JPH02186278A - Part measuring apparatus - Google Patents

Part measuring apparatus

Info

Publication number
JPH02186278A
JPH02186278A JP1007009A JP700989A JPH02186278A JP H02186278 A JPH02186278 A JP H02186278A JP 1007009 A JP1007009 A JP 1007009A JP 700989 A JP700989 A JP 700989A JP H02186278 A JPH02186278 A JP H02186278A
Authority
JP
Japan
Prior art keywords
measured
connection
test board
test
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1007009A
Other languages
Japanese (ja)
Inventor
Shoichi Teshirogi
手代木 庄一
Kyoko Suzuki
京子 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP1007009A priority Critical patent/JPH02186278A/en
Publication of JPH02186278A publication Critical patent/JPH02186278A/en
Pending legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To facilitate the judgement of the propriety of a measuring apparatus by opening or closing sets of connection lines provided between a plurality of measuring units and a test board wherein parts to be measured is not carried with a switch to test the connection line selected with a multimeter. CONSTITUTION:A plurality of measuring units 2a and 2b are connected to a test board 4 yet to carry parts to be tested with sets of connection lines 30 and 31 and 32 and 33 through switches S10-S13. A multi-meter 17 is connected to any of switch couples (S20 and 21), (S22 and 23) and (S24 and 25) selected by a selection means 41. By a command from a testing section 15, relay contacts S10-S13 and S20-25 of the switch 40 and the selection means 41 are controlled to form a specified measuring circuit. An impedance and a voltage are measured with the multi-meter 17 and the results are compared with an expected value stored in the testing section 15 to judge the propriety thereof. This facilitates the judgement of the presence of an abnormality of the circuit thereby preventing a breakage of parts to be measured.

Description

【発明の詳細な説明】 (wc  要〕 本発明は部品測定装置に関し、 被測定部品を挿脱する試験ボードを部品搭載前の接続状
態でチエツクすることを目的とし、被測定部品を挿脱す
る試験ボードと、該試験ボードに試験信号を供給し出力
を測定する測定ユニットと、該測定ユニットと前記試験
ボードとを接続する接続機構とを備えた部品測定装置に
おいて、該測定ユニットと該接続機構とを接続する接続
線をそれぞれ切断するスイッチと、前記スイッチと該接
続機構との間の複数の該接続線のうち、所定の2組の該
接続線を選択し引き出す選択手段と、選択された該接続
線間で所定の特性を測定する測定部と、該選択手段を制
御して測定対象の該接続線を該測定部に接続し該スイッ
チを接続または切断制御して該測定部に測定せしめると
ともに、得られた測定値と対応する期待値とを比較する
試験部とを設け、被測定部品未搭載の該試験ボードを接
続した状態で前記所定の特性を測定し、得られた測定値
と期待値とを比較して該試験ボードの正常性ならびに該
試験ボードの接続状態を試験するように構成する。
[Detailed description of the invention] (wc essential) The present invention relates to a component measuring device, and an object of the present invention is to check the connected state of a test board to which a component to be measured is inserted and removed before mounting the component. A component measuring device comprising a test board, a measurement unit that supplies test signals to the test board and measures output, and a connection mechanism that connects the measurement unit and the test board, the measurement unit and the connection mechanism a switch that disconnects each of the connecting wires connecting said switch and said connecting mechanism; selecting means for selecting and drawing out two predetermined sets of said connecting wires from said plurality of said connecting wires between said switch and said connecting mechanism; a measuring section that measures a predetermined characteristic between the connecting wires; and controlling the selecting means to connect the connecting wire to be measured to the measuring section and controlling the connection or disconnection of the switch to cause the measuring section to measure. At the same time, a test section is provided to compare the obtained measured value and the corresponding expected value, and the predetermined characteristic is measured with the test board without the component to be measured connected, and the obtained measured value and The normality of the test board and the connection state of the test board are tested by comparing the test board with an expected value.

