JPH02119284A - Formation of protective film for semiconductor laser end face - Google Patents

Formation of protective film for semiconductor laser end face

Info

Publication number
JPH02119284A
JPH02119284A JP27363388A JP27363388A JPH02119284A JP H02119284 A JPH02119284 A JP H02119284A JP 27363388 A JP27363388 A JP 27363388A JP 27363388 A JP27363388 A JP 27363388A JP H02119284 A JPH02119284 A JP H02119284A
Authority
JP
Japan
Prior art keywords
protective film
semiconductor laser
light emitting
face
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP27363388A
Other languages
Japanese (ja)
Inventor
Kiyoshi Ito
潔 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP27363388A priority Critical patent/JPH02119284A/en
Publication of JPH02119284A publication Critical patent/JPH02119284A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/028Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To prevent creeping of a protective film to a mount surface without a rectangular jig to be inserted between semiconductor laser bars by closely arranging a plurality of semiconductor bars with the light emitting end face tilted and up on a flat supporting base and by depositing an insulating film. CONSTITUTION:Fixing jigs 3a, 3b are provided with an inclination of about 12 deg., and a plurality of semiconductor laser bars 1 are inserted therebetween in lamination with an electrode 6a at a side of a light emitting region 5 on the left side and fixed to a flat supporting base 4. A protective film is formed to an upper end side 7a on the semiconductor laser bar from an upper part through sputtering, etc. Then, a protective film is formed with a lower end side 7b up. According to this constitution, a protective film of a uniform film thickness can be formed all over the end side, thereby preventing creeping of the protective film on a mount surface.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体レーザーの光出射端面に保護膜を形成
する方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method of forming a protective film on a light emitting end face of a semiconductor laser.

〔従来の技術〕[Conventional technology]

一般に半導゛体し−ザーは、第4図に示すように、幅3
00μm、共振器長300μm、厚さ100μm程度の
直方体である0発光領域5は片側の電極6aより10μ
m以内の所にあり、光出射端面(以下端面と記す>7a
および7bには、表面の酸化を防止するため、5i02
等の保護膜が形成される。保護膜の厚さは、例えば、膜
の屈折率をn、レーザーの波長をλとして、λ/ 2 
n等、所定の厚さに決められる。この保護膜の形成は、
−mに第5図に示すように半導体レーザーが横方向につ
ながったペレッタイズされる前の長さ2cm程度のバー
の状態で行う。
Generally, semiconductor lasers have a width of 3 mm, as shown in Figure 4.
The light emitting region 5, which is a rectangular parallelepiped with a cavity length of 300 μm and a thickness of about 100 μm, is 10 μm away from the electrode 6a on one side.
m, and the light emitting end face (hereinafter referred to as end face) >7a
and 7b contains 5i02 to prevent surface oxidation.
A protective film such as the following is formed. The thickness of the protective film is, for example, λ/2 where the refractive index of the film is n and the wavelength of the laser is λ.
The thickness is determined to be a predetermined value, such as n. The formation of this protective film is
-m, as shown in FIG. 5, a bar with a length of about 2 cm before being pelletized is formed with semiconductor lasers connected in the horizontal direction.

