JPH02113137U - - Google Patents
Info
- Publication number
- JPH02113137U JPH02113137U JP2128789U JP2128789U JPH02113137U JP H02113137 U JPH02113137 U JP H02113137U JP 2128789 U JP2128789 U JP 2128789U JP 2128789 U JP2128789 U JP 2128789U JP H02113137 U JPH02113137 U JP H02113137U
- Authority
- JP
- Japan
- Prior art keywords
- ferromagnetic thin
- thin film
- curie temperature
- thin films
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 claims description 5
- 239000000758 substrate Substances 0.000 claims description 2
- 230000005294 ferromagnetic effect Effects 0.000 claims 3
- 238000005259 measurement Methods 0.000 claims 1
- 229910001252 Pd alloy Inorganic materials 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
Landscapes
- Measuring Temperature Or Quantity Of Heat (AREA)
Description
第１図はこの考案の実施例に係る温度検知素子
を示す平面図、第２図はＮｉにおける温度と１Ｒ
（Ｔｃ）ｄＲ（Ｔ）ｄＴ及びＲ（Ｔ）／Ｒ（Ｔｃ
）との関係を示すグラフ、第３図はＮｉ−Ｐｄ合
金の種々の組成における温度と抵抗との関係を示
すグラフである。
１；基板、２，３，４；薄膜、５，６，７，８
；電極。
Fig. 1 is a plan view showing a temperature sensing element according to an embodiment of this invention, and Fig. 2 shows the temperature and 1R of Ni.
(Tc)dR(T)dT and R(T)/R(Tc
), and FIG. 3 is a graph showing the relationship between temperature and resistance for various compositions of Ni--Pd alloys. 1; Substrate, 2, 3, 4; Thin film, 5, 6, 7, 8
;electrode.
Claims (1)
キユリー温度を有する少なくとも２種類の強磁性
体薄膜と、これら強磁性体薄膜の抵抗を測定する
ための電極とを有し、強磁性体薄膜の抵抗測定に
より各薄膜のキユリー温度に対応した複数の特定
温度を検知することを特徴とする温度検知素子。 The ferromagnetic thin film has at least two types of ferromagnetic thin films formed separately on an insulating substrate, each having a different Curie temperature, and an electrode for measuring the resistance of these ferromagnetic thin films. A temperature sensing element characterized by detecting a plurality of specific temperatures corresponding to the Curie temperature of each thin film by resistance measurement.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2128789U JPH02113137U (en) | 1989-02-28 | 1989-02-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2128789U JPH02113137U (en) | 1989-02-28 | 1989-02-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02113137U true JPH02113137U (en) | 1990-09-11 |
Family
ID=31238392
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2128789U Pending JPH02113137U (en) | 1989-02-28 | 1989-02-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02113137U (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5637603A (en) * | 1979-09-05 | 1981-04-11 | Tdk Electronics Co Ltd | Positive temperature coefficient thermistor |
-
1989
- 1989-02-28 JP JP2128789U patent/JPH02113137U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5637603A (en) * | 1979-09-05 | 1981-04-11 | Tdk Electronics Co Ltd | Positive temperature coefficient thermistor |