〔産業上の利用分野〕[Industrial application field]

本発明は、部品測定装置の改良に関する。 The present invention relates to an improvement in a component measuring device.

半導体部品等の各種電気的特性を測定する測定部W(以
下テスタ)は、複数種別の部品の測定を可能とするため
、被測定部品に応じた試験ボードが準備され、接続機構
により、プログラマブル電源、信号発生器等からなる測
定ユニットにその都度接続して測定するように構成され
ている。
The measurement unit W (hereinafter referred to as the tester), which measures various electrical characteristics of semiconductor components, etc., is capable of measuring multiple types of components, so test boards are prepared according to the components to be measured, and a programmable power supply is installed using the connection mechanism. , a signal generator, etc., for each measurement.

この測定ユニットは、試験ボードに至るまでのケーブル
インピーダンスや、接続機構の接触抵抗などの影響を無
くすため、FORCI!線(供給線)の他に5ENSE
線(フィードバック!151)を設けて試験ボードに所
定の信号を供給しているため、試験ボード内部でFOR
CB線と5BNSE線との間で接続不良が発生すると、
FORCB線に異常な電圧が供給されて被測定部品を破
壊する恐れがある。
This measurement unit uses FORCI! to eliminate the effects of cable impedance up to the test board and contact resistance of the connection mechanism. In addition to the line (supply line), 5ENSE
Since a line (feedback! 151) is provided to supply a predetermined signal to the test board, FOR
If a connection failure occurs between the CB line and the 5BNSE line,
There is a risk that abnormal voltage will be supplied to the FORCB line and destroy the component under test.

この試験ボードは、被測定部品に対処して利用者が準備
するようになっており、接続不良、接触等の障害をチエ
ツクしたいとか、制作された試験ボードをデパックした
いという要望がある。
This test board is prepared by the user in accordance with the parts to be measured, and there is a desire to check for failures such as connection failures and contacts, and to depack the manufactured test board.

[従来の技術1 以下、本発明の要旨をより一層明らかにするため、テス
タの概要を説明しておく。
[Prior Art 1] Hereinafter, in order to further clarify the gist of the present invention, an outline of the tester will be explained.

第3図は従来のテスタブロック図である。FIG. 3 is a block diagram of a conventional tester.

第3図において、複数の測定ユニット2a、2bは、制
御装置lから出力される制御信号により、所定の電圧、
電流等の電源および試験信号を試験ボード4に供給し被
測定部品である集積回路icの出力信号を測定する。
In FIG. 3, a plurality of measuring units 2a, 2b are controlled to a predetermined voltage,
A power source such as a current and a test signal are supplied to the test board 4, and the output signal of the integrated circuit IC, which is the component to be measured, is measured.

試験ボード4は、被測定ICに対応するソケット6と、
ソケット端子と所定の測定ユニット2a、2bとを切替
え接続するとともに出力端子には負荷等を接続する設定
回路5とをプリント板に装着したもので、コネクタまた
はボゴコンタクトビン(バネ付きの接触ビン)等で構成
される接続aJR3によって測定ユニット2a、2bに
接続される。
The test board 4 includes a socket 6 corresponding to the IC to be measured;
A setting circuit 5 that switches and connects the socket terminal and the specified measurement units 2a, 2b and connects a load, etc. to the output terminal is mounted on a printed board, and can be used as a connector or a bogo contact bin (a contact bin with a spring). It is connected to the measuring units 2a, 2b by a connection aJR3 consisting of, etc.

接続線詩は測定ユニット2a、2bからの供給線(FO
RCB線)31.ICの出力線等の他、試験ボード4内
でFORCE線3C色線続された5ENSt!線30が
それぞれ設けられており、例えば測定ユニット2aは5
ENSE線30を参照してFORCB 11A31に信
号を出力する。
The connecting lines are the supply lines (FO
RCB line) 31. In addition to the IC output lines, etc., the FORCE line 3C color wire is connected within the test board 4 to 5ENSt! For example, the measuring unit 2a has 5 wires 30.
Referring to the ENSE line 30, a signal is output to FORCB 11A31.

