JP4951444B2 - Inspection device for light emitting circuit of fire detector and inspection method for light emitting circuit of fire detector - Google Patents

Inspection device for light emitting circuit of fire detector and inspection method for light emitting circuit of fire detector Download PDF

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JP4951444B2
JP4951444B2 JP2007219353A JP2007219353A JP4951444B2 JP 4951444 B2 JP4951444 B2 JP 4951444B2 JP 2007219353 A JP2007219353 A JP 2007219353A JP 2007219353 A JP2007219353 A JP 2007219353A JP 4951444 B2 JP4951444 B2 JP 4951444B2
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light emitting
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emitting element
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英聖 森田
誠 増山
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Nohmi Bosai Ltd
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本発明は、火災感知器の発光回路の検査装置および火災感知器の発光回路の検査方法に関する。
The present invention relates to an inspection device for a light emitting circuit of a fire detector and a method for inspecting a light emitting circuit of a fire detector.

従来の光電式煙感知器および検煙部アッセンブリィは、ハイブリッド基板にリード金具を介して発光素子を実装している(たとえば、特許文献1参照)。   In the conventional photoelectric smoke detector and smoke detector assembly, a light emitting element is mounted on a hybrid substrate via a lead fitting (see, for example, Patent Document 1).

そして、上記光電式煙感知器または上記検煙部アッセンブリィを検査する場合、発光素子が実装されている状態で、検査するので、この検査の結果、基板不良であると判断されると、上記光電式煙感知器または上記検煙部アッセンブリィの全体を廃棄し、たとえ、発光素子自体が正常であっても、その全体を廃棄している。   And when inspecting the photoelectric smoke detector or the smoke detector assembly, since the inspection is performed in a state where the light emitting element is mounted, if it is determined that the substrate is defective as a result of the inspection, The entire photoelectric smoke detector or the smoke detector assembly is discarded, even if the light emitting element itself is normal.

ところで、煙感知器の火災検出動作は、数秒間隔毎に数10〜数100μsの間、発光素子を発光させる。また、発光素子を発光させるときに、瞬間的に大きな電流を流す必要があるが、この電流を供給するために、コンデンサに電荷を蓄え、発光後に、消費した電荷をコンデンサに充電し、次の火災検出動作(発光)に備える。煙感知器は、上記動作を繰り返すことによって、火災監視を行うので、発光回路は充放電を繰り返す。
特許第3370032号公報
By the way, the fire detection operation of the smoke detector causes the light emitting element to emit light for several tens to several hundreds of microseconds every several seconds. In addition, when a light emitting element is caused to emit light, a large current needs to be flowed instantaneously, but in order to supply this current, electric charge is stored in a capacitor, and after light emission, the consumed electric charge is charged into the capacitor, Prepare for fire detection (light emission). Since the smoke detector performs fire monitoring by repeating the above operation, the light emitting circuit repeats charging and discharging.
Japanese Patent No. 3370032

発光回路の充放電が正常に行われているかどうかを検査するには、オシロスコープのように、波形を観測することができる計測器を使用し、確認することが、最も簡単かつ確実な方法である。しかし、製品として使用する火災感知器の被検査基板における発光回路を検査する場合、検査時間が長いので、検査数量が多い場合には、オシロスコープを使用する検査は適切ではないという問題がある。また、オシロスコープ自体が非常に高価であるので、検査ラインを増設すると、設備費用が莫大になるという問題がある。   The simplest and most reliable way to check whether the light-emitting circuit is charging and discharging normally is to use a measuring instrument that can observe the waveform, such as an oscilloscope. . However, when inspecting a light emitting circuit on a board to be inspected of a fire detector used as a product, since the inspection time is long, there is a problem that an inspection using an oscilloscope is not appropriate when the inspection quantity is large. Further, since the oscilloscope itself is very expensive, there is a problem that the equipment cost becomes enormous if the inspection line is added.

一方、機種毎に専用の検査装置を導入して発光回路の検査を行う方法もあるが、この方法は、火災感知器の機種によってトリガ信号や、サンプリングのタイミング等の仕様が異なる場合は使用制限があるので、汎用性があるとは言い難い。   On the other hand, there is a method to inspect the light emitting circuit by introducing a dedicated inspection device for each model, but this method is restricted when the trigger signal and sampling timing specifications differ depending on the fire detector model. It is hard to say that it is versatile.

本発明は、安価でかつ汎用性がある発光回路の検査装置および検査方法を提供することを目的とする。
An object of the present invention is to provide a light-emitting circuit inspection apparatus and inspection method that are inexpensive and versatile.

