JPH02151109A - Semiconductor amplifier circuit - Google Patents

Semiconductor amplifier circuit

Info

Publication number
JPH02151109A
JPH02151109A JP63305276A JP30527688A JPH02151109A JP H02151109 A JPH02151109 A JP H02151109A JP 63305276 A JP63305276 A JP 63305276A JP 30527688 A JP30527688 A JP 30527688A JP H02151109 A JPH02151109 A JP H02151109A
Authority
JP
Japan
Prior art keywords
fet
voltage
gate
bias
amplifier circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63305276A
Other languages
Japanese (ja)
Inventor
Shinji Orisaka
伸治 折坂
Koki Nagahama
長浜 弘毅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP63305276A priority Critical patent/JPH02151109A/en
Publication of JPH02151109A publication Critical patent/JPH02151109A/en
Pending legal-status Critical Current

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  • Junction Field-Effect Transistors (AREA)
  • Amplifiers (AREA)

Abstract

PURPOSE:To constitute an amplifier circuit without less distortion with no adjustment without any load of an external circuit by dividing a threshold level for a FET for a gate bias formed on one and same chip and supplying the divided voltage to the gate of the FET. CONSTITUTION:An amplifier FET 6 and a gate bias FET 12 are formed on one and same chip at the same time. Thus, a pinch-off voltage Vp or a threshold voltage of both the FETs 6, 12 is made nearly equal to each other. A resistor 9a limiting an input current up to an offset IDS is connected to a bias power supply terminal 5 to make the voltage across the FET 12 equal to a voltage Vp. Moreover, the voltage Vp is divided by gate bias resistors 10a, 10b. In the case of class A operation, when the resistance of both the resistors 10a, 10b is selected equal, a voltage 1/2Vp is fed to a gate of the FET 6 via a gate series resistor 8 as a bias voltage. Thus, the selection of the bias point of the amplifier circuit in response to the division ratio of the resistors 10a, 10b is attained with no adjustment.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は半導体増幅回路に関し、主としてGaAsF
ETを利用した電力増幅器の回路に関するものである。
[Detailed Description of the Invention] [Field of Industrial Application] This invention relates to a semiconductor amplifier circuit, and mainly uses GaAsF.
This invention relates to a power amplifier circuit using ET.

〔従来の技術〕[Conventional technology]

第2図は一般的に使用されているFETを用いた電力増
幅回路を示す。高周波信号は入力端子1より直流カット
容量7を経てFET6に入り増幅され、出力は負荷抵抗
11とI’ET6のドレインの接続点に現われ、容量7
を経て端子2に高周波出力信号が得られる。高周波信号
を増幅する際FET6のゲートに印加するバイアス電圧
は端子5より供給され、FETに合ったバイアス電圧が
調整抵抗9bにより調整される。
FIG. 2 shows a power amplifier circuit using a commonly used FET. The high frequency signal enters the FET 6 from the input terminal 1 via the DC cut capacitor 7 and is amplified, and the output appears at the connection point between the load resistor 11 and the drain of I'ET 6, and the capacitor 7
A high-frequency output signal is obtained at terminal 2 through . A bias voltage applied to the gate of the FET 6 when amplifying a high frequency signal is supplied from the terminal 5, and the bias voltage suitable for the FET is adjusted by the adjustment resistor 9b.

A級動作を行なうためにFET6のゲートバイアス電圧
はバイアス電源端子5より供給し、ゲートバイアス電圧
によるドレイン電流がFETの最大ドレイン電流IDS
の1/2になる点にゲート電圧をゲートバイアス電圧8
bで調整して印加する。この場合、ゲート電圧は端子5
の電圧が抵抗9b、10で分割され、該分割電圧が、F
ETのしきい値電圧又はそれとほぼ同値を示すピンチオ
フ電圧の約1/2になる様に調整すればFETのドレイ
ン電流も最大ドレイン電流IDSの約1/2となり、A
級動作の条件を満たす。
In order to perform class A operation, the gate bias voltage of the FET 6 is supplied from the bias power supply terminal 5, and the drain current due to the gate bias voltage is the maximum drain current IDS of the FET.
Set the gate voltage to the point where it becomes 1/2 of the gate bias voltage 8
Adjust with b and apply. In this case, the gate voltage is at terminal 5
is divided by the resistors 9b and 10, and the divided voltage is F
If the FET's drain current is adjusted to approximately 1/2 of the threshold voltage of the ET or the pinch-off voltage, which is approximately the same value, the drain current of the FET will also be approximately 1/2 of the maximum drain current IDS, and the A
satisfies the conditions for class operation.