従来の保護膜形成方法を第3図に示す0図から分かるよ
うに、従来の方法では、半導体レーザーが複数連なった
半導体レーザーバー1とバーの長さと同程度か少し長い
直方体治具2とを交互に複数個重ね合せ、その両端を固
定用治具3で挟み込み平面支持台4に固定し、平面支持
台に対して垂直上方よりスパッタ等によって保護膜を形
成していた。このとき、半導体レーザーバー1の発光領
域側の電極6aに接する直方体治具2の高さがバー状の
半導体レーザーの共振器長よりわずかでも高いと発光領
域近傍の膜厚が所定の厚さに達しなくなる。また逆に半
導体レーザーバー1の方が直方体治具2よりも高すぎる
と、電極部に膜がまわり込み、半導体レーザーの放熱を
悪化させたり、ヒートシンクへのマウントやワイヤーボ
ンディングのさまたげとなる。従って、直方体治具2は
第3図の如く半導体レーザーバー1よりも10〜20μ
m高さの低いものが使用されている。
As can be seen from Figure 3, which shows the conventional method for forming a protective film, in the conventional method, a semiconductor laser bar 1 in which a plurality of semiconductor lasers are connected and a rectangular parallelepiped jig 2 that is about the same length or slightly longer than the bar are used. A plurality of them were stacked alternately, and both ends thereof were sandwiched between fixing jigs 3 and fixed to a flat support base 4, and a protective film was formed by sputtering or the like from perpendicularly above the flat support base. At this time, if the height of the rectangular parallelepiped jig 2 in contact with the electrode 6a on the light emitting region side of the semiconductor laser bar 1 is even slightly higher than the resonator length of the bar-shaped semiconductor laser, the film thickness near the light emitting region will be reduced to a predetermined thickness. will not reach it. On the other hand, if the semiconductor laser bar 1 is too high than the rectangular parallelepiped jig 2, the film wraps around the electrode portion, worsening the heat dissipation of the semiconductor laser and hindering mounting on a heat sink and wire bonding. Therefore, the rectangular parallelepiped jig 2 is 10 to 20μ smaller than the semiconductor laser bar 1 as shown in FIG.
Those with a low m height are used.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の端面保護膜形成方法を用いた場合以下に
示す問題が生じる。第1に、バー状の半導体レーザーの
共振器長は、壁間時のばらつきにより±10μm程度の
ばらつきをもつ。このため、前述したように所定の膜厚
を確保しつつ、できるだけ電極側へのまわり込みを防止
するため、高さの異る数種の直方体治具を用意し、個々
の半導体レーザーバーに合わせて、直方体治具を選ぶ必
要があり、作業に時間を要するため、従来の治具では量
産性が低い。第2は、従来の方法では必ず、電極側への
まわり込みが発生するという点である。特にシリコンや
ダイヤモンド等のヒートシンクヘマウントするマウント
面のまわり込みは、放熱性を十分に確保する必要上極力
おさえなければならない。本発明はこのような問題点を
除去した端面保護膜形成方法を提供するものである。
When the above-described conventional method for forming an end face protective film is used, the following problems occur. First, the resonator length of a bar-shaped semiconductor laser has a variation of approximately ±10 μm due to variation in the distance between walls. Therefore, as mentioned above, in order to prevent the film from wrapping around to the electrode side as much as possible while ensuring a predetermined film thickness, we prepared several types of rectangular parallelepiped jigs with different heights and adjusted them to fit each semiconductor laser bar. Therefore, it is necessary to select a rectangular parallelepiped jig, which requires time, so conventional jigs have low mass productivity. The second point is that in the conventional method, wrapping around to the electrode side always occurs. In particular, the wrap around the mounting surface for mounting onto a heat sink made of silicon, diamond, etc. must be suppressed as much as possible to ensure sufficient heat dissipation. The present invention provides a method for forming an end face protective film that eliminates these problems.

〔課題を解決するための手段〕[Means to solve the problem]

本発明は、発光領域を内包した多層構造体から成る半導
体レーザーが複数連なった半導体レーザーバーを、平面
支持台上に複数個、光出射端面を上にして傾斜させて密
着配列・固定し、前記傾斜配置した光出射端面に絶縁膜
を堆積する構成になっている。
The present invention provides a method for closely arranging and fixing a plurality of semiconductor laser bars in which a plurality of semiconductor lasers each having a multilayer structure including a light-emitting region are connected on a flat support base with the light emitting end face facing upward. The structure is such that an insulating film is deposited on the light emitting end face which is arranged at an angle.

〔実施例1〕 次に本発明について図面を参照して説明する。[Example 1] Next, the present invention will be explained with reference to the drawings.

第1図は、本発明の第1の実施例である。本実施例は、
発光領域で発生する熱を効率よく放散させるために通常
よく用いられる発光領域側の電極6aをヒートシンクヘ
マウントするアップサイド・ダウンマウントの構造の半
導体レーザーに適用する。厚さが100μm、共振器長
が300μm程度でそのばらつきが±10μmの場合、
固定用治具3a、および3bは、図のように半導体レー
ザーバーに接する面に約12°の傾斜を設け、その間に
複数個の半導体レーザーバー1を発光領域5側の電極6
aを左側にそろえて重ね合せて挟み込み、平面支持台4
へ固定する。この状態で上方より、スパッタ等によって
半導体レーザーバーの上端面7aに保護膜を形成する。
FIG. 1 shows a first embodiment of the invention. In this example,
The present invention is applied to a semiconductor laser having an upside-down mount structure in which the electrode 6a on the light emitting region side is mounted on a heat sink, which is commonly used to efficiently dissipate heat generated in the light emitting region. When the thickness is 100 μm, the resonator length is about 300 μm, and the variation is ±10 μm,
As shown in the figure, the fixing jigs 3a and 3b have surfaces that contact the semiconductor laser bars with an inclination of about 12°, and between them, the plurality of semiconductor laser bars 1 are attached to the electrodes 6 on the light emitting region 5 side.
Align a to the left side, stack them and sandwich them, and attach the flat support base 4.
Fix to. In this state, a protective film is formed from above on the upper end surface 7a of the semiconductor laser bar by sputtering or the like.

