JPS6457178A - Method for testing electric connection circuitry - Google Patents
Method for testing electric connection circuitryInfo
- Publication number
- JPS6457178A JPS6457178A JP62212817A JP21281787A JPS6457178A JP S6457178 A JPS6457178 A JP S6457178A JP 62212817 A JP62212817 A JP 62212817A JP 21281787 A JP21281787 A JP 21281787A JP S6457178 A JPS6457178 A JP S6457178A
- Authority
- JP
- Japan
- Prior art keywords
- contact element
- capacity
- issued
- change
- order
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
PURPOSE:To increase an inspection speed, by using a plurality of probes in measuring electrostatic capacity. CONSTITUTION:A control computer 15 successively issues a moving order to X-Y positioning apparatuses 10, 11 and outputs a change-over order to a contact element change-over apparatus 14 to perform the change-over of a contact element and the capacity of a capacity measuring apparatus 13 is measured by a contact element 6 already moved to a predetermined position. After the measuring time, a moving order is issued to the apparatus 10 and a change-over order is issued to the apparatus 14 to perform the measurement of the capacity of the apparatus 13 due to the other already moved contact element 7. In the same way, after said measuring time, a moving order is issued to the apparatus 11 while a change-over order is issued to the apparatus 14 to perform the measurement of capacity due to the contact element 6. After said measuring time, a moving order is issued to the apparatus 10 while a change-over order is issued to the apparatus 14 so as to measure the capacity by the other contact element 7. By measuring capacity by one contact element when the other contact element is moved, an inspection time can be shortened.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62212817A JPS6457178A (en) | 1987-08-28 | 1987-08-28 | Method for testing electric connection circuitry |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62212817A JPS6457178A (en) | 1987-08-28 | 1987-08-28 | Method for testing electric connection circuitry |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6457178A true JPS6457178A (en) | 1989-03-03 |
Family
ID=16628848
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62212817A Pending JPS6457178A (en) | 1987-08-28 | 1987-08-28 | Method for testing electric connection circuitry |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6457178A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002023206A1 (en) * | 2000-09-11 | 2002-03-21 | Oht Inc. | Inspection device and inspection method |
US7049826B2 (en) | 2000-09-11 | 2006-05-23 | Oht Inc. | Inspection device and inspection method |
-
1987
- 1987-08-28 JP JP62212817A patent/JPS6457178A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002023206A1 (en) * | 2000-09-11 | 2002-03-21 | Oht Inc. | Inspection device and inspection method |
US7049826B2 (en) | 2000-09-11 | 2006-05-23 | Oht Inc. | Inspection device and inspection method |
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