JPH0213736B2 - - Google Patents

Info

Publication number
JPH0213736B2
JPH0213736B2 JP56214949A JP21494981A JPH0213736B2 JP H0213736 B2 JPH0213736 B2 JP H0213736B2 JP 56214949 A JP56214949 A JP 56214949A JP 21494981 A JP21494981 A JP 21494981A JP H0213736 B2 JPH0213736 B2 JP H0213736B2
Authority
JP
Japan
Prior art keywords
neutron
ray
gamma
gamma ray
image detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56214949A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58113842A (ja
Inventor
Nobuo Wada
Noboru Tachikawa
Shigemasa Enomoto
Masataka Muraki
Tomio Yasui
Yoshimichi Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP56214949A priority Critical patent/JPS58113842A/ja
Publication of JPS58113842A publication Critical patent/JPS58113842A/ja
Publication of JPH0213736B2 publication Critical patent/JPH0213736B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP56214949A 1981-12-28 1981-12-28 ラジオグラフィー装置 Granted JPS58113842A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56214949A JPS58113842A (ja) 1981-12-28 1981-12-28 ラジオグラフィー装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56214949A JPS58113842A (ja) 1981-12-28 1981-12-28 ラジオグラフィー装置

Publications (2)

Publication Number Publication Date
JPS58113842A JPS58113842A (ja) 1983-07-06
JPH0213736B2 true JPH0213736B2 (enrdf_load_stackoverflow) 1990-04-05

Family

ID=16664224

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56214949A Granted JPS58113842A (ja) 1981-12-28 1981-12-28 ラジオグラフィー装置

Country Status (1)

Country Link
JP (1) JPS58113842A (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0617905B2 (ja) * 1986-12-26 1994-03-09 三島製紙株式会社 紙のワイヤーマークの光学的測定法
US5557108A (en) * 1993-10-25 1996-09-17 T+E,Uml U+Ee Mer; T+E,Uml U+Ee May O. Integrated substance detection and identification system
US5519225A (en) * 1994-10-03 1996-05-21 General Electric Company System and method for using a dual modality detector for inspecting objects
JPH11271453A (ja) * 1998-03-25 1999-10-08 Toshiba Corp 放射線弁別測定方法および放射線弁別測定装置
CN101128731A (zh) * 2004-10-05 2008-02-20 澳联邦科学与工业研究组织 射线照相设备
WO2024018249A1 (en) * 2022-07-22 2024-01-25 Photonis France Dual neutron and x ray imaging

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5622941A (en) * 1979-08-01 1981-03-04 Hitachi Ltd Moisture measuring method

Also Published As

Publication number Publication date
JPS58113842A (ja) 1983-07-06

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