JPH02142152A - Manufacture of film carrier - Google Patents

Manufacture of film carrier

Info

Publication number
JPH02142152A
JPH02142152A JP29539288A JP29539288A JPH02142152A JP H02142152 A JPH02142152 A JP H02142152A JP 29539288 A JP29539288 A JP 29539288A JP 29539288 A JP29539288 A JP 29539288A JP H02142152 A JPH02142152 A JP H02142152A
Authority
JP
Japan
Prior art keywords
film
spray
paint
copper foil
film carrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP29539288A
Other languages
Japanese (ja)
Inventor
Tsukasa Chiba
千葉 司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP29539288A priority Critical patent/JPH02142152A/en
Publication of JPH02142152A publication Critical patent/JPH02142152A/en
Pending legal-status Critical Current

Links

Landscapes

  • Wire Bonding (AREA)

Abstract

PURPOSE:To make the thickness of a back-fixing coating film uniform, to prevent the occurrence of voids and to improve working efficiency to a large extent by spraying back-fixing paint on the rear surface of the copper foil of a device hole on which a semiconductor chip is mounted before etching a film carrier, and smoothing the coated surface by squeezing. CONSTITUTION:A polyimide film 1 is set in a spray device 7. Acrylic paint is supplied from a spray gun 8 by a weight falling method. A spray paint 9 is blown on a rear surface 5 of a device hole. When the spray work is finished, the film 1 is moved in the direction of an arrow A. At this time, the coated surface is in contact with a doctor bar 13 and undergoes squeezing. Thereafter, squeezing is performed with a doctor bar 14, and the perfectly smooth surface is shaped. The film is sent into a drying furnace. A fluororesin is used on the side where the spray device is in contact with the copper foil part of the film. Fluororubber is used for the side where the device is in contact with the film part, including the doctor bars. The other parts are made of metal.

Description

【発明の詳細な説明】 [産業上の利用分野1 本発明は、デープ状のフィルムに形成されたリードと半
導体チップの電極部とを多数個同時に接続するテープボ
ンディングに使用されるフィルムキャリアの製造方法に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field 1] The present invention is directed to the manufacture of a film carrier used in tape bonding for simultaneously connecting a large number of leads formed on a deep film to electrode portions of semiconductor chips. It is about the method.

[従来の技術] 半導体の実装方式どして、これまでは半導体チップとリ
ードフレームを20μr丁1〜70μl)の却!さの純
金、アルミニウム、或いは銅等のボンfイング用ワイ\
ノで、ビン数に応じて1ピンごとに自動ハンダ付すする
ワイヤボンディング方式が主流であった。どころが、半
導体チップの高集積化に伴い、リードの超多ピン化も同
様に進行し、ボンディング技術の超自動化・省力化、更
に崖導イホ実′&(パックージング)の超小型化・薄型
化も1IIL!で求められるようになっている。こうし
た半導体への厳しい要望に応える実装方式としてTAB
(テープ・オートメイテッド・ボンディング)方式が採
用されている。、rAB方式は、V板となるフィルムに
銅箔を接着後、フォト−[ツチングににり配線パターン
を形成しで作製したT A [3用フイルムキヤリアと
、半導体チップを熱11着で−・括ボンディングづるも
のである。このT A B用フィルムキャリアとして、
例えば、第4図(a)に承りように、厚さ75μmのポ
リイミドフィルム1に接着剤3を用いて銅箔2(j9さ
35μm)を接着させ、その後、銅箔2上に感光性のレ
ジスト膜を塗膜5 シ、所定のネガフィルムにより配線
パターンを露光、焼付すし、非露光部のレジストを溶解
除去し、これに、塩化銅等の腐食液を用いて、第4図(
b)に示すように、レジスト除去部分の銅をエツチング
時去してピン4(配線パターン)を形成したものが多用
されている。
[Prior Art] Up until now, semiconductor mounting methods have been based on packaging of semiconductor chips and lead frames (20 μr/1 to 70 μl)! Wire for bonding pure gold, aluminum, copper, etc.
The mainstream was the wire bonding method, which automatically soldered each pin according to the number of pins. However, as semiconductor chips become more highly integrated, the number of lead pins increases as well, leading to ultra-automated and labor-saving bonding technology, and ultra-small and thin bonding technology. Mo1IIL! It is now required by TAB is a mounting method that meets these strict demands for semiconductors.
(tape automated bonding) method is adopted. In the rAB method, copper foil is bonded to a film that will become the V plate, and then a wiring pattern is formed by photo-printing. This is a method of bulk bonding. As a film carrier for this T A B,
For example, as shown in FIG. 4(a), a copper foil 2 (J9 size: 35 μm) is adhered to a polyimide film 1 with a thickness of 75 μm using an adhesive 3, and then a photosensitive resist is applied on the copper foil 2. The film is coated with a coating film 5, and the wiring pattern is exposed and baked using a prescribed negative film, and the resist in the non-exposed areas is dissolved and removed.
As shown in b), the copper in the resist-removed portion is removed during etching to form the pin 4 (wiring pattern), which is often used.