次いで下端面7bを上にして配置し、同様にして端面7
b上にも保護膜を形成する。
Next, place the lower end surface 7b upward, and in the same manner, the end surface 7b
A protective film is also formed on b.

この方法によれば、発光領域近傍の端面は、となり合う
半導体レーザーバーより低くなるが、傾斜させているた
め5.端面全体に渡って膜厚が均一で、しかも所定の厚
さの保護膜を形成することができる。同時に、マウント
面への保護膜のまわり込みも、はぼ完全に防止すること
が可能である。
According to this method, the end face near the light emitting region is lower than the adjacent semiconductor laser bar, but because it is tilted, 5. A protective film having a uniform film thickness and a predetermined thickness can be formed over the entire end face. At the same time, it is possible to almost completely prevent the protective film from wrapping around the mounting surface.

この時、マウント面と反対側の電極6bには平均して片
側20μm程度、最大で40μm程度のまわり込みが発
生するが、ワイヤーボンディングを行う上での障害には
ならない。
At this time, the electrode 6b on the side opposite to the mounting surface has a wraparound of about 20 μm on average and about 40 μm at the maximum on one side, but this does not interfere with wire bonding.

〔実施例2〕 第2図は、本発明の第2の実施例を示す断面図である。[Example 2] FIG. 2 is a sectional view showing a second embodiment of the invention.

本実施例は、放熱の良い半導体レーザーで、マウントに
よって生ずる発光領域に加わる歪をさけるため用いられ
るアップ・サイド・アップマウント構造の半導体レーザ
ーに適用される。この場合、マウント面は、発光領域5
より遠い側の電極6bとなるので、第1の実施例とは逆
に、電極6bを左側にそろえて、複数個の半導体レーザ
ーバー1を重ね合せ、固定用治具3aおよび3bで平面
支持台4へ固定して、第1の実施例と同様にして、保護
膜を形成する。
The present embodiment is applied to a semiconductor laser with an up-side up-mount structure, which is a semiconductor laser with good heat dissipation and is used to avoid distortion caused by the mount on the light emitting region. In this case, the mounting surface is the light emitting area 5
Since the electrode 6b is on the far side, contrary to the first embodiment, the electrode 6b is aligned on the left side, a plurality of semiconductor laser bars 1 are overlapped, and the fixing jigs 3a and 3b are used to support a flat surface. 4 and form a protective film in the same manner as in the first embodiment.

〔発明の効果〕〔Effect of the invention〕

以上、説明したように本発明は、固定用治具に傾斜部を
設けることにより、半導体レーザーバー間に挟む直方体
治具なしで、所定の膜厚形成能力を確保しつつ、マウン
ト面の保護膜のまわり込みをほぼ完全に防止できる効果
がある。従って、直方体治具の高さの選定作業を必要と
せず、大幅に工数を短縮できるとともに、直方体治具の
なくなった分、約2倍、保護膜形成工程の処理能力を向
上させ、量産性に優れている。
As explained above, the present invention provides a fixing jig with an inclined portion, thereby ensuring the ability to form a predetermined film thickness without the need for a rectangular parallelepiped jig sandwiched between semiconductor laser bars. This has the effect of almost completely preventing wraparound. Therefore, there is no need to select the height of the rectangular parallelepiped jig, which greatly reduces the number of man-hours.In addition, since the rectangular parallelepiped jig is eliminated, the throughput of the protective film formation process is approximately doubled, increasing mass productivity. Are better.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の第1の実施例の縦断面図、第2図は第
2の実施例の縦断面図、第3図は従来の保護膜形成用治
具の縦断面図、第4図は半導体レーザーの外観図、第5
図は半導体レーザーバーの外観図を示す。 1・・・半導体レーザーバー 2・・・直方体治具、3
・・・固定用治具、3a、3b・・・固定用治具、4・
・・平面支持台、5・・・発光領域、6a・・・発光領
域側の電極、6b・・・発光領域から遠い方の電極、7
a。 7b・・・端面。 代理人 弁理士  内 原  晋 35区 了a堝n 34因 あ y5 ど因 55困
FIG. 1 is a vertical cross-sectional view of a first embodiment of the present invention, FIG. 2 is a vertical cross-sectional view of a second embodiment, FIG. 3 is a vertical cross-sectional view of a conventional protective film forming jig, and FIG. The figure is an external view of a semiconductor laser, No. 5
The figure shows an external view of a semiconductor laser bar. 1... Semiconductor laser bar 2... Rectangular parallelepiped jig, 3
...Fixing jig, 3a, 3b...Fixing jig, 4.
... Planar support base, 5... Light emitting region, 6a... Electrode on the light emitting region side, 6b... Electrode farther from the light emitting region, 7
a. 7b... end surface. Agent Patent Attorney Susumu Uchihara 35 wards 34 reasons 55 problems