本発明は充電電流制限抵抗を介して電源にコンデンサが接続され、発光素子と上記発光素子に流れる電流を制御する発光電流制限抵抗と上記発光素子に流れる電流のオン、オフを制御するスイッチ素子とが直列に接続される直列回路であって、上記コンデンサと上記直列回路とが並列に接続されている火災感知器の発光回路であって、上記発光素子が接続されていない被検査基板の発光回路を検査する火災感知器の発光回路の検査装置において、上記火災検知器の発光回路の検査装置は、模擬抵抗ユニットと、電圧測定ユニットとを有し、上記模擬抵抗ユニットは、抵抗と、上記抵抗の一端に接続する第1プローブと、上記抵抗の他端に接続する第2プローブとを有し、上記電圧測定ユニットは、電圧測定部と、上記電圧測定部の一端に接続する第3プローブと、上記電圧測定部の他端に接続する第4プローブとを有し、上記発光素子の一端を接続すべき上記被検査基板の発光回路における第1端子と、上記発光素子の他端を接続すべき上記被検査基板の発光回路における第2端子とに、上記模擬抵抗ユニットのいずれかのプローブをそれぞれ接続し、上記コンデンサの両端に上記電圧測定ユニットのいずれかのプローブをそれぞれ接続し、上記スイッチ素子をオンしたときに上記電圧測定部が出力したオン時電圧値と、上記スイッチ素子をオフしたときに上記電圧測定部が出力したオフ時電圧値との差、または比を演算する演算手段とを有する火災感知器の発光回路の検査装置である。
The present invention includes a capacitor connected to a power source via a charging current limiting resistor, a light emitting element, a light emitting current limiting resistor for controlling a current flowing through the light emitting element, and a switch element for controlling on / off of a current flowing through the light emitting element; Is a light emitting circuit of a fire detector in which the capacitor and the series circuit are connected in parallel, and the light emitting circuit of the substrate to be inspected is not connected to the light emitting element. In the fire detector light emission circuit inspection apparatus, the fire detector light emission circuit inspection apparatus includes a simulated resistance unit and a voltage measurement unit, and the simulated resistance unit includes a resistance and the resistance. A first probe connected to one end of the resistor and a second probe connected to the other end of the resistor, the voltage measuring unit connected to the voltage measuring unit and one end of the voltage measuring unit A third probe connected to the other end of the voltage measuring unit, a first terminal in the light emitting circuit of the substrate to be inspected to which one end of the light emitting element is to be connected, and the light emitting element One of the probes of the simulated resistance unit is connected to the second terminal of the light emitting circuit of the board to be inspected to be connected to the other end, and one of the probes of the voltage measuring unit is connected to both ends of the capacitor, respectively. The difference or ratio between the on-time voltage value output by the voltage measurement unit when the switch element is connected and turned on, and the off-time voltage value output by the voltage measurement unit when the switch element is turned off. An inspection device for a light emitting circuit of a fire detector having a calculation means for calculating.

本発明によれば、火災感知器の発光回路の検査装置を、安価で製造することができ、しかも、その検査装置に汎用性があるという効果を奏する。
According to the present invention, an inspection device for a light emitting circuit of a fire detector can be manufactured at low cost, and the inspection device has versatility.

発明を実施するための最良の形態は、以下の実施例である。   The best mode for carrying out the invention is the following examples.

図1は、本発明の実施例1である発光回路の検査装置200が検査する対象である感知器の発光回路100の一部を示す回路図である。   FIG. 1 is a circuit diagram showing a part of a light-emitting circuit 100 of a sensor that is an object to be inspected by the light-emitting circuit inspection device 200 according to the first embodiment of the present invention.

感知器SE1の発光回路100は、被検査回路であり、電源B1と、充電電流制限抵抗R1と、発光電流制限用抵抗R2と、発光素子実装部10と、発光を制御するスイッチ素子SW1と、発光用コンデンサC1とを有する。   The light emitting circuit 100 of the sensor SE1 is a circuit to be inspected, and includes a power source B1, a charging current limiting resistor R1, a light emitting current limiting resistor R2, a light emitting element mounting unit 10, a switch element SW1 that controls light emission, And a light emitting capacitor C1.

電源B1は、発光用コンデンサC1に電荷を供給する。発光電流制限用抵抗R2は、コンデンサC1から発光素子に流れる発光電流を制限する抵抗である。スイッチ素子SW1は、発光素子に流れる電流のオン、オフを制御する。   The power supply B1 supplies electric charges to the light emitting capacitor C1. The light emission current limiting resistor R2 is a resistor that limits the light emission current flowing from the capacitor C1 to the light emitting element. The switch element SW1 controls on / off of a current flowing through the light emitting element.