このようにフイルムキ17す7のIIJ造に際しては多
数の■稈を必要とするが、これら工程中にはエツチング
工程の前にレジストが塗布されたデバイスホールの#4
箔の裏面に塗料を塗布する、いわゆる裏止め工程がある
In this way, a large number of culms are required for IIJ construction of the film 17 and 7, but during these steps, #4 of the device hole where resist is applied before the etching process is used.
There is a so-called backing process in which paint is applied to the back side of the foil.

第3図(a) 、 (b)はフィルムキャリアの一部断
面図及び一部平面図を示すもので1は例えばポリイミド
フィルム、2は銅箔、5はチップが塔載されるデバイス
ボールの裏面、6はスブロケツ1−穴をボす。
FIGS. 3(a) and 3(b) show a partial cross-sectional view and a partial plan view of the film carrier, in which 1 is a polyimide film, 2 is a copper foil, and 5 is the back surface of a device ball on which a chip is mounted. , 6 drills the subrokets 1-hole.

裏止め工程は上記のようにエツチング前にデバイスポー
ルの裏面5を塗料で被覆するものでこの塗膜を裏止めと
称している。
As mentioned above, in the back coating process, the back surface 5 of the device pole is coated with a paint before etching, and this coating film is called a back coating.

裏止め作業を行う場合は塗料を塗布面に滴下させて行う
ボッティング法か或いは塗料を刷毛でζ布する刷毛塗り
法の何れかの7j法が用いられる。
When performing the back-stitching work, either the botting method in which the paint is dropped onto the coating surface or the brush coating method in which the paint is applied with a brush is used.

[発明が解決しようとづ“る課題] 上jホしたようにデバイスホールの裏面に裏止めを行う
揚台はボッティング法か又は刷毛塗り法が用いられるが
、これらの方法は人々特色がある反面、いくつかの課題
がある。即ち、ボッティングの場合は作業は比較的容易
であるが効率が低い。
[Problem to be solved by the invention] As mentioned above, the botting method or the brush coating method is used to back-stack the back side of the device hole, but these methods have their own unique characteristics. On the other hand, there are some problems: Botting is relatively easy to work with, but the efficiency is low.

これを改善するには塗料滴下口をテープギヤリアの長さ
方向に多数並べて−・度に滴下すればよいが、作業性や
保守の難易を考慮すると滴下「]の数は大体10ケ所程
度が限度であり、このIMの処理速度は2−3 m 7
分で効率は依然として不」分である。
To improve this, it is possible to arrange a large number of paint dripping ports along the length of the tape gear and drip the paint at -.degree., but considering workability and difficulty in maintenance, the number of paint dripping holes should be limited to about 10. Yes, the processing speed of this IM is 2-3 m7
The efficiency is still poor.

−・方、刷毛塗りの場合は塗布速度は約5 m 7分で
ボッティングと人よりは効率がよいが塗りむらの発生が
避けられない、、塗りむらが生ずるとエツチング時に不
規則なうねりを生じてエツチング面が不均一・となり、
特に微細のパターンの場合に不良が生じ易い。
- On the other hand, when applying with a brush, the application speed is approximately 5 m/7 minutes, which is more efficient than botting and manual etching, but the occurrence of uneven coating is unavoidable. As a result, the etched surface becomes uneven.
Particularly in the case of fine patterns, defects are likely to occur.

