び外部信号の入出力用の周辺回路セル802
を有している。周辺回路セル802は第9図に示すよう
に、入力バッファ及び出カフ°リバッファ905.出力
バッファトランジスタ902,903.静電耐圧保護回
路、ラッチアップ保護回路904の機能ブロックから成
り、インタフェース以外の機能を実現する内部回路領域
803と同一の半導体チップ801上に形成されていた
As shown in FIG. 8, a conventional gate array type semiconductor device includes an internal circuit area 803 provided in the center of a semiconductor chip 801 and a peripheral circuit cell 802 for inputting and outputting external signals.
have. As shown in FIG. 9, the peripheral circuit cell 802 includes an input buffer and an output buffer 905. Output buffer transistors 902, 903. It consists of functional blocks of an electrostatic voltage protection circuit and a latch-up protection circuit 904, and is formed on the same semiconductor chip 801 as an internal circuit area 803 that implements functions other than an interface.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来のゲートアレイ型半導体装置は、周辺回路
セルと内部回路領域が同一チップ上に構成されており、
充分な出力駆動能力、静電耐圧。
In the conventional gate array type semiconductor device described above, the peripheral circuit cells and the internal circuit area are configured on the same chip.
Sufficient output drive capacity and electrostatic withstand voltage.

ラッチアップ耐量を確保するためには周辺回路セルに大
きな面積を必要とする。また多ピンに対応するために最
小パッド間隔にするため、周辺回路セルの高さが高くな
り、限られたチップの寸法内では内部回路領域を狭め、
集積度向上の妨げとなるという欠点がある。さらに入力
バッファ及び出力プリバッファ部分は、周辺回路セルの
最大機能に対応可能なように多数のトランジスタを用意
するが、実際の品種ではそのすべてを使用することがな
いため、集積度向上の妨げになるという欠点がある。ま
た、最大外部端子数のパッケージに搭載する為に必要な
数だけの周辺回路セルを有しているが、最大外部端子数
より少ない外部端子数のパッケージに搭載する場合には
未使用周辺回路セルが発生し、集積度向上のさまたげと
なる。逆に、外部端子数が多く内部回路セル使用数が少
ない品種では未使用内部回路セルが発生し、これも集積
度向上の妨げとなるという欠点がある。
In order to ensure latch-up tolerance, a large area is required for the peripheral circuit cells. In addition, in order to minimize the pad spacing in order to accommodate a large number of pins, the height of the peripheral circuit cell increases, and the internal circuit area becomes narrower within the limited chip dimensions.
This has the disadvantage that it hinders the improvement of the degree of integration. Furthermore, the input buffer and output pre-buffer sections are equipped with a large number of transistors to accommodate the maximum functionality of the peripheral circuit cells, but in actual products, not all of them are used, which hinders the improvement of integration density. It has the disadvantage of becoming. In addition, it has the necessary number of peripheral circuit cells to be mounted on a package with the maximum number of external terminals, but if it is mounted on a package with fewer external terminals than the maximum number of external terminals, unused peripheral circuit cells occurs, which hinders the improvement of the degree of integration. On the other hand, products with a large number of external terminals and a small number of used internal circuit cells have the disadvantage that unused internal circuit cells are generated, which also hinders the improvement of the degree of integration.

〔課題を解決するための手段〕[Means to solve the problem]

本発明のゲートアレイ半導体装置は、パッケージ本体の
中央部に搭載した基本セルを有する内部回路チップと、
前記ゲートアレイ型半導体装置の入出力信号を処理する
周辺回路を有し前記内部回路チップの周囲に配置して搭
載しな周辺回路チップと、前記内部回路チップの周囲の
前記パッケージ本体上に配置して設け前記内部回路チッ
プと前記周辺回路チップとを電気的に接続する配線と、
前記配線の外周に設けて前記周辺回路チップと接続する
電源線及び接地線と、前記周辺回路チップと接続し且つ
前記周辺回路チップの外側に設けた外部回路接続用のリ
ードとを備えている。
A gate array semiconductor device of the present invention includes an internal circuit chip having a basic cell mounted in the center of a package body;
A peripheral circuit that processes input/output signals of the gate array type semiconductor device is arranged around the internal circuit chip, and a peripheral circuit chip that is mounted on the package body around the internal circuit chip. wiring that is provided to electrically connect the internal circuit chip and the peripheral circuit chip;
The device includes a power supply line and a ground line provided on the outer periphery of the wiring and connected to the peripheral circuit chip, and a lead for external circuit connection connected to the peripheral circuit chip and provided outside the peripheral circuit chip.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の第1の実施例を示す平面図、第2図は
本発明の第1の実施例の周辺回路チップの底面図、第3
図は本発明の第1の実施例の周辺回路セルの構成を示す
模式図、第4図は本発明の第1の実施例の内部回路チッ
プのレイアウト図、第5図は本発明の第1の実施例のパ
ッケージ本体の配線のレイアウト図である。
FIG. 1 is a plan view showing a first embodiment of the present invention, FIG. 2 is a bottom view of a peripheral circuit chip of the first embodiment of the present invention, and FIG.
The figure is a schematic diagram showing the configuration of the peripheral circuit cell of the first embodiment of the present invention, FIG. 4 is a layout diagram of the internal circuit chip of the first embodiment of the present invention, and FIG. FIG. 3 is a wiring layout diagram of the package body of the embodiment.