発光素子実装部10は、図示しない発光素子を実装する部分であり、第1端子T1と、第2端子T2とを有する。第1端子T1は、上記発光素子のアノードを接続すべき発光回路上のランドであり、第2端子T2は、上記発光素子のカソードを接続すべき上記発光回路上のランドである。なお、スイッチ素子SW1は、トランジスタでもよく、FET等でもよい。   The light emitting element mounting part 10 is a part for mounting a light emitting element (not shown), and has a first terminal T1 and a second terminal T2. The first terminal T1 is a land on the light emitting circuit to which the anode of the light emitting element is to be connected, and the second terminal T2 is a land on the light emitting circuit to which the cathode of the light emitting element is to be connected. The switch element SW1 may be a transistor, an FET, or the like.

つまり、感知器SE1の発光回路100は、充電電流制限抵抗を介して電源にコンデンサが接続され、発光素子と上記発光素子に流れる電流を制御する発光電流制限抵抗と上記発光素子に流れる電流のオン、オフを制御するスイッチ素子とが直列に接続される直列回路であって、上記コンデンサと上記直列回路とが並列に接続されている火災感知器SE1の発光回路であって、上記発光素子が接続されていない被検査基板の発光回路を検査する火災感知器SE1の発光回路である。   That is, in the light emitting circuit 100 of the sensor SE1, a capacitor is connected to the power supply via the charging current limiting resistor, and the light emitting current limiting resistor that controls the current flowing through the light emitting element and the light emitting element and the current flowing through the light emitting element are turned on. A series circuit in which switch elements for controlling OFF are connected in series, and the light emitting circuit of the fire detector SE1 in which the capacitor and the series circuit are connected in parallel, wherein the light emitting element is connected This is the light emitting circuit of the fire detector SE1 for inspecting the light emitting circuit of the board to be inspected that has not been performed.

なお、図1に示す例は、スイッチ素子SW1による発光回路の例であるが、このようにする代わりに、スイッチ素子SW1をトランジスタにし、発光電流制限用抵抗R2とともにエミッタフォロアを形成する定電流回路を設けるようにしてもよい。   The example shown in FIG. 1 is an example of a light emitting circuit using the switch element SW1, but instead of doing so, a constant current circuit in which the switch element SW1 is a transistor and an emitter follower is formed together with the light emission current limiting resistor R2. May be provided.

図2は、本発明の実施例1である発光回路の検査装置200を示す回路図である。   FIG. 2 is a circuit diagram showing a light emitting circuit inspection apparatus 200 according to the first embodiment of the present invention.

発光回路の検査装置200は、模擬抵抗R3と、第1プローブP1と、第2プローブP2とを具備する模擬抵抗ユニット50と、第3プローブP3と、第4プローブP4と、電圧測定部20とからなる電圧測定ユニット60と、信号処理部30とを有する。   The light emitting circuit inspection apparatus 200 includes a simulated resistance unit 50 including a simulated resistance R3, a first probe P1, and a second probe P2, a third probe P3, a fourth probe P4, and a voltage measuring unit 20. And a signal processing unit 30.

たとえば、第1プローブP1と第2プローブP2とは、発光素子の一端を接続すべき発光回路上の第1端子または、発光素子の他端を接続すべき発光回路上の第2端子のいずれかに接続するプローブである。また、たとえば、第3プローブP3と第4プローブP4とは、コンデンサC1の両端のいずれかに接続するプローブである。   For example, the first probe P1 and the second probe P2 are either the first terminal on the light emitting circuit to which one end of the light emitting element is connected or the second terminal on the light emitting circuit to which the other end of the light emitting element is connected. It is a probe connected to. In addition, for example, the third probe P3 and the fourth probe P4 are probes connected to either one of the ends of the capacitor C1.

模擬抵抗R3は、発光素子の代わりに接続される模擬抵抗であり、第1のプローブP1と第2プローブP2との間に接続されている。電圧測定部20は、第3プローブP3と第4プローブP4との間に接続されている。   The simulated resistor R3 is a simulated resistor connected instead of the light emitting element, and is connected between the first probe P1 and the second probe P2. The voltage measuring unit 20 is connected between the third probe P3 and the fourth probe P4.

電圧測定部20は、コンデンサC1の両端の電圧を測定する。   The voltage measurement unit 20 measures the voltage across the capacitor C1.

