JPS6457178A - Method for testing electric connection circuitry - Google Patents

Method for testing electric connection circuitry

Info

Publication number
JPS6457178A
JPS6457178A JP62212817A JP21281787A JPS6457178A JP S6457178 A JPS6457178 A JP S6457178A JP 62212817 A JP62212817 A JP 62212817A JP 21281787 A JP21281787 A JP 21281787A JP S6457178 A JPS6457178 A JP S6457178A
Authority
JP
Japan
Prior art keywords
contact element
capacity
issued
change
order
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62212817A
Other languages
Japanese (ja)
Inventor
Hideyuki Sumiyoshi
Akira Busujima
Izumi Namita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Via Mechanics Ltd
Original Assignee
Hitachi Seiko Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Seiko Ltd filed Critical Hitachi Seiko Ltd
Priority to JP62212817A priority Critical patent/JPS6457178A/en
Publication of JPS6457178A publication Critical patent/JPS6457178A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To increase an inspection speed, by using a plurality of probes in measuring electrostatic capacity. CONSTITUTION:A control computer 15 successively issues a moving order to X-Y positioning apparatuses 10, 11 and outputs a change-over order to a contact element change-over apparatus 14 to perform the change-over of a contact element and the capacity of a capacity measuring apparatus 13 is measured by a contact element 6 already moved to a predetermined position. After the measuring time, a moving order is issued to the apparatus 10 and a change-over order is issued to the apparatus 14 to perform the measurement of the capacity of the apparatus 13 due to the other already moved contact element 7. In the same way, after said measuring time, a moving order is issued to the apparatus 11 while a change-over order is issued to the apparatus 14 to perform the measurement of capacity due to the contact element 6. After said measuring time, a moving order is issued to the apparatus 10 while a change-over order is issued to the apparatus 14 so as to measure the capacity by the other contact element 7. By measuring capacity by one contact element when the other contact element is moved, an inspection time can be shortened.
JP62212817A 1987-08-28 1987-08-28 Method for testing electric connection circuitry Pending JPS6457178A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62212817A JPS6457178A (en) 1987-08-28 1987-08-28 Method for testing electric connection circuitry

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62212817A JPS6457178A (en) 1987-08-28 1987-08-28 Method for testing electric connection circuitry

Publications (1)

Publication Number Publication Date
JPS6457178A true JPS6457178A (en) 1989-03-03

Family

ID=16628848

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62212817A Pending JPS6457178A (en) 1987-08-28 1987-08-28 Method for testing electric connection circuitry

Country Status (1)

Country Link
JP (1) JPS6457178A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002023206A1 (en) * 2000-09-11 2002-03-21 Oht Inc. Inspection device and inspection method
US7049826B2 (en) 2000-09-11 2006-05-23 Oht Inc. Inspection device and inspection method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002023206A1 (en) * 2000-09-11 2002-03-21 Oht Inc. Inspection device and inspection method
US7049826B2 (en) 2000-09-11 2006-05-23 Oht Inc. Inspection device and inspection method

Similar Documents

Publication Publication Date Title
CN105372499B (en) A kind of microresistivity survey equipment and measuring method
EP0309956A3 (en) Method of testing semiconductor elements and apparatus for testing the same
DE3778484D1 (en) APPARATUS FOR MEASURING A CRYSTAL DIAMETER.
GB2067762B (en) Process and apparatus for fixing measuring range limits for tests on a tooth-flank tester
ZA7793B (en) A pneumatic drive device for a probe particularly an eddy current measuring probe
US6008660A (en) Method for developing circuit capacitance measurements corrected for stray capacitance
JPS6457178A (en) Method for testing electric connection circuitry
WO1994011745B1 (en) Method and apparatus for measuring film thickness
JPS5378859A (en) Automatic measuring and testing system
GB2201516B (en) Process and apparatus for testing a lambda measuring probe
MY131359A (en) Method and apparatus for zero force part placement
JPS5337077A (en) Probe for tester
FR2613079B1 (en) APPARATUS FOR AUTOMATICALLY TESTING ELECTRONIC CIRCUITS AND MEASURING TIME
JPS5232359A (en) Method and apparatus for inspecting gears
JPS5758328A (en) Probe sensing device
JPS5322757A (en) Testing apparatus of electric a ppliances
JPS5370483A (en) Flaw inspecting device for slender tube
JPS5683045A (en) Wafer probe
JPS5773948A (en) Contact type testing method and tester
ATE5920T1 (en) PROCEDURE FOR LOCATING EARTH FAULTS IN LINES.
SU387820A1 (en) METHOD OF CHECKING DYNAMIC ACCURACY OF ACTIVE CONTROL SYSTEMS
KR200164420Y1 (en) Straightness measuring device for parts
JPS5544975A (en) Tester for h-shaped steel
JPS5756701A (en) Method for measuring v groove
JPS6473267A (en) Test data generation system for lsi