JPH02184777A - Ic chip - Google Patents

Abstract

PURPOSE:To decide whether the function part of an IC chip is normal or not and to improve the test and maintenance efficiency by comparing the digital value of a current which flows in the function part of the IC chip from outside with the digital value of the current consumption of the function part in a normal state. CONSTITUTION:This IC chip is provided with the function part 8 as its function circuit, a circuit 1 which measures the current flowing in the function part 8 from outside, a storage part 3 stored with the digital value of the current consumption of the function part 8 in the normal state, a circuit 4 which compares the current value stored in the storage part 3 with the output current value of an AD converting circuit 2, and a circuit 5 which decides a defect from the difference outputted by the circuit 4 and its continuance. Then if the defect occurs to the function part 8, the current consumption varies continuously and the circuit 5 decides that the IC chip is defective, an alarm output circuit 6 outputs an alarm, and an alarm display part 7 allows the defective IC chip to be recognized visually.

Description

[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to IC chips, particularly IC chips that facilitate the detection of defects.
Regarding chips.

[Conventional technology]

Conventionally, defects in IC chips have been detected using an IC chip measuring device for individual IC chips, and for IC chips mounted on printed circuit boards, etc., the defective ICs have been identified using a package tester, and the IC chips have been removed from the printed circuit board and tested. We are checking for defects using a chip measuring device.

[Problem to be solved by the invention]

With the conventional IC chips mentioned above, it is not possible to identify defects in the IC chips themselves, and defects are detected by removing the IC chips or those attached to printed circuit boards and testing them individually using an IC chip measuring device. This method has the disadvantage that it takes time and effort to detect defects.

[Means to solve the problem]

The IC chip of the present invention includes: a current measurement circuit that measures the current consumption of the functional section of the IC chip; an AD conversion circuit that converts the current consumption value measured by the current measurement circuit into a digital value; a storage unit that stores the current consumption value during normal operation as a digital value; a comparison circuit that compares the digital value stored in the storage unit with the digital value output from the AD conversion circuit and outputs a difference value; It is constructed by having a defect determination circuit that determines a defect based on a difference value from the circuit, and an alarm display section that performs a light-emitting display based on a defect signal that is output when the defect determination circuit determines that the circuit is defective.

〔Example〕

Next, embodiments of the present invention will be described with reference to the drawings.

FIG. 1 is a block diagram of an embodiment of the present invention. In FIG. 0, the functional section 8 is a functional circuit of a conventional IC chip, and the current measurement circuit 1 is a circuit that measures the current flowing into the functional section 8 from the outside. be. The AD conversion circuit 2 is a circuit that converts the current value measured by the current measurement circuit 1 into a digital value. The storage unit 3 is a circuit that stores the current consumption of the functional unit 8 in a normal state as a digital value, and the comparison circuit 4 is a circuit that stores the current consumption of the functional unit 8 in a normal state as a digital value.
This circuit compares the stored current value with the output current value of the AD conversion circuit 2. The defect judgment circuit 5 is a circuit that makes a defect judgment based on the difference output from the comparison circuit 4 and its duration, and the alarm output circuit 6 is a circuit that outputs the defect judgment output from the defect judgment circuit 5 to the outside of the IC chip. The alarm display section 7 is a circuit including a light emitting diode that internally receives the output of the alarm output circuit 6 and emits light, and this light is visible from the outside through a transparent window provided in the IC chip case. .

FIG. 2 is an external perspective view of an embodiment of the present invention, showing that a transparent window 11 is provided on the surface of an IC case 10 housing an IC chip, and light can be seen in the event of a failure.

With the above configuration, when a defect occurs in the functional unit 8, the current consumption changes continuously and the defect determination circuit 5 determines that it is defective, and an alarm is output to the outside via the alarm output circuit 6, and an alarm is displayed. The unit 7 visually recognizes whether the chip is a defective IC chip.

〔Effect of the invention〕

As explained above, the present invention enables testing and maintenance efficiency because even if an IC chip is mounted on a printed circuit board, it can be determined to be defective just by visually observing the lighting, without having to remove it and test it with an IC chip detector. This has the effect of significantly improving the Further, by guiding the output of the defect determination circuit to the central processing unit, there is an effect that automatic processing for failures can be easily performed as a system.

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[Brief explanation of the drawing]

FIG. 1 is a block diagram of one embodiment of the present invention, and FIG. 2 is an external perspective view of one embodiment of the present invention. 1... Current measurement circuit, 2... AD conversion circuit, 3...
・Storage unit, 4... Comparison circuit, 5... Defective judgment circuit,
6... Alarm output circuit, 7... Alarm display section,
8...Functional part, 10...IC case, 11...Transparent window. figure

Claims (1)

[Claims] A current measurement circuit that measures the current consumption of the functional section of the IC chip, an AD conversion circuit that converts the current consumption value measured by the current measurement circuit into a digital value, and a current consumption value of the functional section during normal operation. a storage section that stores digital values; a comparison circuit that compares the digital values stored in the storage section with the digital values output from the AD conversion circuit and outputs a difference value; What is claimed is: 1. An IC chip comprising: a defective determination circuit that determines whether the IC chip is defective; and an alarm display section which performs a light-emitting display based on a defective signal that the defective determining circuit outputs when it determines that it is defective.