JP2000347728A - Device for testing control device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a testing device for a control device capable of easily performing rearranging work of a needed test circuit in the case of performing a confirmation test for a control device housed in a control panel and appropriately performing test data collection and decision work. SOLUTION: A relay 8 of a test object removed from a control panel is attached to a pedestal 7 for test. A controller 5 outputs a command for forming a test circuit to a circuit a test component 2 when a test is performed and also outputs a command for supplying power for test from a power supply 3 to the relay 8 through the test circuit. Thus, the power for test is supplied to the relay 8 attached to the pedestal 7, and a measuring instrument 4 measures electricity quantity showing the output state of the relay 8. Then, the electricity quantity measured by the measuring instrument is recorded in a test recorder 6.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a control device test apparatus for testing the soundness of control devices housed in a control panel installed in a power plant, a power system, or the like.

[0002]

2. Description of the Related Art In a control room of a power plant or a power system, a control panel for controlling a plant is arranged. The control panel houses control devices constituting a control logic, for example, a relay and a timer, and tests are performed to confirm the soundness of these devices. That is, it is checked whether the voltage value at which the relay operates / returns is appropriate, or whether the set time (operating time) of the timer is appropriate.

[0003] Normally, to check the soundness of a relay or a timer, a test is performed with the relay or the timer removed from the control panel. In such a unit test, a necessary test circuit is configured for each device, and it is confirmed that the determination value determined by the model of the device and the specification of the control circuit is satisfied.

[0004]

However, in such a soundness check by a unit test, since a relay or a timer is attached / detached, it is necessary to attach the relay or the timer to a control panel after checking the soundness. In addition, there is a possibility that the setting may be shifted by touching the vibration or the movable part. When removing the relay or the timer, it is necessary to generate a simulation signal in advance so that the removal of the relay or the timer does not cause an abnormal operation of the control circuit.

In order to prevent a setting deviation caused by mounting / removing a relay or a timer, it is conceivable to carry out a test with the relay or timer attached to the control panel. It is necessary to prevent malfunction of the logic circuit on the control panel side due to disconnection of the side.

As described above, in order to perform a confirmation test of the relay and the timer constituting the control logic, it is necessary to reassemble the test circuit for each model, and it is necessary to make a judgment based on a different set value for each circuit used. . In addition, in order to prevent misalignment caused by the installation / removal of relays and timers, when conducting tests with the relays and timers attached, disconnect the relays and timers from the control panel. It is necessary to generate a simulation signal so that the logic circuit does not malfunction.

SUMMARY OF THE INVENTION It is an object of the present invention to provide a control device test which can easily perform a test circuit rearrangement work required for performing a confirmation test of a control device housed in a control panel, and can appropriately perform test data collection and judgment work. Is to get the equipment.

[0008]

According to a first aspect of the present invention, there is provided a control device test apparatus comprising: a test base for mounting a relay to be tested detached from a control panel; and a relay mounted on the test base. A power supply device for supplying a test power supply, a circuit configuration device that forms a test circuit for testing the relay, and a command for forming the test circuit in the circuit configuration device at the time of testing the relay; and A control device for issuing a command for supplying a test power to the relay from the power supply device via the test circuit, a measuring device for measuring an electric quantity indicating an output state of the relay at the time of testing the relay, A test recording device for recording the amount of electricity measured by the device.

In the control device test apparatus according to the first aspect of the present invention, the relay to be tested removed from the control panel is mounted on a test base. The control device issues a command for forming a test circuit to the circuit component device at the time of testing the relay, and issues a command for supplying test power from the power supply device to the relay via the test circuit. As a result, the test power is supplied to the relay attached to the test pedestal, and the measuring device measures the quantity of electricity indicating the output state of the relay. Then, the amount of electricity measured by the measuring device is recorded in the test recording device.

According to a second aspect of the present invention, in the control device test apparatus according to the first aspect, the measuring device includes, as the electric quantity, a contact resistance of a contact at the time of operation of the relay, an operation voltage of the relay, It is characterized in that the return voltage of the relay is measured.

According to a second aspect of the present invention, in addition to the operation of the first aspect of the present invention, the measuring device measures the contact resistance of the contact, the operating voltage of the relay, and the return voltage of the relay. I do.

