JPH021526A - 光分散測定装置 - Google Patents

光分散測定装置

Info

Publication number
JPH021526A
JPH021526A JP63274543A JP27454388A JPH021526A JP H021526 A JPH021526 A JP H021526A JP 63274543 A JP63274543 A JP 63274543A JP 27454388 A JP27454388 A JP 27454388A JP H021526 A JPH021526 A JP H021526A
Authority
JP
Japan
Prior art keywords
optical
pulse
wavelength
variable
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63274543A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0260972B2 (enExample
Inventor
Kiyobumi Mochizuki
望月　清文
Hiroharu Wakabayashi
若林　博晴
Yasuhiko Niino
新納　康彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KDDI Corp
Original Assignee
Kokusai Denshin Denwa KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Denshin Denwa KK filed Critical Kokusai Denshin Denwa KK
Priority to JP63274543A priority Critical patent/JPH021526A/ja
Publication of JPH021526A publication Critical patent/JPH021526A/ja
Publication of JPH0260972B2 publication Critical patent/JPH0260972B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3172—Reflectometers detecting the back-scattered light in the frequency-domain, e.g. OFDR, FMCW, heterodyne detection

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Light Guides In General And Applications Therefor (AREA)
  • Optical Communication System (AREA)
JP63274543A 1988-11-01 1988-11-01 光分散測定装置 Granted JPH021526A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63274543A JPH021526A (ja) 1988-11-01 1988-11-01 光分散測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63274543A JPH021526A (ja) 1988-11-01 1988-11-01 光分散測定装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP287280A Division JPS56100324A (en) 1980-01-14 1980-01-14 Measuring device for light dispersion

Publications (2)

Publication Number Publication Date
JPH021526A true JPH021526A (ja) 1990-01-05
JPH0260972B2 JPH0260972B2 (enExample) 1990-12-18

Family

ID=17543179

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63274543A Granted JPH021526A (ja) 1988-11-01 1988-11-01 光分散測定装置

Country Status (1)

Country Link
JP (1) JPH021526A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0215259A (ja) * 1988-07-04 1990-01-18 Toyo Ink Mfg Co Ltd 画像形成装置および画像形成方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0215259A (ja) * 1988-07-04 1990-01-18 Toyo Ink Mfg Co Ltd 画像形成装置および画像形成方法

Also Published As

Publication number Publication date
JPH0260972B2 (enExample) 1990-12-18

Similar Documents

Publication Publication Date Title
EP1610108B1 (en) Polarization beam splitter
JPH06194611A (ja) 多段光学カーゲート装置
JPS6410767B2 (enExample)
CN100410637C (zh) 利用啁啾脉冲频谱测量太赫兹脉冲序列的方法和装置
JPH021526A (ja) 光分散測定装置
US3437399A (en) Solid-state crystal optical modulator
JPH02311722A (ja) 光サンプリング波形測定装置
JP2000329618A (ja) 光信号電界の時間波形測定方法及び装置
JP3291466B2 (ja) 光信号波形測定方法
CN101149263A (zh) 一种基于慢光效应的光学陀螺
WO2008083445A1 (en) Optical analysis system and method
US6744508B2 (en) Simplified polarization independent optical sampling using a spatially split waveplate
SU1157416A1 (ru) Многолучевой интерференционный эллипсометр
RU2057357C1 (ru) Автокоррелятор световых импульсов
JPH0782036B2 (ja) 光フアイバ型電圧センサ
JPH11288011A (ja) 波長可変擬似位相整合素子
JPH0151164B2 (enExample)
JPH0620987Y2 (ja) 光スペクトル測定装置
JPS5899761A (ja) 光による電界，磁界測定器
JPH01147334A (ja) 偏波保持光ファイバの複屈折率測定装置
JPH037062B2 (enExample)
JP2893921B2 (ja) 光サンプリング装置
RU2057304C1 (ru) Автокоррелятор световых импульсов
JPH0622189Y2 (ja) 光スペクトル測定装置
JP2822433B2 (ja) 光を用いた物理量測定装置