信号処理部30は、第1〜4プローブP1〜P4を、対応する部位に接続した場合、スイッチ素子SW1をオンしたときに電圧測定部20が出力したオン時電圧値と、スイッチ素子SW1をオンする直前またはオフしたときに電圧測定部20が出力したオフ時電圧値との差または比を求める演算手段の例である。また、信号処理部30は、上記オン時電圧値、または、上記差または比の値が、第1の閾値TH1よりも大きければ、上記コンデンサC1が短絡していると判断し、上記オン時電圧値、または、上記差または比の値が上記第1の閾値TH1と第2の閾値TH2との間の値であれば、上記コンデンサC1が正常であると判断し、上記オン時電圧値、または、上記差または比の値が上記第2の閾値TH2よりも小さければ、上記コンデンサC1が開放されていると判断する判断手段の例である。   When the first to fourth probes P1 to P4 are connected to corresponding parts, the signal processing unit 30 turns on the switch element SW1 and the on-time voltage value output by the voltage measuring unit 20 when the switch element SW1 is turned on. It is an example of the calculating means which calculates | requires the difference or ratio with the voltage value at the time of OFF which the voltage measurement part 20 output immediately before turning off. The signal processing unit 30 determines that the capacitor C1 is short-circuited if the on-time voltage value or the difference or ratio value is greater than the first threshold value TH1, and the on-time voltage is determined. If the value or the value of the difference or ratio is a value between the first threshold value TH1 and the second threshold value TH2, it is determined that the capacitor C1 is normal, and the on-time voltage value, or This is an example of determination means for determining that the capacitor C1 is open if the value of the difference or ratio is smaller than the second threshold value TH2.

図3は、感知器SE1と検査装置200との関係を示す図である。   FIG. 3 is a diagram illustrating a relationship between the sensor SE1 and the inspection apparatus 200.

感知器SE1は、CPU40と発光回路100とを有する。   The sensor SE1 includes a CPU 40 and a light emitting circuit 100.

CPU40は、検査装置200に設けられている電圧測定部20に、サンプリング毎に電圧を測定するように指令し、信号処理部30が演算した差または比と第1閾値TH1とを比較し、また、上記差または比と第2閾値TH2とを比較する。   The CPU 40 instructs the voltage measuring unit 20 provided in the inspection apparatus 200 to measure the voltage for each sampling, compares the difference or ratio calculated by the signal processing unit 30 with the first threshold value TH1, and The difference or ratio is compared with the second threshold value TH2.

感知器SE1の外部からの発光制御命令を、感知器SE1が受信すると同時に、CPU40が電圧測定部20に制御信号を送信し、電圧測定部20に電圧測定を開始させる。電圧測定部20は、制御信号に応じたサンプリング間隔で、コンデンサC1の両端電圧を測定し、測定終了の命令を受信するまで測定する。なお、感知器SE1への発光制御命令は検査装置200から送信するようにしてもよい。   At the same time that the sensor SE1 receives a light emission control command from the outside of the sensor SE1, the CPU 40 transmits a control signal to the voltage measurement unit 20 to cause the voltage measurement unit 20 to start voltage measurement. The voltage measuring unit 20 measures the voltage across the capacitor C1 at a sampling interval corresponding to the control signal, and measures until a measurement end command is received. Note that the light emission control command to the sensor SE1 may be transmitted from the inspection apparatus 200.

感知器SE1が発光制御命令を受信してから、所定時間が経過した後に、CPU40が、スイッチ素子SW1をオンする。発光開始直前(スイッチ素子SW1がオンする直前)または発光終了後(スイッチ素子SW1がオフした後)に、電圧測定部20が測定したデータの値と、発光時におけるコンデンサC1の両端電圧の値との差または比を求めることによって、コンデンサC1の良否を判定する。この方法によれば、データ収集時間を必要最小限にとどめることができ、複数回測定する場合でも、最小限の充電時間を設けるだけで検査することができる。また、感知器SE1に対する発光制御命令から、発光までの時間が長ければ、電圧測定時間を長くすることによって、対応することができる。   After a predetermined time has elapsed since the sensor SE1 received the light emission control command, the CPU 40 turns on the switch element SW1. Immediately before the start of light emission (immediately before the switch element SW1 is turned on) or after the end of light emission (after the switch element SW1 is turned off), the value of the data measured by the voltage measuring unit 20 and the value of the voltage across the capacitor C1 during light emission The quality of the capacitor C1 is determined by obtaining the difference or ratio. According to this method, the data collection time can be kept to the minimum necessary, and even when measuring a plurality of times, the inspection can be performed only by providing a minimum charging time. Further, if the time from the light emission control command to the sensor SE1 to the light emission is long, it can be dealt with by increasing the voltage measurement time.

次に、上記実施例1の動作について説明する。   Next, the operation of the first embodiment will be described.

図4は、上記実施例の動作を示すフローチャートである。   FIG. 4 is a flowchart showing the operation of the above embodiment.