FET特性のバラツキによりゲート電圧はゲートバイア
ス抵抗9bにより増幅回路ごとに:JyJ整しないと、
歪の少ない回路は得られない。第3図はFETの特性例
で、ゲートバイアス電圧を約1/2Vp (ピンチオフ
電圧)に調整することにより、ドレイン電流が1/2 
I DSを中心として増幅されることを示している。こ
のことからゲートバイアス電圧が偏ったりするとドレイ
ンの出力波形は歪み、増幅回路として望ましくない。
Due to variations in FET characteristics, the gate voltage must be adjusted for each amplifier circuit by the gate bias resistor 9b.
A circuit with low distortion cannot be obtained. Figure 3 shows an example of FET characteristics. By adjusting the gate bias voltage to approximately 1/2Vp (pinch-off voltage), the drain current can be reduced by 1/2.
This shows that the signal is amplified centering on the IDS. Therefore, if the gate bias voltage is biased, the drain output waveform will be distorted, which is not desirable as an amplifier circuit.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来のFETを用いたA級動作半導体増幅回路は、最適
のゲートバイアス電圧を得るために、第2図に示す調整
用可変抵抗9bを用いて各々の増幅段の調整をするため
、増幅段が多い回路や、バラツキの多いFETを用いる
場合、あるいはFETや抵抗を用いた一体回路(集積回
路)などでは小型化する上で調整抵抗を外付けする必要
がある、調整に手数がかかるなどの問題点があった。
In conventional class A semiconductor amplifier circuits using FETs, in order to obtain the optimum gate bias voltage, each amplification stage is adjusted using a variable adjustment resistor 9b shown in FIG. When using a large number of circuits, FETs with large variations, or integrated circuits (integrated circuits) using FETs and resistors, there are problems such as the need to externally attach an adjustment resistor for miniaturization, and the need for adjustment. There was a point.

この発明は上記のような問題点を解消するためになされ
たもので、回路をほとんど無調整にできると共に、小型
化でき更に歩留りの高い、半導体増幅回路を得ることを
目的とする。
The present invention has been made to solve the above-mentioned problems, and aims to provide a semiconductor amplifier circuit that can be made in a small size and has a high yield, with almost no adjustment required.

〔課題を解決するための手段〕[Means to solve the problem]

この発明に係る半導体増幅回路は、FET特性にバラツ
キがあってもゲートバイアス電圧が歪みの少ない点に自
動的に設定される様、FETと同一チップ上に形成した
別のFETの特性はほぼ同一であることを利用し、その
しきい値電圧(ピンチオフ電圧とほぼ等しい)を分割し
て上記FETのゲートに供給し、外部調整回路又は調整
抵抗を排除するようにしたものである。
In the semiconductor amplifier circuit according to the present invention, the characteristics of another FET formed on the same chip as the FET are almost the same so that the gate bias voltage is automatically set to a point with little distortion even if there are variations in the FET characteristics. Taking advantage of this fact, the threshold voltage (approximately equal to the pinch-off voltage) is divided and supplied to the gate of the FET, thereby eliminating an external adjustment circuit or adjustment resistor.

〔作用〕[Effect]

この発明においては入力信号が過大でFETのゲートバ
イアス電圧値がずれるような場合にも同一チップ内の近
似特性を有するFET特性を利用することによりゲート
バイアス電圧設定値は回路作成時に自動的に形成される
In this invention, even if the input signal is excessive and the gate bias voltage value of the FET deviates, the gate bias voltage setting value is automatically created at the time of circuit creation by using the FET characteristics that have approximate characteristics within the same chip. be done.

〔実施例〕〔Example〕

以下、この発明の一実施例を図について説明する。 An embodiment of the present invention will be described below with reference to the drawings.

第1図において、12はゲートバイアス用FET59a
はゲートバイアス抵抗、10 a、  10 bはゲー
トバイアス抵抗である。
In FIG. 1, 12 is a gate bias FET 59a.
is a gate bias resistance, and 10a and 10b are gate bias resistances.

次に動作について説明する。Next, the operation will be explained.