Claims (1)

【特許請求の範囲】[Claims] 発光領域を内包した多層構造体から成る半導体レーザー
が複数連なった半導体レーザーバーを、平面支持台上に
複数個、光出射端面を上にして傾斜させて密着配列・固
定し、前記傾斜配置した光出射端面に絶縁膜を堆積する
ことを特徴とする半導体レーザー端面保護膜形成方法。
A plurality of semiconductor laser bars each having a plurality of semiconductor lasers each having a multilayer structure including a light-emitting region are closely arranged and fixed on a flat support base with the light emitting end face facing up, and the light emitting area arranged at an angle is A method for forming a protective film on a semiconductor laser end face, the method comprising depositing an insulating film on an emitting end face.
JP27363388A 1988-10-28 1988-10-28 Formation of protective film for semiconductor laser end face Pending JPH02119284A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27363388A JPH02119284A (en) 1988-10-28 1988-10-28 Formation of protective film for semiconductor laser end face

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27363388A JPH02119284A (en) 1988-10-28 1988-10-28 Formation of protective film for semiconductor laser end face

Publications (1)

Publication Number Publication Date
JPH02119284A true JPH02119284A (en) 1990-05-07

Family

ID=17530418

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27363388A Pending JPH02119284A (en) 1988-10-28 1988-10-28 Formation of protective film for semiconductor laser end face

Country Status (1)

Country Link
JP (1) JPH02119284A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0426560U (en) * 1990-06-26 1992-03-03
JP2000133871A (en) * 1998-10-27 2000-05-12 Sharp Corp Manufacture of semiconductor laser device
JP2001127382A (en) * 1999-10-29 2001-05-11 Nichia Chem Ind Ltd Semiconductor laser device, semiconductor laser package, and method for manufacturing semiconductor laser element
KR100769399B1 (en) * 2006-02-17 2007-10-22 엘에스전선 주식회사 Jig apparatus for coating the cleaved facet of laser diode and spacer structure therefor
WO2022102052A1 (en) * 2020-11-12 2022-05-19 三菱電機株式会社 Method for forming end-surface film on laser diode bar

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0426560U (en) * 1990-06-26 1992-03-03
JP2000133871A (en) * 1998-10-27 2000-05-12 Sharp Corp Manufacture of semiconductor laser device
JP2001127382A (en) * 1999-10-29 2001-05-11 Nichia Chem Ind Ltd Semiconductor laser device, semiconductor laser package, and method for manufacturing semiconductor laser element
KR100769399B1 (en) * 2006-02-17 2007-10-22 엘에스전선 주식회사 Jig apparatus for coating the cleaved facet of laser diode and spacer structure therefor
WO2022102052A1 (en) * 2020-11-12 2022-05-19 三菱電機株式会社 Method for forming end-surface film on laser diode bar
JPWO2022102052A1 (en) * 2020-11-12 2022-05-19

Similar Documents

Publication Publication Date Title
EP0891630B1 (en) Laser diode array packaging
EP1376787B1 (en) Submount assembly and associated packaging method
US6574089B1 (en) Monolithic ceramic capacitor
KR101156815B1 (en) Optical module
JP2001168442A (en) Method of manufacturing semiconductor laser element, installation substrate, and support substrate
JP3023883B2 (en) Submount laser
JP2002232061A (en) Semiconductor laser device and manufacturing method
JPH02119284A (en) Formation of protective film for semiconductor laser end face
US6208677B1 (en) Diode array package with homogeneous output
US5636235A (en) Semiconductor laser device including columns of semiconductor lasers with non-central light emitting regions
JP2010521804A (en) Contact pads for optical device arrays
JP5280119B2 (en) Semiconductor laser device
JP2000182887A (en) Multilayer ceramic capacitor
JPH09270531A (en) Light emitting element array assembly
US4748482A (en) Support member
JP4536429B2 (en) Semiconductor laser device and manufacturing method thereof
JP3040763B1 (en) Method of manufacturing semiconductor device and jig for forming film used therefor
JPH1093187A (en) Method and system for manufacturing semiconductor device, spacer and holder
JPH04309282A (en) Method for forming dielectric film on resonator end face of semiconductor laser bar
JP2737625B2 (en) Semiconductor laser device
JPH02103987A (en) Semiconductor laser-array device
EP1536532A1 (en) Semiconductor laser device
WO2023017632A1 (en) Semiconductor laser device, soldered sub-mount, soldered sub-mount assembly, and testing method for semiconductor laser device
JPH10242566A (en) End surface protecting film forming jig for semiconductor laser bar
JP2000098190A (en) Semiconductor laser unit, semiconductor laser module and solid-state laser device