これによりFORCE線3C色線!m 5BNSE線3
0との接続点Pで所定の信号が供給され、接続機構3 
、FORCE線3C色線−ブルインピーダンス等が補正
されて所定の電圧が試験ボード4に供給される。
With this, FORCE line 3C color line! m 5BNSE line 3
A predetermined signal is supplied at the connection point P with 0, and the connection mechanism 3
, FORCE line 3C color line - bull impedance etc. are corrected and a predetermined voltage is supplied to the test board 4.

以上のごとく、テスタの測定ユニット2a、2bの出力
はプログラマブルに設定できるため、試験ボード4の設
定回路5を制御することにより種々の条件で測定が可能
となっており、また試験ボード4を交換することにより
、複数種別の部品の測定が可能となっている。
As described above, since the outputs of the tester measurement units 2a and 2b can be set programmably, measurements can be made under various conditions by controlling the setting circuit 5 of the test board 4, and the test board 4 can be replaced. This makes it possible to measure multiple types of parts.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

試験ボードは、通常利用者によって準備されており、部
品の多ピン化に伴い、接続不良、接触等の障害が発生し
易くなっている。
Test boards are usually prepared by users, and as the number of pins increases, failures such as poor connections and contacts are more likely to occur.

特にFORCB線と5ENSE線とが接続不良になると
、被測定部品に異常電圧が印可される可能性があり、破
壊する恐れがある。
In particular, if there is a poor connection between the FORCB line and the 5ENSE line, there is a possibility that an abnormal voltage will be applied to the component to be measured, which may result in destruction.

また、利用者にとって制作した試験ボードをデバッグす
ることは容易でないという課題もある。
Another problem is that it is not easy for users to debug the test boards they have created.

本発明は、上記課題に鑑み、測定装置に接続した状態で
部品搭載前の試験ボードをチエツクする部品測定装置を
堤供することを目的とする。
SUMMARY OF THE INVENTION In view of the above problems, it is an object of the present invention to provide a component measuring device that checks a test board before components are mounted while connected to the measuring device.

C課題を解決するための手段〕 上記目的を達成するため、本発明の部品測定装置は、第
1図本発明の原理図に示すように、測定ユニット(2)
と接続機構(3)とを接続する接続線(35)をそれぞ
れ切断するスイッチ(40)と、前記スイッチと該接続
機構との間の複数の該接続線(35)のうち、所定の2
組の該接続線を選択し引き出す選択手段(41)と、 選択された該接続線間で所定の特性を測定する測定部(
42)と、 該選択手段(41)を制御して測定対象の該接続線を該
測定部(42)に接続し該スイッチ(40)を接続また
は切断制御して該測定部(42)に測定せしめるととも
に、得られた測定値と対応する期待値とを比較する試験
部(15)とを備える。
Means for Solving Problem C] In order to achieve the above object, the component measuring device of the present invention has a measuring unit (2) as shown in FIG.
and a switch (40) that disconnects each connection line (35) connecting the connection mechanism (3) and the connection mechanism (3);
a selection means (41) for selecting and drawing out the connecting wires of the set; and a measuring section (41) for measuring a predetermined characteristic between the selected connecting wires.
42), controlling the selection means (41) to connect the connection line of the measurement object to the measurement section (42) and controlling the connection or disconnection of the switch (40) to send the measurement to the measurement section (42); and a test section (15) for comparing the obtained measured value and the corresponding expected value.

〔作 用〕[For production]

試験部15は、スイッチ40を切断状態に設定するとと
もに選択手段41を制御して所定の2m1iの接続線3
5(接地線を含む)を選択する。
The test section 15 sets the switch 40 to the disconnected state and controls the selection means 41 to select a predetermined 2m1i connection line 3.
Select 5 (including ground wire).