According to a third aspect of the present invention, in the control device testing apparatus according to the first or second aspect, the input / output terminal of the relay is connected to each of a plurality of relays attached to the control panel. With a relay base,
A test plug for connecting the relay to be tested to the relay pedestal is provided in place of the test pedestal.

According to a third aspect of the present invention, in addition to the operation of the first or second aspect of the present invention, a test plug is connected to a relay pedestal and connected to an input / output terminal of a relay for testing. I do. This makes it possible to perform a test while the relay is arranged on the control panel.

According to a fourth aspect of the present invention, there is provided a control device test apparatus according to the third aspect, further comprising a relay simulation circuit forming the same circuit as a state where the relay to be tested is connected to the wiring on the control panel side. It is characterized by having.

In the control device testing apparatus according to the fourth aspect of the present invention, in addition to the operation of the third aspect of the present invention, during the test with the test plug connected to the relay pedestal, the relay simulating circuit is the relay to be tested. Simulates the same state as connected to the wiring on the control panel side. This prevents a malfunction during the test.

According to a fifth aspect of the present invention, there is provided a control device test apparatus for mounting a test target timer detached from a control panel, and supplying a test power supply to the timer mounted on the test base. A power supply device, a circuit configuration device that forms a test circuit for testing the timer, and a command for forming the test circuit in the circuit configuration device when the timer is tested, and the test circuit from the power supply device. A control device for issuing a command for supplying a test power supply to the timer through the measuring device, a measuring device for measuring the amount of electricity indicating the output state of the timer when testing the timer, and time-up from the start of operation of the timer Time measuring device that measures the time until, and the amount of electricity measured by the measuring device and the time measured by the time measuring device are recorded. Controls testing apparatus is characterized in that a that test recording apparatus.

In the control device testing apparatus according to the invention of claim 5, the timer to be tested removed from the control panel is attached to the test pedestal. The control device issues a command for forming a test circuit to the circuit component device at the time of testing the timer, and issues a command for supplying test power to the timer from the power supply device via the test circuit. As a result, the test power is supplied to the timer attached to the test base,
The measuring device measures the quantity of electricity indicating the output state of the timer, and the time measuring device measures the time of the timer. Then, the amount of electricity measured by the measuring device and the timer time measured by the time measuring device are recorded in the test recording device.

According to a sixth aspect of the present invention, in the control device test apparatus according to the fifth aspect of the present invention, the measuring device includes, as the electric quantity, a contact resistance of a contact at the time of the timer operation, an operating voltage of the timer, It is characterized in that the reset voltage of the timer is measured.

In the control device test apparatus according to the sixth aspect of the present invention, in addition to the operation of the fifth aspect of the present invention, the measuring apparatus
Measure the contact resistance of the contacts, the operating voltage of the timer, and the reset voltage of the timer during timer operation.

According to a seventh aspect of the present invention, in the control device testing apparatus according to the fifth or sixth aspect, an input / output terminal of the timer is connected to each of a plurality of timers attached to the control panel. And a test plug for connecting the timer to be tested to the timer pedestal in place of the test pedestal.

In the control device testing apparatus according to the invention of claim 7, in addition to the operation of the invention of claim 5 or 6, the test plug is connected to the timer base and connected to the input / output terminal of the timer for testing. I do. Thus, the test can be performed while the timer is arranged on the control panel.

According to an eighth aspect of the present invention, there is provided a control device test apparatus according to the seventh aspect, further comprising a timer simulation circuit for forming the same circuit as a state in which a timer to be tested is connected to the wiring on the control panel side. It is characterized by having.

According to an eighth aspect of the present invention, in addition to the operation of the seventh aspect of the present invention, during the test by connecting the test plug to the timer pedestal, the timer simulation circuit operates the timer to be tested. Simulates the same state as connected to the wiring on the control panel side. This prevents a malfunction during the test.

[0024]

Embodiments of the present invention will be described below. FIG. 1 is a configuration diagram of a control device test apparatus according to a first embodiment of the present invention. In this first embodiment,
The case where the relay 8 is tested among the control devices attached to the control panel is shown.

