JPH02140851U - - Google Patents
Info
- Publication number
- JPH02140851U JPH02140851U JP4893389U JP4893389U JPH02140851U JP H02140851 U JPH02140851 U JP H02140851U JP 4893389 U JP4893389 U JP 4893389U JP 4893389 U JP4893389 U JP 4893389U JP H02140851 U JPH02140851 U JP H02140851U
- Authority
- JP
- Japan
- Prior art keywords
- etched
- wafer process
- protective film
- manufacturing process
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 claims description 5
- 230000007547 defect Effects 0.000 claims description 5
- 238000002161 passivation Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 claims 4
- 238000004519 manufacturing process Methods 0.000 claims 2
- 230000001681 protective effect Effects 0.000 claims 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 238000011156 evaluation Methods 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 229910052710 silicon Inorganic materials 0.000 claims 1
- 239000010703 silicon Substances 0.000 claims 1
- 238000009792 diffusion process Methods 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4893389U JPH02140851U (enrdf_load_stackoverflow) | 1989-04-27 | 1989-04-27 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4893389U JPH02140851U (enrdf_load_stackoverflow) | 1989-04-27 | 1989-04-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02140851U true JPH02140851U (enrdf_load_stackoverflow) | 1990-11-26 |
Family
ID=31566184
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4893389U Pending JPH02140851U (enrdf_load_stackoverflow) | 1989-04-27 | 1989-04-27 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02140851U (enrdf_load_stackoverflow) |
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1989
- 1989-04-27 JP JP4893389U patent/JPH02140851U/ja active Pending