JPH02128969U - - Google Patents
Info
- Publication number
- JPH02128969U JPH02128969U JP3766589U JP3766589U JPH02128969U JP H02128969 U JPH02128969 U JP H02128969U JP 3766589 U JP3766589 U JP 3766589U JP 3766589 U JP3766589 U JP 3766589U JP H02128969 U JPH02128969 U JP H02128969U
- Authority
- JP
- Japan
- Prior art keywords
- test
- device under
- unit
- under test
- dsp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3766589U JPH02128969U (enExample) | 1989-03-31 | 1989-03-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3766589U JPH02128969U (enExample) | 1989-03-31 | 1989-03-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02128969U true JPH02128969U (enExample) | 1990-10-24 |
Family
ID=31544985
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3766589U Pending JPH02128969U (enExample) | 1989-03-31 | 1989-03-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02128969U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9201750B2 (en) | 2012-03-01 | 2015-12-01 | Advantest Corporation | Test apparatus and test module |
-
1989
- 1989-03-31 JP JP3766589U patent/JPH02128969U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9201750B2 (en) | 2012-03-01 | 2015-12-01 | Advantest Corporation | Test apparatus and test module |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH02128969U (enExample) | ||
| JPS6447148U (enExample) | ||
| JPH0230061U (enExample) | ||
| JPS6226035U (enExample) | ||
| JPS6291588U (enExample) | ||
| JPH0463085U (enExample) | ||
| JPS63106138U (enExample) | ||
| Ellison | Robot-based electrostatic field measurement system | |
| JPS6354076U (enExample) | ||
| JPS638551U (enExample) | ||
| JPS6457178A (en) | Method for testing electric connection circuitry | |
| JPS6098042U (ja) | 簡易引張圧縮試験機 | |
| JPH0216076U (enExample) | ||
| JPH02675U (enExample) | ||
| JPH01152216U (enExample) | ||
| JPS6399278U (enExample) | ||
| JPS6234384U (enExample) | ||
| JPS5987684U (ja) | 半導体素子の測定装置 | |
| JPH04343443A (ja) | 半導体装置テストシステム | |
| JPS6284839U (enExample) | ||
| JPH0344672U (enExample) | ||
| JPH01157428U (enExample) | ||
| JPH0289507U (enExample) | ||
| JPS646044U (enExample) | ||
| JPH04120143U (ja) | 自動試験装置用供試体シミユレータ |