The relay 8 to be tested is detached from the control panel and attached to the test base 7. The test pedestal 7 is connected to the circuit configuration device 2 that forms a test circuit for testing the relay 8, and is connected to the relay 8 attached to the test pedestal 7 from the power supply 3 when the relay 8 is tested. Power is supplied. In addition, when the relay 8 is tested via the circuit configuration device 2, an electric quantity indicating the output state of the relay 8 is measured by the measuring device 4.

The control device 5 issues a command for forming a test circuit to the circuit configuration device 2 when testing the relay 8 and supplies a test power from the power supply device 3 to the relay 8 via the test circuit. Issue a command. As a result, a test is performed, and an electric quantity indicating the output state of the relay 8 is measured by the measuring device 4, and the measurement result is recorded by the test recording device 6.

FIG. 2 is a detailed view of the relay 8 and the circuit configuration device 2 of FIG. First, the device number and model of the relay 8 to be tested are input to the control device 5. Control device 5
Then, a command to form a test circuit based on the device number and model is output to the circuit configuration device 2. For example, the contacts 1a, 1b, 2a, 2b of the circuit
Turns ON to form a test circuit.

Next, the application of the voltage of the test power supply from the power supply device 3 is started, the voltage is increased until the relay 8 operates, and the measuring device 4 measures the voltage value when the relay 8 operates. Also, the output contact is turned on with the operation of the relay 8.
Therefore, the contact resistance of the circuit connected to the contacts 2a and 2b is measured by the measuring device 4. And the relay 8 which is the measurement result
Are recorded in the test recording device 6. After the measurement in the operation state of the relay 8 is completed, the output voltage from the power supply device 5 is reduced. Thereby, the voltage value when the relay 8 returns is measured by the measuring device 6 as the return voltage of the relay 8 and recorded in the test recording device 6.

After the relay 8 returns, the contacts 2a and 2b of the circuit configuration device 2 are turned off, and the contacts 3a and 3b are turned on. In this case, the contact resistance of the circuit connected to the contacts 3a, 3b is measured by the measuring device 4, and the measurement result is recorded in the test recording device 6. In this manner, the measured data (operating voltage, return voltage, and contact resistance of the relay 8) is compared with a determination value based on the type of the relay 8 and a set value on the circuit to judge pass / fail.

As described above, in the first embodiment, when checking the soundness of the relay 8 constituting the control logic of the control panel, the relay 8 is attached to the test base 7 to control the device number and model. Input to the device 5. As a result, the circuit configuration device 2 automatically forms a test circuit in response to a command from the control device 5, and then automatically sets test conditions such as applied voltage. In addition, data when the relay 8 operates / returns as a test result is automatically stored and determined.

Next, a second embodiment of the present invention will be described. FIG. 3 is a configuration diagram of a control device test apparatus according to the second embodiment of the present invention. This second embodiment is different from the first embodiment shown in FIG. 1 in that the input / output terminal of the relay 8 is connected to each of the plurality of relays 8 attached to the control panel 13. A pedestal 15 is provided, and a test plug 14 for connecting to the relay pedestal 15 of the relay 8 to be tested is provided in place of the test pedestal 7. The other configuration is the same as that of the first embodiment shown in FIG.

A test plug 14 is inserted into the relay pedestal 15 of the relay 8 to be tested, which is attached to the control panel 13, and the test is performed. That is, the relay 8 is connected to the control panel 13
Perform the test without removing it from

FIG. 4 is a detailed diagram of the relay 8 and the circuit configuration device 2 of FIG. A relay simulation circuit 17 is additionally provided to the circuit configuration device 2 according to the first embodiment shown in FIG. The relay simulation circuit 17 forms the same circuit as the state where the relay 8 to be tested is connected to the wiring on the control panel 13 side.
7, the operation of the relay 8 during the test is simulated even when the relay 8 is being tested, so that the malfunction of the control circuit is prevented.

First, the device number and model of the relay 8 to be tested are input to the control device 5. The control device 5 outputs a command to form a test circuit to the circuit configuration device 2 based on the device number and model. By the command of the control device 5, the contacts 1a, 1b, 2a, 2b, 4a, 4b, 5a, 5b, 6
a and 6b are turned ON to form a test circuit.