入力信号は端子1から容蚤7を経てFETθのゲートに
供給される。A級動作の例ではゲートバイアス電圧は第
3図に示すようにほぼ1/2 I DSの点に設定され
る。しかしながらFET特性にバラツキを有する場合、
一定の電圧では出力波形に歪みを生ずる。そのためFE
Tのバラツキがあってもドレイン電流が1/21DSに
なる様なゲートバイアス電圧を高周波入力信号と重畳さ
せて、FET8のゲートに供給する必要がある。本発明
は増幅用FET6とゲートバイアス用FET12を同一
チップに同時に形成する。そのため両FET6,12の
第3図に示すvp又はしきい値電圧はほぼ等しくなる。
The input signal is supplied from terminal 1 through capacitor 7 to the gate of FET θ. In the example of class A operation, the gate bias voltage is set at approximately 1/2 I DS as shown in FIG. However, if there are variations in FET characteristics,
A constant voltage will cause distortion in the output waveform. Therefore, FE
It is necessary to superimpose a gate bias voltage such that the drain current becomes 1/21 DS even with variations in T with the high frequency input signal and supply it to the gate of the FET 8. In the present invention, the amplification FET 6 and the gate bias FET 12 are simultaneously formed on the same chip. Therefore, the vp or threshold voltages shown in FIG. 3 of both FETs 6 and 12 are approximately equal.

バイアス電源端子5には第3(なる。更にそのVpをゲ
ートバイアス抵抗10a、10bにより分割する。A級
動作の場合両抵抗10 a、  10 bの抵抗値を等
しくすることにより1/2Vpがゲート直列抵抗8を経
てFET6のゲートにバイアス電圧として供給される。
The bias power supply terminal 5 is connected to a third voltage (Vp).Furthermore, the Vp is divided by gate bias resistors 10a and 10b.In the case of class A operation, by making the resistance values of both resistors 10a and 10b equal, 1/2Vp is applied to the gate. It is supplied as a bias voltage to the gate of FET 6 via series resistor 8.

第3図は第2図のFET6及び12の特性例であり、両
FETは特性が近似しており、Vpもほとんど同値であ
る。またゲートバイアス電圧を1/2IDSとしてA級
動作を行なう場合、ゲート電圧対ドレイン電流特性は実
用上はぼ直線と考えて差し支えなく、FET12のVp
を2分割してFET6のゲートにバイアス電圧として供
給すれば、A級動作の増幅回路の条件は満たすことにな
る。そのためゲートバイアス電圧によりFET8のゲー
トから流出する電流より少なくとも10倍以上の電流を
オフセット電流(第3図のオフセラ)IDS)とする様
にゲートバイアス抵抗9aを選ぶものとする。
FIG. 3 shows an example of the characteristics of FETs 6 and 12 shown in FIG. 2, and both FETs have similar characteristics and have almost the same value of Vp. In addition, when performing class A operation with the gate bias voltage set to 1/2 IDS, the gate voltage vs. drain current characteristic can be considered to be almost a straight line in practical terms, and the Vp of FET12
If the voltage is divided into two and supplied as a bias voltage to the gate of the FET 6, the conditions for a class-A operation amplifier circuit will be satisfied. Therefore, the gate bias resistor 9a is selected so that the offset current (IDS in FIG. 3) is at least 10 times the current flowing out from the gate of the FET 8 due to the gate bias voltage.

通常のFETではゲート電流はゲート幅1mmに対し1
μAと低くFET12の第3図に示すオフセットIDS
の比は10倍以上が得られるため、FET12のVpを
抵抗L Oa、  10 bで分割してもVpの変動は
無視できる程度となり、抵抗10a、10bの分割比に
応じ増幅回路のバイアス点を選ぶことが、無調整で実現
可能となる。
In a normal FET, the gate current is 1 for every 1 mm of gate width.
Offset IDS shown in Figure 3 for FET12 as low as μA
Since the ratio of 10 times or more can be obtained, even if the Vp of FET 12 is divided by the resistors LOa and 10b, the variation in Vp will be negligible, and the bias point of the amplifier circuit can be set according to the division ratio of the resistors 10a and 10b. The choice becomes possible without adjustment.

