JPH02116574U - - Google Patents
Info
- Publication number
- JPH02116574U JPH02116574U JP2499189U JP2499189U JPH02116574U JP H02116574 U JPH02116574 U JP H02116574U JP 2499189 U JP2499189 U JP 2499189U JP 2499189 U JP2499189 U JP 2499189U JP H02116574 U JPH02116574 U JP H02116574U
- Authority
- JP
- Japan
- Prior art keywords
- columns
- piping
- equipment unit
- toilet bowl
- rigid frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 2
Landscapes
- Sanitary Device For Flush Toilet (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989024991U JPH077422Y2 (ja) | 1989-03-04 | 1989-03-04 | 設備ユニット |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989024991U JPH077422Y2 (ja) | 1989-03-04 | 1989-03-04 | 設備ユニット |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH02116574U true JPH02116574U (xx) | 1990-09-18 |
JPH077422Y2 JPH077422Y2 (ja) | 1995-02-22 |
Family
ID=31245321
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1989024991U Expired - Fee Related JPH077422Y2 (ja) | 1989-03-04 | 1989-03-04 | 設備ユニット |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH077422Y2 (xx) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5536780A (en) * | 1978-09-08 | 1980-03-14 | Fujitsu Ltd | Measuring method of semiconductor gaseous phase grown film thickness |
-
1989
- 1989-03-04 JP JP1989024991U patent/JPH077422Y2/ja not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5536780A (en) * | 1978-09-08 | 1980-03-14 | Fujitsu Ltd | Measuring method of semiconductor gaseous phase grown film thickness |
Also Published As
Publication number | Publication date |
---|---|
JPH077422Y2 (ja) | 1995-02-22 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |