JPH02147966A - Vacuum-suction type rotary index structure of apparatus for measuring chip part characteristics - Google Patents

Abstract

PURPOSE:To realize secure vacuum transmission without vacuum leakage by a method wherein an index table and a vacuum transmission part on a fixed side are constituted in pressed facial contact and a labyrinth seal groove is formed on this contact face. CONSTITUTION:Even if an index table 10 performs index operation, a vacuum path 38 of the table 10 moves along a circular or arc vacuum transmission groove 36 of a vacuum transmission circular member 33. Therefore, the vacuum path 38 of the index table 10 is always applied with negative pressure via the circular member 33 and a vacuum suction hose 50 thereby vacuum-sucking a chip capacitor at the upper end of a carrier 40. The index table 10 and the circular member 33 are press-contacted with facial contact, and in addition since a labyrinth seal groove is formed on this contact face, vacuum leakage can be prevented to have chip parts securely vacuum-sucked.

Description

DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a chip component characteristic measuring device used for measuring characteristics such as capacitance of chip-shaped electronic components such as multilayer ceramic chip capacitors, and more particularly, This invention relates to a vacuum suction type rotary index structure that is applied to automatically measure various characteristics by holding parts on a rotary index table by vacuum suction and sending them to multiple stations through intermittent rotational operations.

(Prior art) As an automatic characteristic measurement and sorting device for electronic components such as C chips and L chips, a plurality of vacuum suction heads are conventionally installed on the outer periphery of a rotary index table that rotates intermittently. A structure is known in which a chip component is held by suction at the table, and characteristics are measured by pinching the chip component between a pair of measurement terminals during intermittent rotation of the table.

In this case, the vacuum transmission means from the vacuum source (vacuum pump) to the vacuum suction head on the index table includes the vacuum passage of the rotating side support shaft built into the index table and the vacuum passage (piping) on the vacuum pump side, that is, the stationary side. , hollow shafts, and other fixed member insertion grooves), or by incorporating an O-ring or the like into the sliding connection between the fixed side and the rotating side to perform vacuum transmission.

(Problem to be Solved by the Invention) The conventional structure in which vacuum suction heads are attached to the outside of a rotary index table is complicated because a plurality of vacuum suction heads are each connected to a vacuum source through a rotary seal. Therefore, vacuum leakage was likely to occur during the process, and there was a risk that the chip components would fall off from the suction head. Furthermore, the stability of the rotary index table was poor, making it difficult to improve measurement accuracy. Furthermore, the vacuum suction head cannot be easily attached to the index table depending on the dimensions of the chip component to be measured.
The overall problem was that it was complicated and expensive.

The present invention has a surface contact between the rotating side and the stationary side connecting portion, and forms a vacuum transmission means in this surface contact area. This prevents vacuum leakage, has a simple and compact structure, and has a large number of It is an object of the present invention to provide a vacuum suction type rotary index structure for a J.71 component characteristic measuring device to which a holding portion of a chip component can be attached.

(Means for Solving the Problems) The vacuum suction type rotary index structure of the present invention includes a rotary index table connected to an index output shaft and having a vacuum passage formed inside, and a rotary index table that is elastically pressed against the lower surface of the index table. a vacuum transmission annular member held on the apparatus main body side so that the vacuum transmission ring member has a circumferential vacuum transmission groove and a labyrinth seal groove formed on its pressing surface; and the vacuum transmission ring member is attached to the rotary index table. The vacuum passage of the rotary index table communicates from the vacuum transmission groove of the annular member to the holding surface of the chip component, and the negative pressure from the vacuum source is applied to the device body. The vacuum is transmitted from the side through the inside of the annular member to the vacuum passage of the rotary index table.

(Example) Next, an example of the present invention will be described with reference to the drawings.

FIG. 3 is a side sectional view of a C pressure measuring machine using a rotary index table according to the present invention, and FIG.
FIG. 3 is a partial top view of the figure; First, the outline of the C pressure measuring machine of this embodiment will be explained with reference to these figures. Chip capacitors as components are held at equal intervals, and a measurement unit housing 11 is fixed to the device base 14 side so as to pass through the center of the index table 10 and cover the top surface of the table. A cam plate 13 for opening and closing a terminal lever 20 of the measuring section is pivotally supported in the center of the housing It via a ball spline shaft 12 so as to be movable up and down. As shown in FIG. 4, a plurality of drive cam plates 13 extend radially from the outer periphery of the disc-shaped base 13a to predetermined measurement stations. A group of cams for driving the device are arranged inside the device base 14, and the cam plate 13 for driving the terminal lever is moved up and down by the cam for driving the device via the cam floor, the transmission link 16, the lever 17, etc. The device driving cam group is the support shaft of the index table 10 according to the present invention, which is the index output shaft 18.
is also connected to the terminal lever driving cam plate 1.
3 and the index table 10 operate in conjunction with each other.

The cam Fi13 corresponds to the terminal lever driving cam plate 13.
A terminal lever support plate 19 is located below the unit housing 1.
A plurality of capacitors are attached to the indenrus table 10 in a radial manner, extending to a position above the chip capacitors on the outer periphery of the indenrus table 10. A pair of terminal levers 20 of the same shape are knife-supported by each terminal lever support plate 19 at their midpoints. At the lower end of each terminal lever 20 is an L-shaped thin plate terminal 2.
A compression spring 27 is mounted between the terminal lever 20 and the support plate 19 below the knife fulcrum of the terminal lever 20. When the terminal lever drive cam plate 13 is in the raised position, the lower ends of the pair of terminal levers 20 approach each other around the knife fulcrum due to the action of the compression spring 27, that is, they are closed, and the carrier 40 on the outer periphery of the table is moved.
Both ends of the chip capacitor held in the L-shaped thin plate terminals 2
2, thereby performing a capacitance measurement in a so-called opposed contact method. As the terminal lever driving cam plate 13 moves downward, the upper end of the terminal lever 20 is pressed against the tapered cam surface of the cam plate 13, and as a result, the lower end of the terminal lever 20 opens around the knife fulcrum and connects the thin plate terminal 22. Contact with the chip capacitor is broken. In this state,
An index table 10, which will be described later, rotates, and the chip capacitor is sent to the next measuring stage, 5 inches. In addition, as an L-shaped thin plate terminal, for example, Utility Application No. 63-65576
The electrodes detailed in this issue can be effectively employed as electrodes for measuring characteristics.

FIG. 1 is a partial side sectional view of a rotary index structure according to an embodiment of the present invention, and FIG. 2 is a perspective view of a vacuum transmitting annular member in the embodiment of FIG. As shown in FIG. 3, the index output shaft 18 of the index unit 30 has a mortar-shaped index output flange 3.
1 is fixed, and the lower surface of the index table 10 is fixed to the upper end of the flange 31. On the outside of the index output flange 31, a vacuum transmission annular member 33 made of polyacetal resin or the like is held between the device main body 14 and the index table 10 so as to be movable up and down. A rotation prevention spring pin 34 is inserted between the two, and a pressure spring 35 is interposed between the two, so that the upper surface of the annular member 33 is always pressed against the lower surface of the index table IO with a constant pressure. Being forced.

As shown in FIG. 2, an annular or arcuate vacuum transmission groove 36 is formed on the upper surface of the annular member 33, and a plurality of vacuum passages 37 are formed in communication with the vacuum transmission groove 36. It is formed to penetrate the annular member. The vacuum passage 37 on the annular member side is connected to a vacuum generation source (not shown) via a vacuum suction hose 50. index table 10
A vacuum passage 38 communicating with the vacuum transmission groove 36 is formed in the vacuum passage 38 . The outer end of this table side vacuum passage 38 is
It communicates with a vacuum suction hole 41 formed in a carrier 40 that holds a chip capacitor. Furthermore, a labyrinth seal groove is formed on the table pressing surface of the upper surface of the annular member 33. As shown in FIG. 1, the carrier 40 has a generally U-shaped outer shape, and includes a carrier main body portion 42 that fits into surface contact with the index table 10 so that the peripheral side portion of the index table 10 is sandwiched between the U-shaped portions. and a chip component accommodating recess 43 formed on the upper surface of the main body portion 42, and the vacuum suction hole 41 opens at the bottom surface of the recess 43, that is, the seat surface for holding the chip component. The recess 43 of the carrier 40 is formed with an insertion groove for the measurement terminal. As for this carrier, for example, a carrier for measuring characteristics as disclosed in Japanese Patent Application No. 6:3-186267 can be effectively employed.

Even if the index table 10 performs an indexing operation, the vacuum passage 38 of the table 10 is connected to the vacuum transmission ring member 33.
Since the carrier moves along the annular or arcuate vacuum transmission groove 36, a negative pressure is always applied to the vacuum passage 38 of the index table 10 via the annular member 33 and the vacuum suction hose 50, and thereby the carrier The chip capacitor at the upper end of 40 is vacuum-adsorbed. The index table 10 and the annular member 33 are in surface contact with each other, and since a labyrinth seal groove is formed on this contact surface, vacuum leakage is prevented and the chip components are surely vacuum-adsorbed.

(Effects of the Invention) As explained above, according to the present invention, the Indenox table and the fixed side vacuum transmission part are configured to have a pressed surface contact, and a labyrinth seal groove is formed on this contact surface, so that vacuum leakage is prevented. There is no reliable vacuum transmission. Unlike conventional models that use a rotary seal on the shaft, the vacuum is transmitted through a circumferential groove on the contact surface, so the structure is simple, and moreover, it is possible to provide a holding section for a large number of chip components around the outer periphery of the table. There is an effect.

[Brief explanation of the drawing]

FIG. 1 is a partial side cross-sectional view of a rotary index structure according to an embodiment of the present invention, FIG. 2 is a perspective view of the vacuum transmission annular member shown in FIG. 1, and FIG. 3 is a rotary index structure according to an embodiment of the present invention. FIG. 4 is a partial side sectional view of a C pressure measuring device using an index structure, and FIG. 4 is a partial top view of FIG. 3. DESCRIPTION OF SYMBOLS 10... Index table, 18... Index output shaft, 36... Vacuum transmission groove annular member, 35... Pressure spring, 36... Vacuum transmission groove, 37.38... Vacuum passage, applicable... 40... 50...

Claims (1)

[Claims] In a chip component characteristic measuring device that measures characteristics by sending chip components held on the outer periphery of a rotary index table to multiple stations arranged around the table by table indexing operation, A rotary index table in which a vacuum passage is formed, and a vacuum transmission circle held on the apparatus main body side so as to be elastically pressed against the lower surface of the index table, and in which a circumferential vacuum transmission groove is formed in the pressing surface. a ring member; and a spring means for pressing the vacuum transmission ring member against the rotary index table, and the vacuum passage of the rotary index table extends from the vacuum transmission groove of the ring member to the chip component holding seat. A vacuum suction type rotary index structure, characterized in that the negative pressure from the vacuum source is transmitted from the device main body side to the vacuum passage of the rotary index table through the inside of the annular member.