JPH02147U - - Google Patents
Info
- Publication number
- JPH02147U JPH02147U JP7811688U JP7811688U JPH02147U JP H02147 U JPH02147 U JP H02147U JP 7811688 U JP7811688 U JP 7811688U JP 7811688 U JP7811688 U JP 7811688U JP H02147 U JPH02147 U JP H02147U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- chamber
- freeze
- reducing
- pressure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004108 freeze drying Methods 0.000 claims description 3
- 238000001816 cooling Methods 0.000 claims description 2
- 238000010438 heat treatment Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Sampling And Sample Adjustment (AREA)
Description
第1図は、本考案の試料凍結乾燥装置の実施例
の構成図、第2図は、その装置の外観斜視図であ
る。
1…チヤンバ、2…試料台、3…サーモモジユ
ール、4…冷却フイン、5…試料、6…リークバ
ルブ、7…フオアライントラツプ、9…油回転ポ
ンプ。
FIG. 1 is a block diagram of an embodiment of the sample freeze-drying apparatus of the present invention, and FIG. 2 is an external perspective view of the apparatus. 1... Chamber, 2... Sample stage, 3... Thermo module, 4... Cooling fin, 5... Sample, 6... Leak valve, 7... Foreline trap, 9... Oil rotary pump.
Claims (1)
、試料を収納するチヤンバと、同チヤンバを減圧
する手段と、同チヤンバ内の試料を少なくとも0
℃から20℃の範囲で温度制御する加熱、冷却手
段を備えることを特徴とする電子顕微鏡用試料凍
結乾燥装置。 An apparatus for freeze-drying a sample for an electron microscope, which includes a chamber for storing the sample, a means for reducing the pressure in the chamber, and a means for reducing the pressure of the sample in the chamber to at least 0.
A sample freeze-drying device for an electron microscope, characterized in that it is equipped with heating and cooling means for temperature control in the range of 20°C to 20°C.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7811688U JPH0621165Y2 (en) | 1988-06-13 | 1988-06-13 | Sample freeze-drying device for electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7811688U JPH0621165Y2 (en) | 1988-06-13 | 1988-06-13 | Sample freeze-drying device for electron microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH02147U true JPH02147U (en) | 1990-01-05 |
JPH0621165Y2 JPH0621165Y2 (en) | 1994-06-01 |
Family
ID=31303065
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7811688U Expired - Lifetime JPH0621165Y2 (en) | 1988-06-13 | 1988-06-13 | Sample freeze-drying device for electron microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0621165Y2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07280714A (en) * | 1994-04-13 | 1995-10-27 | Jeol Ltd | Manufacture of biological sample for scanning electron microscope, device therefor and biological sample observing method |
WO2013035866A1 (en) * | 2011-09-09 | 2013-03-14 | 独立行政法人科学技術振興機構 | Electron-microscopic examination method for examining biosample while keeping said biosample unchanged, and composition for evaporation inhibition under vacuum, scanning electron microscope, and transmission electron microscope for use in said method |
JP2021135141A (en) * | 2020-02-26 | 2021-09-13 | 国立研究開発法人産業技術総合研究所 | Device and method of preparing particle evaluation specimen |
-
1988
- 1988-06-13 JP JP7811688U patent/JPH0621165Y2/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07280714A (en) * | 1994-04-13 | 1995-10-27 | Jeol Ltd | Manufacture of biological sample for scanning electron microscope, device therefor and biological sample observing method |
WO2013035866A1 (en) * | 2011-09-09 | 2013-03-14 | 独立行政法人科学技術振興機構 | Electron-microscopic examination method for examining biosample while keeping said biosample unchanged, and composition for evaporation inhibition under vacuum, scanning electron microscope, and transmission electron microscope for use in said method |
JPWO2013035866A1 (en) * | 2011-09-09 | 2015-03-23 | 独立行政法人科学技術振興機構 | Observation method using an electron microscope for observing a biological sample as it is, a composition for suppressing evaporation under vacuum, a scanning electron microscope and a transmission electron microscope |
JP2021135141A (en) * | 2020-02-26 | 2021-09-13 | 国立研究開発法人産業技術総合研究所 | Device and method of preparing particle evaluation specimen |
Also Published As
Publication number | Publication date |
---|---|
JPH0621165Y2 (en) | 1994-06-01 |
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