なお上記実施例では抵抗負荷型の増幅回路を示したが、
本発明はインダクタンス負荷1公布定数回路を負荷とす
る回路にも適用でき、同様な効果を有する。また上記実
施例ではA級動作の例を示したが、Vpの分割比によっ
ては自動的にA級動作以外のB、  0級などの動作モ
ードにもこの発明は適用可能である。
Although the above embodiment shows a resistive load type amplifier circuit,
The present invention can also be applied to a circuit whose load is an inductance load 1 published constant circuit, and has similar effects. Further, in the above embodiment, an example of class A operation is shown, but depending on the division ratio of Vp, the present invention can be automatically applied to operation modes other than class A operation, such as class B and class 0.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明によれば、同一チップ上に形成
したゲートバイアス用FETのしきい値電圧を分割し、
これをFETのゲートに供給するようにしたので、任意
のゲートバイアス電圧をFETのバラツキに関係な(印
加することができ、歪の少ない増幅回路を、無調整で外
部回路の負荷なしに安価に構成できる効果がある。
As described above, according to the present invention, the threshold voltage of gate bias FETs formed on the same chip is divided,
Since this is supplied to the gate of the FET, any gate bias voltage can be applied regardless of the FET variation, and an amplifier circuit with low distortion can be built at low cost without any adjustment or external circuit load. There are configurable effects.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例によるFETを用いたA級
増幅回路の回路図、第2図は従来の回路例を示す図、第
3図はゲートバイアス電圧とFETのドレイン電流特性
を示す図である。 1は高周波入力端子、2は高周波出力端子、3は電源端
子、4は接地端子、5はバイアス電源端子、6はFET
、7は入出力結合キャパシタ、8はゲート直列抵抗、9
.10はゲートバイアス抵抗、11はFET負荷抵抗、
12はゲートバイアス用F E T。 なお図中同一符号は同−又は相当部分を示す。
Fig. 1 is a circuit diagram of a class A amplifier circuit using an FET according to an embodiment of the present invention, Fig. 2 is a diagram showing a conventional circuit example, and Fig. 3 shows characteristics of gate bias voltage and drain current of the FET. It is a diagram. 1 is a high frequency input terminal, 2 is a high frequency output terminal, 3 is a power supply terminal, 4 is a ground terminal, 5 is a bias power supply terminal, 6 is a FET
, 7 is an input/output coupling capacitor, 8 is a gate series resistance, 9
.. 10 is a gate bias resistance, 11 is a FET load resistance,
12 is FET for gate bias. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】 1)FETを用いた半導体増幅回路において、上記FE
Tと同一チップ内に形成され、上記FETのしきい値電
圧を検出するゲートバイアス用FETと、 ゲートバイアス電圧が上記FETの特性バラツキに応じ
て印加されるよう、上記検出電圧を任意に分割し、上記
FETのゲートバイアス電圧とする検出電圧分割手段と
を備えたことを特徴とする半導体増幅回路。
[Claims] 1) In a semiconductor amplifier circuit using FETs, the above-mentioned FE
A gate bias FET is formed in the same chip as T and detects the threshold voltage of the FET, and the detection voltage is arbitrarily divided so that the gate bias voltage is applied according to the characteristic variation of the FET. . A semiconductor amplifier circuit comprising: a detection voltage dividing means for determining a gate bias voltage of the FET.
JP63305276A 1988-12-01 1988-12-01 Semiconductor amplifier circuit Pending JPH02151109A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63305276A JPH02151109A (en) 1988-12-01 1988-12-01 Semiconductor amplifier circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63305276A JPH02151109A (en) 1988-12-01 1988-12-01 Semiconductor amplifier circuit

Publications (1)

Publication Number Publication Date
JPH02151109A true JPH02151109A (en) 1990-06-11

Family

ID=17943150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63305276A Pending JPH02151109A (en) 1988-12-01 1988-12-01 Semiconductor amplifier circuit

Country Status (1)

Country Link
JP (1) JPH02151109A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0625822A2 (en) * 1993-05-19 1994-11-23 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit
JPH07162242A (en) * 1993-12-09 1995-06-23 Nec Corp Bias circuit
US5808515A (en) * 1996-01-18 1998-09-15 Fujitsu Limited Semiconductor amplifying circuit having improved bias circuit for supplying a bias voltage to an amplifying FET

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0625822A2 (en) * 1993-05-19 1994-11-23 Mitsubishi Denki Kabushiki Kaisha Semiconductor integrated circuit
EP0625822A3 (en) * 1993-05-19 1995-04-05 Mitsubishi Electric Corp Semiconductor integrated circuit.
JPH07162242A (en) * 1993-12-09 1995-06-23 Nec Corp Bias circuit
US5808515A (en) * 1996-01-18 1998-09-15 Fujitsu Limited Semiconductor amplifying circuit having improved bias circuit for supplying a bias voltage to an amplifying FET

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