これにより、測定ユニット2を開放した試験ボード4側
をみた測定回路が形成でき、マルチメータ等で構成され
る測定部42にインピーダンスを測定せしめ、得られた
測定値と期待値(予め測定した正常値)と比較する。
As a result, a measurement circuit can be formed looking at the test board 4 side with the measurement unit 2 open, and the measurement section 42 consisting of a multimeter etc. can be used to measure impedance, and the obtained measurement value and expected value (pre-measured normal value).

例えばPORCE線−5ENSf!線間の抵抗値、各接
続線35〜接地間の抵抗値等を測定し、それぞれ期待値
と比較することにより、試験ボード4の正常性、測定ユ
ニット2に対する試験ボード4の接続状態を判別する。
For example, PORCE line -5ENSf! The normality of the test board 4 and the connection state of the test board 4 to the measurement unit 2 are determined by measuring the resistance value between the lines, the resistance value between each connection line 35 and the ground, etc., and comparing them with the expected values. .

またスイッチ40を接続状態に設定し、測定ユニット2
に対し所定の電圧出力を指示して供給線の電圧測定値と
指示した電圧値(期待値)とを比較し、正常性を検証す
る。
In addition, the switch 40 is set to the connected state, and the measurement unit 2
A predetermined voltage output is instructed to the supply line, and the measured voltage value of the supply line is compared with the instructed voltage value (expected value) to verify normality.

以上の測定はスイッチ40および選択手段41を順次制
御してシーケンシ十ルに行われ、期待値と比較すること
により、試験ボード4のデバッグならびに接続時におけ
る試験ボード4の正常性ならびに接続状態を試験するこ
とができる。
The above measurements are performed sequentially by sequentially controlling the switch 40 and the selection means 41, and are compared with expected values to test the normality and connection status of the test board 4 during debugging and connection. can do.

〔実施例〕〔Example〕

本発明の実施例を図を用いて詳細に説明する。 Embodiments of the present invention will be described in detail with reference to the drawings.

第2図は実施例のテスタブロック図である。FIG. 2 is a tester block diagram of the embodiment.

第2図は、測定対象の接続線35として、FORCE線
31.33 、5ENSE H2O,32ならびに接地
線GNDを例示したものである0図中、 lは制御装置であって、各測定ユニット2a、2bなら
びに設定回路5を制御して被測定部品の測定制御を行い
、測定結果を収集するとともに、試験部15の指示によ
り、指定の電圧、信号を測定ユニット2a、2bに出力
せしめるもの、 S 10.S11.S12.S13は、それぞれスイッ
チ40を構成するリレー接点で、試験部15により制御
されるもの、 520、321 、522.523ならびにS24.S
25は、それぞれ選択手段41を構成するリレー接点で
、試験部15により個別に制御されて2組の接続線35
をマルチメータ17に接続するもの、 17はマルチメータで、試験部15の指示により、イン
ピーダンス、電圧等をそれぞれ測定し、測定値としてデ
ィジタル値を出力するもの、15は試験部であって、ス
イッチ40、選択手段41の各リレー接点をそれぞれ制
御して所定の測定回路を設定するとともに、マルチメー
タ17に対しインピーダンス測定、電圧測定の切替えを
指示し制御装置1には試験信号の出力を指示して試験制
御を行い、またマルチメータ17の出力する測定値と期
待値とを比較して正常性を検証するものであり、その他
全図を通じて同一符号は同一対象物を表す。
FIG. 2 shows FORCE wires 31.33, 5ENSE H2O, 32 and ground wire GND as connection wires 35 to be measured. 2b and the setting circuit 5 to perform measurement control of the part under test, collect measurement results, and output specified voltages and signals to the measurement units 2a and 2b according to instructions from the test section 15; S10 .. S11. S12. 520, 321, 522, 523 and S24. S
25 are relay contacts constituting the selection means 41, and are individually controlled by the test section 15 to connect the two sets of connecting wires 35.
17 is a multimeter that measures impedance, voltage, etc. according to instructions from the test section 15, and outputs a digital value as a measured value. 15 is a test section that connects a switch. 40. Set a predetermined measurement circuit by controlling each relay contact of the selection means 41, and instruct the multimeter 17 to switch between impedance measurement and voltage measurement, and instruct the control device 1 to output a test signal. The multimeter 17 performs test control and compares the measured value output by the multimeter 17 with the expected value to verify normality. The same reference numerals represent the same objects throughout the other figures.