S1で、CPU40が、火災感知器SE1の外部からの発光制御命令を受け、同時に、信号処理部30は、電圧測定部20に対して制御信号を送信する。S2で、CPU40が、電圧測定部20に電圧測定を開始させる。S3で、スイッチ素子SW1をオンし、S4で、スイッチ素子SW1をオフする。S5で、規定時間経過後に電圧測定を終了する。なお、測定回数(n)は、1回でも複数回でもよい。S6で、信号処理部30に測定データを送信し、S7で、最初の測定データA0の値と、n番目の測定データAnの値との差または比を求め、記憶装置に記憶する。上記差または比が、閾値TH1よりも大きければ、S8で、コンデンサC1が短絡等の異常であると判断する。上記差または比が、閾値TH1〜TH2であれば、S9で、コンデンサC1が正常であると判断する。上記差または比が、閾値TH2よりも小さければ、S10で、コンデンサC1が開放等の異常であると判断する。   In S <b> 1, the CPU 40 receives a light emission control command from the outside of the fire detector SE <b> 1, and at the same time, the signal processing unit 30 transmits a control signal to the voltage measurement unit 20. In S <b> 2, the CPU 40 causes the voltage measurement unit 20 to start voltage measurement. In S3, the switch element SW1 is turned on, and in S4, the switch element SW1 is turned off. In S5, the voltage measurement is finished after the lapse of the specified time. The number of times of measurement (n) may be one time or a plurality of times. In S6, the measurement data is transmitted to the signal processing unit 30, and in S7, the difference or ratio between the value of the first measurement data A0 and the value of the nth measurement data An is obtained and stored in the storage device. If the difference or ratio is greater than the threshold value TH1, it is determined in S8 that the capacitor C1 is abnormal such as a short circuit. If the difference or ratio is the threshold value TH1 to TH2, it is determined in S9 that the capacitor C1 is normal. If the difference or ratio is smaller than the threshold value TH2, it is determined in S10 that the capacitor C1 is abnormal such as opening.

S8とS10との異常判断は、最初の測定データA0がどのステップとなるか(たとえば、S3の前またはS3とS4との間)、または、n番目のデータAnがどのステップ(たとえば、S3とS4の間またはS4の後)であるかによって変化する。   The abnormality determination between S8 and S10 is based on which step is the first measurement data A0 (for example, before S3 or between S3 and S4), or which step is the nth data An (for example, S3 and S3). Depending on whether it is during S4 or after S4.

なお、閾値TH1、TH2が記憶装置に予め記憶されている。   The threshold values TH1 and TH2 are stored in advance in the storage device.

上記実施例では、煙感知器SE1の発光回路を短時間で検査することができる。また、基板不良の際に、その基板を廃棄しても、高価な光学素子を廃棄せずにすむ。   In the above embodiment, the light emitting circuit of the smoke detector SE1 can be inspected in a short time. Further, even if the substrate is discarded when the substrate is defective, it is not necessary to discard the expensive optical element.

つまり、上記実施例は、充電電流制限抵抗を介して電源にコンデンサが接続され、発光素子と上記発光素子に流れる電流を制御する発光電流制限抵抗と上記発光素子に流れる電流のオン、オフを制御するスイッチ素子とが直列に接続される直列回路であって、上記コンデンサと上記直列回路とが並列に接続されている火災感知器の発光回路であって、上記発光素子が接続されていない被検査基板の発光回路を検査する火災感知器の発光回路の検査装置において、上記火災検知器の発光回路の検査装置は、模擬抵抗ユニットと、電圧測定ユニットとを有し、上記模擬抵抗ユニットは、抵抗と、上記抵抗の一端に接続する第1プローブと、上記抵抗の他端に接続する第2プローブとを有し、上記電圧測定ユニットは、電圧測定部と、上記電圧測定部の一端に接続する第3プローブと、上記電圧測定部の他端に接続する第4プローブとを有し、上記発光素子の一端を接続すべき上記被検査基板の発光回路における第1端子と、上記発光素子の他端を接続すべき上記被検査基板の発光回路における第2端子とに、上記模擬抵抗ユニットのいずれかのプローブをそれぞれ接続し、上記コンデンサの両端に上記電圧測定ユニットのいずれかのプローブをそれぞれ接続し、上記スイッチ素子をオンしたときに上記電圧測定部が出力したオン時電圧値と、上記スイッチ素子をオフしたときに上記電圧測定部が出力したオフ時電圧値との差、または比を演算する演算手段とを有する火災感知器の発光回路の検査装置の例である。   In other words, in the above embodiment, a capacitor is connected to the power supply via the charging current limiting resistor, and the light emitting current limiting resistor for controlling the current flowing through the light emitting element and the light emitting element and the on / off of the current flowing through the light emitting element are controlled. A series circuit in which a switch element is connected in series, wherein the capacitor and the series circuit are connected in parallel, and is a light emitting circuit of a fire detector, wherein the light emitting element is not connected In the light emission circuit inspection device for a fire detector for inspecting a light emission circuit on a board, the light emission circuit inspection device for the fire detector has a simulated resistance unit and a voltage measurement unit, and the simulated resistance unit is a resistance And a first probe connected to one end of the resistor, and a second probe connected to the other end of the resistor, the voltage measurement unit comprising: a voltage measurement unit; and the voltage measurement A first probe in the light emitting circuit of the substrate to be inspected, to which one end of the light emitting element is to be connected, and a third probe connected to one end of the light emitting element, and a fourth probe connected to the other end of the voltage measuring unit, One of the probes of the simulated resistance unit is connected to the second terminal of the light emitting circuit of the substrate to be inspected to which the other end of the light emitting element is connected, and one of the voltage measuring units is connected to both ends of the capacitor. Between the on-state voltage value output by the voltage measurement unit when the switch element is turned on and the off-state voltage value output by the voltage measurement unit when the switch element is turned off. It is an example of an inspection device for a light emitting circuit of a fire detector having calculation means for calculating a ratio.