周辺回路セル501は第3図に示すように、Pチャネル
出力トランジスタ511.Nチャネル出力トランジスタ
513.ラッチアップ保護回路512を内蔵する。静電
保護回路は出力トランジスタ511,513の一部で構
成される。周辺回路チップ5は周辺回路セル501を1
辺に所要数を配列して設けている。リード1との接続用
パッド502.配線2との接続用パッド503.電源線
6との接続用パッド504.接地線7との接続用パッド
505.内部回路チップ4のパッド401のそれぞれは
バンプを形成している。第5図に示すように、パッケー
ジ本体3にはリードパターン1.配線2.電源線6.接
地線7がそれぞれ設けられ、パッケージ本体3上に形成
されたリードパターン1と周辺内部パターン2に合わせ
て内部回路チップ4と周辺回路チップ5をパッドが下に
向くようにパッケージ本体3上に搭載してリード1とパ
ッド502.パッド503と配線2.配線2とパッド4
01をそれぞれ対応させて接続する。また、同様に電源
線6とパッド504.接地線7とパッド505を接続し
て周辺回路チップ5に電源を供給する。
As shown in FIG. 3, peripheral circuit cell 501 includes P-channel output transistors 511 . N-channel output transistor 513. A latch-up protection circuit 512 is built-in. The electrostatic protection circuit is composed of a portion of the output transistors 511 and 513. The peripheral circuit chip 5 has one peripheral circuit cell 501.
The required number is arranged on each side. Pad 502 for connection with lead 1. Pad 503 for connection with wiring 2. Pad 504 for connection to power supply line 6. Pad 505 for connection with ground wire 7. Each of the pads 401 of the internal circuit chip 4 forms a bump. As shown in FIG. 5, the package body 3 has lead patterns 1. Wiring 2. Power line 6. A grounding wire 7 is provided respectively, and the internal circuit chip 4 and the peripheral circuit chip 5 are mounted on the package body 3 with the pads facing downward in alignment with the lead pattern 1 and the peripheral internal pattern 2 formed on the package body 3. and lead 1 and pad 502. Pad 503 and wiring 2. Wiring 2 and pad 4
01 in correspondence with each other. Similarly, the power line 6 and the pad 504. The ground line 7 and the pad 505 are connected to supply power to the peripheral circuit chip 5.

第6図は本発明の第2の実施例を示す平面図、第7図は
本発明の第2の実施例のパッケージ本体の配線のレイア
ウト図である。
FIG. 6 is a plan view showing a second embodiment of the present invention, and FIG. 7 is a wiring layout diagram of the package body of the second embodiment of the present invention.

内部回路チップ8は長方形に形成されており、内部回路
チップ8のパッドに合わせてパッケージ本体3の配線2
のレイアウトを設定した以外は第1の実施例と同一の構
成を有している。
The internal circuit chip 8 is formed into a rectangle, and the wiring 2 of the package body 3 is aligned with the pad of the internal circuit chip 8.
This embodiment has the same configuration as the first embodiment except that the layout is set.