Next, the test plug 14 is connected to the relay base 15.
Insert into Here, the wiring on the side of the relay 8 connected to the contacts 1a to 3b is connected to the power supply device 3 and the measuring device 4, and the contact 4a
The wiring on the side of the control panel 13 connected to 6b is connected to a relay simulation circuit 17 simulating a circuit equivalent to the relay 8 to be tested.

Next, the application of the voltage of the test power supply from the power supply device 3 is started, the voltage is increased until the relay 8 operates, and the measuring device 4 measures the voltage value when the relay 8 operates. Also, the output contact is turned on with the operation of the relay 8.
Therefore, the contact resistance of the circuit connected to the contacts 2a and 2b is measured by the measuring device 4. And the relay 8 which is the measurement result
Are recorded in the test recording device 6. After the measurement in the operation state of the relay 8 is completed, the output voltage from the power supply device 5 is reduced. Thereby, the voltage value when the relay 8 returns is measured by the measuring device 6 as the return voltage of the relay 8 and recorded in the test recording device 6.

After the relay 8 returns, the contacts 2a and 2b of the circuit configuration device 2 are turned off, and the contacts 3a and 3b are turned on. In this case, the contact resistance of the circuit connected to the contacts 3a, 3b is measured by the measuring device 4, and the measurement result is recorded in the test recording device 6. In this manner, the measured data (operating voltage, return voltage, and contact resistance of the relay 8) is compared with a determination value based on the type of the relay 8 and a set value on the circuit to judge pass / fail.

As described above, by inputting the device number and model of the relay 8 to be tested into the control device 5, the wiring of the test plug 14 on the relay 8 side is connected to the test circuit, and the wiring of the control panel 13 is connected. Has the same circuit as the state where the relay 8 is connected. Then, by inserting the test plug 14 into the relay pedestal 15, the relay simulation circuit 17 is connected to the control panel 13 side, and the power supply device 3 and the measuring device 4 are connected to the relay 8 side.

Therefore, by selecting the start of the test, the test conditions such as the applied voltage and the like are automatically simulated, and the data when the relay 8 is operated / returned as the test result is automatically stored / determined in the test recording device 6. You. In this case, since the operation of the relay 8 during the test is simulated, the malfunction of the control circuit is prevented.

In the above description, the case where the relays 8 are individually tested has been described. However, the test may be performed in units of a relay unit including a plurality of relays 8.

Next, a third embodiment of the present invention will be described. FIG. 5 is a configuration diagram of a control device test apparatus according to the third embodiment of the present invention. The third embodiment is different from the control device attached to the control panel in that a timer 12
3 shows the case where the test is performed.

The timer 12 to be tested is detached from the control panel and attached to the test base 7. The test pedestal 7 is connected to the circuit configuration device 2 that forms a test circuit for testing the timer 12.
During the test, the test power is supplied from the power supply device 3 to the timer 12 attached to the test base 7. Also, when the timer 12 is tested via the circuit configuration device 2,
The electric quantity indicating the output state of 2 is measured by the measuring device 4.

The control device 5 issues a command for forming a test circuit to the circuit configuration device 2 when the timer 12 is tested, and supplies a test power from the power supply device 3 to the timer 12 via the test circuit. Issue a command. This allows
The test power is supplied to the timer 12 attached to the test pedestal 7, the measuring device 4 measures the amount of electricity indicating the output state of the timer 12, and the time measuring device 10 measures the time of the timer 12. Then, the electric quantity measured by the measuring device 4 and the time measuring device 10 are stored in the test recording device 6.
Record the timer time measured in.

FIG. 6 is a detailed diagram of the timer 12 and the circuit configuration device 2 of FIG. First, the device number and model of the timer 12 to be tested are input to the control device 5. The control device 5 outputs a command to form a test circuit to the circuit configuration device 2 based on the device number and model. For example, according to a command from the control device 5, the contacts 1a, 1
b, 2a, 2b are turned ON to form a test circuit. Next, a voltage is applied from the power supply device 3, the timer 12 starts operating, and the time measurement device 10 starts measurement.

When the timer 12 times out, the measurement by the time measuring device 10 ends, and the measured time is recorded in the test recording device 6. Timer 12 with time up
The timed operation contact of operates, so that the measuring device 4 uses the contact 2a, 2
The contact resistance of the circuit connected to b is measured and recorded in the test recording device 6.