この場合、上記オン時電圧値、または、上記差または比の値が、第1の閾値以上であれば、上記コンデンサが短絡していると判断し、上記オン時電圧値、または、上記差または比の値が上記第1の閾値と第2の閾値との間であれば、上記コンデンサが正常であると判断し、上記オン時電圧値、または、上記差または比の値が上記第2の閾値より小さければ、上記コンデンサが開放されていると判断する判断手段を有する。   In this case, if the on-time voltage value or the value of the difference or ratio is equal to or greater than the first threshold value, it is determined that the capacitor is short-circuited, and the on-time voltage value or the difference or ratio is determined. If the value of the ratio is between the first threshold value and the second threshold value, it is determined that the capacitor is normal, and the on-time voltage value, or the value of the difference or ratio is the second value. If it is smaller than the threshold value, it has a judging means for judging that the capacitor is opened.

また、上記スイッチ素子をオンする直前の初期電圧値を測定し、その後に、上記スイッチ素子のオンとオフとを繰り返す際の上記オン時電圧値と上記オフ時電圧値とを連続的に測定し、上記オン時電圧値または上記オフ時電圧値と、上記初期電圧値との差または比を演算し、上記差または比を演算した時系列データの変化の割合が、上記第1の閾値と上記第2の閾値との範囲内であれば、コンデンサが正常であると判断し、上記第1の閾値と上記第2の閾値との範囲外であれば、コンデンサが異常であると判断する判断手段を有する。   In addition, the initial voltage value immediately before the switch element is turned on is measured, and then the on-time voltage value and the off-time voltage value when the switch element is repeatedly turned on and off are continuously measured. A difference or ratio between the on-time voltage value or the off-time voltage value and the initial voltage value is calculated, and the rate of change of the time-series data obtained by calculating the difference or ratio is the first threshold value and the Judgment means for judging that the capacitor is normal if it is within the range of the second threshold and for judging that the capacitor is abnormal if it is outside the range of the first threshold and the second threshold. Have

また、上記実施例を方法の発明として把握することができる。つまり、上記実施例は、充電電流制限抵抗を介して電源にコンデンサが接続され、発光素子と上記発光素子に流れる電流を制御する発光電流制限抵抗と上記発光素子に流れる電流のオン、オフを制御するスイッチ素子とが直列に接続される直列回路であって、上記コンデンサと上記直列回路とが並列に接続されている火災感知器の発光回路であって、上記発光素子が接続されていない被検査基板の発光回路を検査する火災感知器の発光回路の検査装置において、上記発光素子の一端を接続すべき上記被検査基板の発光回路における第1端子と、上記発光素子の他端を接続すべき上記被検査基板の発光回路における第2端子とに上記模擬抵抗ユニットのいずれかのプローブをそれぞれ接続し、上記コンデンサの両端に上記電圧測定ユニットのいずれかのプローブをそれぞれ接続し、上記スイッチ素子をオンしたときに上記電圧測定部が出力したオン時電圧値と、上記スイッチ素子をオフしたときに上記電圧測定部が出力したオフ時電圧値との差または比を求め、記憶装置に記憶する演算工程を有する火災感知器の発光回路の検査方法の例である。   Moreover, the said Example can be grasped | ascertained as invention of a method. In other words, in the above embodiment, a capacitor is connected to the power supply via the charging current limiting resistor, and the light emitting current limiting resistor for controlling the current flowing through the light emitting element and the light emitting element and the on / off of the current flowing through the light emitting element are controlled. A series circuit in which a switch element is connected in series, wherein the capacitor and the series circuit are connected in parallel, and is a light emitting circuit of a fire detector, wherein the light emitting element is not connected In an inspection device for a light emitting circuit of a fire detector for inspecting a light emitting circuit of a board, a first terminal in the light emitting circuit of the board to be inspected to which one end of the light emitting element should be connected and the other end of the light emitting element should be connected One of the probes of the simulated resistance unit is connected to the second terminal of the light emitting circuit of the substrate to be inspected, and the voltage measuring unit is connected to both ends of the capacitor. An on-state voltage value output by the voltage measurement unit when each of the probes is connected and the switch element is turned on, and an off-time voltage value output by the voltage measurement unit when the switch element is turned off It is an example of the test | inspection method of the light emission circuit of the fire detector which has the calculating process which calculates | requires the difference or ratio of these, and memorize | stores it in a memory | storage device.