この実施例では、第1の実施例と同一の外部端子数の品
種を長方形の内部回路チップで形成するため、内部回路
チップの面積を小さくすることができる。そのため多ピ
ン、少ゲート数の品種では内部回路チップ製造コストを
小さくすることができるという利点がある。第1の実施
例の内部回路チップの面積と比較して第2の実施例では
24%の面積縮小を実現できな。
In this embodiment, since a product having the same number of external terminals as in the first embodiment is formed using a rectangular internal circuit chip, the area of the internal circuit chip can be reduced. Therefore, products with a large number of pins and a small number of gates have the advantage that the manufacturing cost of internal circuit chips can be reduced. Compared to the area of the internal circuit chip of the first embodiment, the second embodiment cannot achieve a 24% reduction in area.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、ゲートアレイ半導体装置
において、静電耐圧保護回路、ラッチアづ ツブ保護回路、出力トランジスタ等を含む周辺回路で構
成される周辺回路チップとそれ以外の基本セルを含む内
部回路チップとをパッケージ上で電気的に接続すること
により、チップ寸法の製造限界に対して多くの基本セル
を1チツプ上に形成可となる効果がある。また、周辺回
路チップが独立しているため、内部セル数を犠牲にせず
に静電耐圧、ラッチアップ耐量、出力駆動能力を向上す
ることができる効果がある。さらに、外部端子数に対し
、内部セル使用数が少ない品種では、必要な外部端子数
を確保したうえで内部回路チップを適当な面積に縮小で
きる効果がある。
As explained above, the present invention provides a gate array semiconductor device that includes a peripheral circuit chip consisting of peripheral circuits including an electrostatic voltage protection circuit, a latch tube protection circuit, an output transistor, etc., and an internal circuit including other basic cells. By electrically connecting the circuit chip to the package, it is possible to form a large number of basic cells on one chip within the manufacturing limit of the chip size. Furthermore, since the peripheral circuit chips are independent, it is possible to improve electrostatic withstand voltage, latch-up tolerance, and output drive capability without sacrificing the number of internal cells. Furthermore, for products that use fewer internal cells than the number of external terminals, it is possible to reduce the internal circuit chip to an appropriate area while securing the necessary number of external terminals.

また、実施例1のように、内部回路チップと周辺回路チ
ップとを接続する配線パターンを各辺で平行に作成する
と、同一周辺回路チップ、同一配線パターンを有するパ
ッケージ」1に異なる寸法の内部回路チップが対応可能
となるという効果がある。
Furthermore, as in Example 1, if the wiring patterns connecting the internal circuit chip and the peripheral circuit chip are created in parallel on each side, the same peripheral circuit chip and the package with the same wiring pattern 1 may have internal circuits with different dimensions. This has the effect of making the chip compatible.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の第1の実施例を示す平面図、第2図は
本発明の第1の実施例の周辺回路チップの底面図、第3
図は本発明の第1の実施例の周辺回路セルの構成を示す
模式図、第4図は本発明の第1の実施例の内部回路チッ
プのレイアウト図、第5図は本発明の第1の実施例のパ
ッケージ本体の配線のレイアウト図、第6図は本発明の
第2の実施例を示す平面図、第7図は本発明の第2の実
施例のパッケージ本体の配線のレイアウト図、第8図は
従来の半導体チップの一例を示すレイアウ1〜図、第9
図は従来の周辺回路セルの構成を示す模式図である。 1・・・リード、2・・・配線、3・・パッケージ本体
、4・・・内部回路チップ、5・・・周辺回路チップ、
6・・・電源線、7・・・接地線、8・・・内部回路チ
ップ、50]・・・周辺回路セル、502.503,5
04゜505・・・パッド、506・・・電源線、50
7・・・接地線、508・・・ラッチアップ保護回路、
510・・・パッド、511・・・Pチャネル出力トラ
ンジスタ、512・・・ラッチアップ保護回路、513
・・・Nチャネル出力トランジスタ、401・・パッド
、402・・・基本セル、801・・・半導体チップ、
802・・・周辺回路セル、803・・・内部回路領域
、901・・・ホンディングパッド、902・・・Pチ
ャネル出力l・ランジスタ、903・・・Nチャネル出
力トランジスタ、904・・ラッチアップ保護回路、9
05・・・入力バッファ及び出力バッファ。
FIG. 1 is a plan view showing a first embodiment of the present invention, FIG. 2 is a bottom view of a peripheral circuit chip of the first embodiment of the present invention, and FIG.
The figure is a schematic diagram showing the configuration of the peripheral circuit cell of the first embodiment of the present invention, FIG. 4 is a layout diagram of the internal circuit chip of the first embodiment of the present invention, and FIG. FIG. 6 is a plan view showing the second embodiment of the present invention; FIG. 7 is a layout diagram of the wiring of the package body of the second embodiment of the present invention; Figure 8 shows layouts 1 to 9 showing an example of a conventional semiconductor chip.
The figure is a schematic diagram showing the configuration of a conventional peripheral circuit cell. 1... Lead, 2... Wiring, 3... Package body, 4... Internal circuit chip, 5... Peripheral circuit chip,
6...Power supply line, 7...Grounding line, 8...Internal circuit chip, 50]...Peripheral circuit cell, 502.503,5
04゜505...Pad, 506...Power line, 50
7...Grounding wire, 508...Latch-up protection circuit,
510... Pad, 511... P channel output transistor, 512... Latch-up protection circuit, 513
...N-channel output transistor, 401...pad, 402...basic cell, 801...semiconductor chip,
802... Peripheral circuit cell, 803... Internal circuit area, 901... Honing pad, 902... P channel output transistor, 903... N channel output transistor, 904... Latch-up protection circuit, 9
05...Input buffer and output buffer.