なお、期待値は予め正常な試験ボード4で測定するかま
たは計算値で求め、試験部15が参照可能に登録される
Note that the expected value is measured in advance using a normal test board 4 or calculated value, and is registered so that the test section 15 can refer to it.

以上構成のテスタに被測定部品未搭載の試験ボード4を
接続機構3により接続して試験指示入力を行うと、試験
部15の制御によって以下の測定。
When the test board 4 with no components to be measured is connected to the tester having the above configuration through the connection mechanism 3 and a test instruction is input, the following measurements are performed under the control of the test section 15.

試験が順次行われる。Tests will be conducted sequentially.

(1)  PORCE vA−5ENSE線間の抵抗値
測定S10.S11.S12.S13を開き、520と
521 とを閉じる(S22〜525は開放)とともに
、マルチメータ17にインピーダンス測定を指示する。
(1) Resistance value measurement between PORCE vA-5ENSE wire S10. S11. S12. S13 is opened, 520 and 521 are closed (S22 to 525 are open), and the multimeter 17 is instructed to measure impedance.

これにより、FORCE線(図ではF)31と5ENS
E線(SE) 30との間の抵抗値(期待値はケーブル
インピーダンス)がマルチメータ17より試験部15に
出力され、試験部I5は対応する期待値と比較して正常
性を検証する。
This creates the FORCE line (F in the diagram) 31 and 5ENS
The resistance value (expected value is cable impedance) between the E line (SE) 30 is output from the multimeter 17 to the test section 15, and the test section I5 compares it with the corresponding expected value to verify normality.

続いて、520. S21を開放、S22. S23を
閉じて、PORCE線33と5ENSE線32との間の
インピーダンスを測定せしめ、期待値と比較する。
Next, 520. Open S21, S22. Close S23, measure the impedance between the PORCE line 33 and the 5ENSE line 32, and compare it with the expected value.

以上により、FORClE線一対応する5ENSE線間
の接続状態の正常性が判別される。
As described above, the normality of the connection state between the FORCLE line and the corresponding 5ENSE line is determined.

(2)測定ユニット接続線間のインピーダンス測定52
0、 S23またはS21 、322のみ閉じることに
より、そのインピーダンスを測定して測定ユニット2a
、2bの接続線間の接触状態を検証する。
(2) Impedance measurement 52 between measurement unit connection lines
By closing only S23 or S21, 322, the impedance is measured and the measurement unit 2a
, 2b is verified.

なお、試験ボード4内で抵抗等で接続されている場合は
、設定回路5を種々制御して検証する。
Note that if the connection is made with a resistor or the like within the test board 4, the setting circuit 5 is controlled in various ways for verification.

この場合、制御装置1に設定制御を指示する。In this case, the control device 1 is instructed to perform setting control.

(3)  FORCE &9f、 5ENS!!線−接
地間のインピーダンス測定 S20と525とを閉じ、他のすべてを開放する。
(3) FORCE &9f, 5ENS! ! Line-to-ground impedance measurement S20 and 525 are closed and all others are open.

これにより、5ENSE線30− GND間のインピー
ダンスが測定され、接地されているか否か、正常なイン
ピーダンスであるか否かが検証される。
As a result, the impedance between the 5ENSE line 30 and GND is measured, and it is verified whether or not it is grounded and whether the impedance is normal.