この場合、第1の閾値と第2の閾値とを記憶装置に記憶する記憶工程と、上記オン時電圧値、または、上記差または比の値が、第1の閾値以上であれば、上記コンデンサが短絡していると判断し、上記オン時電圧値、または、上記差または比の値が上記第1の閾値と第2の閾値との間であれば、上記コンデンサが正常であると判断し、上記オン時電圧値、または、上記差または比の値が上記第2の閾値より小さければ、上記コンデンサが開放されていると判断する判断工程とを有する。   In this case, if the storage step of storing the first threshold value and the second threshold value in the storage device and the on-time voltage value or the value of the difference or ratio is greater than or equal to the first threshold value, the capacitor Is determined to be short-circuited, and the capacitor is determined to be normal if the on-time voltage value or the difference or ratio value is between the first threshold value and the second threshold value. A determination step of determining that the capacitor is open if the on-time voltage value or the difference or ratio value is smaller than the second threshold value.

また、第1の閾値と第2の閾値とを記憶装置に記憶する記憶工程と、上記スイッチ素子をオンする直前の初期電圧値を測定し、その後に、上記スイッチ素子のオンとオフとを繰り返す際の上記オン時電圧値と上記オフ時電圧値とを連続的に測定し、上記オン時電圧値または上記オフ時電圧値と、上記初期電圧値との差または比を求め、記憶装置に記憶する比較工程と、上記差または比を演算した時系列データの変化の割合が、上記第1の閾値と上記第2の閾値との範囲内であれば、コンデンサが正常であると判断し、上記第1の閾値と上記第2の閾値との範囲外であれば、コンデンサが異常であると判断する判断工程とを有する火災感知器の発光回路の検査方法である。
In addition, the storage step of storing the first threshold value and the second threshold value in the storage device, the initial voltage value immediately before turning on the switch element is measured, and then the switch element is repeatedly turned on and off. The on-time voltage value and the off-time voltage value are measured continuously, and the difference or ratio between the on-time voltage value or the off-time voltage value and the initial voltage value is obtained and stored in the storage device. If the comparison step and the rate of change of the time-series data obtained by calculating the difference or ratio are within the range between the first threshold and the second threshold, it is determined that the capacitor is normal, and A method for inspecting a light-emitting circuit of a fire detector, comprising: a determination step of determining that a capacitor is abnormal if it is out of a range between a first threshold value and the second threshold value.

本発明の実施例1である発光回路の検査装置200が検査する対象である感知器SE1の発光回路100の一部を示す回路図である。It is a circuit diagram which shows a part of light emission circuit 100 of sensor SE1 which is the object which the test | inspection apparatus 200 of the light emission circuit which is Example 1 of this invention inspects. 発光回路の検査装置200を示す回路図である。It is a circuit diagram which shows the test | inspection apparatus 200 of a light emission circuit. 感知器SE1と検査装置200との関係を示す図である。It is a figure which shows the relationship between sensor SE1 and the test | inspection apparatus 200. FIG. 上記実施例1の動作を示すフローチャートである。It is a flowchart which shows operation | movement of the said Example 1. FIG. 本発明の実施例2である発光回路の検査装置200の信号処理部30による時系列データの変化の例を示す図である。It is a figure which shows the example of the change of the time series data by the signal processing part 30 of the test | inspection apparatus 200 of the light emission circuit which is Example 2 of this invention.

符号の説明Explanation of symbols

SE1…感知器SE1、
100…感知器SE1の発光回路、
SW1…スイッチ素子、
C1…コンデンサ、
10…発光素子実装部、
200…発光回路の検査装置、
20…電圧測定部、
30…信号処理部、
40…CPU、
50…模擬抵抗ユニット、
60…電圧測定ユニット。
SE1 ... sensor SE1,
100: Light emitting circuit of the sensor SE1,
SW1 ... switch element,
C1 ... capacitor
10: Light emitting element mounting part,
200: Light-emitting circuit inspection device,
20: Voltage measuring unit,
30: Signal processing unit,
40 ... CPU,
50 ... Simulated resistance unit,
60: Voltage measurement unit.