Claims (1)

【特許請求の範囲】[Claims] ゲートアレイ型半導体装置において、パッケージ本体の
中央部に搭載した基本セルを有する内部回路チップと、
前記ゲートアレイ型半導体装置の入出力信号を処理する
周辺回路を有し前記内部回路チップの周囲に配置して搭
載した周辺回路チップと、前記内部回路チップの周囲の
前記パッケージ本体上に配置して設け前記内部回路チッ
プと前記周辺回路チップとを電気的に接続する配線と、
前記配線の外周に設けて前記周辺回路チップと接続する
電源線及び接地線と、前記周辺回路チップと接続し且つ
前記周辺回路チップの外側に設けた外部回路接続用のリ
ードとを備えたこと特徴とするゲートアレイ型半導体装
置。
In a gate array type semiconductor device, an internal circuit chip having a basic cell mounted in the center of a package body;
A peripheral circuit chip having a peripheral circuit for processing input/output signals of the gate array type semiconductor device and disposed around the internal circuit chip, and a peripheral circuit chip disposed on the package body around the internal circuit chip. Wiring for electrically connecting the internal circuit chip and the peripheral circuit chip;
A power supply line and a ground line provided on the outer periphery of the wiring and connected to the peripheral circuit chip, and a lead for external circuit connection connected to the peripheral circuit chip and provided outside the peripheral circuit chip. A gate array type semiconductor device.
JP1130289A 1989-01-20 1989-01-20 Gate array type semiconductor device Pending JPH02192144A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1130289A JPH02192144A (en) 1989-01-20 1989-01-20 Gate array type semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1130289A JPH02192144A (en) 1989-01-20 1989-01-20 Gate array type semiconductor device

Publications (1)

Publication Number Publication Date
JPH02192144A true JPH02192144A (en) 1990-07-27

Family

ID=11774203

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1130289A Pending JPH02192144A (en) 1989-01-20 1989-01-20 Gate array type semiconductor device

Country Status (1)

Country Link
JP (1) JPH02192144A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012191213A (en) * 2011-03-11 2012-10-04 Altera Corp Systems including i/o stack and methods for fabricating such systems

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012191213A (en) * 2011-03-11 2012-10-04 Altera Corp Systems including i/o stack and methods for fabricating such systems

Similar Documents

Publication Publication Date Title
US4945395A (en) Semiconductor device
US4733288A (en) Gate-array chip
US7443224B2 (en) Multi-threshold MIS integrated circuit device and circuit design method thereof
US6721933B2 (en) Input/output cell placement method and semiconductor device
JPH03165061A (en) Semiconductor integrated circuit device
US4947233A (en) Semi-custom LSI having input/output cells
JP2560805B2 (en) Semiconductor device
US20080237645A1 (en) Semiconductor device
JPH02152254A (en) Semiconductor integrated circuit device
JP3962441B2 (en) Semiconductor device
US5434436A (en) Master-slice type semiconductor integrated circuit device having multi-power supply voltage
JPH02192144A (en) Gate array type semiconductor device
JPS63314847A (en) Master slice type semiconductor device
JP2780355B2 (en) Semiconductor integrated circuit device
JPS6070742A (en) Master slice type semiconductor device
JPH02267947A (en) Semiconductor device
JPH03195045A (en) Semiconductor integrated circuit device
JPH04171844A (en) Semiconductor integrated circuit
JPH03203363A (en) Semiconductor device
JPH05343525A (en) Semiconductor integrated circuit
JPS6329545A (en) Semiconductor integrated circuit device
JPH02306650A (en) Semiconductor device
JPS6251231A (en) Semiconductor integrated circuit device
JPH02310946A (en) Semiconductor integrated circuit device
JPH058576B2 (en)