JPH02130476A - Ic clip - Google Patents
Ic clipInfo
- Publication number
- JPH02130476A JPH02130476A JP63285397A JP28539788A JPH02130476A JP H02130476 A JPH02130476 A JP H02130476A JP 63285397 A JP63285397 A JP 63285397A JP 28539788 A JP28539788 A JP 28539788A JP H02130476 A JPH02130476 A JP H02130476A
- Authority
- JP
- Japan
- Prior art keywords
- terminals
- contact
- measurement
- measuring
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims abstract description 18
- 239000000523 sample Substances 0.000 abstract description 5
- 238000012360 testing method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 2
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野］
本発明は集積回路（以下ＩＣという］の電気的特性の検
査を行なうための試験用部品に関し、特にクリップ形式
で測定点から測定器に信号全能率よ〈確冥に接続するＩ
Ｃクリップに関する。[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to a test component for testing the electrical characteristics of an integrated circuit (hereinafter referred to as IC), and particularly relates to a test component for testing the electrical characteristics of an integrated circuit (hereinafter referred to as IC). Omnipotence, I connect to the true spirit
Regarding C clip.
（従来の技術Ｊ
従来、この糧のＩＣクリップは、第３図に示すように相
対して２列に並んだＩＣの端子に接触させる接触端子２
．２・・・２が設けられている。(Prior art J) Conventionally, this type of IC clip has two contact terminals that are brought into contact with terminals of ICs arranged in two rows facing each other, as shown in FIG.
．． 2...2 are provided.
ＩＣクリップの両側面に取りつけられたクリップ部１．
１のつまみ部６．６を近づけるようにスプリング７．７
の反発力に抗して押して先端部を開いて被測定ＩＣにセ
ットしたとき、接触端子２．２・・・２のおのおのと電
気的に接続されている測定端子３．３・・・３のそれぞ
れがＩＣ波形などの測定されるべき観測点に対応する。Clip parts 1 attached to both sides of the IC clip.
Spring 7.7 to bring the knob 6.6 of 1 closer together.
When the tip is opened by pushing against the repulsive force of the IC and set on the IC to be measured, the contact terminals 3.3... Each corresponds to an observation point to be measured, such as an IC waveform.
そこで、ＩＣの側足を行なうとき、測定端子３．３・・
・３のなかから被観測点に対応するものを選んで一つず
つプローブで当っていた。Therefore, when measuring the side legs of the IC, the measurement terminals 3.3...
・We selected the ones corresponding to the observed points from among the three and hit them one by one with the probe.
（発明が解決しようとする課題〕
上述した従来のＩＣクリップは、測定するとき、観測点
く対応する測定端子のビンにプローブ七−つずつ押し当
てて測定しなければならない。(Problems to be Solved by the Invention) When measuring with the above-mentioned conventional IC clip, it is necessary to press seven probes at a time to the bins of the measurement terminals corresponding to the observation points.
このような手作業は繁雑であり、また誤って端子と端子
の間を短絡させ、被測定ＩＣ１！を破損することが多い
という欠点がある。Such manual work is tedious and may result in a short circuit between the terminals by mistake, causing the IC1 under test! The disadvantage is that it is often damaged.
本発明の目的は、このような欠点を鱗消し、測定端子に
いちいちプローブを当てないで、スイッチの切換えで済
ませることＫよって端子関知略の事故を防ぐようにした
ＩＣクリップを提供することにある。It is an object of the present invention to eliminate such drawbacks and provide an IC clip that eliminates the need to apply a probe to each measurement terminal by simply switching a switch, thereby preventing terminal mishaps. .
（味題を解決するための手段）
前記の目的を達成するため、本発明のＩＣクリップは、
任意の端子の入出力信号を取り出すため測定されるべき
集積回路の端子に接触させる複数の接＠端子２．２・・
・２を有する集積回路用測定具において、測定器に接続
される複数の測定端子３ａ 、３ｂと、接Ｉ！Ｒ端子２
．２・２と測定端子３ａ、３ｂの開音切換えて接続する
複数のロータリスイッチ４ａ、４ｂをＪする構造とする
。(Means for solving the problem) In order to achieve the above object, the IC clip of the present invention has the following features:
A plurality of contacts @terminals 2.2... which are brought into contact with the terminals of the integrated circuit to be measured in order to extract the input/output signals of any terminals.
・A measuring device for integrated circuits having a plurality of measuring terminals 3a, 3b connected to the measuring device, and a contact I! R terminal 2
．． The structure is such that a plurality of rotary switches 4a, 4b are connected to open/close the measurement terminals 3a, 3b.
（実施例） つぎに１本発明について図面を参照して説明する。(Example) Next, one aspect of the present invention will be explained with reference to the drawings.
第１図は、本発明の一実施例を示し、同図（ａ）は正面
図、同図（ｂ）は右側面図である。FIG. 1 shows an embodiment of the present invention, with FIG. 1(a) being a front view and FIG. 1(b) being a right side view.