このように両者とも改善を要Jる点が共通づる欠点とし
てボイドの発生があり、これが人きイi課題として残さ
れている。
As described above, a common drawback that requires improvement in both is the occurrence of voids, which remains an important issue.

本発明の[1的は、裏止め塗膜の非さが均一でボイドを
発生ぜず、作業効率を大幅に向トするフィルムキャリア
の製造方法を提供することにある。
An object of the present invention is to provide a method for manufacturing a film carrier in which the back coating film is uniform, does not generate voids, and greatly improves work efficiency.

1課題を解決するための手段1 本発明は、テープボンディング方式に使用されるフィル
ム4=17リアの製造方法において、エツチング時稈の
前に半導体チップを取付けるデバイスホールの銅箔の慣
面にスプレーにより裏止め塗料を塗布した後塗作面をス
キ−ジングにより平滑にすることを特徴どしてJ3す、
@1め塗膜の厚さが均一・でボイドが発生せず、効率的
に作業が行えるようにして目的の達成を計っている。
1 Means for Solving the Problem 1 The present invention is a method for manufacturing a film 4=17 rear used in a tape bonding method, in which the inertial surface of a copper foil in a device hole in which a semiconductor chip is attached is sprayed before etching. J3 is characterized by smoothing the painted surface by squeezing after applying the backing paint.
We aim to achieve our goal by ensuring that the first coating film has a uniform thickness and no voids, allowing for efficient work.

[作  用] 本発明のフィルムキャリアの製造方法ではテープキャリ
アのデバイスホール銅箔部裏面に塗料を裏止めする場合
、スプレーを用いて裏止めした後、この面を更にスキー
ジンクにより平沿にしでいるのて°、ボッディング法や
hi!l −’e mす7人に比べて塗1)契を厚さが
均一でボイドが51.住Uず、高効率で作業を行うこと
ができる。
[Function] In the method for producing a film carrier of the present invention, when coating the back surface of the device hole copper foil portion of the tape carrier, after back-tacking using a spray, this surface is further flattened with skizinc. Irinote°, bodding method and hi! 1) The coating thickness is uniform and the voids are 51. Able to work with high efficiency without having to live.

[実 施 例] 以下、本発明の−・実施例について図を用いて説明する
。第1図は本発明のノ、Cルムキャリアの製造方法を適
用づるスプレー装置の−・実施例を示り縦断面図で、7
はスプレー装置、8はスプレーガン、9はスプレー塗料
、10はスプレー及びスキージンク室、11はスキージ
ンク室、12a。
[Examples] Examples of the present invention will be described below with reference to the drawings. FIG. 1 is a vertical sectional view showing an embodiment of a spray device to which the method of manufacturing a C lum carrier of the present invention is applied.
1 is a spray device, 8 is a spray gun, 9 is a spray paint, 10 is a spray and ski zinc chamber, 11 is a ski zinc chamber, and 12a.

121)はスプレー装@7内に充満した溶剤の蒸気又は
空気のり1気口、13及び17Iはドクターバーを示す
121) indicates one vent of solvent vapor or air filled in the spray device @7, and 13 and 17I indicate doctor bars.

第2図は第1図の装置を上方からみた一L面断面図で、
ポリイミドフィルム1は第3図(b)の揚台と同一のも
のである。
Figure 2 is a cross-sectional view of the device shown in Figure 1, viewed from above.
The polyimide film 1 is the same as the platform shown in FIG. 3(b).

両図でポリイミドフィルム11よ厚さ125μm1幅3
5mmでこれに厚さ35μm、幅25Hの銅箔をTボキ
シ系接着剤で接着しである。デバイスホールの裏FRI
5の寸法は−・辺が8#のi1方形で、スブ[]ケケラ
ト6のNj法は−・辺が2qmの正方形である。
In both figures, polyimide film 11, thickness 125 μm, width 3
5 mm, and a copper foil with a thickness of 35 μm and a width of 25 H is adhered to this using a T-box adhesive. FRI behind device hole
The dimensions of 5 are -. i1 rectangle with 8# sides, and the Nj method of Subu [] Kekerat 6 is -. a square with 2 qm sides.