Claims (2)

充電電流制限抵抗を介して電源にコンデンサが接続され、発光素子と上記発光素子に流れる電流を制御する発光電流制限抵抗と上記発光素子に流れる電流のオン、オフを制御するスイッチ素子とが直列に接続される直列回路であって、上記コンデンサと上記直列回路とが並列に接続されている火災感知器の発光回路であって、上記発光素子が接続されていない被検査基板の発光回路を検査する火災感知器の発光回路の検査装置において、
上記火災検知器の発光回路の検査装置は、模擬抵抗ユニットと、電圧測定ユニットとを有し、
上記模擬抵抗ユニットは、抵抗と、上記抵抗の一端に接続する第1プローブと、上記抵抗の他端に接続する第2プローブとを有し、
上記電圧測定ユニットは、電圧測定部と、上記電圧測定部の一端に接続する第3プローブと、上記電圧測定部の他端に接続する第4プローブとを有し、
上記発光素子の一端を接続すべき上記被検査基板の発光回路における第1端子と、上記発光素子の他端を接続すべき上記被検査基板の発光回路における第2端子とに、上記模擬抵抗ユニットのいずれかのプローブをそれぞれ接続し、上記コンデンサの両端に上記電圧測定ユニットのいずれかのプローブをそれぞれ接続し、上記スイッチ素子をオンしたときに上記電圧測定部が出力したオン時電圧値と、上記スイッチ素子をオフしたときに上記電圧測定部が出力したオフ時電圧値との差、または比を演算する演算手段と、
を有することを特徴とする火災感知器の発光回路の検査装置。
A capacitor is connected to the power supply via a charging current limiting resistor, and a light emitting element, a light emitting current limiting resistor that controls the current flowing through the light emitting element, and a switch element that controls on / off of the current flowing through the light emitting element are connected in series. A series circuit to be connected, which is a light emitting circuit of a fire detector in which the capacitor and the series circuit are connected in parallel. In the inspection device for the light emitting circuit of the fire detector,
The inspection device for the light emitting circuit of the fire detector has a simulated resistance unit and a voltage measurement unit,
The simulated resistance unit includes a resistor, a first probe connected to one end of the resistor, and a second probe connected to the other end of the resistor,
The voltage measurement unit includes a voltage measurement unit, a third probe connected to one end of the voltage measurement unit, and a fourth probe connected to the other end of the voltage measurement unit,
The simulated resistance unit is connected to a first terminal in the light emitting circuit of the substrate to be inspected to which one end of the light emitting element is connected and a second terminal in the light emitting circuit of the inspected substrate to which the other end of the light emitting element is to be connected. Each of the probes is connected, and one of the probes of the voltage measurement unit is connected to both ends of the capacitor, and the voltage measurement unit outputs an on-time voltage value when the switch element is turned on, An arithmetic means for calculating a difference or ratio with an off-time voltage value output by the voltage measurement unit when the switch element is turned off;
A device for inspecting a light emitting circuit of a fire detector, comprising:
充電電流制限抵抗を介して電源にコンデンサが接続され、発光素子と上記発光素子に流れる電流を制御する発光電流制限抵抗と上記発光素子に流れる電流のオン、オフを制御するスイッチ素子とが直列に接続される直列回路であって、上記コンデンサと上記直列回路とが並列に接続されている火災感知器の発光回路であって、上記発光素子が接続されていない被検査基板の発光回路を検査する火災感知器の発光回路の検査方法において、
上記発光素子の一端を接続すべき上記被検査基板の発光回路における第1端子と、上記発光素子の他端を接続すべき上記被検査基板の発光回路における第2端子とに上記模擬抵抗ユニットのいずれかのプローブをそれぞれ接続し、上記コンデンサの両端に上記電圧測定ユニットのいずれかのプローブをそれぞれ接続し、上記スイッチ素子をオンしたときに上記電圧測定部が出力したオン時電圧値と、上記スイッチ素子をオフしたときに上記電圧測定部が出力したオフ時電圧値との差または比を求め、記憶装置に記憶する演算工程を有することを特徴とする火災感知器の発光回路の検査方法。
A capacitor is connected to the power supply via a charging current limiting resistor, and a light emitting element, a light emitting current limiting resistor that controls the current flowing through the light emitting element, and a switch element that controls on / off of the current flowing through the light emitting element are connected in series. A series circuit to be connected, which is a light emitting circuit of a fire detector in which the capacitor and the series circuit are connected in parallel, and the light emitting circuit of the board to be inspected to which the light emitting element is not connected is inspected. In the inspection method of the light emitting circuit of the fire detector,
The simulated resistance unit is connected to a first terminal of the light emitting circuit of the substrate to be inspected to which one end of the light emitting element is connected and a second terminal of the light emitting circuit of the to-be-inspected substrate to which the other end of the light emitting element is to be connected. One of the probes is connected, and one of the probes of the voltage measurement unit is connected to both ends of the capacitor, and the on-time voltage value output by the voltage measurement unit when the switch element is turned on, A method for inspecting a light-emitting circuit of a fire detector, comprising: calculating a difference or ratio with an off-time voltage value output from the voltage measuring unit when the switch element is turned off, and storing the difference or ratio in a storage device.
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