第２図は、第１図の実施例の配線例を示す回路図である
。FIG. 2 is a circuit diagram showing a wiring example of the embodiment of FIG. 1.
第１図に示すように、本実施例の正面と裏面にロータリ
スイッチ４８ 、４ ｋｌ備えている。As shown in FIG. 1, rotary switches 48 and 4 kl are provided on the front and back surfaces of this embodiment.
被測定ＩＣの端子ＰＩ、Ｐ２．Ｐ３°、、、、、 Ｐ
ｎに接触させる接触端子２．２−・・２は従来同様の構
造で設けられ、第２図に示すようにロータリスイッチ４
ａ、４ｂｆ）被選択端子にリード線５゜５・・・５で接
続されている。Terminals PI, P2 of the IC under test. P3°, ,,, P
The contact terminals 2.2-...2 to be brought into contact with n are provided in the same structure as the conventional ones, and as shown in FIG.
a, 4bf) Connected to the selected terminal with lead wires 5°5...5.
ロータリスイッチ４ａと４ｂの選択端子は、第２図に示
すように測定端子３ａと３ｂのそれぞれに接続されてい
る。The selection terminals of the rotary switches 4a and 4b are connected to the measurement terminals 3a and 3b, respectively, as shown in FIG.
測定する場合は、測定端子３ａ、３ｂを図示しない測定
器の入力端子に接続し、クリップ部１．１のつまみ部６
．６″’にスプリング７．７の反発力に抗して押し、ク
リップ部１と１の先端部を開いて被測定ＩＣにセットす
る。When measuring, connect the measurement terminals 3a and 3b to the input terminals of a measuring device (not shown), and
．． 6'' against the repulsive force of the spring 7.7, open the tips of the clip parts 1 and 1, and set them on the IC to be measured.
あとは、ロータリスイッチ４ａ、４ｂｔ切換えて任意の
測定点を選択し測定すればよい。All that is left to do is to switch the rotary switches 4a and 4b to select an arbitrary measurement point and measure it.
（発明の効果）
以上説明したように本発明は、ロータリスイッチを設け
、被測定ＩＣの端子に接触させた接触端子と測定器に接
続されている測定端子の間の接続をロータリスイッチに
より切り換えることにより、プローブでいちいち測定端
子に当てることなく測定することができるので、複雑な
手作業が不要となり、また測定端子のピン間を誤って知
略させるおそれがないという効果がある。(Effects of the Invention) As explained above, the present invention provides a rotary switch, and uses the rotary switch to switch the connection between the contact terminal brought into contact with the terminal of the IC to be measured and the measurement terminal connected to the measuring device. This makes it possible to perform measurements without touching the measurement terminals one by one with a probe, which eliminates the need for complicated manual work and has the effect that there is no risk of mistakenly knowing the distance between the pins of the measurement terminals.
第１図は、本発明の一実施例を示す正面図および右側面
図である。
第２図は、第１囚の実施例の配線例七示す回路図である
。
第３図は、従来のｌＣクリップｆｆ１Ｊを示す正面図で
ある。
ｌ・・・クリップ！！Ｂ ２・・・接触端子３ａ、
３ｂ”−測定端子
４ａ、４ｂ・・・ロータリスイッチ
５・・・リード１１ ６・・・クリップのつまみ部７・
・・スプリングFIG. 1 is a front view and a right side view showing an embodiment of the present invention. FIG. 2 is a circuit diagram showing seven wiring examples of the first embodiment. FIG. 3 is a front view showing a conventional IC clip ff1J. l...clip! ! B2... Contact terminal 3a,
3b”-Measurement terminals 4a, 4b...Rotary switch 5...Lead 11 6...Clip knob 7.
··spring
Claims (1)
集積回路の端子に接触させる複数の接触端子を有する集
積回路用測定具において、測定器に接続される複数の測
定端子と、前記接触端子と前記測定端子の間を切換えて
接続する複数のロータリスイッチを有することを特徴と
するＩＣクリップ。A measuring device for integrated circuits having a plurality of contact terminals that are brought into contact with terminals of an integrated circuit to be measured in order to extract input/output signals of arbitrary terminals, the plurality of measurement terminals connected to the measuring instrument, the contact terminals An IC clip comprising a plurality of rotary switches that switch between and connect the measurement terminals.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63285397A JPH02130476A (en) | 1988-11-11 | 1988-11-11 | Ic clip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63285397A JPH02130476A (en) | 1988-11-11 | 1988-11-11 | Ic clip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02130476A true JPH02130476A (en) | 1990-05-18 |
Family
ID=17691004
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63285397A Pending JPH02130476A (en) | 1988-11-11 | 1988-11-11 | Ic clip |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02130476A (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6148420A (en) * | 1984-08-17 | 1986-03-10 | Showa Denko Kk | Purification of silane |
-
1988
- 1988-11-11 JP JP63285397A patent/JPH02130476A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6148420A (en) * | 1984-08-17 | 1986-03-10 | Showa Denko Kk | Purification of silane |
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