このスプレー[1を動作させる場合は両図に示すように
ポリイミドフィルム1をスプレー装置7にヒツトし、ス
プレーガン8からデバイスホール裏面5にスプレー塗料
9を吹(=t jjる。この場合、スプレーガン8には
ノズル径0.2mrs1空気使用&tlOI)/分で俤
料哨04d!:M/分のものを使用し塗料にはアクリル
系塗料を用いこれを重量落下方式で供給した。
When operating this spray [1, as shown in both figures, the polyimide film 1 is applied to the spray device 7, and the spray paint 9 is sprayed from the spray gun 8 onto the back surface 5 of the device hole. Gun 8 has a nozzle diameter of 0.2 mrs 1 air usage & tlOI)/min and a charge of 04 d! : M/min, and an acrylic paint was used as the paint, which was supplied by weight drop method.

スプレー作業が終了するとポリイミドフィルム1は矢印
へ方向に移動するが、この時塗布面はドクターパー13
と接してスキージンクされた後、再びドクターパー14
でスキージンクされて完全な平滑面に整形され次工程の
乾燥炉に送られる。
When the spraying work is finished, the polyimide film 1 moves in the direction of the arrow, but at this time the coated surface is
Dr. Par 14 again after being skijinked in contact with
It is then skizinced and shaped into a completely smooth surface before being sent to the next process, a drying oven.

ポリイミドフィルム1が移動する場合、スプレー装置が
フィルムの銅茫部と接する側には一ノッ素樹脂を用い、
フィルム部と接する側にはドクターパーを含めフッ素ゴ
ムを用いた。その他の部分は金属製である。
When the polyimide film 1 is moved, a mono-nitrogen resin is used on the side where the spray device contacts the copper tin part of the film.
Fluororubber was used on the side in contact with the film part, including the doctor pad. Other parts are made of metal.

このようにしてデバイスホール裏面に10m/分の速度
で裏止めを行った。その結果ボイドが発生せず塗膜のj
9さが均一であることが認められた。
In this way, the back surface of the device hole was back-stacked at a speed of 10 m/min. As a result, no voids occur and the coating film
9 was found to be uniform.

又宋lトめ後エツチングを試みたが良好な結果が得られ
た。
I also tried etching after finishing the process, and good results were obtained.

スプレー装置内はIJI気IJ12a、12bJ:り室
内の空気を絶えずl[気しているので塗布面に)15旧
を生じない。又スプレー作業が完了した侵はスプレーガ
ン8よりシンノ゛−を吹イ」けることにより室内の清掃
を行うことができる。
The interior of the spray device is constantly ventilated with the air inside the room to prevent air from forming on the surface to be coated. Moreover, when the spraying work is completed, the interior of the room can be cleaned by blowing out the spray gun 8.

し発明の効果1 以上述べたように本発明によれば次のような効果が1q
られる。
Effects of the Invention 1 As described above, according to the present invention, the following effects can be achieved by 1q.
It will be done.

(1)  裏止め塗膜にボイドが発生I!ヂ11ノさが
均一で安定したエツチングを行うことができる。
(1) Voids occur in the backing coating I! It is possible to perform stable etching with uniform thickness.

(2)作業効率を大幅に向上することができる。(2) Work efficiency can be significantly improved.

(3)品質並びに作業効率の向上により製品の原価低減
を計ることかぐきる。
(3) Aim to reduce product costs by improving quality and work efficiency.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のフィルムキャリアの製)開方ン入に用
いられるスプレー装置ぎの−・実施例を示す縦断面図、
第2図は第1図の上面断面図、第3図はフィルムキャリ
アの部分断面図及び」−面図、第4図はフィルムキャリ
アの説明図である。 1:フィルムキャリア、 2:銅a5. 5:デバイスホール裏面。 7:スプレー装置、 8ニスプレーガン、 13.14.:ドクターバー 第 2 口 2:4F;I’t  Sニーiハsスtf−、−、し裏
面6t/、+ 完 (α)
FIG. 1 is a longitudinal cross-sectional view showing an embodiment of a spray device used for opening the film carrier of the present invention;
2 is a top sectional view of FIG. 1, FIG. 3 is a partial sectional view and a side view of the film carrier, and FIG. 4 is an explanatory diagram of the film carrier. 1: Film carrier, 2: Copper a5. 5: Back side of device hole. 7: Spray equipment, 8 Varnish spray gun, 13.14. : Doctor bar 2nd opening 2: 4F; I't S knee i hasst tf -, -, back side 6t/, + complete (α)