同様に、S21 と525を閉じ、他をすべて開放する
と、FORCE線3l−GNl、間のインピーダンスが
測定される。
Similarly, when S21 and 525 are closed and all others are opened, the impedance between the FORCE wire 3l and GNl is measured.

以下同様の制御で、各接続線とGND間のインピーダン
スが測定され、その正常性が検証される。
Thereafter, with similar control, the impedance between each connection line and GND is measured, and its normality is verified.

(4)各測定ユニットの出力チェック 510−313を閉じ、上記(3)の選択制御で各接続
線35とGNDとをマルチメータ17に接続するととも
に、制御装置1に指示して設定回路5を設定せしめ、測
定ユニッ)2a、2bより所定の電圧を出力せしめる。
(4) Close the output checks 510-313 of each measurement unit, connect each connection line 35 and GND to the multimeter 17 using the selection control in (3) above, and instruct the control device 1 to set the setting circuit 5. The measurement units 2a and 2b output a predetermined voltage.

これにより、各接続線35の出力電圧が測定され、出力
指示した電圧(期待値)と比較して正常性を検証する。
As a result, the output voltage of each connection line 35 is measured, and normality is verified by comparing it with the output-instructed voltage (expected value).

なお、検証結果は図示省略した出力装置に出力されるが
、異常データのみメツセージ出力するか、またはすべて
の測定値と対応する期待値とを出力し、異常データをマ
ークする。
The verification results are output to an output device (not shown), but only abnormal data is output as a message, or all measured values and corresponding expected values are output, and abnormal data is marked.

以上のごとく、リレー制御とマルチメータ17への接続
(選択)制御により接続線間(接地線を含む)のインピ
ーダンスならびに測定ユニットの出力が測定され、期待
値と比較することにより簡易に試験ボード4のチエツク
ならびに試験ボード4の接続状態のチエツクを行うこと
ができる。
As described above, the impedance between the connecting wires (including the ground wire) and the output of the measurement unit are measured by the relay control and the connection (selection) control to the multimeter 17, and by comparing them with the expected values, the test board 4 It is possible to check the connection state of the test board 4 as well as the connection state of the test board 4.

なお、実施例ではFORCfi線、 5ENSE線を例
としたが、その他の接続線(出力線等)についても同様
に行うことは勿論であり、また正常性のチエツクは行わ
ずプリンタ等に測定値と対応する期待値とを出力する方
式でもよいことは勿論である。
In the example, the FORCfi line and the 5ENSE line were used as examples, but it goes without saying that the same procedure can be applied to other connection lines (output lines, etc.), and the measurement values are sent to a printer etc. without checking the normality. Of course, a method of outputting the corresponding expected value may also be used.

〔発明の効果〕〔Effect of the invention〕

本発明は、試=験ボードを接続した状態で試験する部品
測定装置を提供するもので、■トラブル発生時に異常の
発生した箇所の切り分けができ、修理に要する工数と時
間が大幅に短縮できる、■接続機構における接触不良の
有無を簡単に確認でき、被測定部品の破壊等のトラブル
を予防できるとともに測定結果の信頼度が向上する、■
 試験ボードをデバッグする時間が大幅に短縮できる、
等の効果がある。
The present invention provides a component measuring device that performs tests with a test board connected. ■ When trouble occurs, it is possible to isolate the location where an abnormality has occurred, and the man-hours and time required for repair can be significantly reduced. ■Easily check for poor contact in the connection mechanism, prevent problems such as destruction of the parts being measured, and improve the reliability of measurement results.■
The time required to debug test boards can be significantly reduced.
There are other effects.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の原理図、第2図は実施例のテスタブロ
ック図、第3図は従来のテスタブロック図である。 図中、1は制御装置、2.2a、2bは測定ユニット、
3は接続機構、4は試験ボード、5は設定回路、6はソ
ケット、I5は試験部、17はマルチメータ、40はス
イッチ、41は選択手段、42は測定部、35は接続線
、sio〜S13,520〜S25はリレー接点である
FIG. 1 is a principle diagram of the present invention, FIG. 2 is a block diagram of a tester according to an embodiment, and FIG. 3 is a block diagram of a conventional tester. In the figure, 1 is a control device, 2.2a, 2b are measurement units,
3 is a connection mechanism, 4 is a test board, 5 is a setting circuit, 6 is a socket, I5 is a test section, 17 is a multimeter, 40 is a switch, 41 is a selection means, 42 is a measurement section, 35 is a connection wire, sio~ S13,520 to S25 are relay contacts.