Next, the output of the power supply 3 is turned off and the timer 12 is returned. After the timer 12 returns, the contacts 2a and 2b of the circuit configuration device 2 are turned off and the contacts 3a and 3b are turned on. Thereby, the contact resistance of the circuit connected to the contacts 3a, 3b is measured by the measuring device 4, and the measurement result is recorded in the test recording device 6. The measured data is compared with a determination value based on the type of the timer 12 and a set value on the circuit to determine the acceptability.

As described above, the timer 12 is connected to the test base 7.
The test circuit is automatically configured by inputting the device number and model to the control device 5 and the test conditions such as the applied voltage are automatically set. Further, the data when the timer 12 operates / returns as the test result is automatically stored and determined.

Next, a fourth embodiment of the present invention will be described. FIG. 7 is a configuration diagram of a control device test apparatus according to the fourth embodiment of the present invention. This fourth embodiment is different from the third embodiment shown in FIG. 6 in that each of a plurality of timers 12 attached to a control panel 13 includes a timer 1.
2 is provided with a timer base 16 to which the input / output terminal 2 is connected.
Test plug 1 for connecting to timer base 16 of 2
4 is provided. The other configuration is the same as that of the third embodiment shown in FIG.

The test pedestal 16 of the timer 12 to be tested attached to the control panel 13 has a test plug 1
4 is inserted and the test is performed. That is, the test is performed without removing the timer 12 from the control panel 13.

FIG. 8 is a detailed diagram of the relay 8 and the circuit configuration device 2 of FIG. A timer simulation circuit 18 is additionally provided to the circuit configuration device 2 according to the third embodiment shown in FIG. This timer simulation circuit 18
Forms the same circuit as the state in which the timer 12 to be tested is connected to the wiring on the control panel 13 side. Even if the timer 12 is being tested by this timer simulation circuit 18, Since the operation is simulated, malfunction of the control circuit is prevented.

First, the device number and model of the timer 12 to be tested are input to the control device 5. The control device 5 outputs a command to form a test circuit to the circuit configuration device 2 based on the device number and model. This control device 5
Of the contacts 1a, 1b, 2a, 2b, 4a, 4b, 5
a, 5b, 6a, 6b are turned ON to form a test circuit.

Next, the test plug 14 is connected to the timer base 1.
Insert into 6. Here, the timer 12 connected to the contacts 1a to 3b
Side wiring is connected to the power supply device 3 and the measurement device 4,
The wiring on the side of the control panel 13 connected to the contacts 4a to 6b is connected to a timer simulation circuit 18 simulating a circuit equivalent to the timer 12 to be tested.

Next, the application of the voltage of the test power supply from the power supply device 3 is started, the timer 12 starts operating, and the time measurement device 10 starts measurement. Timer 1
When the time 2 is up, the measurement by the time measuring device 10 ends, and the measured time is recorded in the test recording device 6. Since the time limit operation contact of the timer 12 operates at time-up, the contact resistance of the circuit connected to the contacts 2 a and 2 b is measured by the measuring device 4 and recorded in the test recording device 6.

Next, the output of the power supply device 3 is turned off and the timer 12 is returned. After the timer 12 returns, the contacts 2a and 2b of the circuit configuration device 2 are turned off and the contacts 3a and 3b are turned on. Then, the contact resistance of the circuit connected to the contacts 3a, 3b is measured by the measuring device 4, and the measurement result is recorded in the test recording device 6. The measured data is compared with a judgment value based on the type of the timer and a set value on the circuit to judge pass / fail.

As described above, the timer 12 to be tested is
By inputting the device number and model number of the test plug into the control device 5, the test circuit is connected to the wiring of the test plug 14 on the timer 12 side, and the same circuit as the state where the timer 12 is connected is connected to the wiring of the control panel 13 side. Be composed. And the test plug 1
By inserting 4 into the timer base 16, the timer simulation circuit 17 is connected to the control panel 13 side, and the power supply device 3 and the measuring device 4 are connected to the timer 12 side.

Therefore, by selecting the start of the test, the test conditions such as the applied voltage and the like are automatically simulated, and the data when the timer 12 is operated / returned as the test result is automatically stored / determined in the test recording device 6. You. In this case, since the operation of the timer 12 during the test is simulated, a malfunction of the control circuit is prevented.