Claims (1)

【特許請求の範囲】[Claims] 1、フィルムキャリアの基材となる絶縁性のプラスチッ
クフィルムの全面に配線導体用の銅箔を粘着した後、該
銅箔とエッチングして所望の配線導体を形成するフィル
ムキャリアの製造方法において、該フィルムキャリアを
エッチングする前に、半導体チップを搭載するデバイス
ホールの銅箔の裏面にスプレーにより裏止め塗料を塗布
した後、該塗布面をスキージンクにより平滑にすること
を特徴とするフィルムキャリアの製造方法。
1. A method for producing a film carrier in which a copper foil for a wiring conductor is adhered to the entire surface of an insulating plastic film serving as a base material of the film carrier, and then the copper foil is etched to form a desired wiring conductor. Production of a film carrier characterized in that, before etching the film carrier, a backing paint is applied by spraying to the back side of the copper foil of the device hole in which the semiconductor chip is mounted, and then the applied surface is smoothed by skizinc. Method.
JP29539288A 1988-11-22 1988-11-22 Manufacture of film carrier Pending JPH02142152A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29539288A JPH02142152A (en) 1988-11-22 1988-11-22 Manufacture of film carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29539288A JPH02142152A (en) 1988-11-22 1988-11-22 Manufacture of film carrier

Publications (1)

Publication Number Publication Date
JPH02142152A true JPH02142152A (en) 1990-05-31

Family

ID=17820025

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29539288A Pending JPH02142152A (en) 1988-11-22 1988-11-22 Manufacture of film carrier

Country Status (1)

Country Link
JP (1) JPH02142152A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05114673A (en) * 1991-10-23 1993-05-07 Nikko Kyodo Co Ltd Back fixing agent for manufacturing tab tape carrier

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05114673A (en) * 1991-10-23 1993-05-07 Nikko Kyodo Co Ltd Back fixing agent for manufacturing tab tape carrier

Similar Documents

Publication Publication Date Title
US6306685B1 (en) Method of molding a bump chip carrier and structure made thereby
JPH05185762A (en) Mask for creamy solder printing and soldering method of electric component using the mask
JP2007260993A (en) Screen printing equipment
JPH02142152A (en) Manufacture of film carrier
JPH0621625A (en) Printed wiring board and manufacture thereof
JP4185821B2 (en) Method of solder coating on wiring board
JPH0883875A (en) Dry plating method for lead frame
JP2002057453A (en) Repairing method of semiconductor device
JP2833759B2 (en) Manufacturing method of printed wiring board
JPH0760881B2 (en) Solder application method for semiconductor devices
JPH04304640A (en) Semiconductor device and manufacture thereof
JP3304141B2 (en) Method of coating highly viscous material and coating device
US2356588A (en) Dry rectifier device
JP3287855B2 (en) Circuit pattern coating method
JP2944523B2 (en) Manufacturing method of printed wiring board
JPS60120540A (en) Forming method of bump electrode
JP4005077B2 (en) Manufacturing method of semiconductor device and coating method of viscous liquid
JP3891048B2 (en) Manufacturing method of module parts and masking chip used therefor
JP3314690B2 (en) TAB (Tape Automated Bonding) film carrier manufacturing equipment
JPS6191388A (en) Plating method
JPH07161721A (en) Method of flattening thick film resist
JP2004071873A (en) Flux coating device and manufacturing method of semiconductor device
JPS6262548A (en) Manufacture of lead frame of ic
JPH04269817A (en) Manufacture of chip type solid electrolytic capacitor
JPH0831675B2 (en) Solder-resist coating method for printed wiring board