Claims (1)

【特許請求の範囲】 被測定部品を挿脱する試験ボード(4)と、該試験ボー
ドに試験信号を供給し出力を測定する測定ユニット(2
)と、該測定ユニットと前記試験ボードとを接続する接
続機構(3)とを備えた部品測定装置において、 該測定ユニット(2)と該接続機構(3)とを接続する
接続線(35)をそれぞれ切断するスイッチ(40)と
、 前記スイッチと該接続機構との間の複数の該接続線(3
5)のうち、所定の2組の該接続線を選択し引き出す選
択手段(41)と、 選択された該接続線間で所定の特性を測定する測定部(
42)と、 該選択手段(41)を制御して測定対象の該接続線を該
測定部(42)に接続し該スイッチ(40)を接続また
は切断制御して該測定部(42)に測定せしめるととも
に、得られた測定値と対応する期待値とを比較する試験
部(15)とを設け、 被測定部品未搭載の該試験ボードを接続した状態で前記
所定の特性を測定し、得られた測定値と期待値とを比較
して該試験ボードの正常性ならびに該試験ボードの接続
状態を試験することを特徴とする部品測定装置。
[Claims] A test board (4) into which a part to be measured is inserted and removed, and a measurement unit (2) which supplies a test signal to the test board and measures the output.
) and a connection mechanism (3) that connects the measurement unit and the test board, the connection line (35) that connects the measurement unit (2) and the connection mechanism (3). a switch (40) that disconnects each of the plurality of connection lines (30) between the switch and the connection mechanism;
5), a selection means (41) for selecting and drawing out two predetermined sets of connection lines; and a measurement unit (41) for measuring a predetermined characteristic between the selected connection lines.
42), controlling the selection means (41) to connect the connection line of the measurement object to the measurement section (42) and controlling the connection or disconnection of the switch (40) to send the measurement to the measurement section (42); A test section (15) is provided to compare the obtained measured value with the corresponding expected value, and the predetermined characteristic is measured with the test board without the component to be measured connected. A component measuring device characterized in that the normality of the test board and the connection state of the test board are tested by comparing measured values and expected values.
JP1007009A 1989-01-12 1989-01-12 Part measuring apparatus Pending JPH02186278A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1007009A JPH02186278A (en) 1989-01-12 1989-01-12 Part measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1007009A JPH02186278A (en) 1989-01-12 1989-01-12 Part measuring apparatus

Publications (1)

Publication Number Publication Date
JPH02186278A true JPH02186278A (en) 1990-07-20

Family

ID=11654057

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1007009A Pending JPH02186278A (en) 1989-01-12 1989-01-12 Part measuring apparatus

Country Status (1)

Country Link
JP (1) JPH02186278A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012154914A (en) * 2011-01-27 2012-08-16 Samsung Electro-Mechanics Co Ltd Insulation checker
US8737202B2 (en) * 2012-05-29 2014-05-27 Alcatel Lucent Automatic connection recovery

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012154914A (en) * 2011-01-27 2012-08-16 Samsung Electro-Mechanics Co Ltd Insulation checker
US8737202B2 (en) * 2012-05-29 2014-05-27 Alcatel Lucent Automatic connection recovery

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