In the above description, the case where the timers 12 are individually tested has been described.
May be implemented for each relay unit.

[0058]

As described above, according to the present invention,
When testing the control equipment housed in the control panel, the necessary test circuits can be easily rearranged, so that the work of rearranging the test circuits can be reduced and the equipment can be prevented from being damaged due to incorrect connection. In addition, collection and determination of test data can be reduced.

When a test plug is used, the test can be performed while the control device is arranged on the control panel. Also,
Since the simulation of the control device to be tested is performed during the test, malfunction of the control panel can be prevented.

[Brief description of the drawings]

FIG. 1 is a configuration diagram of a control device test apparatus according to a first embodiment of the present invention.

FIG. 2 is a detailed view of the relay and the circuit configuration device of FIG. 1;

FIG. 3 is a configuration diagram of a control device test apparatus according to a second embodiment of the present invention.

FIG. 4 is a detailed view of the relay and the circuit configuration device of FIG. 3;

FIG. 5 is a configuration diagram of a control device test apparatus according to a third embodiment of the present invention.

FIG. 6 is a detailed view of the relay and the circuit configuration device of FIG. 5;

FIG. 7 is a configuration diagram of a control device test apparatus according to a fourth embodiment of the present invention.

FIG. 8 is a detailed view of the relay and the circuit configuration device of FIG. 7;

[Explanation of symbols]

 2 Circuit configuration device 3 Power supply device 4 Measurement device 5 Control device 6 Test recording device 7 Test pedestal 8 Relay 10 Time measurement device 12 Timer 13 Control panel 14 Test plug 15 Relay pedestal 16 Timer pedestal 17 Relay simulation circuit 18 Timer simulation circuit

Claims (8)

[Claims] A test pedestal for mounting a relay to be tested detached from a control panel, a power supply for supplying a test power to the relay mounted on the test pedestal, and a power supply for testing the relay. A circuit configuration device for forming a test circuit; and a command for forming the test circuit is issued to the circuit configuration device when the relay is tested, and a test power is supplied from the power supply device to the relay via the test circuit. A control device for issuing a command for performing the operation, a measuring device for measuring an electric quantity indicating an output state of the relay at the time of testing the relay, and a test recording device for recording the electric quantity measured by the measuring device. A control device test apparatus characterized by the above-mentioned. 2. The device according to claim 1, wherein the measuring device measures, as the electric quantity, a contact resistance of a contact at the time of operation of the relay, an operation voltage of the relay, and a return voltage of the relay. Control equipment test equipment. 3. A relay pedestal to which an input / output terminal of the relay is connected to each of a plurality of relays attached to the control panel, and wherein the relay of a relay to be tested is replaced with the test pedestal. 3. The control device test apparatus according to claim 1, further comprising a test plug for connecting to the pedestal. 4. The control device test apparatus according to claim 3, further comprising a relay simulation circuit that forms the same circuit as a state in which the relay to be tested is connected to the wiring on the control panel side. 5. A test pedestal for mounting a timer to be tested detached from a control panel, a power supply for supplying test power to the timer mounted on the test pedestal, and a power supply for testing the timer. A circuit configuration device for forming a test circuit; and a command for forming the test circuit is issued to the circuit configuration device when the timer is tested, and a test power is supplied from the power supply device to the timer via the test circuit. A control device for issuing a command to perform
A measuring device that measures the amount of electricity indicating the output state of the timer during the test of the timer, a time measuring device that measures the time from the start of operation of the timer to time-up, and the amount of electricity measured by the measuring device. A test recording device for recording the time measured by the time measuring device. 6. The measuring device according to claim 5, wherein the measuring device measures, as the electric quantity, a contact resistance of a contact at the time of operation of the timer, an operation voltage of the timer, and a return voltage of the timer. Control equipment test equipment. 7. A timer pedestal to which an input / output terminal of the timer is connected to each of a plurality of timers attached to the control panel, and wherein the timer of a timer to be tested is used instead of the test pedestal. 6. A test plug for connecting to a pedestal is provided.
Or a control device test apparatus according to claim 6. 8. The control device test apparatus according to claim 7, further comprising a timer simulation circuit that forms the same circuit as a state in which the timer to be tested is connected to the wiring on the control panel side.